KR100559198B1 - 일체형 가스 분배 채널링을 갖는 벨자 - Google Patents
일체형 가스 분배 채널링을 갖는 벨자 Download PDFInfo
- Publication number
- KR100559198B1 KR100559198B1 KR1020000076881A KR20000076881A KR100559198B1 KR 100559198 B1 KR100559198 B1 KR 100559198B1 KR 1020000076881 A KR1020000076881 A KR 1020000076881A KR 20000076881 A KR20000076881 A KR 20000076881A KR 100559198 B1 KR100559198 B1 KR 100559198B1
- Authority
- KR
- South Korea
- Prior art keywords
- area
- gas distribution
- distribution plate
- gas
- heat treatment
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/324—Thermal treatment for modifying the properties of semiconductor bodies, e.g. annealing, sintering
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67098—Apparatus for thermal treatment
- H01L21/67109—Apparatus for thermal treatment mainly by convection
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Chemical Vapour Deposition (AREA)
- Carbon And Carbon Compounds (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US09/468,238 US6302963B1 (en) | 1999-12-21 | 1999-12-21 | Bell jar having integral gas distribution channeling |
| US09/468,238 | 1999-12-21 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR20010062458A KR20010062458A (ko) | 2001-07-07 |
| KR100559198B1 true KR100559198B1 (ko) | 2006-03-10 |
Family
ID=23858991
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020000076881A Expired - Fee Related KR100559198B1 (ko) | 1999-12-21 | 2000-12-15 | 일체형 가스 분배 채널링을 갖는 벨자 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US6302963B1 (enExample) |
| EP (1) | EP1111660A3 (enExample) |
| JP (1) | JP4665204B2 (enExample) |
| KR (1) | KR100559198B1 (enExample) |
| TW (1) | TW499698B (enExample) |
Families Citing this family (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3472482B2 (ja) * | 1998-06-30 | 2003-12-02 | 富士通株式会社 | 半導体装置の製造方法と製造装置 |
| KR100360401B1 (ko) * | 2000-03-17 | 2002-11-13 | 삼성전자 주식회사 | 슬릿형 공정가스 인입부와 다공구조의 폐가스 배출부를포함하는 공정튜브 및 반도체 소자 제조장치 |
| US6576981B1 (en) * | 2001-07-03 | 2003-06-10 | Lsi Logic Corporation | Reduced particulate etching |
| FR3057390B1 (fr) | 2016-10-11 | 2018-12-07 | Soitec | Four vertical avec dispositif de piegeage de contaminants |
| US11266005B2 (en) * | 2019-02-07 | 2022-03-01 | Fermi Research Alliance, Llc | Methods for treating superconducting cavities |
Citations (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH03194924A (ja) * | 1989-12-22 | 1991-08-26 | Tokyo Electron Sagami Ltd | 縦型処理装置 |
| JPH03285328A (ja) * | 1990-03-31 | 1991-12-16 | Tokyo Electron Sagami Ltd | 縦型熱処理装置 |
| JPH0468522A (ja) * | 1990-07-10 | 1992-03-04 | Tokyo Electron Sagami Ltd | 縦型熱処理装置 |
| JPH04192519A (ja) * | 1990-11-27 | 1992-07-10 | Nec Corp | 半導体熱処理用縦型プロセスチューブの構造 |
| JPH04196522A (ja) * | 1990-11-28 | 1992-07-16 | Nec Corp | 縦型拡散炉 |
| JPH05251372A (ja) * | 1992-03-06 | 1993-09-28 | Matsushita Electron Corp | 縦型拡散炉 |
| JPH0620980A (ja) * | 1992-07-01 | 1994-01-28 | Nec Corp | 縦型熱処理炉 |
| US5318633A (en) * | 1991-03-07 | 1994-06-07 | Tokyo Electron Sagami Limited | Heat treating apparatus |
| JPH08107082A (ja) * | 1994-10-04 | 1996-04-23 | Sony Corp | 縦型熱処理装置 |
| KR100227850B1 (ko) * | 1996-05-06 | 1999-11-01 | 윤종용 | 산화막 성장 공정 및 lp cvd 공정 겸용 수직형 확산로 |
Family Cites Families (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6226820A (ja) * | 1985-07-26 | 1987-02-04 | Ibiden Co Ltd | 炭化珪素質プラズマ分散板 |
| US5062386A (en) | 1987-07-27 | 1991-11-05 | Epitaxy Systems, Inc. | Induction heated pancake epitaxial reactor |
| JPH0642474B2 (ja) | 1988-03-31 | 1994-06-01 | 株式会社東芝 | 半導体製造装置 |
| JPH07120634B2 (ja) * | 1988-12-27 | 1995-12-20 | 東京エレクトロン東北株式会社 | 処理装置 |
| US5160545A (en) | 1989-02-03 | 1992-11-03 | Applied Materials, Inc. | Method and apparatus for epitaxial deposition |
| JPH04280420A (ja) * | 1991-03-07 | 1992-10-06 | Toshiba Corp | 熱処理装置 |
| JP2805589B2 (ja) * | 1994-01-27 | 1998-09-30 | 黄 哲周 | 低圧化学蒸着装置 |
| US5928427A (en) * | 1994-12-16 | 1999-07-27 | Hwang; Chul-Ju | Apparatus for low pressure chemical vapor deposition |
| US5653806A (en) | 1995-03-10 | 1997-08-05 | Advanced Technology Materials, Inc. | Showerhead-type discharge assembly for delivery of source reagent vapor to a substrate, and CVD process utilizing same |
| JPH09249455A (ja) * | 1996-03-14 | 1997-09-22 | Toyo Tanso Kk | 炭化珪素成形体の製造方法 |
| US6159297A (en) * | 1996-04-25 | 2000-12-12 | Applied Materials, Inc. | Semiconductor process chamber and processing method |
| US5976261A (en) | 1996-07-11 | 1999-11-02 | Cvc Products, Inc. | Multi-zone gas injection apparatus and method for microelectronics manufacturing equipment |
| US5653808A (en) * | 1996-08-07 | 1997-08-05 | Macleish; Joseph H. | Gas injection system for CVD reactors |
-
1999
- 1999-12-21 US US09/468,238 patent/US6302963B1/en not_active Expired - Fee Related
-
2000
- 2000-12-15 KR KR1020000076881A patent/KR100559198B1/ko not_active Expired - Fee Related
- 2000-12-15 EP EP00311255A patent/EP1111660A3/en not_active Withdrawn
- 2000-12-19 TW TW089127172A patent/TW499698B/zh not_active IP Right Cessation
- 2000-12-21 JP JP2000388743A patent/JP4665204B2/ja not_active Expired - Fee Related
Patent Citations (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH03194924A (ja) * | 1989-12-22 | 1991-08-26 | Tokyo Electron Sagami Ltd | 縦型処理装置 |
| JPH03285328A (ja) * | 1990-03-31 | 1991-12-16 | Tokyo Electron Sagami Ltd | 縦型熱処理装置 |
| JPH0468522A (ja) * | 1990-07-10 | 1992-03-04 | Tokyo Electron Sagami Ltd | 縦型熱処理装置 |
| JPH04192519A (ja) * | 1990-11-27 | 1992-07-10 | Nec Corp | 半導体熱処理用縦型プロセスチューブの構造 |
| JPH04196522A (ja) * | 1990-11-28 | 1992-07-16 | Nec Corp | 縦型拡散炉 |
| US5318633A (en) * | 1991-03-07 | 1994-06-07 | Tokyo Electron Sagami Limited | Heat treating apparatus |
| JPH05251372A (ja) * | 1992-03-06 | 1993-09-28 | Matsushita Electron Corp | 縦型拡散炉 |
| JPH0620980A (ja) * | 1992-07-01 | 1994-01-28 | Nec Corp | 縦型熱処理炉 |
| JPH08107082A (ja) * | 1994-10-04 | 1996-04-23 | Sony Corp | 縦型熱処理装置 |
| KR100227850B1 (ko) * | 1996-05-06 | 1999-11-01 | 윤종용 | 산화막 성장 공정 및 lp cvd 공정 겸용 수직형 확산로 |
Also Published As
| Publication number | Publication date |
|---|---|
| JP4665204B2 (ja) | 2011-04-06 |
| EP1111660A2 (en) | 2001-06-27 |
| KR20010062458A (ko) | 2001-07-07 |
| JP2001237239A (ja) | 2001-08-31 |
| TW499698B (en) | 2002-08-21 |
| US20010037767A1 (en) | 2001-11-08 |
| US6302963B1 (en) | 2001-10-16 |
| EP1111660A3 (en) | 2003-12-10 |
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