KR100549560B1 - 물리적 증착 부품과 그 형성방법 - Google Patents
물리적 증착 부품과 그 형성방법 Download PDFInfo
- Publication number
- KR100549560B1 KR100549560B1 KR1020037005865A KR20037005865A KR100549560B1 KR 100549560 B1 KR100549560 B1 KR 100549560B1 KR 1020037005865 A KR1020037005865 A KR 1020037005865A KR 20037005865 A KR20037005865 A KR 20037005865A KR 100549560 B1 KR100549560 B1 KR 100549560B1
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- KR
- South Korea
- Prior art keywords
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- stress
- pvd
- component
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/34—Sputtering
- C23C14/3407—Cathode assembly for sputtering apparatus, e.g. Target
- C23C14/3414—Metallurgical or chemical aspects of target preparation, e.g. casting, powder metallurgy
Landscapes
- Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Physical Vapour Deposition (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US09/699,897 | 2000-10-27 | ||
| US09/699,897 US7041204B1 (en) | 2000-10-27 | 2000-10-27 | Physical vapor deposition components and methods of formation |
| PCT/US2001/051243 WO2002066699A2 (en) | 2000-10-27 | 2001-10-26 | Physical vapor deposition components and methods of formation |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR20030045147A KR20030045147A (ko) | 2003-06-09 |
| KR100549560B1 true KR100549560B1 (ko) | 2006-02-08 |
Family
ID=24811380
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020037005865A Expired - Fee Related KR100549560B1 (ko) | 2000-10-27 | 2003-04-28 | 물리적 증착 부품과 그 형성방법 |
Country Status (7)
| Country | Link |
|---|---|
| US (2) | US7041204B1 (https=) |
| EP (1) | EP1501960A2 (https=) |
| JP (1) | JP2004533539A (https=) |
| KR (1) | KR100549560B1 (https=) |
| CN (1) | CN1551927A (https=) |
| AU (1) | AU2002255471A1 (https=) |
| WO (1) | WO2002066699A2 (https=) |
Families Citing this family (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20030002043A1 (en) * | 2001-04-10 | 2003-01-02 | Kla-Tencor Corporation | Periodic patterns and technique to control misalignment |
| US20040129559A1 (en) * | 2002-04-12 | 2004-07-08 | Misner Josh W. | Diffusion bonded assemblies and fabrication methods |
| US20080078268A1 (en) | 2006-10-03 | 2008-04-03 | H.C. Starck Inc. | Process for preparing metal powders having low oxygen content, powders so-produced and uses thereof |
| US7776166B2 (en) * | 2006-12-05 | 2010-08-17 | Praxair Technology, Inc. | Texture and grain size controlled hollow cathode magnetron targets and method of manufacture |
| US20080145688A1 (en) | 2006-12-13 | 2008-06-19 | H.C. Starck Inc. | Method of joining tantalum clade steel structures |
| US9279178B2 (en) | 2007-04-27 | 2016-03-08 | Honeywell International Inc. | Manufacturing design and processing methods and apparatus for sputtering targets |
| US8197894B2 (en) | 2007-05-04 | 2012-06-12 | H.C. Starck Gmbh | Methods of forming sputtering targets |
| US8246903B2 (en) | 2008-09-09 | 2012-08-21 | H.C. Starck Inc. | Dynamic dehydriding of refractory metal powders |
| US9412568B2 (en) | 2011-09-29 | 2016-08-09 | H.C. Starck, Inc. | Large-area sputtering targets |
Family Cites Families (30)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4481470A (en) | 1981-07-29 | 1984-11-06 | The United States Of America As Represented By The United States Department Of Energy | Method for determining the hardness of strain hardening articles of tungsten-nickel-iron alloy |
| JPS59108970A (ja) | 1982-12-13 | 1984-06-23 | Nippon Steel Corp | 鋼材の磁気特性測定方法 |
| JPS6314864A (ja) | 1986-07-08 | 1988-01-22 | Ulvac Corp | Co基合金スパツタタ−ゲツトおよびその製造法 |
| JPS63270461A (ja) | 1986-12-26 | 1988-11-08 | Teijin Ltd | 対向ターゲット式スパッタ装置 |
| US5087297A (en) | 1991-01-17 | 1992-02-11 | Johnson Matthey Inc. | Aluminum target for magnetron sputtering and method of making same |
| JPH06104120A (ja) | 1992-08-03 | 1994-04-15 | Hitachi Metals Ltd | 磁気記録媒体用スパッタリングターゲットおよびその製造方法 |
| US5282947A (en) | 1992-08-13 | 1994-02-01 | Vlsi Technology, Inc. | Magnet assembly for enhanced sputter target erosion |
| JP2857015B2 (ja) | 1993-04-08 | 1999-02-10 | 株式会社ジャパンエナジー | 高純度アルミニウムまたはその合金からなるスパッタリングターゲット |
| US5590389A (en) | 1994-12-23 | 1996-12-31 | Johnson Matthey Electronics, Inc. | Sputtering target with ultra-fine, oriented grains and method of making same |
| JPH08253859A (ja) | 1995-03-16 | 1996-10-01 | Sumitomo Metal Mining Co Ltd | スパッタリング装置 |
| JP3413782B2 (ja) | 1995-03-31 | 2003-06-09 | 日立金属株式会社 | スパッタリング用チタンタ−ゲットおよびその製造方法 |
| US5741377A (en) | 1995-04-10 | 1998-04-21 | Martin Marietta Energy Systems, Inc. | Structures having enhanced biaxial texture and method of fabricating same |
| US5658442A (en) | 1996-03-07 | 1997-08-19 | Applied Materials, Inc. | Target and dark space shield for a physical vapor deposition system |
| FR2756572B1 (fr) | 1996-12-04 | 1999-01-08 | Pechiney Aluminium | Alliages d'aluminium a temperature de recristallisation elevee utilisee dans les cibles de pulverisation cathodiques |
| US6123783A (en) | 1997-02-06 | 2000-09-26 | Heraeus, Inc. | Magnetic data-storage targets and methods for preparation |
| EP1015902A2 (en) | 1997-04-01 | 2000-07-05 | Redcliffe Magtronics Limited | An apparatus and method of measuring the magnetic field distribution of a magnetic sample |
| CA2203601C (en) | 1997-04-24 | 2004-03-16 | James R. Booker | Apparatus and method of detecting loss of cross-sectional area of magnetic metallic strength members used in conductors such as aluminum conductor steel reinforced ("acsr") conductors |
| JP3403918B2 (ja) | 1997-06-02 | 2003-05-06 | 株式会社ジャパンエナジー | 高純度銅スパッタリングタ−ゲットおよび薄膜 |
| US5993621A (en) | 1997-07-11 | 1999-11-30 | Johnson Matthey Electronics, Inc. | Titanium sputtering target |
| US6391172B2 (en) | 1997-08-26 | 2002-05-21 | The Alta Group, Inc. | High purity cobalt sputter target and process of manufacturing the same |
| ATE308761T1 (de) | 1998-03-30 | 2005-11-15 | Sentron Ag | Magnetfeldsensor |
| US6086725A (en) * | 1998-04-02 | 2000-07-11 | Applied Materials, Inc. | Target for use in magnetron sputtering of nickel for forming metallization films having consistent uniformity through life |
| US6323055B1 (en) | 1998-05-27 | 2001-11-27 | The Alta Group, Inc. | Tantalum sputtering target and method of manufacture |
| US6071389A (en) | 1998-08-21 | 2000-06-06 | Tosoh Smd, Inc. | Diffusion bonded sputter target assembly and method of making |
| WO2000040770A1 (en) | 1998-12-29 | 2000-07-13 | Tosoh Smd, Inc. | Diffusion bonded sputter target assembly and method of making same |
| US6342114B1 (en) | 1999-03-31 | 2002-01-29 | Praxair S.T. Technology, Inc. | Nickel/vanadium sputtering target with ultra-low alpha emission |
| US6258217B1 (en) | 1999-09-29 | 2001-07-10 | Plasma-Therm, Inc. | Rotating magnet array and sputter source |
| US6299740B1 (en) | 2000-01-19 | 2001-10-09 | Veeco Instrument, Inc. | Sputtering assembly and target therefor |
| US6454911B1 (en) | 2000-06-01 | 2002-09-24 | Honeywell International Inc. | Method and apparatus for determining the pass through flux of magnetic materials |
| WO2002086183A1 (en) | 2001-04-19 | 2002-10-31 | Honeywell International Inc. | Diffusion bonded assemblies and fabrication methods |
-
2000
- 2000-10-27 US US09/699,897 patent/US7041204B1/en not_active Expired - Fee Related
-
2001
- 2001-10-26 WO PCT/US2001/051243 patent/WO2002066699A2/en not_active Ceased
- 2001-10-26 AU AU2002255471A patent/AU2002255471A1/en not_active Abandoned
- 2001-10-26 EP EP01271080A patent/EP1501960A2/en not_active Withdrawn
- 2001-10-26 CN CNA018181457A patent/CN1551927A/zh active Pending
- 2001-10-26 JP JP2002566000A patent/JP2004533539A/ja active Pending
-
2003
- 2003-04-28 KR KR1020037005865A patent/KR100549560B1/ko not_active Expired - Fee Related
-
2004
- 2004-06-07 US US10/863,062 patent/US20040221930A1/en not_active Abandoned
Also Published As
| Publication number | Publication date |
|---|---|
| EP1501960A2 (en) | 2005-02-02 |
| CN1551927A (zh) | 2004-12-01 |
| US7041204B1 (en) | 2006-05-09 |
| KR20030045147A (ko) | 2003-06-09 |
| US20040221930A1 (en) | 2004-11-11 |
| WO2002066699A2 (en) | 2002-08-29 |
| WO2002066699A3 (en) | 2004-12-09 |
| AU2002255471A1 (en) | 2002-09-04 |
| JP2004533539A (ja) | 2004-11-04 |
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St.27 status event code: A-0-1-A10-A15-nap-PA0105 |
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