KR100582233B1 - Single body probe block combined use as combination and separation - Google Patents

Abstract

The present invention relates to an integrated probe block that combines detachment, and the technical gist of the present invention is that the housing block constituting the probe block can be detached from the joint plate, and the probe block including the TCP block can be used as an integral type of assembly for the probe. In case of pin problem, the housing block can be detached and attached, and the probe pin and TAB IC input terminal of the TCP block are quickly responded to the correct position by the guide. Relates to a probe block.

To this end, the present invention in the probe block 100 formed to couple them to interconnect the electrical signals of the housing block 110 and the TCP block 120, the body is formed in a stepped plate-like step spaced apart up and down Meanwhile, a plurality of coupling holes 131a and 131b and guide grooves 131c are spaced apart from each other in the upper fastening plate 131 of the stairs so that the mounting plate 140 together with the housing block 110 may be simultaneously detached. The lower fixing plate 132 of the stairs is provided with a joint plate 130 in which a separate adhesive hole 132a is installed to be coupled to the TCP block 120.

Therefore, the integral probe block that combines the detachability of the present invention is formed as a separate type and a one-piece type, which can reduce costs by repairing and replacing them individually when a problem occurs in the housing block including the probe pins, as well as when replacing the probe. Quickly locating the TAB IC inputs of pins and TCP blocks provides excellent workability.

LCD display, probe unit, probe block, probe, TCP block, joint plate

Description

SINGLE BODY PROBE BLOCK COMBINED USE AS COMBINATION AND SEPARATION}

1 is a block diagram of a probe unit for inspecting a liquid crystal display according to the present invention;

2 is an exploded perspective view of a probe block according to the present invention;

3 is a side view of a probe block according to the present invention;

4 is a bottom perspective view of a joint plate according to the present invention;

5 is a block diagram showing an inspection process according to the present invention;

6 is an exploded perspective view of a conventional invention,

7 is a side view of a conventional invention.

-Explanation of symbols for the main parts of the drawings-

100 ... probe block 110 ... housing block

120 ... TCP block 130 ... Joint plate

140 ... mount plate

The present invention relates to an integrated probe block that combines detachment, and the technical gist of the present invention is that the housing block constituting the probe block can be detached from the joint plate, and the probe block including the TCP block can be used as an integral type of assembly for the probe. In case of pin problem, the housing block can be detached and attached, and the probe pin and the TAB IC input terminal of the TCP block can be quickly replaced in place by the guide. It's about blocks.

In general, the probe unit is used to test the electrical properties of a test object such as a liquid crystal display panel.

In this case, the liquid crystal display panel or the like is a structure in which two array substrates and a color substrate are bonded to each other with the liquid crystals interposed therebetween, and display an electro-optical characteristic of the liquid crystals by a voltage applied from the outside.

The liquid crystal display panel and the like undergo a fire inspection test to check for the presence of defects (eg, pixel error-defect, pre-defect, stain, etc.) that may occur in the manufacturing process before the product is manufactured.

As such inspection methods, the lighting inspection using a probe unit is mainly used for disconnection inspection and color inspection of a liquid crystal display panel line.

In this case, the probe unit includes a probe block, which is a collection of probe pins for applying a test signal to a plurality of electrodes positioned at an edge of the liquid crystal display panel, and a TAB IC (Taped Automated Bonding Integrated) which is connected to the probe block and transmits an electrical signal. Circuit), a signal generator (Pattern Generator) for generating a predetermined signal for testing the LCD panel, and a Source / Gate PCB unit for dividing it into X, Y Line and delivering to the TAB IC.

These probe units include liquid crystal display panels such as thin film transistor (TFT), twisted nematic (TN), super twisted nematic (STN), color super twisted nematic (CSTN), double super twisted nematic (DSTN) types, and organic EL Luminescence Type Display panels are used to check that they operate normally without pixel errors.

These LCD display panels are being developed with higher resolution. This means that high density dot display per unit area is accepted, and to test this, the high density contact medium is driven. The connection is made between the panel and the drive IC (TAB IC).

In this case, the contact medium is called an LCD probe block. In general, until now, it has been composed of 60μm pitch block and probe block, but for medium and large probe block, it is required for products that can pitch up to 50 ~ 40㎛, and small size up to 35μm. have.

On the other hand, for the reliable test of the above-described liquid crystal display panel, it is necessary to obtain an appropriate contact resistance through the appropriate physical pressure between the electrode of the LCD panel and the probe block, it is essential to ensure the insulation between the individual probe in the probe block.

In addition, as the liquid crystal display panel becomes higher in recent years, the density of pixels is continuously increasing, and thus the necessity of high density probe blocks is increasing day by day.

Such a conventional probe block has been continuously developed by those skilled in the art in recent years, and thus is largely divided into an integrated type and a separated type, and a description thereof is as follows.

<Separate probe block>

6 to 7, a signal generator for generating a predetermined signal for testing the LCD, the pogo block (1) and FPC (receiving an electrical signal from the signal generator through the Source PCB and Gate PCB) 2), a TCP block (3) for transmitting the received electrical signal to an input terminal, a separate probe block (4) contacting an electrode of the LCD to apply an electrical signal for a test, and the separate probe block (4) And the TCP block (3) are combined, while the probe pin of the separate probe block (4) is largely composed of a mounting plate (5) for adjusting to contact the electrodes of the LCD at a suitable physical pressure.

At this time, the detachable probe block 4 is separated from the housing block and the TCP block 4 separately, and in use, the TCP block is already fixed to the mounting plate 5 side, and the housing block is fitted therein, and then the probe of the housing block Pins are formed to be seated on the Tap IC Pad exactly within the input of the TCP block 4.

However, when the detachable probe block 4 is coupled with the housing block to the TCP block, the probe pin and the input terminal of the TCP block are difficult to be coupled at the correct position, and the replacement of the probe block 4 takes a long time to set it. There is a problem that makes it difficult to work.

<Integrated Probe Block>

In order to improve the above-described problem of the separate probe block, the housing block is formed so as not to be attached or detached from the joint plate, thereby fundamentally eliminating the problem that the probe pins of the conventional housing block cannot be easily seated in the TCP block input terminal groove.

However, by combining the housing block and the TCP block integrally, soldering or permanently fixing the probe pin to the Tab IC Pad, the entire probe cannot be detached from the TCP block even when a problem occurs in the probe pin. The problem of having to discard the block is causing the cost increase.

The present invention is to solve the above-mentioned problems, the housing block constituting the probe block can be attached and detached from the joint plate, while the combination of the probe block including the TCP block as an integral form of the assembly, when the problem of the probe pin housing block The purpose of the present invention is to provide an integrated probe block that can be detached and attached, and that the probe pin and the TCP block input terminal according to the replacement can be quickly corresponded to the home position by the guide for easy adjustment of fine gap. have.

In order to achieve the above object, the present invention, in the probe block 100 formed to couple them to interconnect the electrical signals of the housing block 110 and TCP block 120, the body is formed in a stepped plate shape While being spaced up and down, a plurality of coupling holes 131a and 131b and guide grooves 131c are attached to the upper fastening plate 131 of the stairs so that the mounting plate 140 together with the housing block 110 can be simultaneously removed. The joint plate 130 is provided at a position spaced apart from each other, and a separate adhesive hole 132a is attached to the lower fixing plate 132 of the stairs to be coupled to the TCP block 120.

In this case, the joint plate 130 may fix the housing block 110 and the TCP block 120 integrally, and the upper fastening plate so that the housing block 110 may be detached and attached from the joint plate 130. The plurality of uneven parts 131d formed on the bottom of the 131 are inserted to correspond to the top uneven part groove 111d of the housing block, while the one coupling hole 131a of the upper fastening plate and the fastening groove 111a of the housing block. Correspondingly, it is preferable to guide the probe pin 112 of the housing block and the TAB IC input terminal 121 groove of the TCP block to be exactly positioned at the time of coupling.

The following describes the invention in more detail with reference to the accompanying drawings.

First, as shown in Figures 1 to 5, the device configuration of the present invention is a pattern generator (10) which is a PC or signal generator including a VGA graphics card, and the electrical power through the cable from the PC or signal generator (10) While receiving a signal, the BUFFER BOARD 20 converts the incoming voltage of the power supply unit into a used voltage, and the gate / source that divides the electrical signal drawn from the BUFFER BOARD 20 into X and Y lines and transmits them to the TAB IC. Taped Automated Bonding Integrated Circuit (TAB IC) for connecting and transmitting electrical signals through the PCB unit 30 and 40, the gate / source PCB unit 30 and 40 with the probe block 100, and from the TAB IC. The probe block 100 is largely composed of a probe pin 112 that receives electrical signals and applies a test signal to a plurality of electrodes positioned at the edge of the liquid crystal display panel 50.

In this case, the probe block 100 allows the gate PCB 30 and the source PCB 40 to be electrically connected to the FPC block 122, while one end is connected to the probe pin 112 of the housing block. Block 120; A housing block (110) contacting an electrode of the liquid crystal display panel (50) through an electrical connection of the TCP block (120) to apply an electrical signal for pixel error test; It is largely composed of a joint plate 130 formed to couple them to interconnect the electrical signals of the TCP block 120 and the housing block 110.

The TCP block 120 is formed so that one end is in contact with the probe pin 112 of the housing block 110, while the other end receives an electrical signal generated from the Gate PCB 30 or the Source PCB 40 to conduct. The FPC block 122 is formed on one side thereof so that the body is fixed to one side fixing plate 132 of the joint plate 130.

The housing block 110 may include a house 111 having a lower opening, a plurality of probe pins 112 received and fixed to the opened lower portion of the house 111, and the probe pin 112 with a house 111. The fitting hole is provided so that the side plate 113 is fixed to both side ends on which the support shaft 114 is installed to be fixed to the coupling shaft. Is done.

At this time, it is preferable that the uneven portion groove 111d corresponding to the uneven portion 131d of the joint plate is formed on the upper surface of the house 111. This is to allow the operator to quickly check the coupling point.

The joint plate 130 is formed of a synthetic resin material that is an insulator, and the TCP block 120 and the housing block 110 can be fixed integrally, while the housing block 110 is detached from the joint plate 130. The body of the one-piece is spaced up and down to form a plate-shaped staircase, so that the plurality of coupling holes 131a to be simultaneously coupled to the mounting plate 140 together with the housing block 110 in the upper fastening plate 131 of the staircase , 131b), the guide groove 131c is provided at a position spaced apart from each other, the lower fixing plate 132 of the staircase is provided with a separate adhesive hole 132a to be coupled to the TCP block 120.

At this time, the fitting jaw 135 is formed on the bottom of one side of the joint plate 130 due to the difference in height between the upper fastening plate 131 and the lower fixing plate 132. Precision machining to the set value.

As the housing block 110 is detached and attached to the fitting jaw 135, the contact between the probe pin 112 and the TAB IC input terminal 121 is provided with a constant pressure (Over Drive) at the time of coupling, thereby stably providing an electrical signal. The key to energizing is to prevent the fastener 150 that promotes such pressure from being excessively lowered or raised, thereby preventing the electrical signal from being properly energized.

In addition, the upper fastening plate 131 of the joint plate 130 to be coupled to the corresponding coupling groove 111a and the recessed grooves 111d of the housing block, while fastening the hole to quickly guide the correct setting point 131a and the uneven portion 131d are provided.

This is for guiding the probe pin 112 of the housing block to be accurately seated when inserted into the TAB IC input terminal 121 of the TCP block so that a tolerance gap does not occur.

Therefore, the probe block 100 of the present invention can confirm in advance a certain pressure (Over Driver) and the position of the connection portion of the Tab IC input terminal 121, and the wiring of the connection portion is connected or a partial probe pin 112 defect. It can be detached and attached when repairing due to the effect of separation and integration.

In this case, the TCP block 120 fixed to the lower fixing plate 132 of the joint plate 130 is coupled by an adhesive sphere 132a, and the adhesive sphere 132a is preferably formed of an adhesive tape.

This is because in fixing the TCP block 120 to the lower fixing plate 132 of the joint plate 130, while achieving insulation, the manufacturing process is easy and the production cost is low.

Next will be described an embodiment of the present invention by the above-described configuration.

As shown in FIG. 5, the flow of the liquid crystal display panel 50 inspection process includes transmitting electrical signals from a PC or a signal generator 10 including a VGA graphic card;

Receiving an electrical signal from the PC or the signal generator 10 via a cable, while converting the incoming voltage of the power supply unit to the working voltage through the BUFFER BOARD (20),

Dividing the electrical signal drawn from the BUFFER BOARD 20 into X and Y lines through the source / gate PCB units 30 and 40 and transferring the TAB IC to the TAB IC of the TCP block 120;

Connecting and transmitting an electrical signal through the source / gate PCB unit with the probe block 100 through a tapped automated bonding integrated circuit (TAB IC);

Receiving an electrical signal from the TAB IC is a step of applying a test signal to the plurality of electrodes located on the edge of the liquid crystal display panel 50 through the probe block 100 which is a collection of probe pins.

In this case, the probe block 100 is a housing block 110, the TCP block 120 and the joint plate 130 for coupling the joint plate 130 and the joint block 130 and the housing block ( After the 110 is positioned in turn, it is coupled by a separate fastener 141 to inspect the liquid crystal display 50.

At this time, when the work to be repaired or replaced by removing the housing block 110 from the joint plate 130 due to the problem of the probe pin 112, to facilitate the coupling of the joint plate 130 and the housing block 110 Loosen the fastener 150 that is to release the above-described coupling.

Subsequently, upon recombination of the normalized housing block 110 to the joint plate 130 through repair or replacement of the probe pins 112, the operator accurately matches the grooves of the probe pins 112 with the TAB IC input terminal 121. The key to be inserted, as well as to be bite at an appropriate pressure when fastening, this is the coupling hole 131a and concave-convex portion (131d) of the joint plate 130 and the fastening groove (111a) of the housing block 110 And by fixing the concave-convex groove 111d correspondingly, it is possible to quickly work on the positioning.

In addition, the circuit of the probe pin 112 and the TAB IC input terminal 121 is higher than the set pressure even if the fastener 135 is excessively tightened or pressured by the preset fitting height 135 of the joint plate 130. Is formed so that it is not excessively contacted.

Due to this joint plate 130, the probe pin 112 of the housing block and the TAB IC input terminal 121 of the TCP block can be quickly combined in the correct position, and the probe pin 112 by tightening both blocks at an appropriate pressure. ) And the TAB IC input terminal 121 are induced to be in contact with the optimum state.

As such, the reference fastening groove 111a of the housing block and the reference coupling hole 131a of the joint plate are pre-machined to precisely correspond to each other, so that the respective probe pins 112 are quickly positioned at the tab IC input terminal 121 position. On the other hand, it is formed so as to avoid excessive pressure due to the set height of the fitting jaw 135 even if the desired amount of pressure (Over Drive / Pin length) is applied during coupling.

As described above, the present invention is to form a probe block in the form of a separate and integral bar, which, in the event of a problem of the housing block including the probe pin, to reduce the cost by repairing and replacing them individually, as well as to replace the probe when the housing block Quickly locating the TAB IC inputs of pins and TCP blocks provides excellent workability.

Claims (2)

delete In the probe block 100 formed so that the probe pin 112 of the housing block 110 and the TAB IC input terminal 121 of the TCP block 120 are coupled to each other in order to be interconnected by electrical signals, The body is formed in a plate-like stepped spaced apart up and down, while the mounting plate 140 together with the housing block 110 is coupled to the upper fastening plate 131 of the stairs at the same time, a plurality of coupling holes (131a) 131b) and the guide groove 131c are provided at positions spaced apart from each other; The joint plate 130 is formed in the lower fixing plate 132 of the stairs so that a separate adhesive hole 132a is laid to be coupled to the TCP block 120; The joint plate 130 may integrally fix the housing block 110 and the TCP block 120, while the upper fastening plate 131 may be attached to the housing block 110 from the joint plate 130. A plurality of recesses and protrusions 131d formed at the bottom surface of the housing block are inserted to correspond to the recesses and recesses 111d of the upper surface of the housing block, while the one coupling hole 131a of the upper fastening plate and the coupling groove 111a of the housing block correspond to each other. And a detachable integrated probe block for guiding so that the probe pin 112 of the housing block and the TAB IC input terminal 121 of the TCP block are correctly positioned at the time of detachment and recombination.

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