KR101228206B1 - 전력 증폭 회로 및 시험 장치 - Google Patents

전력 증폭 회로 및 시험 장치 Download PDF

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Publication number
KR101228206B1
KR101228206B1 KR1020077020730A KR20077020730A KR101228206B1 KR 101228206 B1 KR101228206 B1 KR 101228206B1 KR 1020077020730 A KR1020077020730 A KR 1020077020730A KR 20077020730 A KR20077020730 A KR 20077020730A KR 101228206 B1 KR101228206 B1 KR 101228206B1
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KR
South Korea
Prior art keywords
voltage
positive
negative
bias
transistor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
KR1020077020730A
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English (en)
Korean (ko)
Other versions
KR20070102620A (ko
Inventor
사토시 코데라
Original Assignee
주식회사 아도반테스토
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Publication date
Application filed by 주식회사 아도반테스토 filed Critical 주식회사 아도반테스토
Publication of KR20070102620A publication Critical patent/KR20070102620A/ko
Application granted granted Critical
Publication of KR101228206B1 publication Critical patent/KR101228206B1/ko
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31924—Voltage or current aspects, e.g. driver, receiver
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
    • H03F3/34—DC amplifiers in which all stages are DC-coupled
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
    • H03F3/30—Single-ended push-pull [SEPP] amplifiers; Phase-splitters therefor
    • H03F3/3001—Single-ended push-pull [SEPP] amplifiers; Phase-splitters therefor with field-effect transistors
    • H03F3/301—CMOS common drain output SEPP amplifiers
    • H03F3/3016—CMOS common drain output SEPP amplifiers with symmetrical driving of the end stage
    • H03F3/3018—CMOS common drain output SEPP amplifiers with symmetrical driving of the end stage using opamps as driving stages
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
    • H03F3/30—Single-ended push-pull [SEPP] amplifiers; Phase-splitters therefor
    • H03F3/3001—Single-ended push-pull [SEPP] amplifiers; Phase-splitters therefor with field-effect transistors
    • H03F3/3022—CMOS common source output SEPP amplifiers

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  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Amplifiers (AREA)
  • Tests Of Electronic Circuits (AREA)
KR1020077020730A 2005-02-10 2006-02-08 전력 증폭 회로 및 시험 장치 Expired - Fee Related KR101228206B1 (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2005034686A JP4170996B2 (ja) 2005-02-10 2005-02-10 電力増幅回路、及び試験装置
JPJP-P-2005-00034686 2005-02-10
PCT/JP2006/302196 WO2006085566A1 (ja) 2005-02-10 2006-02-08 電力増幅回路、及び試験装置

Publications (2)

Publication Number Publication Date
KR20070102620A KR20070102620A (ko) 2007-10-18
KR101228206B1 true KR101228206B1 (ko) 2013-01-30

Family

ID=36793137

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020077020730A Expired - Fee Related KR101228206B1 (ko) 2005-02-10 2006-02-08 전력 증폭 회로 및 시험 장치

Country Status (4)

Country Link
US (1) US7477104B2 (enExample)
JP (1) JP4170996B2 (enExample)
KR (1) KR101228206B1 (enExample)
WO (1) WO2006085566A1 (enExample)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4170996B2 (ja) 2005-02-10 2008-10-22 株式会社アドバンテスト 電力増幅回路、及び試験装置
KR101095249B1 (ko) 2009-12-04 2011-12-20 삼성전기주식회사 전력 증폭 모듈의 검사 장치
US9257949B2 (en) * 2010-03-02 2016-02-09 Devialet Linear amplifier
GB2481069B (en) 2010-06-11 2017-06-07 Snaptrack Inc Improved crossover performance of power amplifier
KR101393932B1 (ko) * 2011-12-08 2014-05-12 진옥상 소신호 버퍼증폭회로
GB2500429B (en) * 2012-03-22 2019-02-06 Snaptrack Inc Bias control for push-pull amplifier arrangement
US10048292B1 (en) * 2017-04-28 2018-08-14 Rohde & Schwarz Gmbh & Co. Kg Logic signal analyzer, logic probe as well as oscilloscope

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0567932A (ja) * 1990-12-27 1993-03-19 Pioneer Electron Corp 増幅器
JP2003046347A (ja) * 2001-07-31 2003-02-14 Agilent Technologies Japan Ltd 高出力増幅器

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5210753A (en) 1975-06-24 1977-01-27 Nisso Masutaabirudaazu Kk Liquid material automatic measuring system in a batcher plant
JPS5210753U (enExample) * 1976-06-25 1977-01-25
US4041408A (en) * 1976-11-12 1977-08-09 Rca Corporation Push-pull audio amplifier system with muting
JPH01169810A (ja) 1987-12-25 1989-07-05 Fujikura Ltd 架空送電線
US4866398A (en) * 1988-04-12 1989-09-12 Zdzislaw Gulczynski Analog power amplifier
JPH01169810U (enExample) * 1988-05-19 1989-11-30
US4959623A (en) * 1989-07-19 1990-09-25 At&T Bell Laboratories Low impedance buffer circuit
JPH06331700A (ja) * 1993-05-19 1994-12-02 Hitachi Electron Eng Co Ltd Ｉｃテスターのｇｎｄバッファ回路
US5525931A (en) * 1995-04-25 1996-06-11 National Semiconductor Corporation High-speed video amplifier
US6268770B1 (en) * 1998-07-17 2001-07-31 Anthony T. Barbetta Wide bandwidth, current sharing, MOSFET audio power amplifier with multiple feedback loops
JP2002009566A (ja) * 2000-04-17 2002-01-11 Rohm Co Ltd オーディオ信号増幅回路およびこの増幅回路を用いる携帯型の電話機および携帯型電子機器
JP4170996B2 (ja) 2005-02-10 2008-10-22 株式会社アドバンテスト 電力増幅回路、及び試験装置

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0567932A (ja) * 1990-12-27 1993-03-19 Pioneer Electron Corp 増幅器
JP2003046347A (ja) * 2001-07-31 2003-02-14 Agilent Technologies Japan Ltd 高出力増幅器

Also Published As

Publication number Publication date
US7477104B2 (en) 2009-01-13
KR20070102620A (ko) 2007-10-18
JP4170996B2 (ja) 2008-10-22
JP2006222770A (ja) 2006-08-24
US20080036539A1 (en) 2008-02-14
WO2006085566A1 (ja) 2006-08-17

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