KR100972251B1 - 중합체 ptc 서미스터 및 온도 센서 - Google Patents
중합체 ptc 서미스터 및 온도 센서 Download PDFInfo
- Publication number
- KR100972251B1 KR100972251B1 KR1020047007345A KR20047007345A KR100972251B1 KR 100972251 B1 KR100972251 B1 KR 100972251B1 KR 1020047007345 A KR1020047007345 A KR 1020047007345A KR 20047007345 A KR20047007345 A KR 20047007345A KR 100972251 B1 KR100972251 B1 KR 100972251B1
- Authority
- KR
- South Korea
- Prior art keywords
- conductive polymer
- electrode
- polymer
- electrode member
- ptc thermistor
- Prior art date
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
- G01K7/16—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements
- G01K7/22—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements the element being a non-linear resistance, e.g. thermistor
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01C—RESISTORS
- H01C7/00—Non-adjustable resistors formed as one or more layers or coatings; Non-adjustable resistors made from powdered conducting material or powdered semi-conducting material with or without insulating material
- H01C7/02—Non-adjustable resistors formed as one or more layers or coatings; Non-adjustable resistors made from powdered conducting material or powdered semi-conducting material with or without insulating material having positive temperature coefficient
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01C—RESISTORS
- H01C1/00—Details
- H01C1/14—Terminals or tapping points or electrodes specially adapted for resistors; Arrangements of terminals or tapping points or electrodes on resistors
- H01C1/1406—Terminals or electrodes formed on resistive elements having positive temperature coefficient
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- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Nonlinear Science (AREA)
- General Physics & Mathematics (AREA)
- Ceramic Engineering (AREA)
- Electromagnetism (AREA)
- Thermistors And Varistors (AREA)
- Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
Abstract
Description
Claims (4)
- PTC 특성을 가지며, 두 측면과 두 단부를 구비한 판으로 형성된 도전성 중합체와,상기 도전성 중합체에 접합된 제1 전극을 포함하고,상기 제1 전극은 상기 판의 제1 측면을 따라 배치되고, 상기 제1 측면의 모서리로부터 이격되며, 상기 판의 제1 단부를 둘러싸며, 상기 판의 제2 측면상에 배치되며,수지막은 상기 제1 전극을 둘러싸기 위해 상기 제1 측면을 피복하는, 중합체 PTC 서미스터.
- 삭제
- PTC 특성을 가지며, 두 측면과 두 단부를 구비한 판으로 형성된 도전성 중합체와,상기 판의 제1 측면상에 상기 도전성 중합체와 접합된 제1 및 제2 전극과,상기 제1 및 제2 전극을 둘러싸기 위해 상기 제1 측면을 피복하는 수지막을 포함하며,각각의 상기 제1 및 제2 전극은 상기 제1 측면의 모서리로부터 이격되며,상기 제1 전극은 상기 판의 제1 단부를 둘러싸고 상기 판의 제2 측면상에 배치되며,상기 제2 전극은 상기 제1 전극으로부터 이격되며, 상기 판의 제2 단부를 둘러싸고, 상기 판의 제2 측면상에 배치되는, 중합체 PTC 서미스터.
- 삭제
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2001350737A JP3857571B2 (ja) | 2001-11-15 | 2001-11-15 | ポリマーptcサーミスタおよび温度センサ |
JPJP-P-2001-00350737 | 2001-11-15 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20050044463A KR20050044463A (ko) | 2005-05-12 |
KR100972251B1 true KR100972251B1 (ko) | 2010-07-23 |
Family
ID=19163175
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020047007345A KR100972251B1 (ko) | 2001-11-15 | 2002-11-14 | 중합체 ptc 서미스터 및 온도 센서 |
Country Status (8)
Country | Link |
---|---|
US (1) | US20050062581A1 (ko) |
EP (1) | EP1492131B1 (ko) |
JP (1) | JP3857571B2 (ko) |
KR (1) | KR100972251B1 (ko) |
CN (1) | CN1613123A (ko) |
AT (1) | ATE549724T1 (ko) |
TW (1) | TW200305892A (ko) |
WO (1) | WO2003043032A1 (ko) |
Families Citing this family (28)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100495133B1 (ko) * | 2002-11-28 | 2005-06-14 | 엘에스전선 주식회사 | 피티씨 서미스터 |
KR100694383B1 (ko) * | 2003-09-17 | 2007-03-12 | 엘에스전선 주식회사 | 표면 실장형 서미스터 |
US7119655B2 (en) * | 2004-11-29 | 2006-10-10 | Therm-O-Disc, Incorporated | PTC circuit protector having parallel areas of effective resistance |
KR100685088B1 (ko) * | 2005-01-27 | 2007-02-22 | 엘에스전선 주식회사 | 복층 구조를 갖는 표면 실장형 서미스터 및 그의 제조방법 |
US7853669B2 (en) | 2007-05-04 | 2010-12-14 | Microsoft Corporation | Mesh-managing data across a distributed set of devices |
CN101335125B (zh) * | 2007-06-26 | 2011-06-08 | 上海神沃电子有限公司 | 一种表面贴装型过流过温保护元件及其制造方法 |
US7715164B2 (en) * | 2007-11-20 | 2010-05-11 | Inpaq Technology Co., Ltd. | Embedded type multifunctional integrated structure and method for manufacturing the same |
US8288902B2 (en) | 2007-12-14 | 2012-10-16 | Asmo Co., Ltd. | Thermistor device preventing deformation of thermistor element, and preventing first conductive plate from directly conducted to second conductive plate |
US9753712B2 (en) * | 2008-03-20 | 2017-09-05 | Microsoft Technology Licensing, Llc | Application management within deployable object hierarchy |
US8484174B2 (en) * | 2008-03-20 | 2013-07-09 | Microsoft Corporation | Computing environment representation |
US8572033B2 (en) | 2008-03-20 | 2013-10-29 | Microsoft Corporation | Computing environment configuration |
US9298747B2 (en) | 2008-03-20 | 2016-03-29 | Microsoft Technology Licensing, Llc | Deployable, consistent, and extensible computing environment platform |
US20090248737A1 (en) * | 2008-03-27 | 2009-10-01 | Microsoft Corporation | Computing environment representation |
WO2012001465A1 (en) * | 2010-06-29 | 2012-01-05 | Indian Institute Of Technology Kanpur | Flexible temperature sensor and sensor array |
US9413158B2 (en) * | 2011-05-02 | 2016-08-09 | Littelfuse Japan G.K. | PTC device |
CN102592762A (zh) * | 2012-03-14 | 2012-07-18 | 福州市台江区振斌高效电磁聚能科技研究所 | 正温传感电阻 |
WO2014195631A1 (fr) * | 2013-06-04 | 2014-12-11 | Commissariat A L'energie Atomique Et Aux Energies Alternatives | Capteur de temperature a pate thermosensible |
FR3006439B1 (fr) * | 2013-06-04 | 2016-04-29 | Commissariat Energie Atomique | Capteur de temperature a pate thermosensible |
FR3006440B1 (fr) * | 2013-06-04 | 2015-07-17 | Commissariat Energie Atomique | Capteur de temperature a seuil de detection ajustable |
DE102015223951B4 (de) * | 2015-12-01 | 2022-12-01 | TE Connectivity Sensors Germany GmbH | Substrat für eine Sensoranordnung für ein Widerstandsthermometer, Sensoranordnung und Widerstandsthermometer |
DE102015223950A1 (de) * | 2015-12-01 | 2017-06-01 | TE Connectivity Sensors Germany GmbH | Substrat für eine Sensoranordnung für ein Widerstandsthermometer, Sensoranordnung, Widerstandsthermometer und Verfahren zur Herstellung eines solchen Substrats |
CN106679844A (zh) * | 2017-01-19 | 2017-05-17 | 上海长园维安电子线路保护有限公司 | 高分子ptc温度传感器 |
US20190027796A1 (en) * | 2017-07-20 | 2019-01-24 | Littelfuse, Inc. | Interdigitated 2-d positive temperature coefficient device |
EP3584808B1 (en) * | 2018-06-18 | 2021-10-06 | Mahle International GmbH | Ptc heating module for heating a fluid |
EP3585134B1 (en) * | 2018-06-18 | 2022-08-03 | Mahle International GmbH | Ptc heating module |
TWI676187B (zh) * | 2019-02-22 | 2019-11-01 | 聚鼎科技股份有限公司 | 過電流保護元件 |
DE102019217453A1 (de) * | 2019-11-12 | 2021-05-12 | Eberspächer Catem Gmbh & Co. Kg | PTC-Heizzelle |
KR102473758B1 (ko) | 2020-05-09 | 2022-12-06 | 제이에이취엔지니어링주식회사 | 재사용이 가능한 극저온 온도센서를 이용한 시스템 |
Citations (2)
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JP2000311801A (ja) * | 1999-04-27 | 2000-11-07 | Murata Mfg Co Ltd | チップ型有機質サーミスタおよびその製造方法 |
JP2001052901A (ja) * | 1999-08-05 | 2001-02-23 | Tdk Corp | チップ型有機質正特性サーミスタとその製造方法 |
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JPH05234706A (ja) * | 1992-02-25 | 1993-09-10 | Rohm Co Ltd | 面実装用サーミスタ |
US5793276A (en) * | 1995-07-25 | 1998-08-11 | Tdk Corporation | Organic PTC thermistor |
EP0955643B1 (en) * | 1996-12-26 | 2005-10-05 | Matsushita Electric Industrial Co., Ltd | Ptc thermistor and method for manufacturing the same |
US6782604B2 (en) | 1997-07-07 | 2004-08-31 | Matsushita Electric Industrial Co., Ltd. | Method of manufacturing a chip PTC thermistor |
JP2000082603A (ja) * | 1998-07-08 | 2000-03-21 | Murata Mfg Co Ltd | チップ型サ―ミスタおよびその製造方法 |
JP2000124003A (ja) * | 1998-10-13 | 2000-04-28 | Matsushita Electric Ind Co Ltd | チップ形ptcサーミスタおよびその製造方法 |
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2001
- 2001-11-15 JP JP2001350737A patent/JP3857571B2/ja not_active Expired - Lifetime
-
2002
- 2002-11-14 CN CNA028269853A patent/CN1613123A/zh active Pending
- 2002-11-14 EP EP02803119A patent/EP1492131B1/en not_active Expired - Lifetime
- 2002-11-14 KR KR1020047007345A patent/KR100972251B1/ko active IP Right Grant
- 2002-11-14 AT AT02803119T patent/ATE549724T1/de active
- 2002-11-14 WO PCT/JP2002/011889 patent/WO2003043032A1/ja active Application Filing
- 2002-11-14 US US10/495,598 patent/US20050062581A1/en not_active Abandoned
- 2002-11-14 TW TW091133322A patent/TW200305892A/zh unknown
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2000311801A (ja) * | 1999-04-27 | 2000-11-07 | Murata Mfg Co Ltd | チップ型有機質サーミスタおよびその製造方法 |
JP2001052901A (ja) * | 1999-08-05 | 2001-02-23 | Tdk Corp | チップ型有機質正特性サーミスタとその製造方法 |
Also Published As
Publication number | Publication date |
---|---|
CN1613123A (zh) | 2005-05-04 |
EP1492131B1 (en) | 2012-03-14 |
KR20050044463A (ko) | 2005-05-12 |
TW200305892A (en) | 2003-11-01 |
ATE549724T1 (de) | 2012-03-15 |
JP2003151806A (ja) | 2003-05-23 |
EP1492131A4 (en) | 2005-01-05 |
US20050062581A1 (en) | 2005-03-24 |
JP3857571B2 (ja) | 2006-12-13 |
WO2003043032A1 (fr) | 2003-05-22 |
EP1492131A1 (en) | 2004-12-29 |
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