JP4170996B2 - 電力増幅回路、及び試験装置 - Google Patents

電力増幅回路、及び試験装置 Download PDF

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Publication number
JP4170996B2
JP4170996B2 JP2005034686A JP2005034686A JP4170996B2 JP 4170996 B2 JP4170996 B2 JP 4170996B2 JP 2005034686 A JP2005034686 A JP 2005034686A JP 2005034686 A JP2005034686 A JP 2005034686A JP 4170996 B2 JP4170996 B2 JP 4170996B2
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JP
Japan
Prior art keywords
voltage
positive
negative
transistor
output
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP2005034686A
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English (en)
Japanese (ja)
Other versions
JP2006222770A (ja
JP2006222770A5 (enExample
Inventor
悟司 小寺
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advantest Corp
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Priority to JP2005034686A priority Critical patent/JP4170996B2/ja
Priority to PCT/JP2006/302196 priority patent/WO2006085566A1/ja
Priority to KR1020077020730A priority patent/KR101228206B1/ko
Publication of JP2006222770A publication Critical patent/JP2006222770A/ja
Priority to US11/777,296 priority patent/US7477104B2/en
Publication of JP2006222770A5 publication Critical patent/JP2006222770A5/ja
Application granted granted Critical
Publication of JP4170996B2 publication Critical patent/JP4170996B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31924—Voltage or current aspects, e.g. driver, receiver
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
    • H03F3/34—DC amplifiers in which all stages are DC-coupled
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
    • H03F3/30—Single-ended push-pull [SEPP] amplifiers; Phase-splitters therefor
    • H03F3/3001—Single-ended push-pull [SEPP] amplifiers; Phase-splitters therefor with field-effect transistors
    • H03F3/301—CMOS common drain output SEPP amplifiers
    • H03F3/3016—CMOS common drain output SEPP amplifiers with symmetrical driving of the end stage
    • H03F3/3018—CMOS common drain output SEPP amplifiers with symmetrical driving of the end stage using opamps as driving stages
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
    • H03F3/30—Single-ended push-pull [SEPP] amplifiers; Phase-splitters therefor
    • H03F3/3001—Single-ended push-pull [SEPP] amplifiers; Phase-splitters therefor with field-effect transistors
    • H03F3/3022—CMOS common source output SEPP amplifiers

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Amplifiers (AREA)
  • Tests Of Electronic Circuits (AREA)
JP2005034686A 2005-02-10 2005-02-10 電力増幅回路、及び試験装置 Expired - Fee Related JP4170996B2 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2005034686A JP4170996B2 (ja) 2005-02-10 2005-02-10 電力増幅回路、及び試験装置
PCT/JP2006/302196 WO2006085566A1 (ja) 2005-02-10 2006-02-08 電力増幅回路、及び試験装置
KR1020077020730A KR101228206B1 (ko) 2005-02-10 2006-02-08 전력 증폭 회로 및 시험 장치
US11/777,296 US7477104B2 (en) 2005-02-10 2007-07-13 Power amplifier circuit and test apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2005034686A JP4170996B2 (ja) 2005-02-10 2005-02-10 電力増幅回路、及び試験装置

Publications (3)

Publication Number Publication Date
JP2006222770A JP2006222770A (ja) 2006-08-24
JP2006222770A5 JP2006222770A5 (enExample) 2007-08-30
JP4170996B2 true JP4170996B2 (ja) 2008-10-22

Family

ID=36793137

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2005034686A Expired - Fee Related JP4170996B2 (ja) 2005-02-10 2005-02-10 電力増幅回路、及び試験装置

Country Status (4)

Country Link
US (1) US7477104B2 (enExample)
JP (1) JP4170996B2 (enExample)
KR (1) KR101228206B1 (enExample)
WO (1) WO2006085566A1 (enExample)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4170996B2 (ja) 2005-02-10 2008-10-22 株式会社アドバンテスト 電力増幅回路、及び試験装置
KR101095249B1 (ko) 2009-12-04 2011-12-20 삼성전기주식회사 전력 증폭 모듈의 검사 장치
CN102906999B (zh) * 2010-03-02 2016-06-08 帝瓦雷公司 A类推挽放大器
GB2481069B (en) 2010-06-11 2017-06-07 Snaptrack Inc Improved crossover performance of power amplifier
KR101393932B1 (ko) * 2011-12-08 2014-05-12 진옥상 소신호 버퍼증폭회로
GB2500429B (en) * 2012-03-22 2019-02-06 Snaptrack Inc Bias control for push-pull amplifier arrangement
US10048292B1 (en) * 2017-04-28 2018-08-14 Rohde & Schwarz Gmbh & Co. Kg Logic signal analyzer, logic probe as well as oscilloscope

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5210753A (en) 1975-06-24 1977-01-27 Nisso Masutaabirudaazu Kk Liquid material automatic measuring system in a batcher plant
JPS5210753U (enExample) * 1976-06-25 1977-01-25
US4041408A (en) * 1976-11-12 1977-08-09 Rca Corporation Push-pull audio amplifier system with muting
JPH01169810A (ja) 1987-12-25 1989-07-05 Fujikura Ltd 架空送電線
US4866398A (en) * 1988-04-12 1989-09-12 Zdzislaw Gulczynski Analog power amplifier
JPH01169810U (enExample) * 1988-05-19 1989-11-30
US4959623A (en) * 1989-07-19 1990-09-25 At&T Bell Laboratories Low impedance buffer circuit
JPH0567932A (ja) * 1990-12-27 1993-03-19 Pioneer Electron Corp 増幅器
JPH06331700A (ja) * 1993-05-19 1994-12-02 Hitachi Electron Eng Co Ltd Ｉｃテスターのｇｎｄバッファ回路
US5525931A (en) * 1995-04-25 1996-06-11 National Semiconductor Corporation High-speed video amplifier
US6268770B1 (en) * 1998-07-17 2001-07-31 Anthony T. Barbetta Wide bandwidth, current sharing, MOSFET audio power amplifier with multiple feedback loops
JP2002009566A (ja) * 2000-04-17 2002-01-11 Rohm Co Ltd オーディオ信号増幅回路およびこの増幅回路を用いる携帯型の電話機および携帯型電子機器
JP2003046347A (ja) * 2001-07-31 2003-02-14 Agilent Technologies Japan Ltd 高出力増幅器
JP4170996B2 (ja) 2005-02-10 2008-10-22 株式会社アドバンテスト 電力増幅回路、及び試験装置

Also Published As

Publication number Publication date
JP2006222770A (ja) 2006-08-24
KR20070102620A (ko) 2007-10-18
US20080036539A1 (en) 2008-02-14
KR101228206B1 (ko) 2013-01-30
US7477104B2 (en) 2009-01-13
WO2006085566A1 (ja) 2006-08-17

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