KR101650375B1 - Light Emitting Diode Repair Method and Apparatus using Quantum Dot Coating - Google Patents

Light Emitting Diode Repair Method and Apparatus using Quantum Dot Coating Download PDF

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Publication number
KR101650375B1
KR101650375B1 KR1020090110847A KR20090110847A KR101650375B1 KR 101650375 B1 KR101650375 B1 KR 101650375B1 KR 1020090110847 A KR1020090110847 A KR 1020090110847A KR 20090110847 A KR20090110847 A KR 20090110847A KR 101650375 B1 KR101650375 B1 KR 101650375B1
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South Korea
Prior art keywords
light emitting
quantum dot
emitting diode
light emission
light
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KR1020090110847A
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Korean (ko)
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KR20110054262A (en
Inventor
김태연
김윤회
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주식회사 탑 엔지니어링
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Priority to KR1020090110847A priority Critical patent/KR101650375B1/en
Priority to TW99132453A priority patent/TW201123527A/en
Priority to JP2012538746A priority patent/JP2013511146A/en
Priority to PCT/KR2010/006526 priority patent/WO2011062362A2/en
Priority to CN201080052153.0A priority patent/CN102668142B/en
Publication of KR20110054262A publication Critical patent/KR20110054262A/en
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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L33/00—Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L33/48—Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor body packages
    • H01L33/50—Wavelength conversion elements
    • H01L33/507—Wavelength conversion elements the elements being in intimate contact with parts other than the semiconductor body or integrated with parts other than the semiconductor body
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2933/00—Details relating to devices covered by the group H01L33/00 but not provided for in its subgroups
    • H01L2933/0008—Processes
    • H01L2933/0033—Processes relating to semiconductor body packages
    • H01L2933/0041—Processes relating to semiconductor body packages relating to wavelength conversion elements

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  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Power Engineering (AREA)
  • Led Devices (AREA)
  • Led Device Packages (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)

Abstract

In the present invention, the light emitting diodes of the manufactured light emitting diodes are measured, and the light emitting diodes classified according to the grades of the light emitting characteristics are coated with the quantum dot mixed solution to form quantum dot layers, thereby repairing the light emitting diodes And to a repair method and apparatus of a light emitting diode capable of improving the yield. The method of repairing a light emitting diode according to the present invention includes the steps of: determining a light emission grade for the measured light emission characteristic value by measuring a light emission property value of the light emitting diode; determining a repair quantum dot corresponding to the light emission grade; And a third step of forming a quantum dot layer corresponding to the quantum dot on the uppermost layer of the light emitting diode.

Figure R1020090110847

LED, good product, defective product, quantum dot, repair, color coordinate

Description

TECHNICAL FIELD [0001] The present invention relates to a light emitting diode repair method and apparatus using a quantum dot coating,

The present invention relates to a method and an apparatus for repairing light emitting diodes, and more particularly, to a method and apparatus for repairing light emitting diodes by measuring light emitting characteristics of manufactured light emitting diodes (LEDs) To a method and an apparatus for repairing a light emitting diode capable of repairing a light emitting diode as a good product having improved light emission hue and luminance by forming a quantum dot layer and improving a production yield.

LEDs are fabricated on the basis of III-V nitride semiconductors such as GaN. The LED is basically manufactured by bonding a P-type nitride semiconductor layer and an N-type nitride semiconductor layer in which a P-type or N-type impurity is added to the nitride semiconductor as described above, and a P-type nitride semiconductor layer and an N-type nitride semiconductor An active layer is interposed between the layers to increase the recombination ratio of the electron-holes, thereby improving the luminance characteristics of the LED.

1, a typical LED is fabricated such that each of the P-type nitride semiconductor layer and the N-type nitride semiconductor layer is connected to an external electrode, and LEDs to which power is applied to both electrodes can emit light of a visible light wavelength .

In addition, in recent years, in order to improve the luminance characteristic or to change the luminescent color, an attempt to appropriately insert the quantum dot layer into an appropriate position of the basic LED structure composed of the P type nitride semiconductor layer, the active layer and the N type nitride semiconductor layer .

Further, as shown in FIG. 2, the LED having the fluorescent layer coated on the multilayer structure as described above can be manufactured, and the LED having such a structure can improve the luminance characteristic. The LED having the quantum dot layer coated thereon can be fabricated on the multi-layer structure as described above. The LED having such a structure can change the emission color and improve the luminance characteristic. For example, in the structure of FIG. 3, an LED having a structure that emits blue light before applying the quantum dot layer may be an LED that emits white light by applying a quantum dot layer for emitting light of a yellow wavelength band.

As described above, the LED can be manufactured with a structure in which the quantum dot layer is appropriately inserted at a proper position of the basic LED structure in addition to the basic structure composed of the P-type nitride semiconductor layer, the active layer, and the N-type nitride semiconductor layer. A high-luminance LED of various luminescent colors may be produced by applying a fluorescent layer, a quantum dot layer, or the like to the outside of the uppermost layer.

However, when manufacturing LEDs having various structures, it is necessary to apply power to the LEDs in the good-quality test step after all the manufacturing steps and to measure the light emission intensity of the LEDs using the photodetector. do. In order to produce an LED having a high luminous efficiency at a low cost, it is necessary to improve the color and brightness characteristics of the LED determined to be defective and to use the LED so that defective products can be reduced.

SUMMARY OF THE INVENTION The present invention has been made to solve the above-mentioned problems, and it is an object of the present invention to provide a light emitting diode having a light emitting diode, Which can improve the production yield by repairing a light emitting diode as a good product having improved light emission hue and brightness, and a method and an apparatus for repairing a light emitting diode.

The method of repairing a light emitting diode according to an embodiment of the present invention includes a first step of determining a light emitting level of the measured light emitting property by measuring a light emitting property of the light emitting diode, A second step of determining a repair quantum dot corresponding to the emission level; And a third step of forming a quantum dot layer corresponding to the repair quantum dot on the uppermost layer of the light emitting diode.

Wherein if the emission level is higher than the reference emission level, the light emitting diode is classified as a good product, and if the emission level is lower than the reference emission level, the light emitting diode is classified as a defective product, Lt; RTI ID = 0.0 > quantum dot.

After the third step, the step of re-measuring the light emitting property of the light emitting diode having the quantum dot layer and determining whether the light emitting property of the re-measured light emitting property is not less than the reference light emitting grade.

The third step may include: coating a quantum dot mixed solution corresponding to the repair quantum dot on the uppermost layer of the light emitting diode; And drying the applied quantum dot mixed solution.

Forming a protective layer of a transparent material on the quantum dot layer after the third step.

According to another aspect of the present invention, there is provided a repair apparatus for a light emitting diode, comprising: a first photodetector for measuring a light emission characteristic value of a light emitting diode; A quantum dot selector for determining a light emission grade for the measured light emission property value and determining a repair quantum dot corresponding to the light emission grade; A quantum dot dispenser for applying the quantum dot mixed solution corresponding to the repair quantum dot on the uppermost layer of the light emitting diode; And a first dryer for drying the applied quantum dot mixed solution, wherein the application of the quantum dot mixed solution using the quantum dot dispenser and the drying of the quantum dot mixed solution using the first dryer allow the quantum dot Layer.

The repair device of the light emitting diode may further include: a second photodetector for measuring a light emission characteristic value of the light emitting diode on which the quantum dot layer is formed; And a goodness-of-goodness determiner for determining whether the emission level of the emission characteristic measured by the second photodetector is higher than a reference emission level.

The quantum dot dispenser has a plurality of nozzles corresponding to a plurality of repair quantum dots and applies the quantum dot mixed solution through nozzles corresponding to the repair quantum dots.

The repair apparatus of the light emitting diode may further include: a protective film applicator for applying a protective film of a transparent material on the quantum dot layer; And a second dryer for drying the applied protective film.

Wherein the quantum dot selector comprises: a light emission grade determination unit for determining the light emission grade with respect to light emission characteristic values from the first photodetector or the second photodetector; And a quantum dot determination unit for determining a repair quantum dot corresponding to the emission level by referring to information of a database storing information on the kind of quantum dots according to the emission level.

The quantum dot selector may further include a good product transferring unit for transferring the corresponding light emitting diode having a light emitting grade determined by the light emitting grade determining unit to a standard collector.

Wherein the repair device of the light emitting diode has a plurality of light emitting diodes inserted into each jig, and after the measurement of the light emission characteristic value of the first light detector, the plurality of light emitting diodes are sequentially supplied one by one below the first light detector And a feeder.

According to another aspect of the present invention, there is provided a repair method for a light emitting diode, comprising: measuring a light emission characteristic value of a plurality of light emitting diodes to determine a light emission grade for the measured light emission characteristic value; A first step of classifying a plurality of cells; A second step of collecting the collected plurality of light emitting diodes by respectively transferring the classified light emitting diodes according to the light emitting grades in different paths and determining the repair quantum dots corresponding to the respective light emitting grades; And a third step of forming different quantum dot layers corresponding to the repair quantum dots determined by the light emission grade on the uppermost layer of each of the collected plurality of light emitting diodes.

Wherein if the emission level is higher than the reference emission level, the light emitting diode is classified as a good product, and if the emission level is lower than the reference emission level, the light emitting diode is classified as a defective product, Lt; RTI ID = 0.0 > quantum dot.

Measuring a light emission characteristic value of the plurality of light emitting diodes having the quantum dot layer formed thereon after the third step and determining whether the light emitting property of the re-measured light emitting property value is greater than or equal to the reference light emitting property .

Forming a protective layer of a transparent material on the quantum dot layer after the third step.

According to another aspect of the present invention, there is provided a repair apparatus for a light emitting diode, comprising: a light emitting diode having a plurality of light emitting diodes, Classifiers to classify; Transport means for transporting the sorted plurality of light emitting diodes according to different emission grades by different routes; A plurality of collectors collecting the light emitting diodes transferred to the different paths into the jigs according to the light emitting grades; And a plurality of repairers for repairing and forming a quantum dot layer corresponding to each of the plurality of collectors on the uppermost layer of the plurality of light emitting diodes collected in each of the plurality of collectors.

Wherein each of the plurality of repair units comprises: a feeder for sequentially supplying the plurality of light emitting diodes collected in the jig one by one; A quantum dot dispenser for applying the quantum dot mixed solution onto the uppermost layer of the light emitting diode supplied from the feeder; And a first dryer for drying the applied quantum dot mixed solution, wherein the application of the quantum dot mixed solution using the quantum dot dispenser and the drying of the quantum dot mixed solution using the first dryer allow the quantum dot Layer.

Wherein each of the plurality of repair units comprises: a photodetector for measuring a light emission characteristic value of the light emitting diode on which the quantum dot layer is formed; And a goodness-of-goodness determiner for determining whether the emission level of the emission characteristic measured by the photodetector is higher than a reference emission level.

Each of the plurality of repair units includes a protective film applicator for applying a protective film of a transparent material on the quantum dot layer; And a second dryer for drying the applied protective film.

The classifier transmits the corresponding light emitting diode having the luminosity grade of the measured luminosity characteristic value to the luminosity grade or more to the good article collector.

According to the method and apparatus for repairing a light emitting diode according to the present invention, a light emitting diode, which is required to be improved in light emission characteristics, is coated with a quantum dot mixed solution to form a quantum dot layer, The yield can be improved.

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS Reference will now be made in detail to the preferred embodiments of the present invention, examples of which are illustrated in the accompanying drawings, wherein like reference numerals refer to the like elements throughout. Like reference symbols in the drawings denote like elements.

4 is a view for explaining a repair apparatus 100 of a light emitting diode according to an embodiment of the present invention.

4, a repair apparatus 100 of a light emitting diode according to an exemplary embodiment of the present invention includes a conveyor system 110, a feeder 120, a first photodetector 130, A selector 140, a quantum dot dispenser 140, a first dryer 150, a protective film applicator 160, a second dryer 170, a second photodetector 180, 181, and a good collector 190.

In the present invention, power is applied in the goodness test step of the manufactured LED, the light emission characteristic value of light emitted from the LED is measured using the first photodetector 130, and the measured value of the light emission characteristic, A quantum dot layer is formed on the uppermost layer of the semiconductor laminated structure constituting each LED in order to improve light emission characteristics such as color and brightness of the LEDs classified according to the value, A repair device (100) of a light emitting diode is disclosed.

Hereinafter, the operation of the repair apparatus 100 of the light emitting diode according to the embodiment of the present invention will be described with reference to the flowchart of FIG.

The feeder 120 includes a plurality of LEDs inserted into each jig, and sequentially supplies the diodes to the lower portion of the first photodetector 130 one by one (S11). After the LED inserted in the jig supplied from the feeder 120 is measured by the first photodetector 130, the conveyor system 110 can transport the measured LED to the bottom of the quantum dot dispenser 140, And supplies the next LED to the lower portion of the first photodetector 130.

The first photodetector 130 measures a light emission characteristic value of the LED inserted in the jig supplied from the feeder 120 (S12). The LED inserted and fixed in the jig may be powered by a predetermined terminal capable of supplying power to emit light. The light emission characteristic value measured by the first photodetector 130 includes a digital value for hue or luminance. For example, the first photodetector 130 may generate information (digital value) about the color of light through spectrum (or wavelength) analysis of the input light, It is possible to generate information (digital value) about the luminance of light through the analysis of the luminance value.

The quantum dot selector 131 determines the emission level for the emission characteristics measured by the first photodetector 130 and classifies the LEDs measured by the first photodetector 130 as good or defective. And determines the repair quantum dots corresponding to the emission level (S13). For example, the quantum dot selector 131 can classify the light emission grades into a plurality of grades, for example, 256 gradations, depending on the combination of hue or brightness measured by the first photodetector 130, Similarly, referring to the database storing information on the quantum dots required for each grade, it is possible to determine the repair quantum dots corresponding to each grade. The repair quantum dot is a corresponding quantum dot for repairing the emission level of the LED to be equal to or higher than the reference emission level by forming the quantum dot layer in the subsequent process.

FIG. 7 is a block diagram of a quantum dot selector 131 according to an embodiment of the present invention.

7, the quantum dot selector 131 according to an exemplary embodiment of the present invention includes a light emitting level determination unit 410, a quantum dot determination unit 420, a quantum dot type database 421, and a good product transfer unit 430 do.

The light emission class determiner 410 determines the light emission class corresponding to a light emission characteristic value from the first photodetector 130, for example, a digital value for hue or brightness. In the case where the quantum dot layer is formed again according to the determination of the good product determiner 181 as described below, the light emitting class determining unit 410 determines the light emitting characteristic value from the second photodetector 180, For example, the corresponding emission class may be determined for a digital value for color or luminance.

The quantum dot type database 421 stores and holds information on the types of quantum dots required for each emission level as shown in FIG.

The quantum dot determination unit 420 can determine the repair quantum dots corresponding to the emission level determined by the emission level determination unit 410 by referring to the information of the quantum dot type database 421. [ For example, when the information of the quantum dot type database 421 is configured as required quantum dots # 1 of FIG. 6, the quantum dot determination unit 420 determines the number of quantum dots Information can be determined as a repair quantum dot. Alternatively, when the information of the quantum dot type database 421 is configured as required quantum dot # 2 of FIG. 6, the quantum dot determination unit 420 determines that the necessary quantum dots are equally associated with a plurality of luminous grades that are grouped Information on any one of a plurality of necessary quantum dots can be determined as the repair quantum dots. 6, the quantum dot determination unit 420 determines that the emission level is equal to or higher than the reference emission level (for example, grades 1 to 50, etc.) The required quantum dots are equally associated with the plurality of light emission grades grouped with respect to the LEDs classified in the remaining grades, that is, the LEDs whose grades are smaller than the reference light emitting grade, Information on any one of a plurality of necessary quantum dots can be determined as the repair quantum dots. Likewise, when it is necessary to repair such a good product having a light emission grade equal to or higher than the standard light emission grade (for example, grades 1 to 50, etc.) so that the light emission grade is further improved, The unit 420 may determine information on any one of the necessary quantum dots, which correspond to one of the quantum dots differently for each emission level, as the repair quantum dots. Here, among the LEDs classified as defective products whose emission grades are smaller than the reference emission grade, LEDs of a certain lower emission rating (for example, grades 200 to 256, etc.) can be discarded.

The good product transferring unit 430 transfers the corresponding LED having a light emission grade of the light emission characteristic value from the first photodetector 130 to a reference light emission grade or more (for example, grades 1 to 50 in FIG. 6) ). ≪ / RTI > For example, when the emission level determination unit 410 determines that the LED is a defective LED to which a quantum dot layer is to be formed for the LED of the corresponding emission level, the quantum dot determination unit 420 determines the repair quantum dots as above, When the determination unit 410 determines that the emission level for the light emission characteristic value from the first photodetector 130 is equal to or higher than the reference emission level (for example, grades 1 to 50), the good product transfer unit 430 Can deliver the good quality LED to the good article collector 190.

5, the quantum dot dispenser 140 transmits the quantized point data to the quantum dot selector 140 through the quantum dot selector 140. In step S14 of FIG. 5, 131), and the corresponding quantum dot mixed solution is applied on the uppermost layer of the lower LED (S14). The quantum dot dispenser 140 has a plurality of nozzles corresponding to a plurality of repair quantum dots and can eject the quantum dot mixed solution through nozzles corresponding to the repair quantum dots and apply the solution on the LED.

The quantum dots may be compound semiconductor nanocrystals such as CdS, CdSe, CdTe, ZnS, ZnSe, ZnTe, HgS, HgSe, and HgTe and may be mixed with a quantum dot mixed with a dispersion solvent (for example, toluene, The solution may be contained in a container connected to each nozzle provided in the quantum dot dispenser 140 and used to dispense through the nozzle. In addition, a quantum dot mixed solution prepared by various methods can be used.

Thereafter, when the LED coated with the quantum dot layer by the conveyor system 110 is transported to the lower portion of the first dryer 150, the first dryer 150 can dry the quantum dot mixed solution coated on the LED (S15) .

Next, when the LED is transferred to the lower portion of the protective film applicator 160 by the conveyor system 110, the protective film applicator 160 can apply a protective material of transparent material on the quantum dot layer formed on the LED as described above (S16 ). The protective film prevents damage to the quantum dot layer and can be made of a transparent resin-based insulating material.

When the LED coated with the protective film by the conveyor system 110 is transferred to the lower portion of the second dryer 170, the second dryer 170 can dry the protective film coated on the LED (S17).

After the quantum dot layer and the protective film are formed on the defective LEDs as described above, the second photodetector 180 again measures the light emission characteristic values of the LED having the quantum dot layer and the protective film (S19).

The good product determiner 181 determines whether or not the light emitting grade for the light emitting property measured by the second photodetector 180 is equal to or higher than the reference light emitting grade (for example, grades 1 to 50) (S19).

For example, as shown in FIG. 10, a light emission characteristic value corresponding to a target range A in a constant color (for example, white) in a CIE (Commission International de I'Edairage) When the emission level is determined to be equal to or higher than the reference emission level (for example, grades 1 to 50, etc.), the good quality determiner 181 determines that the good quality LED having the light emission characteristic value within the target range A (S20). ≪ / RTI > Accordingly, even if the light emission characteristic value measured by the first photodetector 130 is out of the target range A and indicates a light emission grade corresponding to a value smaller than the reference light emission grade, the light emission characteristic value within the repairable range B The repairing device 100 can be used to repair the LED having the quantum dot layer and the protective film as described above on the LED as a good product with improved light emission color and brightness. When the corresponding emission characteristic value determined by the good quality determiner 181 is smaller than the reference emission level through the formation of the quantum dot layer and the protective film as described above, the repaired quantum dot, which is determined by the quantum dot selector 131, The quantum dot layer and the protective layer may be formed again or may not be released as an LED for sale and may be discarded (S21).

8 is a view for explaining a repair apparatus 200 of a light emitting diode according to another embodiment of the present invention.

8, a repair apparatus 200 of a light emitting diode according to another embodiment of the present invention includes an LED sorter 210, a plurality of collectors 220, and a plurality of repairers 230, Collector 231 and a plurality of repair units 230 each include a feeder 231, a quantum dot dispenser 232, a first dryer 233, a protective film applicator 234 A second dryer 235, a photodetector 236, and a good-quality determiner 237. The light emitting diode repair device 200 may also be configured to transport the LEDs between the LED sorter 210 and the plurality of collectors 220 and between the plurality of collectors 220 and the plurality of repair devices 230, And transport means such as a conveyor system for sequentially transferring the LEDs to subsequent processes in each of the repair units 230.

Hereinafter, the operation of the repair apparatus 200 of the light emitting diode according to another embodiment of the present invention will be described with reference to the flowchart of FIG.

In step S61, the LED classifier 210 determines the emission level of the measured emission characteristic value by measuring the emission characteristic of light emitted from the LED in the goodness test step of the manufactured LED, and classifies each LED according to the emission level. The LED classifier 210 can classify the emission grades into a plurality of grades, for example, 256 grades according to emission values measured for light emitted from the LED using a predetermined photodetector, that is, digital values for hue or luminance have. For example, the LED classifier 210 may classify a corresponding LED having a light emission grade higher than the reference light emission grade (for example, a grade 1 to 50) LEDs can be classified as defective. Also, the LED classifier 210 can determine the repair quantum dots corresponding to each emission class by referring to the database information as shown in FIG. 6 for the LED classified as defective.

Each of the LEDs classified as above may be transferred to different collectors by a transferring means such as a conveyor system according to the luminous grades and collected in a plurality of collectors 220 (S62). In some cases, the LED classifier 210 may transfer the corresponding LED whose measured light emission characteristic value is not less than the reference light emission rating (for example, 1 to 50 grades, etc.) to the good article collector 290.

The plurality of collectors 220 collect the LEDs, which are transported by different paths by the transporting means, in each jig according to the emission level. Each of the plurality of collectors 220 may collect the LEDs in a line in a jig having a predetermined terminal capable of supplying power, fix the LEDs so that they are not shaken, collect LEDs in a two- have.

The LEDs collected in the plurality of collectors 220 are transferred to each of the plurality of repairers 230 corresponding to the respective grades by the transferring means (S62).

Accordingly, the plurality of repair units 230 are arranged on the uppermost layer of the LEDs collected and transported in each jig, corresponding to each of the plurality of collectors 220, that is, the LED classifier 210 determines the repair quantum dots (S64 to S71).

For example, the feeder 231 may sequentially supply a plurality of LEDs collected in the jig to the lower portion of the quantum dot dispenser 232 one by one. The quantum dot dispenser 232 applies the quantum dot mixed solution onto the uppermost layer of the LED supplied from the feeder 231 (S64). The quantum dot dispenser 232 included in each of the plurality of repair units 230 is configured to mix the quantum dots mixed on the uppermost layer of the LED using a nozzle from a predetermined container containing the quantum dot mixed solution for applying the quantum dot mixed solution corresponding to the light emission grade, The solution can be dispensed by dispensing. The quantum dots may be compound semiconductor nanocrystals such as CdS, CdSe, CdTe, ZnS, ZnSe, ZnTe, HgS, HgSe, and HgTe and may be mixed with a quantum dot mixed with a dispersion solvent (for example, toluene, The solution may be contained in a container connected to each nozzle provided in the quantum dot dispenser 232 and used to dispense through the nozzle. For example, each of the quantum dot dispensers 232 included in the plurality of repair units 230 may be coated with a different quantum dot mixed solution including quantum dots to improve color and brightness required for repair.

Thereafter, when the LED coated with the quantum dot layer by the conveying system such as the conveyor system is transported to the lower portion of the first dryer 233, the first dryer 233 can dry the quantum dot mixed solution coated on the LED (S65 ).

Next, when the LED is transferred to the lower portion of the protective film applicator 234 by the conveying means, the protective film applicator 234 can apply a protective material of transparent material on the quantum dot layer formed on the LED as above (S66). The protective film prevents damage to the quantum dot layer and can be made of a transparent resin-based insulating material.

When the LED coated with the protective film by the transfer means is transferred to the lower portion of the second dryer 235, the second dryer 235 can dry the protective film coated on the LED (S67).

After the quantum dot layer and the protective layer are formed on the defective LED, the photodetector 236 measures the light emitting property values of the LED coated with the quantum dot layer and the protective layer (S68).

The good product determiner 237 determines whether the emission level of the light emission characteristic value measured by the photodetector 236 is equal to or higher than the reference emission level (for example, grades 1 to 50) or not (S69).

For example, as shown in FIG. 10, in the Commission international de I'Edairage (CIE) color coordinate system representing a general display color coordinate system, a light emission characteristic value corresponding to a range A indicating a luminance over a certain color In the case where the grade is a reference emission level (for example, grades 1 to 50, etc.), the good product determiner 237 feeds the defective good LED having the light emission characteristic value of the reference emission level or higher to the good product collector 290 (S70). Accordingly, even if the defective LED is classified as indicating the emission level corresponding to the value less than the reference emission level in the classifier 210, the LED having the emission characteristic value within the repairable range B The repairing apparatus 200 can be used to repair the light emitting diode (LED) as a good product having improved light emission color and brightness by forming the quantum dot layer and the protective film on the LED. If the corresponding emission characteristic value determined by the good quality determiner 237 exceeds the target range A through formation of the quantum dot layer and the protective film as described above and exhibits a luminous intensity corresponding to a value smaller than the reference emission level, The quantum dot layer and the protective film may be formed again, or the LED may not be released as a product for sale and may be discarded (S71).

While the invention has been shown and described with reference to certain preferred embodiments thereof, it will be understood by those of ordinary skill in the art that various changes in form and details may be made therein without departing from the spirit and scope of the invention as defined by the appended claims. This is possible. Therefore, the scope of the present invention should not be limited to the described embodiments, but should be determined by the equivalents of the claims, as well as the claims.

1 is an example of a structure of a general light emitting diode.

2 is another example of the structure of a general light emitting diode.

3 is another example of the structure of a general light emitting diode.

4 is a view for explaining a repair apparatus for a light emitting diode according to an embodiment of the present invention.

5 is a flowchart illustrating an operation of a repair apparatus for a light emitting diode according to an embodiment of the present invention.

FIG. 6 is a view for explaining a database of necessary quantum dot information according to the emission level of a light emitting diode according to an embodiment of the present invention.

7 is a block diagram of a quantum dot selector according to an embodiment of the present invention.

8 is a view for explaining a repair apparatus for a light emitting diode according to another embodiment of the present invention.

9 is a flowchart illustrating an operation of a repair apparatus for a light emitting diode according to another embodiment of the present invention.

10 is a diagram for explaining a general CIE color coordinate system.

Claims (21)

A first step of measuring a light emission characteristic value of the light emitting diode and determining a light emission grade for the measured light emission characteristic value; A second step of determining a repair quantum dot corresponding to the emission level; A third step of forming a quantum dot layer corresponding to the repair quantum dot on the uppermost layer of the light emitting diode; And And forming a protective layer of a transparent material on the quantum dot layer after the third step. 2. The method according to claim 1, wherein, in the second step, And classifying the light emitting diode as a defective product and determining a repair quantum dot corresponding to the light emitting grade if the light emitting class is equal to or greater than the reference light emitting class, Wherein the light emitting diode has a light emitting diode. 2. The method according to claim 1, wherein, after the third step, Measuring a light emission characteristic value of the light emitting diode having the quantum dot layer formed thereon and determining whether the light emission grade for the re-measured light emission characteristic value is equal to or higher than a reference light emission grade And a light emitting diode (LED). 2. The method according to claim 1, Applying a quantum dot mixed solution corresponding to the repair quantum dot on the uppermost layer of the light emitting diode; And The step of drying the applied quantum dot mixed solution And a light emitting diode (LED). delete A first photodetector for measuring a light emission characteristic value of the light emitting diode; A quantum dot selector for determining a light emission grade for the measured light emission property value and determining a repair quantum dot corresponding to the light emission grade; A quantum dot dispenser for applying the quantum dot mixed solution corresponding to the repair quantum dot on the uppermost layer of the light emitting diode; A first dryer for drying the applied quantum dot mixed solution to form a quantum dot layer; And And a protective film applicator for applying a protective film of a transparent material on the quantum dot layer, Wherein the quantum dot layer is formed on the uppermost layer of the light emitting diode by applying the quantum dot mixed solution using the quantum dot dispenser and drying the quantum dot mixed solution using the first dryer. The method according to claim 6, A second photodetector for measuring a light emission characteristic value of the light emitting diode on which the quantum dot layer is formed; And A goodness-of-good judging unit for judging whether or not the light emitting rating of the light emitting property measured by the second photodetector is equal to or greater than a reference light emitting rating, Further comprising a light emitting diode (LED). The apparatus of claim 6, wherein the quantum dot dispenser comprises: Wherein the plurality of repaired quantum dots have a plurality of nozzles corresponding to the plurality of repaired quantum dots, and the quantum dot mixed solution is applied through nozzles corresponding to the repair quantum dots. The method according to claim 6, A second drier for drying the coated protective film; Further comprising a light emitting diode (LED). 8. The apparatus of claim 7, wherein the quantum dot selector comprises: A light emission level determining unit for determining the light emission level with respect to light emission characteristic values from the first photodetector or the second photodetector; And A quantum dot determination unit for determining a repair quantum dot corresponding to the emission level by referring to information of a database in which information on the type of quantum dots is stored for each emission level, And a light emitting diode (LED). The apparatus of claim 10, wherein the quantum dot selector comprises: And a non-defective part for transferring the corresponding light emitting diode whose emission level determined by the emission level determination unit is equal to or higher than the standard emission level, Further comprising a light emitting diode (LED). The method according to claim 6, A plurality of light emitting diodes inserted in each jig, and after the measurement of the light emission characteristic value of the first light detector, a feeder for sequentially supplying the plurality of light emitting diodes to the lower portion of the first photo- Further comprising a light emitting diode (LED). A first step of measuring a light emission characteristic value of a plurality of light emitting diodes to determine a light emission grade for the measured light emission characteristic value and classifying the plurality of light emitting diodes according to the light emission grade; A second step of collecting the collected plurality of light emitting diodes by respectively transferring the classified light emitting diodes according to the light emitting grades in different paths and determining the repair quantum dots corresponding to the respective light emitting grades; A third step of forming different quantum dot layers corresponding to the repair quantum dots classified by the emission level on the uppermost layer of each of the collected plurality of light emitting diodes; And Forming a protective layer of a transparent material on the quantum dot layer after the third step And a light emitting diode (LED). 14. The method of claim 13, wherein, in the second step, And classifying the light emitting diode as a defective product and determining a repair quantum dot corresponding to the light emitting grade if the light emitting class is equal to or greater than the reference light emitting class, Wherein the light emitting diode has a light emitting diode. 14. The method of claim 13, further comprising, after the third step, Measuring a light emission characteristic value of the plurality of light emitting diodes having the quantum dot layer formed thereon and determining whether the light emission grade for the re-measured light emission characteristic value is equal to or higher than a reference light emission grade Further comprising the step of: delete A classifier for measuring a light emission characteristic value of a plurality of light emitting diodes to determine a light emitting class for the measured light emitting characteristic value and classifying the plurality of light emitting diodes according to the light emitting class; Transport means for transporting the sorted plurality of light emitting diodes according to different emission grades by different routes; A plurality of collectors collecting the light emitting diodes transferred to the different paths into the jigs according to the light emitting grades; And And a plurality of repairers for repairing and forming a quantum dot layer corresponding to each of the plurality of collectors on the uppermost layer of the plurality of light emitting diodes collected in each of the plurality of collectors, Wherein each of the plurality of repair units includes a protective film applicator for applying a protective film of a transparent material on the quantum dot layer. 18. The system of claim 17, wherein each of the plurality of repairers comprises: A feeder for sequentially supplying the plurality of light emitting diodes collected in the jig one by one; A quantum dot dispenser for applying the quantum dot mixed solution onto the uppermost layer of the light emitting diode supplied from the feeder; And And a first dryer for drying the applied quantum dot mixed solution, Wherein the quantum dot layer is formed on the uppermost layer of the light emitting diode by applying the quantum dot mixed solution using the quantum dot dispenser and drying the quantum dot mixed solution using the first dryer. 19. The system of claim 18, wherein each of the plurality of repairers comprises: A photodetector for measuring a light emission characteristic value of the light emitting diode on which the quantum dot layer is formed; And A goodness-of-good judging unit for judging whether or not the light emitting grade for the light emitting property measured by the photodetector is equal to or higher than a reference light emitting grade; Further comprising a light emitting diode (LED). 20. The method of claim 19, wherein each of the plurality of repairers comprises: A second drier for drying the coated protective film; Further comprising a light emitting diode (LED). 18. The apparatus according to claim 17, Wherein the corresponding light emitting diode having the light emission grade of the measured light emission characteristic value is equal to or greater than the mild light emission grade is transferred to the good product collector.
KR1020090110847A 2009-11-17 2009-11-17 Light Emitting Diode Repair Method and Apparatus using Quantum Dot Coating KR101650375B1 (en)

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KR1020090110847A KR101650375B1 (en) 2009-11-17 2009-11-17 Light Emitting Diode Repair Method and Apparatus using Quantum Dot Coating
TW99132453A TW201123527A (en) 2009-11-17 2010-09-24 Method and apparatus for repairing light emitting diode using quantum dot coating
JP2012538746A JP2013511146A (en) 2009-11-17 2010-09-27 Light emitting diode repair method and apparatus using quantum dot coating
PCT/KR2010/006526 WO2011062362A2 (en) 2009-11-17 2010-09-27 Method and apparatus for repairing a light-emitting diode using a quantum-dot coating
CN201080052153.0A CN102668142B (en) 2009-11-17 2010-09-27 The method and apparatus of light-emitting diode is repaired for using quantum spot printing to cover

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