KR100930429B1 - Pad structure of LCD - Google Patents

Abstract

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a pad structure of a liquid crystal display device, and in particular, by forming a test-only pad on the outside of a panel of the liquid crystal display device to efficiently perform an array test and a cell test. The present invention relates to a pad structure of a liquid crystal display device capable of greatly improving the outflow of defects caused by driving. In the pad structure of a liquid crystal display device having a gate pad and a data pad, the pad structure of the liquid crystal display device according to the present invention includes an array at an outer portion of an LCD panel in which the gate pad and the data pad are formed. In order to perform a test and a cell test, a separate test dedicated pad including a separately extended pad part line and a test probe pin contact connected to each of the extended pad part lines is formed.

Description

Pad structure of liquid crystal display {PAD structure of Liquid Crystal Display}

1 is a view showing a test method in a conventional small liquid crystal display device.

2 is a view showing a pad structure of a liquid crystal display device according to the present invention;

3 is an enlarged view of a portion A of FIG. 2;

4A and 4B illustrate a method of forming a line cross portion of a test-only pad in a pad structure of a liquid crystal display according to the present invention.

Explanation of symbols on the main parts of the drawings

10: gate pad 12: gate line

14: common line 20: data pad

22: data line 30: switching TFT

40: test probe pin contact 42: common line signal application

44: gate odd line signal applying unit 46: gate even line signal applying unit

48: blue data line signal applying unit 50: red data line signal applying unit

52: green data line signal applying unit 54: switch TFT unit signal applying unit

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a pad structure of a liquid crystal display, and in particular, an array test and a cell test can be efficiently performed by forming a test-only pad for testing outside the panel of the liquid crystal display. The pad structure of the liquid crystal display device is provided.

In general, in a small liquid crystal display, a test by probe pin contact is not possible due to the pitch limit (particularly, high resolution) of the pad part.

Accordingly, when the test is performed in the conventional small liquid crystal display, as shown in FIG. 1, the array test is omitted, while in the cell test, the gate line of the gate pad 10 and the data pad 20 are separated. The data lines are bundled together to be implemented in a batch drive method.

However, in the case where the array test is omitted as described above and the cell test is performed in a batch driving manner by grouping the gate line of the gate pad 10 and the data line of the data pad 20 together, the color is generated by the batch driving. Due to the impossibility of pattern implementation, the inability to detect line short defects, and the inability to detect dark pixel defects, defect leakage to the module line has occurred.

Therefore, the present invention has been made to solve the problems in the prior art as described above, by forming a test-only pad on the outside of the panel of the liquid crystal display device to efficiently perform the array test and cell test It is an object of the present invention to provide a pad structure of a liquid crystal display device capable of greatly improving the outflow of defects caused by driving.

The pad structure of the liquid crystal display device according to the present invention for achieving the above object, in the pad structure of the liquid crystal display device having a gate pad and a data pad, an array in the outer portion of the LCD panel on which the gate pad and data pad is formed In order to perform a test and a cell test, a separate test-only pad including a separately extended pad portion line and a test probe pin contact portion connected to each of the extended pad portion lines is formed.

Preferably, the test-only pad includes one common line signal applying unit configured by tying a common line (Cst Line) on the array side, and a gate line line with a gate odd line and a gate even line. Two gate line signal applying units configured to bundle each of the three lines; a data line signal applying unit configured to bundle the data line units by data blue line, data red line, and data green line, respectively; and the common line, gate order line, and gate And a switch TFT unit signal applying unit for selectively applying a signal to the switching TFTs formed on the even line, the data blue line, the data red line, and the data green line, respectively.                     

More preferably, the switching TFTs are TFTs of the bundled gate odd line, gate even line and data blue line, data red line, and data green line only when a predetermined voltage is applied through the switch TFT unit signal applying unit for a test. In addition, the switching TFT is formed in the same manner as the TFT process of the pixel, the size can be set in various ways according to the design criteria of the panel and W of the switching TFT The size is characterized by having a value of at least 10um.

The cross section between the common line, the gate odd line, the gate even line, the data blue line, the data red line, and the data green line has a substantially "+" shape to remove a portion of the longitudinal direction in contact with the transverse direction. After the gate metal pattern is formed, an insulating film is deposited on the upper side thereof, and contact holes are formed at the longitudinal ends of the positions adjacent to the transverse direction, and then the transparent electrode pattern ITO is connected so that the pair of contact holes are interconnected. Or a cross portion between the common line, the gate odd line, the gate even line, the data blue line, the data red line, and the data green line forms a gate metal pattern along the transverse direction. An insulating film is deposited on the upper side, and the data metal pattern in the longitudinal direction on the upper side of the insulating layer. Formed is characterized in that is made.

In addition, the position where the test-only pad is formed is characterized in that it is configured to be arbitrarily changed setting in the space portion of the LCD panel outer portion.

(Example)                     

Hereinafter, a pad structure of a liquid crystal display according to the present invention will be described in detail with reference to the accompanying drawings.

2 is a diagram illustrating a pad structure of a liquid crystal display according to the present invention, and FIG. 3 is an enlarged view of portion A of FIG. 2.

According to an exemplary embodiment of the present invention, a pad structure of a liquid crystal display device includes a pad portion line extending separately from an outer portion of an LCD panel on which a gate pad 10 and a data pad 20 are formed, and a test probe pin connected to each of the extended pad portion lines. The test 40 may be formed by forming a separate test dedicated pad including the contact unit 40 and applying a predetermined signal to the gate pad 10 and the data pad 20 through the test dedicated pad.

Here, the test-only pad is provided with a common line signal applying unit 42 formed by tying the common line 14 on the array side as a whole.

In addition, the gate line unit 12 connected to the gate pad 10 region is bundled by the gate odd line and the gate even line, respectively, and includes a gate odd line signal applying unit 44 and a gate even line signal applying unit 46. Gate line signal applying sections are formed.

The data line unit 22 connected to the area of the data pad 20 is bundled for each of the data blue line, the data red line, and the data green line, respectively, so that the blue data line signal applying unit 48 and the red data line signal applying unit 50 are connected. ) And three data line signal applying units constituted by the green data line signal applying unit 52 are formed.                     

In addition, a signal is selectively applied to the test dedicated pads to the switching TFTs 30 formed on the common line 14, the gate order line, the gate even line, the blue data line, the red data line, and the green data line, respectively. One switch TFT unit signal applying unit 54 is formed.

In this case, since the gate odd line, the gate even line, the blue data line, the red data line, and the green data line are bundled in the plurality of lines, when the predetermined signal is applied to the test pad, the bundled line The batch drive will be performed.

Accordingly, the bundled gate odd line, the gate even line, the data blue line, the data red line, and the data green line are in a short state, and thus problems occur in actual display. Therefore, the switch TFT unit signal applying unit 54 Only when the test is performed through the switching TFTs 30 formed in the respective lines can be electrically connected to solve the above problems.

Here, the switching TFTs 30 formed on the common line 14, the gate odd line, the gate even line, the data blue line, the data red line, and the data green line are formed in the same manner as the TFT process of the pixel.

In addition, the size of the switching TFT 30 can be changed and set in accordance with the design criteria of the panel, the W size of the switching TFT 30 is configured to have a value of at least 10um or more.

4A and 4B illustrate a method of forming a line cross portion of a test-only pad in a pad structure of a liquid crystal display according to the present invention, wherein the test-only pad in the pad structure of the liquid crystal display according to the present invention. In forming the cross section between the common line, the gate odd line, the gate even line, the data blue line, the data red line, and the data green line, according to the first embodiment shown in FIG. After forming the gate metal pattern of the substantially "+" shape from which the longitudinal direction was removed, an insulating film is deposited on the gate metal pattern.

Then, a portion of the insulating layer corresponding to the longitudinal end of the position adjacent to the transverse direction of the gate metal pattern is removed to form contact holes, respectively, and then the longitudinal direction of the gate metal pattern of the portion where the respective contact holes are formed. By forming the transparent electrode patterns so that the ends are interconnected, it is possible to form a line cross portion of the test pad.

In addition, according to the second embodiment shown in FIG. 4B, first, a gate metal pattern is formed in the transverse direction, an insulating film is deposited on the gate metal pattern, and a data metal pattern is vertically formed on the insulating film. By forming, the cross portion between the common line, the gate order line, the gate even line, the data blue line, the data red line, and the data green line may be formed.

On the other hand, in the pad structure of the liquid crystal display device according to the present invention, the position where the test pad is formed may be arbitrarily changed and set in the space portion of the panel outer portion.

Referring to the operation of the pad structure of the liquid crystal display device according to the present invention made as described above are as follows.

First, in order to perform a test of a small liquid crystal display using a test dedicated pad formed at an outer portion of the LCD panel, a voltage of several tens of volts is applied to the switch TFT signal applying unit 54 by DC to switch the TFT. 30) shall be in an electrically conducting state.

The common line signal applying unit 42, the gate odd line signal applying unit 44, the gate even line signal applying unit 46, and blue are provided in the state where the switching TFT 30 is electrically conductive. When a signal is applied to the data line signal applying unit 48, the red data line signal applying unit 50, and the green data line signal applying unit 52, the gate odd line, the gate even line, and the data are respectively bundled. While the blue line, the data red line, and the data green line are collectively driven, a predetermined signal is applied to the gate pad 10 and the data pad 20, so that an array test and a cell test can be easily performed.

On the other hand, since the voltage is not applied to the switching TFT 30 during the actual display of the liquid crystal display device configured as described above, the short state of the lines which are tied to each other is released to operate the liquid crystal display device. It will not affect anything.

Here, if the switching TFT 30 for controlling the lines in the bundled state is not provided, a separate process of cutting the lines in the short state by using a laser or the like after the test as described above is necessary. Done.

According to the present invention made as described above, there is an effect that can prevent the failure of the test due to the reduction of the pad pitch in the small liquid crystal display device or the outflow of defects due to the collective driving of the gate pad and the data pad unit.

On the other hand, the present invention is not limited to the above-described specific preferred embodiments, anyone of ordinary skill in the art without departing from the gist of the invention claimed in the claims can be changed and implemented. .

Claims (7)

In the pad structure of a liquid crystal display device provided with a gate pad and a data pad, In the outer portion of the LCD panel where the gate pad and the data pad are formed, a separate test including a separately extended pad portion line and a test probe pin contact connected to each of the extended pad portion lines to perform an array test and a cell test. A dedicated pad is formed, The test dedicated pad One common line signal applying unit configured by collectively tying the common lines on the array side; Two gate line signal applying units configured to bundle the gate line unit by the gate odd line and the gate even line, respectively; Three data line signal applying units each configured to group the data line unit by the data blue line, the data red line, and the data green line, and And a switch TFT unit signal applying unit for selectively applying a signal to the switching TFTs formed on the common line, the gate odd line, the gate even line, the data blue line, the data red line, and the data green line, respectively. Pad structure of the display device. delete The method of claim 1, The switching TFT works by connecting the TFTs of the bundled gate odd line, gate even line and data blue line, data red line, and data green line only when a predetermined voltage is applied through the switch TFT unit signal applying unit for a test. Pad structure of the liquid crystal display device characterized in that it can be. The method of claim 1, The switching TFT is formed in the same manner as the TFT process of the pixel, and the size of the switching TFT can be variously set according to the design criteria of the panel, and the W size of the switching TFT has a value of at least 10 μm or more. Pad structure. The method of claim 1, The cross portion between the common line, the gate odd line, the gate even line, the data blue line, the data red line, and the data green line has a substantially "+" shape to remove a portion of the longitudinal direction in contact with the transverse direction. After the pattern is formed, an insulating film is deposited on the upper side, and contact holes are formed at the longitudinal ends of the positions adjacent to the transverse direction, and then a transparent electrode pattern is formed to interconnect the pair of contact holes. Pad structure of the liquid crystal display device, characterized in that. The method of claim 1, The cross portion between the common line, the gate odd line, the gate even line, the data blue line, the data red line, and the data green line forms a gate metal pattern along a transverse direction, and then an insulating film is deposited on the upper side thereof. A pad structure of a liquid crystal display device, characterized by forming a data metal pattern in a longitudinal direction above an insulating film. The method according to any one of claims 1 or 3 to 6, The pad structure of the liquid crystal display device, characterized in that the position where the test-only pad is formed is configured to be arbitrarily changed and set in the space portion of the LCD panel outer portion.

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