KR100638915B1 - 광학소자 및 이것을 사용한 방사선 검출기 - Google Patents
광학소자 및 이것을 사용한 방사선 검출기 Download PDFInfo
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- KR100638915B1 KR100638915B1 KR1020017007382A KR20017007382A KR100638915B1 KR 100638915 B1 KR100638915 B1 KR 100638915B1 KR 1020017007382 A KR1020017007382 A KR 1020017007382A KR 20017007382 A KR20017007382 A KR 20017007382A KR 100638915 B1 KR100638915 B1 KR 100638915B1
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- optical
- scintillator
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- radiation detector
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- 230000003287 optical effect Effects 0.000 title claims abstract description 127
- 230000005855 radiation Effects 0.000 title claims abstract description 58
- 239000000853 adhesive Substances 0.000 claims abstract description 30
- 230000001070 adhesive effect Effects 0.000 claims abstract description 19
- 230000001681 protective effect Effects 0.000 claims abstract description 10
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- VRBFTYUMFJWSJY-UHFFFAOYSA-N 28804-46-8 Chemical compound ClC1CC(C=C2)=CC=C2C(Cl)CC2=CC=C1C=C2 VRBFTYUMFJWSJY-UHFFFAOYSA-N 0.000 description 1
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Images
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
- G01T1/2002—Optical details, e.g. reflecting or diffusing layers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
- G01T1/2018—Scintillation-photodiode combinations
- G01T1/20185—Coupling means between the photodiode and the scintillator, e.g. optical couplings using adhesives with wavelength-shifting fibres
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
- G01T1/2018—Scintillation-photodiode combinations
- G01T1/20188—Auxiliary details, e.g. casings or cooling
- G01T1/20189—Damping or insulation against damage, e.g. caused by heat or pressure
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Life Sciences & Earth Sciences (AREA)
- High Energy & Nuclear Physics (AREA)
- Molecular Biology (AREA)
- Health & Medical Sciences (AREA)
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Electromagnetism (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Measurement Of Radiation (AREA)
Abstract
Description
Claims (16)
- 복수의 광 파이버를 서로 평행하게 배치하여 일체로 성형되고, 서로 평행한 입사단면, 출사단면을 갖는 평판 형상의 광학 부재를 복수 가지며,상기 광학 부재는 상기 입사단면 각각이 동일 평면 상에 배치되도록 배열되며,서로 인접하는 상기 광학 부재의 측면 각각은 접착제에 의해 접착되며,상기 측면을 서로 접착함으로써 복수의 광학 부재가 일체화되고, 복수의 광학 부재의 상기 입사단면과 그것들을 접착하는 접착제를 포함하여 형성된 동일 평면상에, 방사선의 입사에 따라 광을 발하는 신틸레이터가 퇴적되어 있는 것을 특징으로 하는 광학 소자.
- 제 1 항에 있어서,상기 신틸레이터는 기상 성장에 의해 성장되어 있는 것을 특징으로 하는 광학 소자.
- 제 2 항에 있어서,상기 신틸레이터는 기둥 형상으로 성장된 기둥 형상 구조체의 배열로 이루어지는 것을 특징으로 하는 광학 소자.
- 제 1 항 내지 제 3 항 중 어느 한 항에 있어서,상기 신틸레이터는 X선의 입사에 따라 가시 광을 발산하는 신틸레이터인 것을 특징으로 하는 광학 소자.
- 제 1 항 내지 제 3 항 중 어느 한 항에 있어서,상기 신틸레이터는 X선의 입사에 따라 자외 광을 발산하는 신틸레이터인 것을 특징으로 하는 광학 소자.
- 제 1 항 내지 제 3 항 중 어느 한 항에 있어서,상기 신틸레이터는 CsI를 포함하여 구성되는 것을 특징으로 하는 광학 소자.
- 제 1 항 내지 제 3 항 중 어느 한 항에 있어서,상기 접착제는 방사선의 입사에 따라 상기 신틸레이터에서 생기며, 상기 접착제에 입사하는 광을 흡수하는 접착제인 것을 특징으로 하는 광학 소자.
- 삭제
- 삭제
- 삭제
- 삭제
- 제 1 항 내지 제 3 항 중 어느 한 항에 있어서,상기 신틸레이터 상에 보호막이 형성되어 있는 것을 특징으로 하는 광학 소자.
- 제 12 항에 있어서,상기 보호막은 상기 신틸레이터에 접하도록 형성된 폴리파라키실렌으로 이루어지는 내습 보호층을 포함하여 형성되는 것을 특징으로 하는 광학 소자.
- 제 12 항에 있어서,상기 보호막은 상기 신틸레이터에 접하도록 형성된 폴리파라클로로키실렌으로 이루어지는 내습 보호층을 포함하여 형성되는 것을 특징으로 하는 광학 소자.
- 제 1 항 내지 제 3 항 중 어느 한 항에 기재된 광학 소자와, 상기 광학 부재의 상기 출사단면으로부터 출력되는 광 이미지를 촬상하는 촬상 소자를 구비한 것을 특징으로 하는 방사선 검출기.
- 제 15 항에 있어서,상기 광학 부재의 상기 출사단면으로부터 출력되는 광 이미지를 상기 촬상 소자로 유도하는 도광용 광학 부재를 부가로 구비한 것을 특징으로 하는 방사선 검출기.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/JP1998/005645 WO2000036436A1 (fr) | 1998-12-14 | 1998-12-14 | Element optique et detecteur de rayonnement mettant ce dernier en application |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20010108017A KR20010108017A (ko) | 2001-12-07 |
KR100638915B1 true KR100638915B1 (ko) | 2006-10-25 |
Family
ID=14209604
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020017007382A KR100638915B1 (ko) | 1998-12-14 | 1998-12-14 | 광학소자 및 이것을 사용한 방사선 검출기 |
Country Status (7)
Country | Link |
---|---|
US (1) | US6781131B2 (ko) |
EP (1) | EP1148349A4 (ko) |
JP (1) | JP3582825B2 (ko) |
KR (1) | KR100638915B1 (ko) |
CN (1) | CN1160581C (ko) |
AU (1) | AU1507399A (ko) |
WO (1) | WO2000036436A1 (ko) |
Families Citing this family (29)
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US6800836B2 (en) * | 2000-07-10 | 2004-10-05 | Canon Kabushiki Kaisha | Image pickup device, radiation image pickup device and image processing system |
JP4447752B2 (ja) | 2000-08-03 | 2010-04-07 | 浜松ホトニクス株式会社 | 放射線検出器 |
JP4283427B2 (ja) | 2000-08-03 | 2009-06-24 | 浜松ホトニクス株式会社 | 放射線検出器およびシンチレータパネル |
US6800857B2 (en) * | 2000-08-10 | 2004-10-05 | Canon Kabushiki Kaisha | Large-area fiber plate, radiation image pickup apparatus utilizing the same and producing method therefor |
JP4693297B2 (ja) * | 2000-08-10 | 2011-06-01 | キヤノン株式会社 | 放射線撮像装置および放射線撮像システム |
AU2001284525A1 (en) * | 2000-09-11 | 2002-03-26 | Hamamatsu Photonics K.K. | Scintillator panel, radiation image sensor and methods of producing them |
CN1264026C (zh) * | 2001-01-30 | 2006-07-12 | 浜松光子学株式会社 | 闪烁器板及射线图象传感器 |
JP4647828B2 (ja) * | 2001-05-07 | 2011-03-09 | 浜松ホトニクス株式会社 | シンチレータパネルおよびそれを用いた放射線検出器 |
US6720561B2 (en) * | 2001-12-06 | 2004-04-13 | General Electric Company | Direct CsI scintillator coating for improved digital X-ray detector assembly longevity |
KR100467237B1 (ko) * | 2001-12-07 | 2005-01-24 | 한국수력원자력 주식회사 | Ccd 영상 소자만을 이용한 감마/x선원 탐지장치 및그 방법 |
JP4138529B2 (ja) | 2003-02-24 | 2008-08-27 | 浜松ホトニクス株式会社 | 半導体装置、及びそれを用いた放射線検出器 |
EP1861733B1 (en) | 2005-03-16 | 2016-03-09 | Philips Intellectual Property & Standards GmbH | X-ray detector with in-pixel processing circuits |
US7214947B2 (en) * | 2005-03-25 | 2007-05-08 | General Electric Company | Detector assembly and method of manufacture |
US8299436B2 (en) * | 2005-06-29 | 2012-10-30 | General Electric Company | High energy resolution scintillators having high light output |
US7405406B1 (en) | 2006-04-21 | 2008-07-29 | Radiation Monitoring Devices, Inc. | Two-sided scintillation detectors and related methods |
US7375341B1 (en) * | 2006-05-12 | 2008-05-20 | Radiation Monitoring Devices, Inc. | Flexible scintillator and related methods |
JP5206410B2 (ja) * | 2006-09-05 | 2013-06-12 | コニカミノルタエムジー株式会社 | シンチレータパネル |
US8232531B2 (en) * | 2007-03-29 | 2012-07-31 | Varian Medical Systems, Inc. | Corrosion barrier layer for photoconductive X-ray imagers |
US7723687B2 (en) * | 2007-07-03 | 2010-05-25 | Radiation Monitoring Devices, Inc. | Lanthanide halide microcolumnar scintillators |
US8426823B2 (en) | 2007-08-22 | 2013-04-23 | Koninklijke Philips Electronics N.V. | Reflector and light collimator arrangement for improved light collection in scintillation detectors |
JP5883556B2 (ja) * | 2010-06-04 | 2016-03-15 | 浜松ホトニクス株式会社 | 放射線イメージセンサ |
JP2012047487A (ja) | 2010-08-24 | 2012-03-08 | Hamamatsu Photonics Kk | 放射線検出器 |
JP2012172971A (ja) * | 2011-02-17 | 2012-09-10 | Konica Minolta Medical & Graphic Inc | シンチレータパネル、その製造方法、フラットパネルディテクタ及びその製造方法 |
DE102011080892B3 (de) * | 2011-08-12 | 2013-02-14 | Siemens Aktiengesellschaft | Röntgenstrahlungsdetektor zur Verwendung in einem CT-System |
CN103445797B (zh) * | 2012-05-31 | 2016-10-05 | Ge医疗系统环球技术有限公司 | X射线检测器及x射线成像设备 |
CN106653778B (zh) * | 2016-12-29 | 2024-03-01 | 同方威视技术股份有限公司 | 辐射探测器组件及其制造方法 |
CN108387923B (zh) * | 2018-03-15 | 2023-10-20 | 西北核技术研究所 | 带有光子晶体层的封装式闪烁体及闪烁探测器 |
JP7046698B2 (ja) * | 2018-04-24 | 2022-04-04 | 浜松ホトニクス株式会社 | 放射線検出器、放射線検出器の製造方法、及び画像処理方法 |
CN109545810A (zh) * | 2018-11-20 | 2019-03-29 | 京东方科技集团股份有限公司 | 一种平板探测器及其制备方法 |
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JPH09197051A (ja) * | 1995-11-21 | 1997-07-31 | Loral Fairchild Corp | Ccdベースのx線イメージセンサシステム |
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-
1998
- 1998-12-14 AU AU15073/99A patent/AU1507399A/en not_active Abandoned
- 1998-12-14 EP EP98959199A patent/EP1148349A4/en not_active Withdrawn
- 1998-12-14 JP JP2000588621A patent/JP3582825B2/ja not_active Expired - Fee Related
- 1998-12-14 KR KR1020017007382A patent/KR100638915B1/ko active IP Right Grant
- 1998-12-14 WO PCT/JP1998/005645 patent/WO2000036436A1/ja active IP Right Grant
- 1998-12-14 CN CNB988143860A patent/CN1160581C/zh not_active Expired - Lifetime
-
2001
- 2001-06-13 US US09/879,062 patent/US6781131B2/en not_active Expired - Lifetime
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH09197051A (ja) * | 1995-11-21 | 1997-07-31 | Loral Fairchild Corp | Ccdベースのx線イメージセンサシステム |
Also Published As
Publication number | Publication date |
---|---|
WO2000036436A1 (fr) | 2000-06-22 |
KR20010108017A (ko) | 2001-12-07 |
US6781131B2 (en) | 2004-08-24 |
CN1160581C (zh) | 2004-08-04 |
US20020005489A1 (en) | 2002-01-17 |
AU1507399A (en) | 2000-07-03 |
EP1148349A4 (en) | 2003-07-09 |
EP1148349A1 (en) | 2001-10-24 |
CN1342268A (zh) | 2002-03-27 |
JP3582825B2 (ja) | 2004-10-27 |
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