KR100935985B1 - Apparatus for inspecting electrical properties of mass electronic component - Google Patents

Abstract

The present invention relates to an apparatus for inspecting electrical characteristics of a large quantity of electronic components, comprising: a plurality of first to n-th electronic component groups EDG1 to EDGn grouped by a plurality of preset electronic components among a large number of electronic components; A plurality of agents for inspecting electrical characteristics of the plurality of electronic components included in each of the first to n-th electronic component groups EDG1 to EDGn in each of the first to n-th electronic component groups EDG1 to EDGn. 1st-th nth measuring apparatus 100-1-100-n; Control the start of measurement of the first to n-th measuring device (100-1 ~ 100-n), receives the measurement value from the first to n-th measuring device (100-1 ~ 100-n) a large amount of electronic And a main processor 200 for storing and analyzing electrical characteristics for the component.

Bulk Electronic Components, Multilayer Ceramic Capacitors, MLCC, Electrical Properties, Insulation Resistance, Group Parallel Measurement, Sequential Measurement

Description

Equipment for inspecting electrical properties of mass electronic components {APPARATUS FOR INSPECTING ELECTRICAL PROPERTIES OF MASS ELECTRONIC COMPONENT}

BACKGROUND OF THE INVENTION 1. Field of the Invention [0001] The present invention relates to a device for inspecting electrical characteristics of a large quantity of electronic components. In particular, a plurality of electronic components, such as a multilayer ceramic chip capacitor (MLCC), is grouped into a plurality, and an insulation resistance of a large quantity of electronic components is included. The present invention relates to a system for inspecting electrical characteristics of large-scale electronic components that can measure electrical characteristics such as (IR) and the like in parallel in a group, and sequentially measure within each group.

In general, electronic components such as multi-layer ceramic chip capacitors (MLCC) can be produced in large quantities, and in order to increase the production efficiency of such mass-produced electronic components, insulation resistance for the corresponding electronic components, etc. A device should be provided for the rapid examination of the electrical characteristics of the system.

As described above, in order to quickly inspect the electronic parts produced in large quantities, a measuring apparatus as shown in FIG. 1 is conventionally proposed.

1 is a configuration diagram of an insulation resistance measuring apparatus of a conventional array capacitor.

Insulation resistance measuring apparatus of the conventional array capacitor shown in Figure 1,

Switches 27a to 27d for selecting each of the array capacitors 1 including a plurality of capacitors, ammeters 26a to 26d for measuring current through each of the array capacitors 1, and the switch ( 27a to 27d) includes a power supply switching switch 24 for selecting and supplying one of the DC power supply 22 and the AC power supply 23.

In the conventional insulation resistance measuring apparatus of the array capacitor, there is an advantage that the electrical characteristics can be measured for each of the plurality of capacitors without having to reorganize the wiring for each of the plurality of capacitors.

However, in the insulation resistance measuring apparatus of the conventional array capacitor shown in FIG. 1, since a plurality of capacitors are selected and inspected sequentially through a switch, it takes a long time to examine the electrical characteristics of a thousand or more capacitors. There is this.

SUMMARY OF THE INVENTION The present invention has been proposed to solve the above problems of the prior art, and an object thereof is to group a large number of electronic components such as a multilayer ceramic chip capacitor (MLCC) and the like into a plurality of electronic components. By measuring the electrical characteristics such as insulation resistance (IR) in parallel in each group and sequential measurement in each group, the electrical characteristics of mass electronic components can be tested more quickly. To provide a system.

One technical aspect of the present invention for achieving the above object of the present invention comprises a plurality of first to n-th electronic component group grouped by a plurality of predetermined electronic components of a large number of electronic components; A plurality of first to n-th measuring devices for inspecting electrical characteristics of the plurality of electronic parts included in each of the first to n-th electronic component groups in each of the first to n-th electronic component groups; A mass electronic component including a main processor that controls a measurement start of the first to n-th measuring devices, receives a measurement value from the first to n-th measuring devices, and stores and analyzes electrical characteristics of a large number of electronic parts. It is to provide an electrical property inspection device.

Each of the first to n-th measuring devices may include: a switching unit including a plurality of switches that sequentially select an inspection target electronic component among a plurality of electronic components included in a corresponding group and supply an inspection signal; A measuring unit measuring electrical characteristics of the electronic component selected by the switching unit; And a sub-processor controlling the electronic component sequential selection in the switching unit, and storing the measured values measured by the measuring unit for each of the plurality of electronic components.

The sub-processor may include: a main controller configured to control selection of a plurality of electronic components and control storage of measured values by the measurement unit according to a start command of the main processor; A switching controller controlling sequential selection of a plurality of electronic components included in a corresponding group under the control of the main controller; And a memory configured to classify and store the plurality of measurement values measured by the measuring unit for each of the plurality of electronic components under the control of the main controller.

The sub-processor sequentially receives a plurality of measurement values according to a control command for controlling the electronic component sequential selection, and stores the plurality of measurement values sequentially received into memory addresses in order of transmission. Characterized in that.

The sub-processors of the first to n-th measuring devices each transmit a transmission signal including group identification information, electronic component identification information, and a measurement value to the main processor.

According to the present invention, a large number of electronic components such as a multilayer ceramic chip capacitor (MLCC), etc. are grouped into a plurality of groups, and electrical characteristics such as insulation resistance (IR) of the large electronic components are grouped. By performing parallel measurement separately and sequentially measuring in each group, there is an effect that the inspection of the electrical characteristics of the electronic component can be performed more quickly.

Hereinafter, exemplary embodiments of the present invention will be described in detail with reference to the accompanying drawings.

The present invention is not limited to the embodiments described, and the embodiments of the present invention are used to assist in understanding the technical spirit of the present invention. In the drawings referred to in the present invention, components having substantially the same configuration and function will use the same reference numerals.

2 is a block diagram of an apparatus for inspecting electrical characteristics of a mass electronic component according to the present invention.

Referring to FIG. 2, the apparatus for inspecting electrical characteristics of a mass electronic component according to the present invention includes a plurality of first to n-th electronic components grouped by a plurality of preset electronic components ED1 to EDn among a large number of electronic components. A plurality of electronic components included in each of the groups EDG1 to EDGn and the first to nth electronic component groups EDG1 to EDGn in each of the first to nth electronic component groups EDG1 to EDGn. The measurement start of the plurality of first to n-th measuring device (100-1 to 100-n) and the first to n-th measuring device (100-1 to 100-n) for inspecting the electrical characteristics is controlled, The main processor 200 receives the measurement values from the first to n-th measuring devices 100-1 to 100-n and stores and analyzes electrical characteristics of a large amount of electronic components.

Each of the first to n-th measuring devices 100-1 to 100-n includes a plurality of switches SW1 to sequentially supply the inspection signal by sequentially selecting the inspection target electronic component among the plurality of electronic components included in the group. A switching unit 110 including SWn, a measuring unit 120 measuring electrical characteristics of the electronic component selected by the switching unit 110, and the switching unit 110 to sequentially select electronic components. And a sub-processor 130 for controlling and storing the measured values measured by the measuring unit 120 for each of the plurality of electronic components.

3 is a diagram illustrating the configuration of a subprocessor of FIG. 3.

Referring to FIG. 3, the sub processor 130 controls a selection of a plurality of electronic components and controls storage of measured values by the measurement unit 120 according to a start command of the main processor. 131, a switching controller 132 for controlling the sequential selection of a plurality of electronic components included in the group in the switching unit 110 under the control of the main controller 131, and the main controller 131. According to the control of the), the memory unit 133 for storing the plurality of measurement values measured by the measuring unit 120 for each of the plurality of electronic components are stored.

4 is a relationship diagram of the switching control unit 132, the measurement unit 120 and the memory 133 of the present invention. Referring to FIG. 4, the subprocessor 130 controls a plurality of measured values from the measurement unit 120 according to a control command for controlling the electronic component sequential selection S1 to Sn to the switching unit 110. V1 to Vn may be sequentially transmitted, and the plurality of measured values V1 to Vn sequentially transmitted may be divided and stored as memory addresses Add1 to Addn of the memory 133 in the order of transmission.

5 is a configuration diagram of information of a transmission signal according to the present invention.

Referring to FIG. 5, in the subprocessor 130 of each of the first to nth measuring devices 100-1 to 100-n, the transmission signal transmitted to the main processor 200 is group identification information (GID). ), Electronic component identification information (EDID) and measurement value (MV).

Hereinafter, the operation and effects of the present invention will be described in detail with reference to the accompanying drawings.

Referring to FIGS. 2 to 5, the apparatus for inspecting electrical characteristics of mass electronic components according to the present invention will be described. In FIG. 2, the main processor 200 of the present invention includes the first to n-th measuring devices 100-1. Control the measurement start of ~ 100-n). In this case, the electrical characteristics may be obtained by measuring a current flowing through the electronic component, which may be different from each other according to the electronic component. For example, in the case of a multilayer ceramic capacitor (MLCC) May be an insulation resistance IR.

First, each of the first to n-th electronic component groups EDG1 to EDGn of the present invention is grouped by including a plurality of preset electronic components ED1 to EDn among a large number of electronic components.

Each of the first to n-th measuring devices 100-1 to 100-n performs an electrical characteristic test on a plurality of electronic components included in a corresponding group grouped among a large number of electronic components.

For example, the first measuring device 100-1 inspects electrical characteristics of a plurality of electronic parts included in the first electronic component group EDG1, and the second measuring device 100-2 measures the second electronics. The electrical characteristics of the plurality of electronic components included in the component group EDG2 are inspected, and in this manner, the n-th measuring device 100-n includes the plurality of electronic components included in the n-th electronic component group EDGn. Examine the electrical properties for

Thereafter, the main processor 200 receives measurement values from the first to n-th measuring devices 100-1 to 100-n to store and analyze electrical characteristics of a large amount of electronic components.

In this case, each of the first to n-th measuring devices 100-1 to 100-n performs a measurement operation in parallel with each other independently and performs a measurement operation through the same operation process.

Referring to FIG. 2, each of the first to n-th measuring devices 100-1 to 100-n may include a switching unit 110, a measuring unit 120, and a subprocessor 130. In this case, the switching unit 110 sequentially selects an inspection target electronic component among a plurality of electronic components included in the corresponding group and supplies an inspection signal. Here, the test signal may be a current.

The measurement unit 120 measures electrical characteristics of the electronic component selected by the switching unit 110.

The subprocessor 130 controls the electronic component sequential selection to the switching unit 110 and stores the measured values measured by the measuring unit 120 for each of the plurality of electronic components.

The subprocessor 130 will be described in detail with reference to FIGS. 2 and 3.

Referring to FIG. 3, the subprocessor 130 may include a main controller 131, a switching controller 132, and a memory 133. In this case, the main controller 131 may include the main processor. According to the start instruction of, the selection of the plurality of electronic components is controlled.

In this case, the switching controller 132 controls the selection of a plurality of electronic components included in the group in the switching unit 110 under the control of the main controller 131.

The memory 133 stores the plurality of measurement values measured by the measuring unit 120 according to the control of the main control unit 131 for each of the plurality of electronic components.

2, 3 and 4, the relationship between the switching control unit 132, the measurement unit 120 and the memory 133 according to the present invention will be described.

Referring to FIG. 4, the subprocessor 130 controls a plurality of measurement values from the measurement unit 120 according to a control command for controlling the electronic component sequential selection S1 to Sn to the switching unit 110. V1 to Vn may be sequentially transmitted, and the plurality of measured values V1 to Vn sequentially received may be divided and stored as memory addresses Add1 to Addn of the memory 133 in the order of transmission.

For example, when 'ED1' is selected from a plurality of electronic components through the selection signal S1 in the switching unit 110, the memory 133 measures the measured value V1 of the selected electronic component ED1 in the memory 133. Can be stored at the specified address (Add1).

As described above, each of the first to n-th measuring devices 100-1 to 100-n may transmit the measured values for the plurality of electronic components to the main processor 200 together with the information shown in FIG. 5. .

Referring to FIG. 5, each of the sub-processors 130 of the first to n-th measuring devices 100-1 to 100-n includes a group identification information (GID) in a transmission signal to be transmitted to the main processor 200. The electronic component identification information EDID and the measurement value MV may be included.

Accordingly, the main processor 200 uses the first to n-th electronic components by using the group identification information included in the transmission signal received from each of the first to n-th measuring devices 100-1 to 100-n. Groups EDG1 to EDGn may be identified, and electronic components in the group may be identified using the electronic component identification information included in the transmission signal, and a plurality of electronic components may be used using the measured values included in the transmission signal. The measurement for each can be recognized.

According to the present invention as described above, since a large amount of electronic components can be grouped and the inspection work can be performed in parallel, it is possible to inspect the electrical characteristics of a large quantity of electronic components more quickly. The inspection results can be stored in separate units for each electronic component, so they can be systematically managed for future use.

1 is a configuration diagram of an insulation resistance measuring apparatus of a conventional array capacitor.

2 is a block diagram of an electrical characteristic inspection apparatus of a mass electronic component according to the present invention.

3 is a configuration diagram of a subprocessor of FIG. 3.

4 is a relationship diagram of the switching control unit 132, the measurement unit 120 and the memory 133 of the present invention.

5 is a configuration diagram of information of a transmission signal according to the present invention;

Explanation of symbols on the main parts of the drawings

EDG1 to EDGn: 1st to nth electronic component group 100-1 to 100-n: 1st to nth measuring device

110: switching unit 120: measuring unit

130: subprocessor 131: main control unit

132: switching control unit 133: memory

200: main processor SW1 to SWn: multiple switches

Claims (5)

A plurality of first to n-th electronic component groups EDG1 to EDGn grouped into a plurality of electronic components, including a plurality of preset electronic components; A plurality of agents for inspecting electrical characteristics of the plurality of electronic components included in each of the first to n-th electronic component groups EDG1 to EDGn in each of the first to n-th electronic component groups EDG1 to EDGn. 1st-th nth measuring apparatus 100-1-100-n; Control the start of measurement of the first to n-th measuring device (100-1 ~ 100-n), receives the measurement value from the first to n-th measuring device (100-1 ~ 100-n) a large amount of electronic A main processor 200 for storing and analyzing electrical characteristics for the component, Each of the first to n-th measuring devices 100-1 to 100-n is, A switching unit 110 including a plurality of switches SW1 to SWn for sequentially selecting an inspection target electronic component among a plurality of electronic components included in the corresponding group and supplying an inspection signal; A measuring unit 120 measuring electrical characteristics of the electronic component selected by the switching unit 110; And The sub processor 130 controls the electronic component sequential selection to the switching unit 110 and stores the measured values measured by the measuring unit 120 separately for a plurality of electronic components. Electrical property inspection apparatus for a mass electronic component comprising a. delete The method of claim 1, wherein the subprocessor 130, A main control unit 131 for controlling selection of a plurality of electronic components and controlling storage of measured values by the measurement unit 120 according to a start command of the main processor; A switching controller 132 for controlling sequential selection of a plurality of electronic components included in a corresponding group in the switching unit 110 under the control of the main controller 131; And Under the control of the main controller 131, a memory 133 for dividing and storing a plurality of measured values measured by the measuring unit 120 for each of a plurality of electronic components. Electrical property inspection apparatus for a mass electronic component comprising a. The method of claim 1, wherein the subprocessor 130, The plurality of measurement values V1 to Vn are sequentially received and the plurality of measurement values V1 to Vn sequentially transmitted to the switching unit 110 according to a control command for controlling the electronic component sequential selection. Apparatus for inspecting electrical characteristics of bulk electronic components, characterized in that the memory addresses (Add1 ~ Addn) in order to store them. The subprocessor 130 of claim 1, wherein each of the sub-processors 130 of the first to n-th measuring devices 100-1 to 100-n includes: And a transmission signal including group identification information, electronic component identification information, and a measurement value, to the main processor (200).

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