KR100589109B1 - 전자 디스플레이 화질 검사 장치 - Google Patents

전자 디스플레이 화질 검사 장치 Download PDF

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Publication number
KR100589109B1
KR100589109B1 KR1020020049125A KR20020049125A KR100589109B1 KR 100589109 B1 KR100589109 B1 KR 100589109B1 KR 1020020049125 A KR1020020049125 A KR 1020020049125A KR 20020049125 A KR20020049125 A KR 20020049125A KR 100589109 B1 KR100589109 B1 KR 100589109B1
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KR
South Korea
Prior art keywords
electronic display
image
imaging
pixels
moving
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Expired - Fee Related
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KR1020020049125A
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English (en)
Korean (ko)
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KR20030016187A (ko
Inventor
와타누키아키오
Original Assignee
가부시키가이샤 히다치 고쿠사이 덴키
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Publication of KR20030016187A publication Critical patent/KR20030016187A/ko
Application granted granted Critical
Publication of KR100589109B1 publication Critical patent/KR100589109B1/ko
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    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N17/00Diagnosis, testing or measuring for television systems or their details
    • H04N17/004Diagnosis, testing or measuring for television systems or their details for digital television systems
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N17/00Diagnosis, testing or measuring for television systems or their details
    • H04N17/04Diagnosis, testing or measuring for television systems or their details for receivers
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N5/00Details of television systems
    • H04N5/14Picture signal circuitry for video frequency region
    • H04N5/21Circuitry for suppressing or minimising disturbance, e.g. moiré or halo

Landscapes

  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Health & Medical Sciences (AREA)
  • Biomedical Technology (AREA)
  • General Health & Medical Sciences (AREA)
  • Testing, Inspecting, Measuring Of Stereoscopic Televisions And Televisions (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
  • Manufacture Of Electron Tubes, Discharge Lamp Vessels, Lead-In Wires, And The Like (AREA)
KR1020020049125A 2001-08-20 2002-08-20 전자 디스플레이 화질 검사 장치 Expired - Fee Related KR100589109B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JPJP-P-2001-00248554 2001-08-20
JP2001248554A JP2003061115A (ja) 2001-08-20 2001-08-20 電子ディスプレイ画質検査装置

Publications (2)

Publication Number Publication Date
KR20030016187A KR20030016187A (ko) 2003-02-26
KR100589109B1 true KR100589109B1 (ko) 2006-06-13

Family

ID=19077697

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020020049125A Expired - Fee Related KR100589109B1 (ko) 2001-08-20 2002-08-20 전자 디스플레이 화질 검사 장치

Country Status (3)

Country Link
JP (1) JP2003061115A (enExample)
KR (1) KR100589109B1 (enExample)
CN (1) CN1283109C (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105699049A (zh) * 2016-01-08 2016-06-22 深圳控石智能系统有限公司 一种自动图像质量检测机具及其使用方法

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN100477062C (zh) * 2003-11-27 2009-04-08 松下电器产业株式会社 等离子体显示器面板的点亮检查方法
CN100344164C (zh) * 2004-11-03 2007-10-17 南京Lg同创彩色显示系统有限责任公司 等离子显示器画质测试器
KR20060044032A (ko) * 2004-11-11 2006-05-16 삼성전자주식회사 표시패널용 검사 장치 및 이의 검사 방법
KR100763019B1 (ko) * 2005-03-31 2007-10-02 윈텍 주식회사 평판표시장치의 화질 검사 시스템 및 그 방법
US7508994B2 (en) * 2005-12-05 2009-03-24 Eastman Kodak Company Method for detecting streaks in digital images
JP4956009B2 (ja) * 2006-02-02 2012-06-20 キヤノン株式会社 撮像装置及びその制御方法
JPWO2010146733A1 (ja) * 2009-06-18 2012-11-29 シャープ株式会社 表示パネルの欠陥検査方法および欠陥検査装置
JP5335614B2 (ja) * 2009-08-25 2013-11-06 株式会社日本マイクロニクス 欠陥画素アドレス検出方法並びに検出装置
CN102622950B (zh) * 2012-04-23 2014-10-22 江苏省计量科学研究院 一种医用显示器均匀性的检测方法及装置
CN110166765B (zh) * 2019-05-10 2021-04-13 苏州科达科技股份有限公司 一种花屏检测方法、电子设备及可读存储介质
JP7621739B2 (ja) * 2020-03-04 2025-01-27 日本発條株式会社 検査システムの点検方法、検査システム、およびコンピュータプログラム。

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH08178797A (ja) * 1994-12-22 1996-07-12 Casio Comput Co Ltd フラットパネルディスプレイの表示欠陥抽出方法及びそのための装置
JP2000338000A (ja) * 1999-03-23 2000-12-08 Hitachi Ltd 電子ディスプレイ装置の画素欠陥検査方法、および、電子ディスプレイ装置の製造方法

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH08178797A (ja) * 1994-12-22 1996-07-12 Casio Comput Co Ltd フラットパネルディスプレイの表示欠陥抽出方法及びそのための装置
JP2000338000A (ja) * 1999-03-23 2000-12-08 Hitachi Ltd 電子ディスプレイ装置の画素欠陥検査方法、および、電子ディスプレイ装置の製造方法

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105699049A (zh) * 2016-01-08 2016-06-22 深圳控石智能系统有限公司 一种自动图像质量检测机具及其使用方法

Also Published As

Publication number Publication date
JP2003061115A (ja) 2003-02-28
CN1407814A (zh) 2003-04-02
KR20030016187A (ko) 2003-02-26
CN1283109C (zh) 2006-11-01

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