CN102341717B - 通用协议引擎 - Google Patents

通用协议引擎 Download PDF

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Publication number
CN102341717B
CN102341717B CN2010800108730A CN201080010873A CN102341717B CN 102341717 B CN102341717 B CN 102341717B CN 2010800108730 A CN2010800108730 A CN 2010800108730A CN 201080010873 A CN201080010873 A CN 201080010873A CN 102341717 B CN102341717 B CN 102341717B
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China
Prior art keywords
protocol
data
agreement
protocol definition
test
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Application number
CN2010800108730A
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English (en)
Chinese (zh)
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CN102341717A (zh
Inventor
乔治·康纳
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Teradyne Inc
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Teradyne Inc
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Publication of CN102341717A publication Critical patent/CN102341717A/zh
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Publication of CN102341717B publication Critical patent/CN102341717B/zh
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31919—Storing and outputting test patterns
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
    • H04L1/00—Arrangements for detecting or preventing errors in the information received
    • H04L1/24—Testing correct operation
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
    • H04L69/00—Network arrangements, protocols or services independent of the application payload and not provided for in the other groups of this subclass
    • H04L69/03—Protocol definition or specification 

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Signal Processing (AREA)
  • General Engineering & Computer Science (AREA)
  • Computer Security & Cryptography (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Maintenance And Management Of Digital Transmission (AREA)
CN2010800108730A 2009-03-13 2010-03-12 通用协议引擎 Active CN102341717B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US12/404,158 2009-03-13
US12/404,158 US8195419B2 (en) 2009-03-13 2009-03-13 General purpose protocol engine
PCT/US2010/027247 WO2010105238A2 (en) 2009-03-13 2010-03-12 General purpose protocol engine

Publications (2)

Publication Number Publication Date
CN102341717A CN102341717A (zh) 2012-02-01
CN102341717B true CN102341717B (zh) 2013-09-11

Family

ID=42729156

Family Applications (1)

Application Number Title Priority Date Filing Date
CN2010800108730A Active CN102341717B (zh) 2009-03-13 2010-03-12 通用协议引擎

Country Status (8)

Country Link
US (2) US8195419B2 (https=)
EP (1) EP2406646B1 (https=)
JP (1) JP5260758B2 (https=)
KR (1) KR101297513B1 (https=)
CN (1) CN102341717B (https=)
MY (1) MY169817A (https=)
SG (1) SG173675A1 (https=)
WO (1) WO2010105238A2 (https=)

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TW201236395A (en) * 2011-02-23 2012-09-01 Novatek Microelectronics Corp TMDS receiver system and BIST method thereof
CN102655416A (zh) * 2011-03-04 2012-09-05 联咏科技股份有限公司 最小化传输差分信号接收器系统及其内建自我测试方法
US9521062B2 (en) * 2011-09-23 2016-12-13 Roche Diabetes Care, Inc. Communication test framework
US9910086B2 (en) 2012-01-17 2018-03-06 Allen Czamara Test IP-based A.T.E. instrument architecture
US9959186B2 (en) 2012-11-19 2018-05-01 Teradyne, Inc. Debugging in a semiconductor device test environment
US9116785B2 (en) * 2013-01-22 2015-08-25 Teradyne, Inc. Embedded tester
US10162007B2 (en) * 2013-02-21 2018-12-25 Advantest Corporation Test architecture having multiple FPGA based hardware accelerator blocks for testing multiple DUTs independently
US20140236527A1 (en) * 2013-02-21 2014-08-21 Advantest Corporation Cloud based infrastructure for supporting protocol reconfigurations in protocol independent device testing systems
US10161993B2 (en) * 2013-02-21 2018-12-25 Advantest Corporation Tester with acceleration on memory and acceleration for automatic pattern generation within a FPGA block
EP2773068B1 (en) 2013-03-01 2019-04-10 Viavi Solutions Deutschland GmbH Test device and method
WO2015018455A1 (en) * 2013-08-09 2015-02-12 Advantest (Singapore) Pte. Ltd. Automated test equipment, instruction provider for providing a sequence of instructions, method for providing a signal to a device under test, method for providing a sequence of instructions and test system
US10288685B2 (en) * 2014-04-30 2019-05-14 Keysight Technologies, Inc. Multi-bank digital stimulus response in a single field programmable gate array
US9679098B2 (en) 2015-01-29 2017-06-13 Mentor Graphics Corporation Protocol probes
US10536553B1 (en) * 2015-09-04 2020-01-14 Cadence Design Systems, Inc. Method and system to transfer data between components of an emulation system
US9883412B2 (en) * 2016-01-04 2018-01-30 Microsoft Technology Licensing, Llc Verification of a wireless protocol implementation
US10481206B2 (en) * 2016-09-08 2019-11-19 Texas Instruments Incorporated Automatic test equipment (ATE) platform translation
US10976361B2 (en) 2018-12-20 2021-04-13 Advantest Corporation Automated test equipment (ATE) support framework for solid state device (SSD) odd sector sizes and protection modes
JP7101814B2 (ja) 2019-01-22 2022-07-15 株式会社アドバンテスト １または複数の被テストデバイスをテストするための自動試験装置、１または複数の被テストデバイスの自動試験のための方法、および、バッファメモリを使用するコンピュータプログラム
US11137910B2 (en) 2019-03-04 2021-10-05 Advantest Corporation Fast address to sector number/offset translation to support odd sector size testing
US11237202B2 (en) 2019-03-12 2022-02-01 Advantest Corporation Non-standard sector size system support for SSD testing
US10884847B1 (en) 2019-08-20 2021-01-05 Advantest Corporation Fast parallel CRC determination to support SSD testing
US11574248B2 (en) 2020-04-02 2023-02-07 Rovi Guides, Inc. Systems and methods for automated content curation using signature analysis
KR102440440B1 (ko) * 2020-12-16 2022-09-06 와이아이케이 주식회사 반도체 소자 검사 장치
TWI770855B (zh) * 2021-03-04 2022-07-11 凌華科技股份有限公司 裝置測試排序方法、裝置組態生成方法及其設備
WO2025154007A1 (en) * 2024-01-17 2025-07-24 Crea - Collaudi Elettronici Automatizzati S.R.L. Testing system and test method

Citations (1)

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Publication number Priority date Publication date Assignee Title
US20080089682A1 (en) * 2004-07-15 2008-04-17 Verizon Services Corp Automated testing and analysis of dense wave division multiplexing (dwdm) switching devices

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US6425101B1 (en) 1998-10-30 2002-07-23 Infineon Technologies North America Corp. Programmable JTAG network architecture to support proprietary debug protocol
US20030018457A1 (en) 2001-03-13 2003-01-23 Lett Gregory Scott Biological modeling utilizing image data
US7222261B2 (en) 2002-06-19 2007-05-22 Teradyne, Inc. Automatic test equipment for design-for-test (DFT) and built-in-self-test circuitry
US7181660B2 (en) * 2002-07-26 2007-02-20 Verigy Pte. Ltd. Reconstruction of non-deterministic algorithmic tester stimulus used as input to a device under test
US7216273B2 (en) 2003-06-26 2007-05-08 Teradyne, Inc. Method for testing non-deterministic device data
US7702767B2 (en) * 2004-03-09 2010-04-20 Jp Morgan Chase Bank User connectivity process management system
KR100628835B1 (ko) 2005-02-26 2006-09-26 한국정보통신기술협회 시나리오 기반의 데이터 방송 수신기 시험 자동화 장치 및방법
US7233875B2 (en) * 2005-11-21 2007-06-19 Sigmatel, Inc. Test set for testing a device and methods for use therewith
US20090112548A1 (en) 2007-10-30 2009-04-30 Conner George W A method for testing in a reconfigurable tester
US20090113245A1 (en) 2007-10-30 2009-04-30 Teradyne, Inc. Protocol aware digital channel apparatus

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20080089682A1 (en) * 2004-07-15 2008-04-17 Verizon Services Corp Automated testing and analysis of dense wave division multiplexing (dwdm) switching devices

Also Published As

Publication number Publication date
US20120221285A1 (en) 2012-08-30
JP5260758B2 (ja) 2013-08-14
US20100235135A1 (en) 2010-09-16
US8195419B2 (en) 2012-06-05
WO2010105238A3 (en) 2011-01-13
MY169817A (en) 2019-05-16
SG173675A1 (en) 2011-09-29
WO2010105238A2 (en) 2010-09-16
KR20120003886A (ko) 2012-01-11
CN102341717A (zh) 2012-02-01
EP2406646B1 (en) 2017-07-19
US8521465B2 (en) 2013-08-27
JP2012520471A (ja) 2012-09-06
KR101297513B1 (ko) 2013-08-16
EP2406646A2 (en) 2012-01-18
EP2406646A4 (en) 2014-08-06

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