WO2007069818A1

WO2007069818A1 - Detachable integrated probe block

Info

Publication number: WO2007069818A1
Application number: PCT/KR2006/004093
Authority: WO
Inventors: Sang-Woan Han; Sung-Ro Lee; Jin-Seog Oh
Original assignee: Nano Semitech Co., Ltd.
Priority date: 2005-12-16
Filing date: 2006-10-12
Publication date: 2007-06-21
Also published as: KR100582233B1; TW200724928A

Abstract

Disclosed herein is a detachable integrated probe block. The detachable integrated probe block includes a joint plate. In the joint plate, upper and lower fastening plates are provided in a step form, a plurality of fastening holes and a guide hole are formed in the upper fastening plate at locations spaced apart from each other such that both the housing block and a mounting plate can be attached to and detached from the upper fastening plate, and a separate adhesive means is provided on the lower fastening plate to be attached to the TCP block. The joint plate is configured such that the housing block and the TCP block are combined into a single body, a plurality of protrusions formed in the bottom of the upper fastening plate is inserted into a plurality of corresponding depressions formed in the top of the housing block such that the housing block can be attached to and detached from the joint plate, and the fastening hole of the upper fastening plate corresponds to the fastening depression of the housing block, therefore accurate assignment of the probe pins of the housing block to the holes of the TAB IC input terminal of the TCP block is guided at the time of attachment after detachment.

Description

DETACHABLE INTEGRATED PROBE BLOCK

Technical Field

[1] The present invention relates generally to a detachable integrated probe block and, more particularly, to a detachable integrated probe block, in which a housing block constituting part of the probe block can be attached to and detached from a joint plate, and the probe block including a TCP block is integrally fabricated in the form of an assembly, therefore the housing block can be attached and detached at the time of occurrence of a problem with probe pins, and probe pins and the TAB IC input terminal of the TCP block can be rapidly positioned at accurate locations through guide at the time of exchange, thereby facilitating minute gap adjustment.

Background Art

[2] In general, a probe unit is used to inspect the electrical characteristics of an object, such as a Liquid Crystal Display (LCD) panel.

[3] An LCD panel has a structure in which an array substrate and a color substrate are attached to each other with liquid crystals interposed therebetween, and is a device for performing display based on the electro-optical characteristics of the liquid crystals, which are controlled by voltage applied from outside.

[4] After the completion of manufacturing and before the shipment of products, such

LCD panels are subjected to shipment inspections for inspections of the LCD panels for defects (for example, pixel errors-spot defects, line defects, area defects, etc.) that can occur during a manufacturing process.

[5] Methods for the inspection of LCD panels include a method for the inspection of the cutting of LCD wires and a method for lighting inspection using a probe unit to inspect the color of LCD panels.

[6] The probe unit includes probe blocks, that is, collections of probe pins, for applying inspection signals to multiple electrodes located on the border of an LCD panel, a Taped Automated Bonding Integrated Circuits (TAB ICs) respectively connected to the probe blocks and configured to send electric signals thereto, a pattern generator for generating predetermined signals for inspecting LCD panels, and a source/gate PCB unit for dividing the inspection signals into X and Y line signals, and sending the divided signals to the TAB IC.

[7] Such a probe unit is used to inspect whether Thin Film Transistor (TFT)-type,

Twisted Nematic (TN)-type, Super Twisted Nematic (STN)-type, Color Super Twisted Nematic (CSTN)-type, and Double Super Twisted Nematic (DSTN)-type LCD panels and organic Electro Luminescence (EL)-type display panels operate normally without pixel errors. [8] Such LCD display panels are being developed toward high image quality. This requires a large number of dots per unit area of display. To inspect this, a high-density contact medium is connected between an LCD panel and a drive IC (TAB IC), that is, driven parts.

[9] In this case, the contact medium is referred to as an LCD probe block. In general, up to now, 60 D -pitch probe blocks have been used. For medium and large probe blocks, a pitch of 50-40 D is required. For small probe blocks, a pitch of 35 D is required. Small pitch products are demanded more and more.

[10] Meanwhile, to reliably inspect the above-described LCD panel, appropriate contact resistance must be established between the electrode of the LCD panel and the probe block using appropriate physical pressure therebetween, and insulation between respective probes within the probe block must be ensured. Disclosure of Invention

Technical Problem

[11] Furthermore, as LCD panels trend toward high definition, pixel density is also increasing continuously, with the result that the need for high-density probe blocks is increasing.

[12] Such conventional probe blocks are being continuously developed by those skilled in the art. The probe blocks are classified into a separate type and an integrated type. The separate-type probe block and the integrated type probe block are described below.

[13] <Separate-type probe block>

[14] As shown in FIGS. 6 and 7, a separate-type probe block includes a signal generator for generating predetermined signals to inspect an LCD, a Pogo block 1 and an FPC 2 for receiving electrical signals from the signal generator via a source PCB and a gate PCB, a TCP block 3 for delivering the received electrical signals to an input terminal, a probe block 4 for coming into contact with the electrodes of the LCD and applying electrical signals to perform inspection, and a mounting plate 5 for combining the separate-type probe block 4 with the TCP block 3 and performing adjustment such that the probe pins of the separate-type probe block 4 come into contact with the electrodes of an LCD with appropriate physical pressure.

[15] In this case, the separate probe block 4 is separated from the housing block and the

TCP block 3, and the TCP block 3 is fixed on the mounting plate 5 during use, so the housing block is fitted and the probe pins of the housing block are then accurately seated on a Tap IC Pad within the input terminal of the TCP block 4.

[16] However, in the case of the separate-type probe block 4, it is difficult for the probe pins and the input terminal of the TCP block to be combined with each other at accurate positions when the housing block is combined with the TCP block, and a long time is required to perform setting at the time of exchange, therefore it is difficult for a user to perform work.

[17] <Integrated-type probe block>

[18] To solve the problem of the above-described separate-type probe block, by preventing a housing block from being attached to and detached from a joint plate, the problem in which the probe pins of the prior art housing block are not easily seated in the depression of the TCP block input terminal is fundamentally solved.

[19] However, this technology uses technology in which the housing block and the TCP block are integrated with each other, so the probe pins are soldered or fixed to a tab IC pad. As a result, even when a problem with the probe pins occurs, the housing block cannot be detached from the TCP block, so the entire probe block must be discarded, thereby increasing the maintenance cost.

Technical Solution

[20] Accordingly, the present invention has been made keeping in mind the above problems occurring in the prior art, and an object of the present invention is to provide a probe block, in which a housing block constituting part of the probe block can be attached to and detached from a joint plate, and the probe block including a TCP block is integrally fabricated in the form of an assembly, therefore the housing block can be attached and detached at the time of occurrence of a problem with probe pins, and probe pins and the TAB IC input terminal of the TCP block can be rapidly positioned at accurate locations through guide at the time of exchange, thereby facilitating minute gap adjustment.

[21] In order to accomplish the above object, the present invention provides a detachable integrated probe block, the probe block being configured to couple the probe pins of a housing block to the TAB IC input terminal of a TCP block 120 so as to couple electrical signals thereof to each other, the detachable integrated probe block including:

[22] a joint plate, in which upper and lower fastening plates are provided in a step form, a plurality of fastening holes and a guide hole are formed in the upper fastening plate at locations spaced apart from each other such that both the housing block and a mounting plate can be attached to and detached from the upper fastening plate, and a separate adhesive means is provided on the lower fastening plate to be attached to the TCP block;

[23] wherein the joint plate is configured such that the housing block and the TCP block are combined into a single body, a plurality of protrusions formed in the bottom of the upper fastening plate is inserted into a plurality of corresponding depressions formed in the top of the housing block such that the housing block can be attached to and detached from the joint plate, and the fastening hole of the upper fastening plate corresponds to the fastening depression of the housing block, therefore accurate assignment of the probe pins of the housing block to the holes of the TAB IC input terminal of the TCP block is guided at the time of attachment after detachment.

Advantageous Effects

[24] As described above, in the present invention, the probe block is formed in a separate and integrated form. Accordingly, the housing block can be separately repaired or exchanged at the time of occurrence of a problem with the housing block including the probe pins, therefore maintenance cost can be reduced, and the probe pins and the TAB IC input terminal of the TCP block are rapidly and appropriately positioned, thereby increasing working efficiency at the time of exchange of the housing block.

[25] Although the preferred embodiments of the present invention have been disclosed for illustrative purposes, those skilled in the art will appreciate that various modifications, additions and substitutions are possible, without departing from the scope and spirit of the invention as disclosed in the accompanying claims.

Description of Drawings

[26] The above and other objects, features and advantages of the present invention will be more clearly understood from the following detailed description taken in conjunction with the accompanying drawings, in which:

[27] FlG. 1 is a diagram showing the construction of a probe unit for inspecting LCDs according to the present invention;

[28] FlG. 2 is an exploded perspective view of a probe block according to the present invention;

[29] FlG. 3 is a side view of the probe block according to the present invention;

[30] FlG. 4 is a perspective view of a joint plate according to the present invention, as viewed from the bottom thereof;

[31] FlG. 5 is a block diagram of an inspection process according to the present invention;

[32] FlG. 6 is an exploded view of a prior art; and

[33] FlG. 7 is a side view of the prior art.

Best Mode

[34] Reference now should be made to the drawings, in which the same reference numerals are used throughout the different drawings to designate the same or similar components.

[35] As shown in FIGS. 1 to 5, the apparatus according to the present invention includes a pattern generator 10, which is a Personal Computer (PC) including a VGA graphics card, or a signal generator, a buffer board 20 for receiving electrical signals from the PC or signal generator 10 via a cable and converting the output voltage of a power supply unit into working voltage, gate/source PCB units 30 and 40 for dividing electrical signals, input from the buffer board 20, into X and Y line signals, and the X and Y signals to a Taped Automated Bonding Integrated Circuit (TAB IC), the TAB ICs for connecting and transmitting electrical signals to probe blocks 100 via the gate/ source PCB units 30 and 40, and the probe blocks 100, that is, collections of probe pins 112, for receiving electrical signals from the TAB ICs, and applying inspection signals to a plurality of electrodes located on the border of the LCD panel 50.

[36] In this case, each of the probe blocks 100 includes a TCP block 120 which allows the gate PCB 30 and the source PCB 40 to be electrically connected to an FPC block 122, and one end of which is connected to the probe pins 112 of the housing block; a housing block 110 that comes into contact with the electrode of the LCD panel 50 via the electrical connection of the TCP block 120 and applies electrical signals to inspect the LCD panel 50 for pixel errors; and a joint plate 130 for coupling the TCP block 120 to the housing block 110 to couple the electrical signals of the TCP block 120 and the housing block 110 to each other.

[37] The TCP block 120 is configured such that one end thereof is connected to the probe pins 112 of the housing block 110, the other end thereof is provided with a FPC block 122 to receive electrical signals from the gate PCB 30 or source PCB 40 and conduct the electrical signals, and the body thereof is fastened to the fastening plate 132 of the joint plate 130.

[38] The housing block 110 includes a housing 111 provided with an open bottom, a plurality of probe pins 112 accommodated in and fixed to the lower portion of the housing 111, and fitting holes provided such that side plates 113 are fastened to both ends of the housing block 110, which are provided with support shafts 114, so as to fasten the probe pins 112 to the housing 111. The fastening holes 11 Ia of the housing correspond to and are connected with the engaging holes 131a of the joint plate.

[39] In this case, it is preferred that depressions 11 Id corresponding to the depressions

131d of the joint plate 130 be formed in the top of the housing 111. The reason for this is to allow a worker to rapidly find connection points.

[40] The joint plate 130 is made of synthetic resin. The joint plate 130 serves to combine the TCP block 120 and the housing block 110 into a single body. The joint plate 130 has a single body in which upper and lower fastening plates 131 and 132 are provided and stepped such that the housing block 110 can be attached to or detached from the joint plate 130. A plurality of engaging holes 131a and 131b and a plurality of guide holes 131c are formed in the upper fastening plate 131 at locations spaced apart from each other such that both the housing block 110 and the mounting plate 140 can be fastened at the same time. A separate fastener 132a is provided on the lower fastening plate 132 to fasten the TCP block 120.

[41] In this case, a fitting protrusion 135 is formed on a portion of the bottom of the joint plate 130 because the body of the joint plate 130 has the upper fastening plate 131 and the lower fastening plate 132. The height of the fitting protrusion 135 is adjusted to a preset value in a manufacturing process.

[42] As the housing block 110 is attached to and detached from the fitting protrusion

135, it is important to provide constant pressure to the contact between the probe pins 112 and the TAB IC input terminal 121 and to stably conduct electrical signals. The reason for this is to prevent electrical signals from being inappropriately conducted because the height of the fastener 150 is excessively high or low.

[43] Furthermore, the engaging holes 131a and the protrusions 13 Id are formed in the upper fastening plate 131 of the joint plate 130, therefore they correspond to and are connected with the fastening holes Ilia and depressions 11 Id of the housing block and accurate setting points can be rapidly guided.

[44] The reason for this is that the probe pins 112 of the housing block can be accurately seated on the TAB IC input terminal 121 of the TCP block at the time of insertion of the probe pins 112 of the housing block into the TAB IC input terminal 121 of the TCP block, thereby preventing the occurrence of a tolerance gap.

[45] Accordingly, the probe block 100 of the present invention can determine constant pressure at the connection of the Tab IC input terminal 121 in advance and the location of the connection of the Tab IC input terminal 121 in advance, and can be attached to and detached from the other parts at the time of repair when the wiring of the connection is cut or when some of the probe pins 112 have defects, thus being used as a separate type and an integrated type.

[46] In this case, the TCP block 120 fastened to the lower fastening plate 132 of the joint plate 130 is fastened using an adhesive means 132a. It is preferred that the adhesive means 132a be formed using adhesive tape.

[47] The reason for this is that, when the TCP block 120 is attached to the lower fastening plate 132 of the joint plate 130, insulation is ensured, thus a manufacturing process is easy and a manufacturing cost is low.

[48] Thereafter, an embodiment of the present invention based on the above-described construction is described below.

[49] As illustrated in FIG. 5, a process of inspecting the LCD panel 50 includes:

[50] the step of sending electrical signals from a PC or signal generator 10 (pattern generator), including a VGA graphics card,

[51] the step of receiving the electrical signals from the PC or signal generator 10 via a cable, and converting incoming voltage from the power supply unit into working voltage via the buffer board 20,

[52] the step of dividing incoming electrical signals from the buffer board 20 into X and

Y line signals via the source/gate PCB units 30 and 40, and delivering the X and Y line signals to the TAB ICs of the TCP blocks 120,

[53] the step of delivering electrical signals, passing through the source/gate PCB units, to the probe blocks 100 via the TAB ICs, and

[54] the step of receiving electrical signals from the TAB IC, and applying inspection signals to a plurality of electrodes, positioned on the edge of the LCD panel 50, via the probe blocks 100, that is, collections of probe pins.

[55] In the probe block 100, the housing block 110, the TCP block 120 and the joint plate 130 are integrated with each other. The joint plate 130 and the housing block 110 are sequentially placed on the mounting plate 140, are fastened by a separate fastener 141, and are used to inspect the LCD 50.

[56] When the housing block 110 needs to be detached from the joint plate 130 to be repaired or exchanged due to a problem with the probe pins 112, the fastening is released by loosening the fastener 150 that fastens the joint plate 130 and the housing block 110.

[57] Thereafter, when the housing block 110 is restored through the repair or exchange of the probe pins 112, and is re-attached to the joint plate 130, it is important for a worker to accurately insert the probe pins 112 into the holes of the TAB IC input terminal 121 and to perform fastening using appropriate pressure. In this case, the work of setting locations can be rapidly done by accordingly connecting the engaging holes 131a and protrusions 131d of the joint plate 130 to the fastening depressions Ilia and depressions 11 Id of the housing block 110.

[58] Furthermore, even if the fastener 135 is excessively fastened or pressed due to the preset height of the fitting protrusion 135 of the joint plate 130, design is made such that the probe pins 112 and the circuit of the TAB IC input terminal 121 do not come into contact at a pressure higher than a predetermined pressure.

[59] By the function of the joint plate 130, the probe pins 112 of the housing block and the TAB IC input terminal 121 of the TCP block can be rapidly engaged with each other at appropriate locations, and both blocks are tightened with appropriate pressure, therefore the probe pins 112 and the TAB IC input terminal 121 are brought into contact with each other under appropriate conditions.

[60] As described above, the reference fastening depressions 11 Ia of the housing block and the reference engaging holes 131a of the joint plate are formed such that they can accurately correspond to each other. As a result, respective probe pins 112 can be rapidly positioned on the Tab IC input terminal 121, and excessive pressing can be avoided due to the preset height of the fitting protrusion 135 even though desired pressure is used at the time of fastening.

Industrial Applicability

[61] As described above, in the present invention, the probe block is formed in a separate and integrated form. Accordingly, the housing block can be separately repaired or exchanged at the time of occurrence of a problem with the housing block including the probe pins, therefore maintenance cost can be reduced, and the probe pins and the TAB IC input terminal of the TCP block are rapidly and appropriately positioned, thereby increasing working efficiency at the time of exchange of the housing block.

[62] Although the preferred embodiments of the present invention have been disclosed for illustrative purposes, those skilled in the art will appreciate that various modifications, additions and substitutions are possible, without departing from the scope and spirit of the invention as disclosed in the accompanying claims.

Claims

[1] A detachable integrated probe block, the probe block being configured to couple probe pins of a housing block to a Taped Automated Bonding Integrated Circuit (TAB IC) input terminal of a TCP block 120 so as to couple electrical signals thereof to each other, the detachable integrated probe block comprising: a joint plate, in which upper and lower fastening plates are provided in a step form, a plurality of fastening holes and a guide hole are formed in the upper fastening plate at locations spaced apart from each other such that both the housing block and a mounting plate can be attached to and detached from the upper fastening plate, and a separate adhesive means is provided on the lower fastening plate to be attached to the TCP block; wherein the joint plate is configured such that the housing block and the TCP block are combined into a single body, a plurality of protrusions formed in a bottom of the upper fastening plate is inserted into a plurality of corresponding depressions formed in a top of the housing block such that the housing block can be attached to and detached from the joint plate, and a fastening hole of the upper fastening plate corresponds to a fastening depression of the housing block, therefore accurate assignment of the probe pins of the housing block to holes of the TAB IC input terminal of the TCP block is guided at the time of attachment after detachment.