KR100790795B1 - 진공처리장치 - Google Patents
진공처리장치 Download PDFInfo
- Publication number
- KR100790795B1 KR100790795B1 KR1020070013978A KR20070013978A KR100790795B1 KR 100790795 B1 KR100790795 B1 KR 100790795B1 KR 1020070013978 A KR1020070013978 A KR 1020070013978A KR 20070013978 A KR20070013978 A KR 20070013978A KR 100790795 B1 KR100790795 B1 KR 100790795B1
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- South Korea
- Prior art keywords
- chamber
- discharge hole
- baffle
- processing apparatus
- vacuum processing
- Prior art date
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- 239000000758 substrate Substances 0.000 claims abstract description 48
- 238000000034 method Methods 0.000 claims abstract description 13
- 238000009489 vacuum treatment Methods 0.000 claims description 17
- 239000007789 gas Substances 0.000 description 33
- 239000011521 glass Substances 0.000 description 3
- 230000015572 biosynthetic process Effects 0.000 description 2
- 238000000151 deposition Methods 0.000 description 2
- 238000005530 etching Methods 0.000 description 2
- 230000033001 locomotion Effects 0.000 description 2
- 229920000642 polymer Polymers 0.000 description 2
- 239000000919 ceramic Substances 0.000 description 1
- 230000008021 deposition Effects 0.000 description 1
- 230000009545 invasion Effects 0.000 description 1
- 239000011148 porous material Substances 0.000 description 1
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Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/306—Chemical or electrical treatment, e.g. electrolytic etching
- H01L21/3065—Plasma etching; Reactive-ion etching
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
- H01L21/67063—Apparatus for fluid treatment for etching
- H01L21/67069—Apparatus for fluid treatment for etching for drying etching
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
- H01L21/68714—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
- H01L21/68742—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support characterised by a lifting arrangement, e.g. lift pins
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- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Plasma & Fusion (AREA)
Abstract
Description
Claims (7)
- 진공처리를 위한 처리공간이 형성된 챔버와;상기 챔버의 하측에 설치되어 진공처리될 기판이 안착되는 기판지지대와;상기 챔버의 내벽과 상기 기판지지대 사이에 설치되며 하나 이상의 배출공이 형성된 배플과;상기 배출공의 하측에 설치되어 승강 또는 하강에 의하여 상기 배출공의 개구부분을 통한 가스의 유동을 제어하기 위한 가스유동제어부를 포함하는 것을 특징으로 하는 진공처리장치.
- 제 1항에 있어서,상기 가스유동제어부는상기 배출공의 하측에 위치되는 배플판와;상기 배플판과 결합되어 상기 배플판을 승하강시키는 이동모듈을 포함하는 것을 특징으로 하는 진공처리장치.
- 제 2항에 있어서,상기 배플판은 상기 배출공과 중첩되는 면적보다 큰 면적을 가지도록 형성된 것을 특징으로 하는 진공처리장치.
- 제 1항 내지 제 3항 중 어느 하나의 항에 있어서,상기 배출공은 상기 기판지지대의 꼭지점에 대응되는 부근에 하나 이상으로 형성되며,상기 가스유동제어부는 상기 각 배출공에 각각 설치되는 것을 특징으로 하는 진공처리장치.
- 제 1항 내지 제 3항 중 어느 하나의 항에 있어서,상기 배출공은 상기 기판지지대의 측변에 대응되는 부근에 하나 이상으로 형성되며,상기 가스유동제어부는 상기 각 배출공에 각각 설치되는 것을 특징으로 하는 진공처리장치.
- 제 2항에 있어서,상기 이동모듈은일단이 상기 배플판의 저면과 결합되는 이동로드와;상기 챔버의 저면에 관통형성된 관통공의 상측에 설치되며 상단에 상기 이동로드와 결합되는 지지플레이트가 설치되는 벨로우즈부와;상기 지지플레이트의 저면과 결합되는 구동로드와 상기 구동로드를 상승 또는 하강시키는 구동장치를 포함하는 구동부를 포함하는 것을 특징으로 하는 진공처리장치.
- 진공처리를 위한 처리공간이 형성된 챔버와,상기 챔버의 하측에 설치되어 진공처리될 기판이 안착되는 기판지지대와;상기 챔버의 내벽과 상기 기판지지대 사이에 설치되며 하나 이상의 배출공이 형성된 배플과;상기 배플에 형성된 상기 배출공의 저면에 설치되어 회전에 의하여 상기 배출공의 개구부분을 조절하여 상기 개구부의 개구부분을 통한 가스의 유동을 제어하기 위한 가스유동제어부를 포함하는 것을 특징으로 하는 진공처리장치.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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KR1020070013978A KR100790795B1 (ko) | 2007-02-09 | 2007-02-09 | 진공처리장치 |
Applications Claiming Priority (1)
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KR1020070013978A KR100790795B1 (ko) | 2007-02-09 | 2007-02-09 | 진공처리장치 |
Publications (1)
Publication Number | Publication Date |
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KR100790795B1 true KR100790795B1 (ko) | 2008-01-03 |
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Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
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KR1020070013978A KR100790795B1 (ko) | 2007-02-09 | 2007-02-09 | 진공처리장치 |
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KR (1) | KR100790795B1 (ko) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102610543A (zh) * | 2012-01-18 | 2012-07-25 | 清华大学 | 用于内部稀薄气流模拟验证及压力检测的变结构真空腔室 |
KR101522633B1 (ko) * | 2009-04-08 | 2015-05-22 | 주식회사 원익아이피에스 | 진공처리장치 |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR0164922B1 (ko) * | 1994-02-21 | 1999-02-01 | 모리시다 요이치 | 반도체제조장치, 가스공급장치 및 배가스처리장치와 공압기기의 대기개방방법 |
KR20050045360A (ko) * | 2003-11-11 | 2005-05-17 | 주식회사 디엠에스 | 기판의 진공처리장치 |
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2007
- 2007-02-09 KR KR1020070013978A patent/KR100790795B1/ko active IP Right Grant
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR0164922B1 (ko) * | 1994-02-21 | 1999-02-01 | 모리시다 요이치 | 반도체제조장치, 가스공급장치 및 배가스처리장치와 공압기기의 대기개방방법 |
KR20050045360A (ko) * | 2003-11-11 | 2005-05-17 | 주식회사 디엠에스 | 기판의 진공처리장치 |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101522633B1 (ko) * | 2009-04-08 | 2015-05-22 | 주식회사 원익아이피에스 | 진공처리장치 |
CN102610543A (zh) * | 2012-01-18 | 2012-07-25 | 清华大学 | 用于内部稀薄气流模拟验证及压力检测的变结构真空腔室 |
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