KR100986021B1 - 박막형 태양전지 및 이의 제조방법 - Google Patents
박막형 태양전지 및 이의 제조방법 Download PDFInfo
- Publication number
- KR100986021B1 KR100986021B1 KR1020080125599A KR20080125599A KR100986021B1 KR 100986021 B1 KR100986021 B1 KR 100986021B1 KR 1020080125599 A KR1020080125599 A KR 1020080125599A KR 20080125599 A KR20080125599 A KR 20080125599A KR 100986021 B1 KR100986021 B1 KR 100986021B1
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- South Korea
- Prior art keywords
- solar cell
- substrate
- thin film
- semiconductor layer
- film solar
- Prior art date
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- 239000010409 thin film Substances 0.000 title claims abstract description 34
- 238000004519 manufacturing process Methods 0.000 title claims abstract description 13
- 239000000758 substrate Substances 0.000 claims abstract description 68
- 239000004065 semiconductor Substances 0.000 claims abstract description 58
- 238000002834 transmittance Methods 0.000 claims abstract description 19
- 239000011521 glass Substances 0.000 description 24
- 238000000034 method Methods 0.000 description 21
- 229910052709 silver Inorganic materials 0.000 description 17
- 229910006404 SnO 2 Inorganic materials 0.000 description 14
- 239000000463 material Substances 0.000 description 6
- 239000004020 conductor Substances 0.000 description 5
- 229910052751 metal Inorganic materials 0.000 description 5
- 239000002184 metal Substances 0.000 description 5
- 238000004544 sputter deposition Methods 0.000 description 5
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 4
- 229910052782 aluminium Inorganic materials 0.000 description 4
- 230000000052 comparative effect Effects 0.000 description 4
- 230000001965 increasing effect Effects 0.000 description 4
- 239000013077 target material Substances 0.000 description 4
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 3
- 238000005229 chemical vapour deposition Methods 0.000 description 3
- 230000005684 electric field Effects 0.000 description 3
- 238000005530 etching Methods 0.000 description 3
- 238000012545 processing Methods 0.000 description 3
- 238000005488 sandblasting Methods 0.000 description 3
- 229910052710 silicon Inorganic materials 0.000 description 3
- 239000010703 silicon Substances 0.000 description 3
- 229910021417 amorphous silicon Inorganic materials 0.000 description 2
- 238000007646 gravure printing Methods 0.000 description 2
- AMGQUBHHOARCQH-UHFFFAOYSA-N indium;oxotin Chemical compound [In].[Sn]=O AMGQUBHHOARCQH-UHFFFAOYSA-N 0.000 description 2
- 238000007641 inkjet printing Methods 0.000 description 2
- 229910052750 molybdenum Inorganic materials 0.000 description 2
- 238000000623 plasma-assisted chemical vapour deposition Methods 0.000 description 2
- 239000004576 sand Substances 0.000 description 2
- 238000007650 screen-printing Methods 0.000 description 2
- 238000001039 wet etching Methods 0.000 description 2
- 229910052725 zinc Inorganic materials 0.000 description 2
- 238000010521 absorption reaction Methods 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 238000001312 dry etching Methods 0.000 description 1
- 230000002708 enhancing effect Effects 0.000 description 1
- 239000004744 fabric Substances 0.000 description 1
- 239000005357 flat glass Substances 0.000 description 1
- 230000001788 irregular Effects 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 229910052759 nickel Inorganic materials 0.000 description 1
- 238000000206 photolithography Methods 0.000 description 1
- 239000000377 silicon dioxide Substances 0.000 description 1
- 239000005361 soda-lime glass Substances 0.000 description 1
- 239000007921 spray Substances 0.000 description 1
- 238000007655 standard test method Methods 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/02—Details
- H01L31/0236—Special surface textures
- H01L31/02366—Special surface textures of the substrate or of a layer on the substrate, e.g. textured ITO/glass substrate or superstrate, textured polymer layer on glass substrate
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/0248—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies
- H01L31/036—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by their crystalline structure or particular orientation of the crystalline planes
- H01L31/0376—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by their crystalline structure or particular orientation of the crystalline planes including amorphous semiconductors
- H01L31/03762—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by their crystalline structure or particular orientation of the crystalline planes including amorphous semiconductors including only elements of Group IV of the Periodic System
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/04—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices
- H01L31/06—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices characterised by at least one potential-jump barrier or surface barrier
- H01L31/075—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices characterised by at least one potential-jump barrier or surface barrier the potential barriers being only of the PIN type
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
- Y02E10/548—Amorphous silicon PV cells
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- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Electromagnetism (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Photovoltaic Devices (AREA)
Abstract
Description
패턴 폭 (㎛) |
패턴 높이 (㎛) |
투과율 (T, %) |
헤이즈 특성 (%) |
||
비교예 1 | 패턴화하지 않은 유리 기판 + SnO2:F | 0 | 0 | 80.9 | 3.1 |
비교예 2 | 패턴화된 유리 기판 1 + SnO2:F | 200 | 3 | 81.3 | 5.1 |
실시예 1 | 패턴화된 유리 기판 2 + SnO2:F | 200 | 4 | 84.3 | 32.1 |
실시예 2 | 패턴화된 유리 기판 3 + SnO2:F | 200 | 6 | 88.9 | 47.8 |
실시예 3 | 패턴화된 유리 기판 4 + SnO2:F | 200 | 8 | 89.2 | 52.6 |
실시예 4 | 패턴화된 유리 기판 5 + SnO2:F | 200 | 10 | 90.3 | 72.7 |
실시예 5 | 패턴화된 유리 기판 6 + SnO2:F | 200 | 12 | 90.1 | 74.2 |
실시예 6 | 패턴화된 유리 기판 7 + SnO2:F | 200 | 15 | 87.3 | 74.4 |
비교예 3 | 패턴화된 유리 기판 8 + SnO2:F | 200 | 50 | 74.1 | 72.0 |
Claims (3)
- 기판 상에 전면전극, 비정질 반도체층 및 후면전극이 형성되어 이루어진 박막형 태양전지에 있어서, 기판 표면에 200㎛의 폭과 4~15㎛의 높이를 갖는 오목한 모양의 패턴을 형성하며, 입사한 태양광의 투과율이 84~95%이고, 헤이즈율이 30~75%인 것을 특징으로 하는 박막형 태양전지.
- 삭제
- 1) 기판(100)의 한쪽 표면에 200㎛의 폭과 4~15㎛의 높이를 갖는 오목한 모양의 패턴을 형성하는 단계,2) 기판(100)의 패턴화되지 않은 다른쪽 표면에 전면전극(200)을 형성하는 단계,3) 상기 전면전극(200) 상에 비정질 반도체층(300)을 형성하는 단계,4) 상기 비정질 반도체층(300) 상에 투명도전층(400)을 형성하는 단계, 및5) 상기 투명도전층(400) 상에 후면전극(500)을 형성하는 단계를 포함하는, 제 1항의 박막형 태양전지의 제조방법.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020080125599A KR100986021B1 (ko) | 2008-12-11 | 2008-12-11 | 박막형 태양전지 및 이의 제조방법 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020080125599A KR100986021B1 (ko) | 2008-12-11 | 2008-12-11 | 박막형 태양전지 및 이의 제조방법 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20100067157A KR20100067157A (ko) | 2010-06-21 |
KR100986021B1 true KR100986021B1 (ko) | 2010-10-06 |
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KR1020080125599A KR100986021B1 (ko) | 2008-12-11 | 2008-12-11 | 박막형 태양전지 및 이의 제조방법 |
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Families Citing this family (1)
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CN104769726B (zh) * | 2012-09-05 | 2018-10-09 | 兹尼亚泰克有限公司 | 具有三维表面特征的光伏设备及制造该光伏设备的方法 |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0410351U (ko) * | 1990-05-16 | 1992-01-29 | ||
JP2003229584A (ja) * | 2002-01-31 | 2003-08-15 | Nippon Sheet Glass Co Ltd | 光電変換装置用ガラス基板およびそれを用いた光電変換装置 |
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- 2008-12-11 KR KR1020080125599A patent/KR100986021B1/ko active IP Right Grant
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0410351U (ko) * | 1990-05-16 | 1992-01-29 | ||
JP2003229584A (ja) * | 2002-01-31 | 2003-08-15 | Nippon Sheet Glass Co Ltd | 光電変換装置用ガラス基板およびそれを用いた光電変換装置 |
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KR20100067157A (ko) | 2010-06-21 |
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