KR100672166B1 - 선폭 측정 장치 - Google Patents
선폭 측정 장치 Download PDFInfo
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- KR100672166B1 KR100672166B1 KR1020060026218A KR20060026218A KR100672166B1 KR 100672166 B1 KR100672166 B1 KR 100672166B1 KR 1020060026218 A KR1020060026218 A KR 1020060026218A KR 20060026218 A KR20060026218 A KR 20060026218A KR 100672166 B1 KR100672166 B1 KR 100672166B1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8806—Specially adapted optical and illumination features
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
- G01N2021/8887—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N2021/9513—Liquid crystal panels
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- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Engineering & Computer Science (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Signal Processing (AREA)
- Length Measuring Devices By Optical Means (AREA)
Abstract
Description
Claims (3)
- 복수의 촬상 헤드부와 화상 처리부를 포함하고,상기 촬상 헤드부가 취득한 화상을 상기 화상 처리부가 화상 처리하는 것에 의해 피측정 대상물의 소망하는 부분의 측정 또는 검사를 실행하는 선폭 측정 장치에 있어서,상기 복수의 촬상 헤드부의 위치를 개별적으로 보정하는 위치 보정 수단을 더 포함하되,상기 화상 처리부는, 상기 복수의 촬상 헤드부가 취득한 화상으로부터, 상기 복수의 촬상 헤드부의 위치를 검출하고,상기 위치 보정 수단은, 상기 검출한 위치에 근거하여, 상기 복수의 촬상 헤드부의 위치를 개별적으로 보정하는선폭 측정 장치.
- 시료의 일부를 확대 촬영하는 수단과,동일축 상을 개별적으로 이동할 수 있는 복수의 촬상 헤드부와,촬상하는 시료의 위치를 바꾸기 위한 위치 보정 수단과,상기 촬상한 화상에 대하여 화상 처리를 실행하는 수단과,상기 위치 보정 수단을 동작시키는 제어 수단을 포함하고,상기 시료의 위치 어긋남을 보정하는선폭 측정 장치.
- 시료의 일부를 확대 촬상할 수 있고, 각각 독립적으로 이동할 수 있는 복수의 촬상 헤드부와,상기 시료의 위치를 바꾸기 위한 조작 수단을 포함하는 선폭 측정 장치에 있어서,촬상한 화상에 대하여 화상 처리를 실행하는 기능과, 상기 조작 수단을 컴퓨터 프로그램에 의해 동작시키는 제어 수단에 의해 상기 촬상한 화상으로부터 상기 시료의 치수를 측정하고,시료의 탑재 위치 어긋남을 보정하기 위한 촬상 헤드부의 이동축에 직교하는 방향의 이동 미동 기구와,상기 이동 미동 기구를 제어하는 미동 기구 제어 수단과,시료의 탑재 어긋남을 측정 및 보정하는 위치 보정 수단을 더 포함하여,하나의 촬상 헤드부를 기준으로, 다른 촬상 헤드부의 위치를 이동하여 화상 저장 위치를 보정하는선폭 측정 장치.
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JPJP-P-2005-00112241 | 2005-04-08 | ||
JP2005112241 | 2005-04-08 | ||
JPJP-P-2006-00035164 | 2006-02-13 | ||
JP2006035164 | 2006-02-13 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20060107297A KR20060107297A (ko) | 2006-10-13 |
KR100672166B1 true KR100672166B1 (ko) | 2007-01-19 |
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Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020060026218A KR100672166B1 (ko) | 2005-04-08 | 2006-03-22 | 선폭 측정 장치 |
Country Status (2)
Country | Link |
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KR (1) | KR100672166B1 (ko) |
TW (1) | TWI282404B (ko) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5138268B2 (ja) * | 2006-06-14 | 2013-02-06 | 株式会社タニタ | 寸法測定装置 |
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2006
- 2006-03-22 KR KR1020060026218A patent/KR100672166B1/ko active IP Right Grant
- 2006-04-04 TW TW095111937A patent/TWI282404B/zh active
Also Published As
Publication number | Publication date |
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KR20060107297A (ko) | 2006-10-13 |
TWI282404B (en) | 2007-06-11 |
TW200643368A (en) | 2006-12-16 |
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