KR100989316B1 - 플라즈마-강화 화학 증착장치 - Google Patents
플라즈마-강화 화학 증착장치 Download PDFInfo
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- KR100989316B1 KR100989316B1 KR1020100060435A KR20100060435A KR100989316B1 KR 100989316 B1 KR100989316 B1 KR 100989316B1 KR 1020100060435 A KR1020100060435 A KR 1020100060435A KR 20100060435 A KR20100060435 A KR 20100060435A KR 100989316 B1 KR100989316 B1 KR 100989316B1
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- plasma
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- heat dissipation
- chemical vapor
- vapor deposition
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- 238000000623 plasma-assisted chemical vapour deposition Methods 0.000 title claims abstract description 24
- 238000004140 cleaning Methods 0.000 claims abstract description 27
- 229910000859 α-Fe Inorganic materials 0.000 claims abstract description 10
- 238000001816 cooling Methods 0.000 claims abstract description 9
- 238000000151 deposition Methods 0.000 claims description 47
- 230000008021 deposition Effects 0.000 claims description 45
- 230000017525 heat dissipation Effects 0.000 claims description 27
- 239000002243 precursor Substances 0.000 claims description 12
- 239000000758 substrate Substances 0.000 claims description 12
- 239000000463 material Substances 0.000 claims description 11
- 238000000034 method Methods 0.000 claims description 8
- 238000005229 chemical vapour deposition Methods 0.000 claims description 4
- 239000000498 cooling water Substances 0.000 claims description 4
- 238000005192 partition Methods 0.000 claims description 4
- 230000008439 repair process Effects 0.000 abstract description 8
- 150000003071 polychlorinated biphenyls Chemical class 0.000 abstract 1
- 239000007789 gas Substances 0.000 description 46
- 230000008569 process Effects 0.000 description 5
- 230000003213 activating effect Effects 0.000 description 4
- 230000007246 mechanism Effects 0.000 description 4
- 230000004888 barrier function Effects 0.000 description 3
- 239000012495 reaction gas Substances 0.000 description 3
- 238000005137 deposition process Methods 0.000 description 2
- 238000005240 physical vapour deposition Methods 0.000 description 2
- 238000007740 vapor deposition Methods 0.000 description 2
- 230000004913 activation Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
- 238000013024 troubleshooting Methods 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/4401—Means for minimising impurities, e.g. dust, moisture or residual gas, in the reaction chamber
- C23C16/4405—Cleaning of reactor or parts inside the reactor by using reactive gases
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/50—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges
- C23C16/505—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges using radio frequency discharges
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02107—Forming insulating materials on a substrate
- H01L21/02225—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer
- H01L21/0226—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a deposition process
- H01L21/02263—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a deposition process deposition from the gas or vapour phase
- H01L21/02271—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a deposition process deposition from the gas or vapour phase deposition by decomposition or reaction of gaseous or vapour phase compounds, i.e. chemical vapour deposition
- H01L21/02274—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a deposition process deposition from the gas or vapour phase deposition by decomposition or reaction of gaseous or vapour phase compounds, i.e. chemical vapour deposition in the presence of a plasma [PECVD]
-
- H01L21/205—
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67155—Apparatus for manufacturing or treating in a plurality of work-stations
- H01L21/67207—Apparatus for manufacturing or treating in a plurality of work-stations comprising a chamber adapted to a particular process
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- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Physics & Mathematics (AREA)
- Metallurgy (AREA)
- General Chemical & Material Sciences (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Organic Chemistry (AREA)
- Plasma & Fusion (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Chemical Vapour Deposition (AREA)
Abstract
Description
도 2는 종래에 따른 원격 플라즈마 소스 세정부의 사시도.
도 3은 종래에 따른 원격 플라즈마 소스 세정부의 분해 사시도.
도 4는 종래에 따른 원격 플라즈마 소스 세정부의 평면도.
도 5는 본 발명에 따른 원격 플라즈마 소스 세정부를 개략적으로 나타낸 사시도.
도 6은 본 발명에 따른 원격 플라즈마 소스 세정부의 컨트롤부에 대한 제1실시예를 나타낸 평면도.
도 7은 본 발명에 따른 원격 플라즈마 소스 세정부의 컨트롤부에 대한 제1실시예를 나타낸 정면도.
도 8은 본 발명에 따른 원격 플라즈마 소스 세정부의 컨트롤부에 대한 제2실시예를 나타낸 평면도.
211:챔버본체 211a: 가스 유입구
211b: 가스 배출구 212: 페라이트 코어
213: 냉각판 214: 메인 컨트롤 보드
220: 파워유닛 221: 인쇄회로기판
221a: 퓨즈 보드 221b: 부스터 보드
221c: 파워 보드 221d: 릴레이 보드
222: 전력소자 223: 방열수단
223a: 방열판 223b: 방열팬
223c: 수냉 방열판 223c-1: 입구
223c-2: 출구 224: 격벽
225: 중앙부 226: 우측부
227: 좌측부
Claims (4)
- 진공으로 이루어지고, 가스의 공급에 의해 내부에 설치된 기판에 가스를 증착되도록 하는 증착챔버와,
전구체 가스원으로부터 공급된 가스를 활성화시켜 상기 증착챔버 내부로 공급시켜 상기 증착챔버의 내부 표면으로부터 증착된 재료를 제거하도록 상기 증착 챔버의 외부 및 일정 거리에 위치되어진 원격 플라즈마 소스 세정부를 포함하는 플라즈마-강화 화학 증착장치에 있어서,
상기 원격 플라즈마 소스 세정부는,
가스 유입구와 가스 배출구가 형성되고, 가스가 유입되어 플라즈마가 형성되는 챔버본체, 상기 챔버본체의 외측에 형성되어 발생된 플라즈마를 유지시키는 페라이트 코어, 상기 챔버본체의 외측에 배치되고, 챔버본체 내부의 열을 방열시키는 냉각판을 포함하는 본체;
상기 본체에 일정간격 이격됨과 아울러 복수의 인쇄회로 기판이 전기적으로 연결되고, 상기 페라이트 코어에 무선 주파수(RF)를 공급하기 위한 전력소자가 설치되며, 상기 전력소자를 방열시키는 방열수단을 포함하는 파워유닛;
로 이루어진 것을 특징으로 하는 플라즈마-강화 화학 증착장치. - 제 1항에 있어서,
상기 파워유닛은 적어도 하나 이상의 격벽으로 구분되고, 구획된 부위에 설치된 인쇄회로 기판에 설치된 전력소자를 독립적으로 방열되도록 하는 것을 특징으로 하는 플라즈마-강화 화학 증착장치. - 제 1항에 있어서,
상기 방열수단은, 방열핀이 복수개 형성되고, 표면에 전력소자가 접면되어진 방열판과, 상기 방열판에서 방열된 열을 외부로 배출하도록 하는 방열팬으로 구성되어진 것을 특징으로 하는 플라즈마-강화 화학 증착장치. - 제 1항에 있어서,
상기 방열수단은, 내부로 냉각수가 순환되도록 하고, 표면에 전력소자가 접면되도록 하는 수냉 방열판으로 이루어진 것을 특징으로 하는 플라즈마-강화 화학 증착장치.
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Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
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CN117673335A (zh) * | 2024-01-31 | 2024-03-08 | 贝特瑞新材料集团股份有限公司 | 负极材料及其制备方法、锂离子电池 |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2005142568A (ja) | 2003-11-04 | 2005-06-02 | Samsung Electronics Co Ltd | ヘリカル共振器型のプラズマ処理装置 |
KR20070091829A (ko) * | 2006-03-07 | 2007-09-12 | 잘만테크 주식회사 | 전원공급장치 |
JP2008218431A (ja) | 1997-06-26 | 2008-09-18 | Mks Instruments Inc | トロイダル・プラズマ・チャンバ |
KR20080111334A (ko) * | 2007-06-18 | 2008-12-23 | 권태균 | 화학기상증착장비 |
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2010
- 2010-06-25 KR KR1020100060435A patent/KR100989316B1/ko active IP Right Grant
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2008218431A (ja) | 1997-06-26 | 2008-09-18 | Mks Instruments Inc | トロイダル・プラズマ・チャンバ |
JP2005142568A (ja) | 2003-11-04 | 2005-06-02 | Samsung Electronics Co Ltd | ヘリカル共振器型のプラズマ処理装置 |
KR20070091829A (ko) * | 2006-03-07 | 2007-09-12 | 잘만테크 주식회사 | 전원공급장치 |
KR20080111334A (ko) * | 2007-06-18 | 2008-12-23 | 권태균 | 화학기상증착장비 |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN117673335A (zh) * | 2024-01-31 | 2024-03-08 | 贝特瑞新材料集团股份有限公司 | 负极材料及其制备方法、锂离子电池 |
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