KR101205141B1 - 메모리 주변 장치에서의 향상된 에러 검출을 위한 시스템및 방법 - Google Patents

메모리 주변 장치에서의 향상된 에러 검출을 위한 시스템및 방법 Download PDF

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Publication number
KR101205141B1
KR101205141B1 KR1020077015466A KR20077015466A KR101205141B1 KR 101205141 B1 KR101205141 B1 KR 101205141B1 KR 1020077015466 A KR1020077015466 A KR 1020077015466A KR 20077015466 A KR20077015466 A KR 20077015466A KR 101205141 B1 KR101205141 B1 KR 101205141B1
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South Korea
Prior art keywords
memory
error
data
stored
predetermined location
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KR1020077015466A
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English (en)
Korean (ko)
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KR20070093090A (ko
Inventor
찰스 윌리암스 블레빈스
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지이 애비에이션 시스템즈 엘엘씨
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    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/08—Error detection or correction by redundancy in data representation, e.g. by using checking codes
    • G06F11/10—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
    • G06F11/1076—Parity data used in redundant arrays of independent storages, e.g. in RAID systems
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/08—Error detection or correction by redundancy in data representation, e.g. by using checking codes
    • G06F11/10—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
    • G06F11/1008—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices
    • G06F11/1012—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices using codes or arrangements adapted for a specific type of error
    • G06F11/1032—Simple parity
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/08—Error detection or correction by redundancy in data representation, e.g. by using checking codes
    • G06F11/10—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
    • G06F11/1008—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices
    • G06F11/1044—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices with specific ECC/EDC distribution

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  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
  • Static Random-Access Memory (AREA)
  • Detection And Correction Of Errors (AREA)
  • Debugging And Monitoring (AREA)
KR1020077015466A 2004-12-08 2005-12-07 메모리 주변 장치에서의 향상된 에러 검출을 위한 시스템및 방법 Expired - Fee Related KR101205141B1 (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US63443904P 2004-12-08 2004-12-08
US60/634,439 2004-12-08
PCT/US2005/044086 WO2006062959A2 (en) 2004-12-08 2005-12-07 System and method for enhanced error detection in memory peripherals

Publications (2)

Publication Number Publication Date
KR20070093090A KR20070093090A (ko) 2007-09-17
KR101205141B1 true KR101205141B1 (ko) 2012-11-26

Family

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Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020077015466A Expired - Fee Related KR101205141B1 (ko) 2004-12-08 2005-12-07 메모리 주변 장치에서의 향상된 에러 검출을 위한 시스템및 방법

Country Status (7)

Country Link
US (1) US7865804B2 (enExample)
EP (1) EP1825371B1 (enExample)
JP (1) JP5096161B2 (enExample)
KR (1) KR101205141B1 (enExample)
DE (1) DE602005015482D1 (enExample)
IL (2) IL183741A (enExample)
WO (1) WO2006062959A2 (enExample)

Families Citing this family (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4363471B2 (ja) * 2007-08-03 2009-11-11 株式会社デンソー 故障コード記憶管理装置、及び記憶管理装置
JP5059524B2 (ja) * 2007-09-05 2012-10-24 ルネサスエレクトロニクス株式会社 メモリ制御回路、半導体集積回路、不揮発性メモリのベリファイ方法
JP2010128392A (ja) * 2008-11-28 2010-06-10 Canon Inc ハッシュ処理装置及びその方法
KR101062755B1 (ko) 2009-07-29 2011-09-06 주식회사 하이닉스반도체 Ｅｃｃ 회로를 포함하는 반도체 메모리 시스템 및 그 제어 방법
WO2012051039A1 (en) * 2010-10-12 2012-04-19 Rambus Inc. Facilitating error detection and recovery in a memory system
JP5914660B2 (ja) * 2011-08-23 2016-05-11 華為技術有限公司Ｈｕａｗｅｉ Ｔｅｃｈｎｏｌｏｇｉｅｓ Ｃｏ．，Ｌｔｄ． データ信頼性を検出するための方法及び装置
WO2014074390A1 (en) 2012-11-06 2014-05-15 Rambus Inc. Memory repair using external tags
US9442854B2 (en) 2012-11-15 2016-09-13 Elwha Llc Memory circuitry including computational circuitry for performing supplemental functions
US9582465B2 (en) 2012-11-15 2017-02-28 Elwha Llc Flexible processors and flexible memory
US8996951B2 (en) * 2012-11-15 2015-03-31 Elwha, Llc Error correction with non-volatile memory on an integrated circuit
US9026719B2 (en) 2012-11-15 2015-05-05 Elwha, Llc Intelligent monitoring for computation in memory
US9323499B2 (en) 2012-11-15 2016-04-26 Elwha Llc Random number generator functions in memory
US8966310B2 (en) 2012-11-15 2015-02-24 Elwha Llc Redundancy for loss-tolerant data in non-volatile memory
US8925098B2 (en) 2012-11-15 2014-12-30 Elwha Llc Data security and access tracking in memory
WO2014193350A1 (en) * 2013-05-29 2014-12-04 Hewlett-Packard Development Company, L.P. Invoking an error handler to handle an uncorrectable error
US20150169406A1 (en) * 2013-12-16 2015-06-18 Sandisk Technologies Inc. Decoding techniques for a data storage device
US9553608B2 (en) 2013-12-20 2017-01-24 Sandisk Technologies Llc Data storage device decoder and method of operation
CN118692545A (zh) 2021-03-24 2024-09-24 长江存储科技有限责任公司 使用冗余存储体进行故障主存储体修复的存储器件
US11960360B1 (en) * 2022-09-22 2024-04-16 Micron Technology, Inc. Redundancy-based error detection in a memory device

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS53105138A (en) * 1977-02-25 1978-09-13 Hitachi Ltd Memory unit
US5177744A (en) * 1990-09-04 1993-01-05 International Business Machines Corporation Method and apparatus for error recovery in arrays
JPH04290144A (ja) * 1991-03-19 1992-10-14 Hitachi Ltd メモリ拡張方式
JPH0644386A (ja) * 1992-07-24 1994-02-18 Yokogawa Electric Corp データ処理装置及び物理量測定装置
US5619642A (en) * 1994-12-23 1997-04-08 Emc Corporation Fault tolerant memory system which utilizes data from a shadow memory device upon the detection of erroneous data in a main memory device
US5953351A (en) * 1995-09-15 1999-09-14 International Business Machines Corporation Method and apparatus for indicating uncorrectable data errors
SG76501A1 (en) * 1996-02-28 2000-11-21 Sun Microsystems Inc Error detection and correction method and apparatus for computer memory
US6223301B1 (en) * 1997-09-30 2001-04-24 Compaq Computer Corporation Fault tolerant memory
JP2001334057A (ja) * 2000-05-29 2001-12-04 Pfu Ltd 遊技機の管理装置
US6904556B2 (en) * 2001-08-09 2005-06-07 Emc Corporation Systems and methods which utilize parity sets

Also Published As

Publication number Publication date
IL183741A0 (en) 2007-09-20
IL183741A (en) 2012-02-29
EP1825371A2 (en) 2007-08-29
IL183800A0 (en) 2007-09-20
WO2006062959A2 (en) 2006-06-15
DE602005015482D1 (de) 2009-08-27
US20060259848A1 (en) 2006-11-16
US7865804B2 (en) 2011-01-04
JP2008523503A (ja) 2008-07-03
JP5096161B2 (ja) 2012-12-12
WO2006062959A3 (en) 2007-03-15
KR20070093090A (ko) 2007-09-17
EP1825371B1 (en) 2009-07-15

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