KR101297513B1 - 범용 프로토콜 엔진 - Google Patents

범용 프로토콜 엔진 Download PDF

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Publication number
KR101297513B1
KR101297513B1 KR1020117023960A KR20117023960A KR101297513B1 KR 101297513 B1 KR101297513 B1 KR 101297513B1 KR 1020117023960 A KR1020117023960 A KR 1020117023960A KR 20117023960 A KR20117023960 A KR 20117023960A KR 101297513 B1 KR101297513 B1 KR 101297513B1
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South Korea
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protocol
data
definition
test
under test
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KR1020117023960A
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English (en)
Korean (ko)
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KR20120003886A (ko
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조지 코너
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테라다인 인코퍼레이티드
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31919—Storing and outputting test patterns
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
    • H04L1/00—Arrangements for detecting or preventing errors in the information received
    • H04L1/24—Testing correct operation
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
    • H04L69/00—Network arrangements, protocols or services independent of the application payload and not provided for in the other groups of this subclass
    • H04L69/03—Protocol definition or specification 

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Signal Processing (AREA)
  • General Engineering & Computer Science (AREA)
  • Computer Security & Cryptography (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Maintenance And Management Of Digital Transmission (AREA)
KR1020117023960A 2009-03-13 2010-03-12 범용 프로토콜 엔진 Active KR101297513B1 (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US12/404,158 2009-03-13
US12/404,158 US8195419B2 (en) 2009-03-13 2009-03-13 General purpose protocol engine
PCT/US2010/027247 WO2010105238A2 (en) 2009-03-13 2010-03-12 General purpose protocol engine

Publications (2)

Publication Number Publication Date
KR20120003886A KR20120003886A (ko) 2012-01-11
KR101297513B1 true KR101297513B1 (ko) 2013-08-16

Family

ID=42729156

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020117023960A Active KR101297513B1 (ko) 2009-03-13 2010-03-12 범용 프로토콜 엔진

Country Status (8)

Country Link
US (2) US8195419B2 (https=)
EP (1) EP2406646B1 (https=)
JP (1) JP5260758B2 (https=)
KR (1) KR101297513B1 (https=)
CN (1) CN102341717B (https=)
MY (1) MY169817A (https=)
SG (1) SG173675A1 (https=)
WO (1) WO2010105238A2 (https=)

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CN102655416A (zh) * 2011-03-04 2012-09-05 联咏科技股份有限公司 最小化传输差分信号接收器系统及其内建自我测试方法
US9521062B2 (en) * 2011-09-23 2016-12-13 Roche Diabetes Care, Inc. Communication test framework
US9910086B2 (en) 2012-01-17 2018-03-06 Allen Czamara Test IP-based A.T.E. instrument architecture
US9959186B2 (en) 2012-11-19 2018-05-01 Teradyne, Inc. Debugging in a semiconductor device test environment
US9116785B2 (en) * 2013-01-22 2015-08-25 Teradyne, Inc. Embedded tester
US10162007B2 (en) * 2013-02-21 2018-12-25 Advantest Corporation Test architecture having multiple FPGA based hardware accelerator blocks for testing multiple DUTs independently
US20140236527A1 (en) * 2013-02-21 2014-08-21 Advantest Corporation Cloud based infrastructure for supporting protocol reconfigurations in protocol independent device testing systems
US10161993B2 (en) * 2013-02-21 2018-12-25 Advantest Corporation Tester with acceleration on memory and acceleration for automatic pattern generation within a FPGA block
EP2773068B1 (en) 2013-03-01 2019-04-10 Viavi Solutions Deutschland GmbH Test device and method
WO2015018455A1 (en) * 2013-08-09 2015-02-12 Advantest (Singapore) Pte. Ltd. Automated test equipment, instruction provider for providing a sequence of instructions, method for providing a signal to a device under test, method for providing a sequence of instructions and test system
US10288685B2 (en) * 2014-04-30 2019-05-14 Keysight Technologies, Inc. Multi-bank digital stimulus response in a single field programmable gate array
US9679098B2 (en) 2015-01-29 2017-06-13 Mentor Graphics Corporation Protocol probes
US10536553B1 (en) * 2015-09-04 2020-01-14 Cadence Design Systems, Inc. Method and system to transfer data between components of an emulation system
US9883412B2 (en) * 2016-01-04 2018-01-30 Microsoft Technology Licensing, Llc Verification of a wireless protocol implementation
US10481206B2 (en) * 2016-09-08 2019-11-19 Texas Instruments Incorporated Automatic test equipment (ATE) platform translation
US10976361B2 (en) 2018-12-20 2021-04-13 Advantest Corporation Automated test equipment (ATE) support framework for solid state device (SSD) odd sector sizes and protection modes
JP7101814B2 (ja) 2019-01-22 2022-07-15 株式会社アドバンテスト １または複数の被テストデバイスをテストするための自動試験装置、１または複数の被テストデバイスの自動試験のための方法、および、バッファメモリを使用するコンピュータプログラム
US11137910B2 (en) 2019-03-04 2021-10-05 Advantest Corporation Fast address to sector number/offset translation to support odd sector size testing
US11237202B2 (en) 2019-03-12 2022-02-01 Advantest Corporation Non-standard sector size system support for SSD testing
US10884847B1 (en) 2019-08-20 2021-01-05 Advantest Corporation Fast parallel CRC determination to support SSD testing
US11574248B2 (en) 2020-04-02 2023-02-07 Rovi Guides, Inc. Systems and methods for automated content curation using signature analysis
KR102440440B1 (ko) * 2020-12-16 2022-09-06 와이아이케이 주식회사 반도체 소자 검사 장치
TWI770855B (zh) * 2021-03-04 2022-07-11 凌華科技股份有限公司 裝置測試排序方法、裝置組態生成方法及其設備
WO2025154007A1 (en) * 2024-01-17 2025-07-24 Crea - Collaudi Elettronici Automatizzati S.R.L. Testing system and test method

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JP2000148528A (ja) 1998-10-30 2000-05-30 Infineon Technol North America Corp 複数のｊｔａｇ準拠集積回路のテスト装置および複数の集積回路をテストするためのテストシステム
US20030033127A1 (en) 2001-03-13 2003-02-13 Lett Gregory Scott Automated hypothesis testing
US20080089682A1 (en) 2004-07-15 2008-04-17 Verizon Services Corp Automated testing and analysis of dense wave division multiplexing (dwdm) switching devices

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US7181660B2 (en) * 2002-07-26 2007-02-20 Verigy Pte. Ltd. Reconstruction of non-deterministic algorithmic tester stimulus used as input to a device under test
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US7702767B2 (en) * 2004-03-09 2010-04-20 Jp Morgan Chase Bank User connectivity process management system
KR100628835B1 (ko) 2005-02-26 2006-09-26 한국정보통신기술협회 시나리오 기반의 데이터 방송 수신기 시험 자동화 장치 및방법
US7233875B2 (en) * 2005-11-21 2007-06-19 Sigmatel, Inc. Test set for testing a device and methods for use therewith
US20090112548A1 (en) 2007-10-30 2009-04-30 Conner George W A method for testing in a reconfigurable tester
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Patent Citations (3)

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Publication number Priority date Publication date Assignee Title
JP2000148528A (ja) 1998-10-30 2000-05-30 Infineon Technol North America Corp 複数のｊｔａｇ準拠集積回路のテスト装置および複数の集積回路をテストするためのテストシステム
US20030033127A1 (en) 2001-03-13 2003-02-13 Lett Gregory Scott Automated hypothesis testing
US20080089682A1 (en) 2004-07-15 2008-04-17 Verizon Services Corp Automated testing and analysis of dense wave division multiplexing (dwdm) switching devices

Also Published As

Publication number Publication date
US20120221285A1 (en) 2012-08-30
JP5260758B2 (ja) 2013-08-14
US20100235135A1 (en) 2010-09-16
US8195419B2 (en) 2012-06-05
WO2010105238A3 (en) 2011-01-13
MY169817A (en) 2019-05-16
SG173675A1 (en) 2011-09-29
WO2010105238A2 (en) 2010-09-16
KR20120003886A (ko) 2012-01-11
CN102341717B (zh) 2013-09-11
CN102341717A (zh) 2012-02-01
EP2406646B1 (en) 2017-07-19
US8521465B2 (en) 2013-08-27
JP2012520471A (ja) 2012-09-06
EP2406646A2 (en) 2012-01-18
EP2406646A4 (en) 2014-08-06

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