KR100950327B1 - Sop type insert for test handler - Google Patents

Abstract

The present invention relates to an SOP type insert for a test handler.

SOP type insert according to the present invention, the insert body; And a holding device provided to hold both terminals of the SOP type semiconductor device mounted and loaded in a mounting space formed in the insert body. It includes, The holding device is coupled to the insert body with one point of the upper end as the rotation center point, one side of the SOP-type semiconductor device loaded in the loading space by the lower end is advanced to the loading space side according to the rotation state A latch member for holding a terminal or releasing the holding; An elastic member for applying an elastic force to the latch member toward the loading space; It includes.

According to the SOP type insert according to the present invention, by reducing the length of the insert by minimizing the width for the installation, operation and locking device configuration of the latch member, more inserts can be mounted on the test tray of the same area ultimately This increases the throughput of the test handler.

Test handler, test tray, insert, SOP

Description

SOP type insert for test handler {SOP TYPE INSERT FOR TEST HANDLER}

The present invention relates to an SOP type insert for a test handler which is a semiconductor device inspection device, and more particularly, to a holding device for holding an SOP type semiconductor device loaded on an SOP type insert.

The semiconductor device produced is tested by a tester, and then divided into good and defective products, and only good products are shipped. An automated inspection apparatus called a test handler is used to support the test process by the tester. Such a test handler is provided with a plurality of test trays for circulating a predetermined path inside the test handler. The test tray circulates a predetermined path with the semiconductor elements loaded therein, and a test point on the predetermined path (the point corresponding to the position of the tester). Docked in the tester to support the testing of the loaded semiconductor devices.

1 shows a conventional test tray 100.

As illustrated in FIG. 1, the test tray 100 is arranged in a matrix form and includes an insert 110 on which a semiconductor device is loaded and a frame 120 for supporting the inserts 110.

The insert 110 includes an insert body 10 and a holding device. Here, the holding device and the technology related to the opening of the holding device are described in detail through the Korean Patent Registration No. 486412 (hereinafter referred to as “prior art”), which was previously proposed by the applicant of the present invention, and FIG. 1 for convenience of description. The illustration of the holding device is omitted.

As shown in FIG. 1, the insert main body 10 has a loading space 11 for loading semiconductor elements and a pair of mounting spaces 12 positioned on both sides of the loading space 11, respectively. have.

A semiconductor device is loaded in the loading space 11, and a holding device for holding both ends of the semiconductor devices loaded in the loading space 11 is mounted in the pair of mounting spaces 12.

On the other hand, semiconductor devices have various types such as BGA (Ball Grid Array) type, terminal side protrusion type ( SOPSmall Out-line Package type, SSOPShrink SOP type, TSOPThin SOP type, etc. ) according to package type. There is a kind, but the present invention relates to an SOP type insert for loading an SOP type semiconductor element.

2 shows a cross-sectional front view of the SOP type semiconductor device D. As shown in FIG. As shown in FIG. 2, the SOP type semiconductor device D has a shape in which the terminal T protrudes toward the side of the body.

3 shows a cross sectional front view of an SOP insert 300 according to an example of the prior art for loading an SOP semiconductor device. For reference, the SOP type insert 300 of FIG. 3 constitutes a holding device 320 having the simplest structure consisting of the latch member 321 and the spring 322, and the SOP type in the current loading space 311. The semiconductor element D is loaded.

As referred to in FIG. 3, the semiconductor device D loaded in the loading space 311 is held by the holding device 320.

The latch member 321 is coupled to the insert body 310 using one point spaced a predetermined distance from the loading space 311 as the rotation center point (C). The end of the loading space 311 side holds or releases the terminal T of the semiconductor device D according to the rotation state of the latch member 321. That is, as shown in Figure 4, when the external force is applied by the open pin (P, Republic of Korea Patent Registration No. 10-687676), the latch member 321 is rotated reversely loaded in the loading space 311 When the terminal T of the device D is released or as shown in FIG. 3, the latch member 321 is rotated forward by the elastic restoring force of the spring 322 when the external force by the open pin is erased. The terminal T of the element D is held.

The spring 322 is provided to maintain the holding state of the latch member 321.

In the case of the SOP type insert 300 according to the prior art as described above, the holding state of the latch member 321 is maintained by the spring 322, and the opening pin P pushes the latch member 321 upwards. Release the holding state.

However, according to the SOP type insert 300 according to the prior art, the installation and operation width of the latch member 321 is long, and ultimately, the overall length is increased. This is because the length of the latch member 321 is from the point where the terminal T of the SOP-type semiconductor device D loaded in the loading space 311 to the rotation center point C, where the terminal T is positioned. This is because a width that can come into contact with the opening pin (P) must be provided between the rotation center point (C). As such, when the total length of the SOP-type insert 300 becomes long, the number of SOP-type inserts 300 mounted on the test tray of the same area is reduced, which ultimately lowers the capacity of the test handler once.

In addition, when an external force is applied to the semiconductor device due to an external impact, the latch member is rotated by the external force, thereby temporarily releasing the holding state of the semiconductor device, thereby leaving the semiconductor device out of the loading space. Therefore, in order to solve such a problem, a locking device (referred to as a ' locker ' in the prior art) must be further configured to prevent rotation of the latch member when the latch member is in a holding state. In this case, the length for mounting the holding device must be secured longer, so that the above-mentioned problems become larger.

In particular, the above problems are conspicuous in SOP type inserts for loading SOP type semiconductor elements whose terminals protrude outward.

SUMMARY OF THE INVENTION The present invention has been made to solve the above problems, and an object of the present invention is to provide an SOP type insert which does not need to configure a separate locking device by changing the operation of the latch member.

TSOP type insert for a test handler according to the present invention for achieving the above object, the insert body formed with a mounting space for loading the semiconductor element and a pair of mounting spaces respectively located on both sides of the loading space; And holding both terminals of a terminal side protruding semiconductor device (hereinafter, referred to as a 'SOP semiconductor device') mounted in the pair of mounting spaces formed in the insert body and loaded in the loading space. A pair of holding devices provided; Includes, at least one of the pair of holding devices, the one point of the upper end as the rotation center point On the insert body Combined According to the rotation state, the lower end toward the loading space Back and forth  Holding or releasing holding of one terminal of the SOP-type semiconductor device loaded in the loading space Latch member ; An elastic member for applying an elastic force to the latch member toward the loading space; And the latch member is inclined with respect to the vertical line passing through the center of rotation of the latch member at the center of rotation of the latch member at the center of rotation of the latch member when the latch member is held. The holding portion of the lower end of the member is characterized in that more protruding toward the loading space than the center of rotation of the latch member.

remind The insert body  remind Of latch member Rotation width  To limit Restriction Groove  Formed, and the The latch member  remind On the rotary limit groove  Inserted to enable rotational movement Rotation limit projection  It is characterized by what is formed.

The insert body is another specific feature that the rotation limiting jaw is formed to limit the rotation width of the latch member.

remind Of latch member  Rotation center point is Insert body  Located at the top and the outside is another specific feature.

According to the present invention as described above, by reducing the length of the entire insert by minimizing the width for the installation, operation and locking device configuration of the latch member, more inserts can be mounted in the test tray of the same area ultimately of the test handler There is an effect that can increase the treatment capacity once.

Hereinafter, a preferred embodiment of the SOP-type insert (hereinafter, referred to as 'insert') for a test handler according to the present invention as described above will be described in more detail with reference to the accompanying drawings.

5 is a partially exploded perspective view of insert 500 according to a preferred embodiment of the present invention, and FIG. 6 is a front sectional view of insert 500 of FIG.

5 and as will be referenced in Figure 6, the insert 500 according to this embodiment is configured to include the inserts body 510 and the holding device 520 of the pair.

The insert body 510 has a loading space 511 for loading an SOP type semiconductor device (hereinafter referred to as a 'semiconductor device') and a pair of mounting spaces 512 respectively positioned at both sides of the loading space 511. Is formed. In addition, the front and rear sides of the mounting space 512, the rotation limit groove 513 is formed.

The loading space 511 is opened upwards so that the semiconductor device can be loaded while going in and out from above.

The holding device 520 is mounted in each of the pair of mounting spaces 512.

The holding device 520 includes a latch member 521, a latch shaft 522, a spring 523, and the like.

The latch member 521 is installed on the mounting space 512 with its upper end fixed to the insert body 510 so as to be rotatable through the latch shaft 522. Furthermore, both sides of the latch member 521 are provided with a rotation limiting projection 521a which is movably inserted into the rotation limiting groove 513, and the holding portion at the lower end of the latching member 521 is used for the stable holding of the semiconductor device. It has a step shape corresponding to the step shape terminal. Here, the rotation limiting projection 521a may limit the maximum rotation width of the latch member 521 but also serve to receive an external force by the open pin as described later.

6, when the latch member 521 maintains the holding state, the line Lt connecting the holding portion at the lower end of the latch member 521 at the rotation center point C is the rotation center point C. It is inclined with respect to the vertical line (Lc) passing through, the inclined direction is a direction in which the holding portion at the lower end of the latch member 521 protrudes more toward the loading space 511 than the rotation center point (C), It is preferable that the inclination angle θ is larger than 0 degrees and smaller than 45 degrees.

In addition, the lower end of the latch member 521 is to move forward and backward in the horizontal direction toward the loading space 511 as the inclination angle (θ) is smaller, but the latch member because it rotates based on the rotation center point (C) When 521 is rotated, the lower end of the minute but one latch member 521 is also parallel to the shanghaidong in the vertical direction. Therefore, the lower end of the latch member 521 in order to prevent the interference between the holding portion at the lower end of the latch member 521 and the terminal of the semiconductor device within the limit that the lower end of the latch member 521 is moved vertically. And the clearance between the terminals of the semiconductor element.

The latch shaft 522 provides a center of rotation C of the latch member 521, and serves to secure one side of the latch member 521 , that is, the upper end , to be rotatable.

When the latch member 521 rotates the latch shaft 522 to the rotation center point C by the elastic force of the spring 523, the rotation limiting projection 521a is inserted into the rotation limiting groove 513. Therefore, the maximum rotation width of the latch member 521 is limited to one end of the rotation limiting groove 513, and the lower end of the latch member 521 due to the clearance between the lower end of the latch member 521 and the terminal of the semiconductor device. And there is no interference between the terminals of the semiconductor element.

The spring 523 is an elastic member that applies an elastic force to the latch member 521 so that the other side of the latch member 521 , that is, the lower end thereof, holds the terminal on one side of the semiconductor element loaded in the loading space 511. It serves as.

Subsequently, the operation state of the insert 500 as described above will be described with reference to the cross sectional view of FIG. 7.

In most cases, the lower end of the latch member 521 is in the protruding state by advancing toward the loading space 511 by the elastic force of the spring 523, as shown in FIG. 7.

If a situation occurs in which the semiconductor device is to be loaded into the insert 500 in which the loading space 511 is empty, as shown in FIG. 8, the opening pin P is raised to the rotation limiting projection 521a. Contact. Here, since the upper end of the opening pin (P) has an inclined surface inclined to the outside of the loading space 511, if the opening pin (P) continuously rises, the elastic force of the spring 523 is overcome and the rotation limiting projection (521a) is The inclined surface is moved to the outside of the loading space 511 ultimately, as shown in Figure 9, the latch member 521 is rotated so that the lower end of the latch member 521 is retracted to the outside of the loading space 511 Will release the holding state.

As shown in FIG. 9, when the holding state of the latch member 521 is released, the semiconductor device can be properly seated in the loading space 511 by the pick and place device. On the other hand, when the semiconductor device is properly seated in the loading space 511, the latch member 521 is rotated by the elastic restoring force of the spring 523 while the opening pin (P) is lowered to the lower end of the latch member 521 It moves to this loading space 511 side. Accordingly, as shown in FIG. 10, the holding portion at the lower end of the latch member 521 can be positioned above the terminal of the semiconductor device D, so that the semiconductor device D loaded in the loading space 511 can be positioned above the semiconductor device D. FIG. This will prevent departures.

If the external force F is applied upward to the semiconductor device D as shown in FIG. 11 while the holding state is maintained as shown in FIG. 10, the center of rotation of the latch member 521 ( C) and the line connecting the holding portion at the bottom of the latch member 521 (Lt, see Fig. 6) loaded area from the holding area is a rotation center point (C) at the bottom of the latch member 521 to the extent binary is tilted ( Since the protrusion 511 is further protruded, the latch member 521 is subjected to a force to rotate in the direction of the arrow of FIG. In this case, the rotation in the direction of the arrow of FIG. 11 is limited by the rotation limiting projection 521a formed in the latch member 521 and the rotation limiting groove 513 formed in the insert body 510. Therefore, even if an external force is applied upward to the semiconductor device D, the holding state of the latch member 521 can be maintained as it is.

Meanwhile, in the above-described embodiment, the rotation limiting groove 513 is formed in the insert body 510 and the rotation limiting projection 521a is formed in the latch member 521 to limit the maximum rotation width of the latch member 521. According to the implementation, as shown in FIG. 12, the function can be realized by configuring the rotation limiting jaw 1214 for limiting the rotation width of the latch member 1221 in the insert body 1210. . The rotation limiting jaw 1214 may also serve to induce mounting of the semiconductor device. In addition, the latch member 1221 may further include a locking jaw or a locking projection that is caught by the rotation limiting jaw 1214. For reference, in the insert 500 according to FIG. 5, the rotation limiting projection 521a is subjected to a force applied by the opening pin P. However, in the case of the insert 1200 having the structure as shown in FIG. It may be required that the protrusion 1221a for receiving the force by (P) be formed separately.

Further, depending is not such a rotation limiting structure to the insert body and the latch member when in the above examples and to have a rotation limit structure to limit the rotational range of the latch member on the insert body and the latch, or the insert body to the member, but Instead, the structure of the pusher of the match plate (see Korean Patent Registration No. 10-709114) may be changed to limit the rotation of the latch member. That is, for example, as shown in FIG. 13, when the match plate M is advanced, the pusher M1 supports one side of the latch member 1321 so that the rotation of the latch member 1321 is limited. It is also possible to structure.

Above In the embodiment From opening pin (P)  Only the protrusions 521a and 1221a are configured to receive an external force. However, you may want to add bearings and other features to the protrusions for smooth operation.

As described above, the detailed description of the present invention has been made by the embodiments with reference to the accompanying drawings. However, since the above-described embodiments have only been described with reference to preferred examples of the present invention, the present invention is limited to the above embodiments. It should not be understood that the scope of the present invention is to be understood by the claims and equivalent concepts described below.

1 is a schematic exploded perspective view of a typical test tray.

2 is a schematic sectional front view of an SOP type semiconductor device.

3 and 4 are front cross-sectional views of the insert according to the prior art.

 5 is an exploded perspective view of a portion of an insert according to an embodiment of the present invention.

6 is a front sectional view of the insert of FIG.

7 to 11 are operational state diagrams for reference to the operational description of the insert of FIG.

12 and 13 are front cross-sectional views of inserts according to other embodiments of the invention.

* Description of the symbols for the main parts of the drawings *

500: Insert

510: insert body

511: loading space 512: mounting space

513: Restriction Groove

520: holding device

521: latch member

521a: rotation limit projection

522: latch shaft

523: spring

Claims (4)

An insert body having a loading space for loading a semiconductor device and a pair of mounting spaces positioned at both sides of the loading space; And It is provided to hold both terminals of terminal side protruding semiconductor devices (hereinafter referred to as SOP semiconductor devices) mounted in the pair of mounting spaces formed in the insert body and loaded in the loading space. A pair of holding devices; Including, At least one of the pair of holding devices, The latch is coupled to the insert body with one point of the upper end as the rotation center point, and the lower end is retracted toward the loading space according to the rotation state, thereby holding or releasing the holding of one terminal of the SOP-type semiconductor device loaded in the loading space. absence; And An elastic member that applies an elastic force to the latch member toward the loading space; Including; When the latch member maintains the holding state, the line connecting the holding portion of the lower end of the latch member at the center of rotation of the latch member is inclined with respect to the vertical line passing through the center of rotation of the latch member. The holding portion is characterized in that more protruding toward the loading space than the center of rotation of the latch member SOP inserts for test handlers. The method of claim 1, The insert body is provided with a rotation limiting groove for limiting the rotation width of the latch member, The latch member is characterized in that the rotation limiting projection is formed to be rotatable in the rotational restriction groove is formed. SOP inserts for test handlers. The method of claim 1, The insert body is characterized in that a rotation limiting jaw is formed to limit the rotation width of the latch member SOP inserts for test handlers. The method of claim 1, The center of rotation of the latch member is characterized in that located on the top, outer edge of the insert body SOP inserts for test handlers.

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