KR100966010B1 - 하나 이상의 중복 테스트 제거 및 하나 이상의 비효율적테스트 재배열 방법 - Google Patents

하나 이상의 중복 테스트 제거 및 하나 이상의 비효율적테스트 재배열 방법 Download PDF

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KR100966010B1
KR100966010B1 KR1020030002469A KR20030002469A KR100966010B1 KR 100966010 B1 KR100966010 B1 KR 100966010B1 KR 1020030002469 A KR1020030002469 A KR 1020030002469A KR 20030002469 A KR20030002469 A KR 20030002469A KR 100966010 B1 KR100966010 B1 KR 100966010B1
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South Korea
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vector
correlation
tests
test
vectors
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Korean (ko)
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KR20030061686A (ko
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우캉
스티랫수잔엘
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베리지 (싱가포르) 피티이. 엘티디.
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
    • G01R31/318342—Generation of test inputs, e.g. test vectors, patterns or sequences by preliminary fault modelling, e.g. analysis, simulation
    • G01R31/31835—Analysis of test coverage or failure detectability
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2273—Test methods

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  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
KR1020030002469A 2002-01-15 2003-01-14 하나 이상의 중복 테스트 제거 및 하나 이상의 비효율적테스트 재배열 방법 Expired - Fee Related KR100966010B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US10/047,344 US6941497B2 (en) 2002-01-15 2002-01-15 N-squared algorithm for optimizing correlated events
US10/047,344 2002-01-15

Publications (2)

Publication Number Publication Date
KR20030061686A KR20030061686A (ko) 2003-07-22
KR100966010B1 true KR100966010B1 (ko) 2010-06-24

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Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020030002469A Expired - Fee Related KR100966010B1 (ko) 2002-01-15 2003-01-14 하나 이상의 중복 테스트 제거 및 하나 이상의 비효율적테스트 재배열 방법

Country Status (5)

Country Link
US (1) US6941497B2 (enExample)
EP (1) EP1327890B1 (enExample)
JP (1) JP2003232838A (enExample)
KR (1) KR100966010B1 (enExample)
DE (1) DE60204535T2 (enExample)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20040006447A1 (en) * 2000-06-22 2004-01-08 Jacky Gorin Methods and apparatus for test process enhancement
US7225107B2 (en) * 2001-05-24 2007-05-29 Test Advantage, Inc. Methods and apparatus for data analysis
US7167811B2 (en) * 2001-05-24 2007-01-23 Test Advantage, Inc. Methods and apparatus for data analysis
US7395170B2 (en) * 2001-05-24 2008-07-01 Test Advantage, Inc. Methods and apparatus for data analysis
US7904279B2 (en) * 2004-04-02 2011-03-08 Test Advantage, Inc. Methods and apparatus for data analysis
JP4849798B2 (ja) * 2004-12-28 2012-01-11 富士通株式会社 電子機器、記録制御方法及びプログラム
TW200724949A (en) * 2005-08-19 2007-07-01 Koninkl Philips Electronics Nv Test sequence optimization method and design tool
US7596731B1 (en) * 2006-04-07 2009-09-29 Marvell International Ltd. Test time reduction algorithm
US8180142B2 (en) * 2008-12-02 2012-05-15 International Business Machines Corporation Test fail analysis on VLSI chips
US8484592B1 (en) 2012-02-29 2013-07-09 Umm Al-Qura University Timing verification method for circuits
US9401222B1 (en) 2015-11-23 2016-07-26 International Business Machines Corporation Determining categories for memory fail conditions
KR102782974B1 (ko) 2019-10-21 2025-03-18 삼성전자주식회사 반도체 회로를 검증하기 위한 최적화된 검증 벡터를 생성하는 전자 장치 및 그 동작 방법

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0536802A (ja) * 1991-07-31 1993-02-12 Hitachi Ltd 半導体集積回路補修診断方法
JPH06282462A (ja) * 1993-03-26 1994-10-07 Toshiba Corp 半導体試験装置制御プログラムデバッグ方式
JP2785901B2 (ja) * 1992-03-27 1998-08-13 松下電器産業株式会社 検査系列生成方法および検査系列生成装置
KR20000007565A (ko) * 1998-07-04 2000-02-07 윤종용 테스트 시퀀스 데이터의 압축 알고리듬

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5410552A (en) 1992-03-27 1995-04-25 Matsushita Electric Industrial Co., Ltd. Method and apparatus for generating test sequence
US5345450A (en) * 1993-03-26 1994-09-06 Vlsi Technology, Inc. Method of compressing and decompressing simulation data for generating a test program for testing a logic device
US5935264A (en) 1997-06-10 1999-08-10 Micron Technology, Inc. Method and apparatus for determining a set of tests for integrated circuit testing
US6070131A (en) * 1997-09-26 2000-05-30 Micron Technology, Inc. System for evaluating and reporting semiconductor test processes
US6810372B1 (en) * 1999-12-07 2004-10-26 Hewlett-Packard Development Company, L.P. Multimodal optimization technique in test generation
US6782501B2 (en) * 2001-01-23 2004-08-24 Cadence Design Systems, Inc. System for reducing test data volume in the testing of logic products

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0536802A (ja) * 1991-07-31 1993-02-12 Hitachi Ltd 半導体集積回路補修診断方法
JP2785901B2 (ja) * 1992-03-27 1998-08-13 松下電器産業株式会社 検査系列生成方法および検査系列生成装置
JPH06282462A (ja) * 1993-03-26 1994-10-07 Toshiba Corp 半導体試験装置制御プログラムデバッグ方式
KR20000007565A (ko) * 1998-07-04 2000-02-07 윤종용 테스트 시퀀스 데이터의 압축 알고리듬

Also Published As

Publication number Publication date
EP1327890A3 (en) 2003-09-03
JP2003232838A (ja) 2003-08-22
US20030140287A1 (en) 2003-07-24
EP1327890B1 (en) 2005-06-08
DE60204535D1 (de) 2005-07-14
EP1327890A2 (en) 2003-07-16
DE60204535T2 (de) 2006-04-27
KR20030061686A (ko) 2003-07-22
US6941497B2 (en) 2005-09-06

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