KR100940073B1 - Method for detecting fail of LCD using division photographing - Google Patents

Abstract

The present invention is a method for detecting defects of an LCD by lighting the inspection pattern on the LCD and photographing the illuminated test pattern and then measuring the amount of light in the image obtained by the imaging. After photographing each inspection pattern that is lit, a plurality of divided images obtained by photographing are combined into one image, and the amount of light is measured to detect defects of the LCD, so that defects of minute light quantity differences can be detected, thereby improving defect detection power. There is an advantage to this.

LCD, Defective, Detected, Moiré, Pattern, Split, Lit

Description

Method for detecting fail of LCD using division photographing}

The present invention relates to a defect detection method of an LCD, and more particularly, to a method for detecting a defect of an LCD in a state in which a moiré phenomenon generated by interference between neighboring pixels is removed.

In general, an LCD automated image inspection device detects defects of an LCD by lighting a predetermined test pattern on the LCD, photographing the lighted test pattern, and measuring a light amount of the image obtained by photographing. 1 is a conceptual diagram of defect detection of an LCD using a conventional LCD automatic image inspection device. The pattern generator 10 turns on the inspection pattern on the LCD 1, photographs the inspection pattern with the image camera 20, and then displays an image processor ( 30) detect the defect of the LCD by measuring the amount of light in the image.

Specifically, when looking at the defect detection method of the LCD, by lighting all the sub-pixels (Sub Pixel) at the same time in one test pattern, photographed, sum the captured image into a single image (Raw Image) and measure the amount of the LCD Defect is detected.

However, when all the sub-pixels are lighted and photographed at the same time, as shown in FIG. 2, light interference, or moiré, occurs between the sub-pixels, and when the defect is detected by the moiré image, It is difficult to accurately classify the defects, so there is a problem that the defect detection power is lowered. In other words, by simultaneously lighting a specific pattern (white, green, red, blue, etc.) on the LCD and photographing it with an image camera, the amount of light of a specific pixel is determined by the interference of light between pixels adjacent to the captured image. The moiré phenomenon, which is not a value but summed with the amount of light of surrounding pixel interference, is generated, resulting in poor detection power.

Accordingly, an object of the present invention is to provide a defect detection method using partitioned photographing of an LCD, which can improve defect detection by removing moiré phenomena due to light interference between subpixels. have.

In order to achieve the above object, a defect detection method using splitting of an LCD according to the present invention comprises lighting a test pattern on an LCD, photographing a lighted test pattern, and measuring a light amount of an image obtained by photographing a lighted test pattern. In the method of detecting, a single test pattern in the LCD has 4 such as an even line, an even line, an even line, an odd line, an even line, an odd line, and an odd line. Photographing each inspection pattern that is divided into two lamps and lit by an image camera, and then combining four divided images obtained by the image camera into a single image and measuring the amount of light in the image to detect defective LCDs. It is characterized by.

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The defect detection method using segmented imaging of an LCD according to the present invention has the advantage of improving defect detection ability by detecting defects of minute light quantity difference by removing moiré phenomenon generated by interference between neighboring pixels. .

Hereinafter, with reference to the accompanying drawings will be described in detail the present invention.

In the present invention, the lighting means that 63 or more gradations are expressed when the amount of light (0% to 100%) of the LCD is expressed by 0 to 255 gradations.

3 is a flow chart showing a defect detection method using the segmentation of the LCD according to the present invention, Figure 4 is a conceptual diagram illustrating a defect detection method using the segmentation of the LCD according to the present invention, Figure 5 is a view according to the present invention It is a view showing that the moire phenomenon is improved by minimizing the interference of light with a checker dispersion pattern.

As shown in FIG. 3, in the defect detection method using divisional imaging of an LCD according to the present invention, first, a single inspection pattern is divided into a plurality of LCDs and turned on (S110). That is, in order to remove the moiré phenomenon caused by the interference of light between the subpixels, the inspection pattern is divided into a plurality of lights such as two, four, six, and the like. At this time, in consideration of an efficient aspect, it is advantageous to divide and light one pattern into four. If a pattern is lit by dividing it into four, as shown in FIG. 4, it may be lit by dividing into four in the form of an even line, an even line, an even line, an odd line, an odd line, and an odd line. .

Subsequently, the inspection pattern divided by the image camera is photographed (S120).

Finally, the plurality of divided images obtained by repeated photographing are combined into one image, and the amount of light of the image is measured to detect defects of the LCD (S130). In this way, it is possible to obtain a clean image from which moiré phenomena due to light interference is eliminated by combining a plurality of images obtained by dividing and lighting a plurality of LEDs into a single image without lighting all the subpixels of the LCD at once. The detection power can be improved.

When the light is photographed by scattering the light into four patterns and the image is added and generated, the moiré phenomenon is removed as shown in FIG.

On the other hand, the failure detection method using the segmentation of the LCD according to the present invention has been described according to a limited embodiment, the scope of the present invention is not limited to a specific embodiment, to those skilled in the art with respect to the present invention Various alternatives, modifications, and changes can be made within the scope of the obvious.

1 is a conceptual diagram of defect detection of the LCD using the conventional LCD automatic image inspection device.

2 is a diagram showing that a moiré phenomenon occurs due to an unbalanced interference of light between subpixels in a conventional real multiplex convolution.

Figure 3 is a flow chart showing a defect detection method using the segmentation of the LCD according to the present invention.

Figure 4 is a conceptual diagram for explaining a defect detection method using the segmentation of the LCD according to the present invention.

5 is a view showing that the moire phenomenon is improved by minimizing the interference of light in the checker dispersion pattern according to the present invention.

Claims (2)

delete In the method of detecting the defect of the LCD by lighting the test pattern on the LCD, photographing the illuminated test pattern and measuring the amount of light in the image obtained In order to remove the moire manifestation caused by the interference of light between the subpixels, the LED is divided into four parts such as an even line, an even line, an odd line, an odd line, and an odd line. After shooting each inspection pattern that is lighted up with the image camera, 4. A defect detection method using segmented photographing of an LCD, wherein four divided images obtained by an image camera are combined into one image and the amount of light of the image is measured to detect defects of the LCD.

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