KR101157649B1 - 슬러리 이용 증진 홈을 갖는 연마 패드 - Google Patents

슬러리 이용 증진 홈을 갖는 연마 패드 Download PDF

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Publication number
KR101157649B1
KR101157649B1 KR1020040092276A KR20040092276A KR101157649B1 KR 101157649 B1 KR101157649 B1 KR 101157649B1 KR 1020040092276 A KR1020040092276 A KR 1020040092276A KR 20040092276 A KR20040092276 A KR 20040092276A KR 101157649 B1 KR101157649 B1 KR 101157649B1
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KR
South Korea
Prior art keywords
polishing
grooves
slurry
groove
polishing pad
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Expired - Lifetime
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KR1020040092276A
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English (en)
Korean (ko)
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KR20050046599A (ko
Inventor
멀다우니그레고리피.
Original Assignee
롬 앤드 하스 일렉트로닉 머티리얼스 씨엠피 홀딩스 인코포레이티드
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Application filed by 롬 앤드 하스 일렉트로닉 머티리얼스 씨엠피 홀딩스 인코포레이티드 filed Critical 롬 앤드 하스 일렉트로닉 머티리얼스 씨엠피 홀딩스 인코포레이티드
Publication of KR20050046599A publication Critical patent/KR20050046599A/ko
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    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B37/00Lapping machines or devices; Accessories
    • B24B37/11Lapping tools
    • B24B37/20Lapping pads for working plane surfaces
    • B24B37/26Lapping pads for working plane surfaces characterised by the shape of the lapping pad surface, e.g. grooved
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B37/00Lapping machines or devices; Accessories
    • B24B37/04Lapping machines or devices; Accessories designed for working plane surfaces
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B37/00Lapping machines or devices; Accessories
    • B24B37/11Lapping tools
    • B24B37/20Lapping pads for working plane surfaces
    • B24B37/24Lapping pads for working plane surfaces characterised by the composition or properties of the pad materials
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10STECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S451/00Abrading
    • Y10S451/921Pad for lens shaping tool

Landscapes

  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • Mechanical Treatment Of Semiconductor (AREA)
  • Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
  • Grinding-Machine Dressing And Accessory Apparatuses (AREA)
KR1020040092276A 2003-11-13 2004-11-12 슬러리 이용 증진 홈을 갖는 연마 패드 Expired - Lifetime KR101157649B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US10/712,186 US7018274B2 (en) 2003-11-13 2003-11-13 Polishing pad having slurry utilization enhancing grooves
US10/712,186 2003-11-13

Publications (2)

Publication Number Publication Date
KR20050046599A KR20050046599A (ko) 2005-05-18
KR101157649B1 true KR101157649B1 (ko) 2012-06-18

Family

ID=34435661

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020040092276A Expired - Lifetime KR101157649B1 (ko) 2003-11-13 2004-11-12 슬러리 이용 증진 홈을 갖는 연마 패드

Country Status (7)

Country Link
US (1) US7018274B2 (enExample)
EP (1) EP1533075B1 (enExample)
JP (1) JP4689241B2 (enExample)
KR (1) KR101157649B1 (enExample)
CN (1) CN100343958C (enExample)
DE (1) DE602004007597T2 (enExample)
TW (1) TWI339146B (enExample)

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US7377840B2 (en) * 2004-07-21 2008-05-27 Neopad Technologies Corporation Methods for producing in-situ grooves in chemical mechanical planarization (CMP) pads, and novel CMP pad designs
WO2005030439A1 (ja) * 2003-09-26 2005-04-07 Shin-Etsu Handotai Co., Ltd. 研磨布及び研磨布の加工方法並びにそれを用いた基板の製造方法
US6958002B1 (en) * 2004-07-19 2005-10-25 Rohm And Haas Electronic Materials Cmp Holdings, Inc. Polishing pad with flow modifying groove network
KR101334012B1 (ko) * 2005-07-25 2013-12-02 호야 가부시키가이샤 마스크 블랭크용 기판의 제조방법, 마스크 블랭크의제조방법 및 마스크의 제조방법
JP5080769B2 (ja) * 2006-09-15 2012-11-21 株式会社東京精密 研磨方法及び研磨装置
US9180570B2 (en) 2008-03-14 2015-11-10 Nexplanar Corporation Grooved CMP pad
CN102814725B (zh) * 2011-06-08 2015-11-25 无锡华润上华科技有限公司 一种化学机械研磨方法
JP6065208B2 (ja) * 2012-12-25 2017-01-25 富士紡ホールディングス株式会社 研磨パッド及びその製造方法
JP5919592B1 (ja) * 2015-02-23 2016-05-18 防衛装備庁長官 研磨装置
US9770092B2 (en) * 2015-08-20 2017-09-26 Taiwan Semiconductor Manufacturing Co., Ltd. Brush, back surface treatment assembly and method for cleaning substrate
CN105500183B (zh) * 2015-11-26 2018-08-10 上海集成电路研发中心有限公司 一种研磨垫及其使用周期检测方法
SE539716C2 (en) * 2016-06-15 2017-11-07 Valmet Oy Refine plate segment with pre-dam
US10688621B2 (en) * 2016-08-04 2020-06-23 Rohm And Haas Electronic Materials Cmp Holdings, Inc. Low-defect-porous polishing pad
KR102702996B1 (ko) * 2018-12-10 2024-09-04 삼성전자주식회사 연마 균일도를 제어할 수 있는 화학 기계적 연마 장치
GB2582639B (en) * 2019-03-29 2023-10-18 Zeeko Innovations Ltd Shaping apparatus, method and tool
CN113021181B (zh) * 2021-03-22 2023-05-30 万华化学集团电子材料有限公司 一种高去除速率、低划伤化学机械抛光垫及其应用
CN114619362B (zh) * 2022-04-07 2024-04-12 南京理工大学 一种球阀研磨盘装置
CN115922557B (zh) * 2023-03-09 2023-07-25 长鑫存储技术有限公司 一种抛光组件及抛光设备
DE102024109581A1 (de) * 2024-04-05 2025-10-09 Lapmaster Wolters Gmbh Läppscheibe für eine Läppmaschine, Läppmaschine und Verfahren zum Läppen eines Werkstücks mit einer Läppmaschine

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EP0111469A2 (de) * 1982-11-15 1984-06-20 Kurt Hirsch Verfahren und Vorrichtung zum Vorschäumen von Kunststoffen
US6159088A (en) * 1998-02-03 2000-12-12 Sony Corporation Polishing pad, polishing apparatus and polishing method

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US5093651A (en) * 1990-10-11 1992-03-03 Thomas Edward M Intelligent smoke detector
JP3042593B2 (ja) * 1995-10-25 2000-05-15 日本電気株式会社 研磨パッド
US5645469A (en) * 1996-09-06 1997-07-08 Advanced Micro Devices, Inc. Polishing pad with radially extending tapered channels
US6273806B1 (en) * 1997-05-15 2001-08-14 Applied Materials, Inc. Polishing pad having a grooved pattern for use in a chemical mechanical polishing apparatus
US5921855A (en) 1997-05-15 1999-07-13 Applied Materials, Inc. Polishing pad having a grooved pattern for use in a chemical mechanical polishing system
US6093651A (en) 1997-12-23 2000-07-25 Intel Corporation Polish pad with non-uniform groove depth to improve wafer polish rate uniformity
US6139402A (en) * 1997-12-30 2000-10-31 Micron Technology, Inc. Method and apparatus for mechanical and chemical-mechanical planarization of microelectronic substrates
JPH11267961A (ja) * 1998-03-23 1999-10-05 Sony Corp 研磨パッド、研磨装置および研磨方法
JP2000033553A (ja) * 1998-05-11 2000-02-02 Sony Corp 研磨パッドおよび研磨方法
JP2000000755A (ja) * 1998-06-16 2000-01-07 Sony Corp 研磨パッド及び研磨方法
KR20000025003A (ko) * 1998-10-07 2000-05-06 윤종용 반도체 기판의 화학 기계적 연마에 사용되는 연마 패드
US6110832A (en) * 1999-04-28 2000-08-29 International Business Machines Corporation Method and apparatus for slurry polishing
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US6241596B1 (en) * 2000-01-14 2001-06-05 Applied Materials, Inc. Method and apparatus for chemical mechanical polishing using a patterned pad
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KR20030015567A (ko) * 2001-08-16 2003-02-25 에스케이에버텍 주식회사 웨이브 형태의 그루브가 형성된 화학적 기계적 연마패드
US6602123B1 (en) * 2002-09-13 2003-08-05 Infineon Technologies Ag Finishing pad design for multidirectional use

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EP0111469A2 (de) * 1982-11-15 1984-06-20 Kurt Hirsch Verfahren und Vorrichtung zum Vorschäumen von Kunststoffen
US6159088A (en) * 1998-02-03 2000-12-12 Sony Corporation Polishing pad, polishing apparatus and polishing method

Also Published As

Publication number Publication date
DE602004007597T2 (de) 2008-04-17
DE602004007597D1 (de) 2007-08-30
TW200529978A (en) 2005-09-16
JP2005150745A (ja) 2005-06-09
CN1617308A (zh) 2005-05-18
US20050107009A1 (en) 2005-05-19
KR20050046599A (ko) 2005-05-18
JP4689241B2 (ja) 2011-05-25
EP1533075A1 (en) 2005-05-25
US7018274B2 (en) 2006-03-28
EP1533075B1 (en) 2007-07-18
CN100343958C (zh) 2007-10-17
TWI339146B (en) 2011-03-21

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