KR100996266B1 - Ssd 테스트용 지그 - Google Patents
Ssd 테스트용 지그 Download PDFInfo
- Publication number
- KR100996266B1 KR100996266B1 KR1020090015604A KR20090015604A KR100996266B1 KR 100996266 B1 KR100996266 B1 KR 100996266B1 KR 1020090015604 A KR1020090015604 A KR 1020090015604A KR 20090015604 A KR20090015604 A KR 20090015604A KR 100996266 B1 KR100996266 B1 KR 100996266B1
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- South Korea
- Prior art keywords
- ssd
- extension
- socket
- connector
- pair
- Prior art date
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- 238000012360 testing method Methods 0.000 title claims abstract description 37
- 239000007787 solid Substances 0.000 title description 3
- 238000004891 communication Methods 0.000 claims abstract description 4
- 230000000712 assembly Effects 0.000 claims abstract description 3
- 238000000429 assembly Methods 0.000 claims abstract description 3
- 238000000034 method Methods 0.000 claims 3
- 230000008878 coupling Effects 0.000 description 9
- 238000010168 coupling process Methods 0.000 description 9
- 238000005859 coupling reaction Methods 0.000 description 9
- 230000015654 memory Effects 0.000 description 7
- 238000007689 inspection Methods 0.000 description 4
- 238000010521 absorption reaction Methods 0.000 description 2
- 239000000470 constituent Substances 0.000 description 2
- 230000005856 abnormality Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000035939 shock Effects 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0433—Sockets for IC's or transistors
- G01R1/0441—Details
- G01R1/0466—Details concerning contact pieces or mechanical details, e.g. hinges or cams; Shielding
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2855—Environmental, reliability or burn-in testing
- G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
- G01R31/2863—Contacting devices, e.g. sockets, burn-in boards or mounting fixtures
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2884—Testing of integrated circuits [IC] using dedicated test connectors, test elements or test circuits on the IC under test
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/31725—Timing aspects, e.g. clock distribution, skew, propagation delay
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- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- General Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Environmental & Geological Engineering (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Details Of Connecting Devices For Male And Female Coupling (AREA)
Abstract
Description
Claims (4)
- SSD의 접속단자가 접속되는 SSD커넥터가 상방돌출된 소켓; 중앙부에 소켓장착홀이 형성되어, 상기 소켓이 장착되는 하우징; 및 상기 SSD의 접속단자가 상기 SSD커넥터에 접속 시 상기 SSD의 양측을 각각 가이드하고, 상기 SSD의 이젝팅 시 상기 SSD에 상방배출력을 제공하는 한 쌍의 블록조립체;를 포함하는 SSD 테스트용 지그에 있어서,상기 하우징은, 양측 상면에 각각 형성된 홈부;를 포함하여 구성되고,상기 블록조립체는, 상기 하우징의 양측 상면에 장착되되, 상기 홈부와 연통되어 하면 내부로 형성된 잔공부, 상기 잔공부와 연통되어 상방으로 연장형성된 한 쌍의 연장홀이 구비된 가이드블록; 상기 홈부 및 잔공부 상에서 상하슬라이딩 가능하게 설치되되, 양측면에 연장편이 형성되고, 상기 SSD의 코너부가 안착되는 안착홈이 형성된 슬라이더; 및 상기 각 연장홀에 삽입되어 상하슬라이딩 가능한 한 쌍의 작동링크, 일단부가 상기 각 작동링크의 하단에 힌지연결되고 타단부가 상기 슬라이더의 연장편의 하면에 각각 당접되며 중심부를 기준으로 1축회전가능하게 설치되는 한 쌍의 레버링크를 포함하는 이젝팅모듈;을 포함하는 것을 특징으로 하는 SSD 테스트용 지그.
- 제1항에 있어서,상기 작동링크는 하단부가 상기 레버링크의 일단부와 힌지결합되는 연장바 및 상기 연장바의 상단부를 감싸도록 결합되어 상기 연장바의 측면과 제1단차부를 형성하는 바헤드를 포함하여 구성되고, 상기 연장홀의 내부에는 제2단차부가 형성되며, 상기 제1단차부와 상기 제2단차부의 사이에 상기 작동링크의 상방복원력을 제공하는 탄성스프링;이 개재된 것을 특징으로 하는 SSD 테스트용 지그.
- 제2항에 있어서,상기 연장바에는 장방홈이 형성되고, 상기 연장홀에는 상기 연장바의 상방이동량을 제한하는 제1정렬핀 및 상기 연장바의 하방이동량을 제한하는 제2정렬핀이 상기 장방홈을 관통하여 고정설치된 것을 특징으로 하는 SSD 테스트용 지그.
- 제1항에 있어서,상기 소켓의 하면에는, 상기 소켓의 하면 내부로 형성된 커넥터홈, 상기 커넥터홈의 저면에서 외측으로 돌출형성된 숫돌출부, 상기 숫돌출부의 일측면에 상기 SSD커넥터와 전기적으로 연결되도록 마련된 접촉부, 상기 숫돌출부의 타측면에 마련된 다수의 록킹홈을 포함하여 구성된 범용커넥터;가 구비된 것을 특징으로 하는 SSD 테스트용 지그.
Priority Applications (1)
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KR1020090015604A KR100996266B1 (ko) | 2009-02-25 | 2009-02-25 | Ssd 테스트용 지그 |
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KR1020090015604A KR100996266B1 (ko) | 2009-02-25 | 2009-02-25 | Ssd 테스트용 지그 |
Publications (2)
Publication Number | Publication Date |
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KR20100096629A KR20100096629A (ko) | 2010-09-02 |
KR100996266B1 true KR100996266B1 (ko) | 2010-11-23 |
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KR1020090015604A KR100996266B1 (ko) | 2009-02-25 | 2009-02-25 | Ssd 테스트용 지그 |
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Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103675491B (zh) * | 2012-09-07 | 2016-05-18 | 神讯电脑(昆山)有限公司 | 电子元器件调试器 |
KR101490499B1 (ko) * | 2013-08-27 | 2015-02-06 | 주식회사 아이에스시 | Ssd용 테스트 소켓 |
KR101987912B1 (ko) * | 2018-07-30 | 2019-06-12 | 주식회사 마이크로컨텍솔루션 | 더미 젠더 |
KR102091155B1 (ko) * | 2018-10-25 | 2020-03-19 | 주식회사 마이크로컨텍솔루션 | 젠더 장치 |
KR102187265B1 (ko) * | 2019-09-06 | 2020-12-04 | (주)마이크로컨텍솔루션 | 반도체 칩 테스트 소켓 |
CN114360589B (zh) * | 2021-12-10 | 2024-07-23 | 武汉一阁工坊文化科技有限公司 | 一种微信小程序数据储存系统 |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2003203715A (ja) | 2001-12-06 | 2003-07-18 | Hon Hai Precision Industry Co Ltd | 電気コネクタ |
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Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
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JP2003203715A (ja) | 2001-12-06 | 2003-07-18 | Hon Hai Precision Industry Co Ltd | 電気コネクタ |
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