KR20090110116A - Method for detecting fail of LCD using division photographing - Google Patents

Method for detecting fail of LCD using division photographing Download PDF

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KR20090110116A
KR20090110116A KR1020080035733A KR20080035733A KR20090110116A KR 20090110116 A KR20090110116 A KR 20090110116A KR 1020080035733 A KR1020080035733 A KR 1020080035733A KR 20080035733 A KR20080035733 A KR 20080035733A KR 20090110116 A KR20090110116 A KR 20090110116A
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lcd
light
image
photographing
divided
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KR1020080035733A
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Korean (ko)
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KR100940073B1 (en
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박대성
이승원
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하이텍교역 주식회사
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    • GPHYSICS
    • G02OPTICS
    • G02FDEVICES OR ARRANGEMENTS, THE OPTICAL OPERATION OF WHICH IS MODIFIED BY CHANGING THE OPTICAL PROPERTIES OF THE MEDIUM OF THE DEVICES OR ARRANGEMENTS FOR THE CONTROL OF THE INTENSITY, COLOUR, PHASE, POLARISATION OR DIRECTION OF LIGHT, e.g. SWITCHING, GATING, MODULATING OR DEMODULATING; TECHNIQUES OR PROCEDURES FOR THE OPERATION THEREOF; FREQUENCY-CHANGING; NON-LINEAR OPTICS; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1306Details
    • G02F1/1309Repairing; Testing
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F5/00Screening processes; Screens therefor
    • G03F5/22Screening processes; Screens therefor combining several screens; Elimination of moiré
    • GPHYSICS
    • G06COMPUTING; CALCULATING; COUNTING
    • G06KRECOGNITION OF DATA; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS
    • G06K9/00Methods or arrangements for reading or recognising printed or written characters or for recognising patterns, e.g. fingerprints
    • G06K9/62Methods or arrangements for recognition using electronic means
    • G06K9/6217Design or setup of recognition systems and techniques; Extraction of features in feature space; Clustering techniques; Blind source separation
    • G06K9/6261Design or setup of recognition systems and techniques; Extraction of features in feature space; Clustering techniques; Blind source separation partitioning the feature space
    • GPHYSICS
    • G09EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09GARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays

Abstract

PURPOSE: A detection method using a divided photograph of an LCD is provided to improve defective detection capacity by removing moire effect generated by interference between pixels. CONSTITUTION: A detection method using a divided photograph of an LCD is as follows. The inferiority of LCD is detected by taking a picture of a test pattern by measuring the LCD quantity of light. The test pattern is turned on in LCD(S110). Each test pattern which is separately turned on is filmed(S120). The inferiority of LCD is detected by the quantity of light and the photograph divided image of the plural number is summed by the image(S130).

Description

엘시디의 분할촬영을 이용한 불량검출방법{Method for detecting fail of LCD using division photographing}Method for detecting fail of LCD using division photographing}
본 발명은 엘시디의 불량검출방법에 관한 것으로서, 특히 이웃하는 픽셀들 간의 간섭에 의하여 생성되는 모아레 현상을 제거한 상태로 엘시디의 불량을 검출할 수 있는 방법에 관한 것이다. The present invention relates to a defect detection method of an LCD, and more particularly, to a method for detecting a defect of an LCD in a state in which a moiré phenomenon generated by interference between neighboring pixels is removed.
일반적으로, 엘시디(LCD) 자동화상 검사장치는 엘시디에 일정한 검사 패턴을 점등하고 점등된 검사 패턴을 촬영한 후 촬영하여 얻어진 이미지의 광량을 측정하여 엘시디의 불량을 검출한다. 도 1은 종래 엘시디 자동화상 검사장치를 이용한 엘시디의 불량검출 개념도로서, 패턴 발생기(10)로 엘시디(1)에 검사 패턴을 점등하고, 화상 카메라(20)로 검사 패턴을 촬영한 후 화상 처리기(30)로 이미지의 광량을 측정하여 엘시디의 불량을 검출한다. In general, an LCD automated image inspection device detects defects of an LCD by lighting a predetermined test pattern on the LCD, photographing the lighted test pattern, and measuring a light amount of the image obtained by photographing. 1 is a conceptual diagram of defect detection of an LCD using a conventional LCD automatic image inspection device. The pattern generator 10 turns on the inspection pattern on the LCD 1, photographs the inspection pattern with the image camera 20, and then displays an image processor ( 30) detect the defect of the LCD by measuring the amount of light in the image.
구체적으로, 엘시디의 불량검출방법을 살펴보면, 하나의 검사 패턴으로 모든 서브 픽셀(Sub Pixel)을 동시에 점등하여 촬영한 후, 촬영된 이미지를 하나의 이미지(Raw Image)로 합하고 그 광량을 측정하여 엘시디의 불량을 검출한다. Specifically, when looking at the defect detection method of the LCD, by lighting all the sub-pixels (Sub Pixel) at the same time in one test pattern, photographed, sum the captured image into a single image (Raw Image) and measure the amount of the LCD Defect is detected.
그런데, 모든 서브 픽셀을 동시에 점등하여 촬영하게 되면 도 2에 도시한 바 와 같이 서브 픽셀들 간에 빛의 간섭 현상 즉 모아레 현상이 발생하게 되고, 모아레 현상이 있는 이미지로 불량을 검출하는 경우, 모아레와 불량의 정확한 구분이 어려워서 불량 검출력이 저하되는 문제점이 있다. 부연하자면, 엘시디에 특정한 패턴(White, Green, Red, Blue 등)을 동시에 점등하여 이를 화상 카메라로 촬영함으로써 촬영된 이미지에 이웃한 픽셀들 간 빛의 간섭으로 특정한 픽셀의 광량값이 자신의 온전한 광량값이 아닌 주위의 픽셀 간섭의 광량과 합산된 모아레 현상이 발생되어 불량 검출력이 저하되게 되는 것이다. However, when all the sub-pixels are lighted and photographed at the same time, as shown in FIG. 2, light interference, or moiré, occurs between the sub-pixels, and when the defect is detected by the moiré image, It is difficult to accurately classify the defects, so there is a problem that the defect detection power is lowered. In other words, by simultaneously lighting a specific pattern (white, green, red, blue, etc.) on the LCD and photographing it with an image camera, the amount of light of a specific pixel is determined by the interference of light between pixels adjacent to the captured image. The moiré phenomenon, which is not a value but summed with the amount of light of surrounding pixel interference, is generated, resulting in poor detection power.
이에 본 발명은 상기와 같은 문제점을 해결하기 위한 것으로서, 서브 픽셀들 간 빛의 간섭으로 인한 모아레 현상을 제거하여 불량 검출력을 향상시킬 수 있는 엘시디의 분할촬영을 이용한 불량검출방법을 제공하는데 그 목적이 있다. Accordingly, an object of the present invention is to provide a defect detection method using partitioned photographing of an LCD, which can improve defect detection by removing moiré phenomena due to light interference between subpixels. have.
상기와 같은 목적을 달성하기 위하여 본 발명에 따른 엘시디의 분할촬영을 이용한 불량검출방법은, 엘시디에 검사 패턴을 점등하고 점등된 검사 패턴을 촬영한 후 촬영하여 얻어진 이미지의 광량을 측정하여 엘시디의 불량을 검출하는 방법에 있어서, 엘시디에 하나의 검사 패턴을 복수개로 분할 점등하고 분할 점등된 각각의 검사 패턴을 촬영한 후, 촬영하여 얻어진 복수개의 분할 이미지를 하나의 이미지로 합하고 그 광량을 측정하여 엘시디의 불량을 검출하는 것을 특징으로 한다. In order to achieve the above object, a defect detection method using splitting of an LCD according to the present invention comprises lighting a test pattern on an LCD, photographing a lighted test pattern, and measuring a light amount of an image obtained by photographing a lighted test pattern. In the method of detecting a light, a plurality of inspection patterns are divided and lit on an LCD, each of the inspection patterns that are lighted up is divided, and the plurality of divided images obtained by photographing are combined into one image, and the amount of light is measured to determine the LCD. It is characterized by detecting the failure of.
여기에서, 상기 불량검출방법은, 하나의 검사 패턴을 4개로 분할 점등하고, 촬영하여 얻어진 4개의 분할 이미지를 하나의 이미지로 합하고 그 광량을 측정하여 엘시디의 불량을 검출할 수 있다. Here, in the defect detection method, one inspection pattern may be divided into four lamps, the four divided images obtained by photographing may be combined into one image, and the amount of light may be measured to detect defects of the LCD.
본 발명에 따른 엘시디의 분할촬영을 이용한 불량검출방법은 이웃하는 픽셀들 간의 간섭에 의하여 생성되는 모아레 현상을 제거함으로써 미세한 광량 차이의 결함 등을 검출할 수 잇어 불량 검출력을 향상시킬 수 있는 잇점이 있다. The defect detection method using segmented imaging of an LCD according to the present invention has the advantage of improving defect detection ability by detecting defects of minute light quantity difference by removing moiré phenomenon generated by interference between neighboring pixels. .
이하, 첨부된 도면을 참조하여 본 발명을 상세히 설명하기로 한다.Hereinafter, with reference to the accompanying drawings will be described in detail the present invention.
본 발명에서의 점등은 엘시디의 광량(0%~100%)을 0~255계조로 표현할 때 63계조 이상을 의미하는 것으로 한다. In the present invention, the lighting means that 63 or more gradations are expressed when the amount of light (0% to 100%) of the LCD is expressed by 0 to 255 gradations.
도 3은 본 발명에 따른 엘시디의 분할촬영을 이용한 불량검출방법을 나타내는 흐름도, 도 4는 본 발명에 따른 엘시디의 분할촬영을 이용한 불량검출방법을 설명하기 위한 개념도이고, 도 5는 본 발명에 따라 체커 분산 패턴으로 빛의 간섭을 최소화하여 모아레 현상이 개선된 것을 보여주는 도면이다. 3 is a flow chart showing a defect detection method using the segmentation of the LCD according to the present invention, Figure 4 is a conceptual diagram illustrating a defect detection method using the segmentation of the LCD according to the present invention, Figure 5 is a view according to the present invention It is a view showing that the moire phenomenon is improved by minimizing the interference of light with a checker dispersion pattern.
도 3에 도시한 바와 같이, 본 발명에 따른 엘시디의 분할촬영을 이용한 불량검출방법은, 먼저 엘시디에 하나의 검사 패턴을 복수개로 분할하여 점등한다(S110). 즉, 서브 픽셀들 간 빛의 간섭으로 인한 모아레 현상을 제거하기 위하여 검사 패턴을 2개, 4개, 6개 등과 같은 복수개로 분할하여 점등하는 것이다. 이때, 효율적인 측면에서 고려할 때 하나의 패턴을 4개로 분할하여 점등하는 것이 유리하다. 만약, 하나의 패턴을 4개로 분할하여 점등한다면, 도 4에 도시한 바와 같이 짝수 라인 짝수 열, 짝수 라인 홀수 열, 홀수 라인 짝수 열 및 홀수 라인 홀수 열과 같은 형태로 4개로 분할하여 점등할 수 있다. As shown in FIG. 3, in the defect detection method using divisional imaging of an LCD according to the present invention, first, a single inspection pattern is divided into a plurality of LCDs and turned on (S110). That is, in order to remove the moiré phenomenon caused by the interference of light between the subpixels, the inspection pattern is divided into a plurality of lights such as two, four, six, and the like. At this time, in consideration of an efficient aspect, it is advantageous to divide and light one pattern into four. If a pattern is lit by dividing it into four, as shown in FIG. 4, it may be lit by dividing into four in the form of an even line, an even line, an even line, an odd line, an odd line, and an odd line. .
계속하여, 화상 카메라로 분할 점등된 검사 패턴을 촬영한다(S120). Subsequently, the inspection pattern divided by the image camera is photographed (S120).
마지막으로, 반복 촬영하여 얻어진 복수개로 분할된 이미지를 하나의 이미지로 합하고 그 이미지의 광량을 측정하여 엘시디의 불량을 검출한다(S130). 이와 같이, 엘시디의 모든 서브픽셀을 한꺼번에 동시에 점등하지 않고 이를 복수개로 분할 점등 촬영하여 얻어진 복수개의 이미지를 하나의 이미지로 합함으로써 빛의 간섭으 로 인한 모아레 현상이 제거된 깨끗한 이미지를 얻을 수 있어 불량 검출력을 향상시킬 수 있다. Finally, the plurality of divided images obtained by repeated photographing are combined into one image, and the amount of light of the image is measured to detect defects of the LCD (S130). In this way, it is possible to obtain a clean image from which moiré phenomena due to light interference is eliminated by combining a plurality of images obtained by dividing and lighting a plurality of LEDs into a single image without lighting all the subpixels of the LCD at once. The detection power can be improved.
패턴을 4개로 분산 점등하여 촬영하고 이를 합산하여 이미지를 생성하게 되면, 도 5에 도시한 바와 같이 모아레 현상이 제거되고 서브 픽셀들 간 광량값의 유의차가 적어 검출력을 향상시킬 수가 있다. When the light is photographed by scattering the light into four patterns and the image is added and generated, the moiré phenomenon is removed as shown in FIG.
한편, 본 발명에 따른 엘시디의 분할촬영을 이용한 불량검출방법을 한정된 실시예에 따라 설명하였지만, 본 발명의 범위는 특정 실시예에 한정되는 것은 아니며, 본 발명과 관련하여 통상의 지식을 가진자에게 자명한 범위내에서 여러 가지의 대안, 수정 및 변경하여 실시할 수 있다. On the other hand, the failure detection method using the segmentation of the LCD according to the present invention has been described according to a limited embodiment, the scope of the present invention is not limited to a specific embodiment, to those skilled in the art with respect to the present invention Various alternatives, modifications, and changes can be made within the scope of the obvious.
도 1은 종래 엘시디 자동화상 검사장치를 이용한 엘시디의 불량검출 개념도. 1 is a conceptual diagram of defect detection of the LCD using the conventional LCD automatic image inspection device.
도 2는 종래 실수 배 컨벌루션에서 서브 픽셀 간의 불균형한 빛의 간섭으로 모아레 현상이 발생된 것을 보여주는 도면. 2 is a diagram showing that a moiré phenomenon occurs due to an unbalanced interference of light between subpixels in a conventional real multiplex convolution.
도 3은 본 발명에 따른 엘시디의 분할촬영을 이용한 불량검출방법을 나타내는 흐름도. Figure 3 is a flow chart showing a defect detection method using the segmentation of the LCD according to the present invention.
도 4는 본 발명에 따른 엘시디의 분할촬영을 이용한 불량검출방법을 설명하기 위한 개념도. Figure 4 is a conceptual diagram for explaining a defect detection method using the segmentation of the LCD according to the present invention.
도 5는 본 발명에 따라 체커 분산 패턴으로 빛의 간섭을 최소화하여 모아레 현상이 개선된 것을 보여주는 도면. 5 is a view showing that the moire phenomenon is improved by minimizing the interference of light in the checker dispersion pattern according to the present invention.

Claims (2)

  1. 엘시디에 검사 패턴을 점등하고 점등된 검사 패턴을 촬영한 후 촬영하여 얻어진 이미지의 광량을 측정하여 엘시디의 불량을 검출하는 방법에 있어서, In the method of detecting the defect of the LCD by lighting the test pattern on the LCD, photographing the illuminated test pattern and measuring the amount of light in the image obtained
    엘시디에 하나의 검사 패턴을 복수개로 분할 점등하고 분할 점등된 각각의 검사 패턴을 촬영한 후, 촬영하여 얻어진 복수개의 분할 이미지를 하나의 이미지로 합하고 그 광량을 측정하여 엘시디의 불량을 검출하는 것을 특징으로 하는 엘시디의 분할촬영을 이용한 불량검출방법. It is characterized by detecting a defect of LCD by dividing and lighting a plurality of inspection patterns on the LCD and photographing each of the inspection patterns that are divided and lighting, and then combining the plurality of divided images obtained by photographing into one image and measuring the amount of light. Defect detection method using segmented photographing of LCD.
  2. 청구항 1에 있어서 상기 불량검출방법은, The method of claim 1 wherein the defect detection method,
    하나의 검사 패턴을 4개로 분할 점등하고, 촬영하여 얻어진 4개의 분할 이미지를 하나의 이미지로 합하고 그 광량을 측정하여 엘시디의 불량을 검출하는 것을 특징으로 하는 엘시디의 분할촬영을 이용한 불량검출방법. A method for detecting defects using divided photographing of an LCD, characterized by detecting a defect of an LCD by dividing and lighting one inspection pattern into four, adding four divided images obtained by photographing into one image, and measuring the amount of light.
KR1020080035733A 2008-04-17 2008-04-17 Method for detecting fail of LCD using division photographing KR100940073B1 (en)

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CN106569353A (en) * 2015-10-12 2017-04-19 比亚迪股份有限公司 Method and device for measuring display crosstalk of liquid crystal display
WO2018176261A1 (en) * 2017-03-29 2018-10-04 深圳配天智能技术研究院有限公司 Method for determining detection parameter, and detection device

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TWI220689B (en) * 2002-12-27 2004-09-01 Ind Tech Res Inst An inspection system and method for the inspection of a display device
KR100586790B1 (en) 2003-05-06 2006-06-08 주식회사 아이티오테크 Apparatus for detecting leakage current of light emitting cell and method and method and apparatus for checking light emitting cell array employing the same

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CN106569353A (en) * 2015-10-12 2017-04-19 比亚迪股份有限公司 Method and device for measuring display crosstalk of liquid crystal display
CN106569353B (en) * 2015-10-12 2019-12-10 比亚迪股份有限公司 Method and device for measuring display crosstalk of liquid crystal display
WO2018176261A1 (en) * 2017-03-29 2018-10-04 深圳配天智能技术研究院有限公司 Method for determining detection parameter, and detection device

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