KR100402313B1 - Test handler and control method of the same - Google Patents

Abstract

A test handler and a control method for improving the inefficiency of the robot picker by using a buffer, and a method of controlling the same, including a loading part, an unloading part, at least one test part, a robot picker, a loading buffer, A buffer unit including at least one test good buffer and at least one test bad buffer, wherein an object stored in the loading unit is moved to at least one test unit by a unit of movement of a preset robot picker using a robot picker. In the test handler for moving the object according to a predetermined order and classifying the object according to the result of the execution, and moving the object to the unloading part, when the number of objects stored in the loading part is less than the number of movements of the robot picker, it is loaded. Number of objects stored in the robot and in the loading buffer If the number of movements of the picker is more than one time, moving it to the corresponding test unit, and if a part of the test result of each test unit is determined to be defective, store the determined object in the corresponding test bad buffer and store the remaining good determined object in the corresponding test good. When the number of objects stored in the buffer and the test bad buffer and the test good buffer is more than one movement of the robot picker, the method includes storing the objects in the buffer in the unloading unit. By minimizing the time, the operation efficiency of the test handler can be improved.

Description

Test handler and control method of the same}

The present invention relates to a test handler, and more particularly, to a test handler and a control method thereof.

In general, a test handler is a device for handling and testing a large amount of products in various memory or non-memory fields using semiconductor devices. The test handler is, for example, a module in which a logic IC or various semiconductor devices are mounted on a single chip. It may show a difference in configuration depending on the test target such as RAM.

Hereinafter, as an example of a test handler according to the related art, a type of testing a module by mounting it on a kind of motherboard will be described.

That is, as shown in Figure 1, the loading section 2 vertically stacked in two rows of trays (module RAM) in a state in which a large number of module RAM (module RAM) is stored in the front of the housing 1 forming the overall appearance, Receiving the module ram stored in the tray of the loading unit 2, the first test unit 3 for performing a test such as a short inspection, the state of the module ram tested in the first test unit 3 According to the present invention, the buffer part 4 for temporarily storing the material and the defective product and temporarily storing the mother part 5 in the rear part of the housing 1 can be lifted and pulled out and pulled out in the horizontal direction. It is also possible to receive only the modulators in a good state of the temporarily stored in the buffer unit 4, and temporarily mounted on the motherboard (5), the secondary secondary in a plurality of rows to check the abnormal state in the mounted state By the test section 6, the secondary test section 6 The first unloading unit 7 in which two empty trays are vertically stacked in two rows so as to accommodate a large number of second-order modular rams of the modular ram, and the second ram by the secondary test unit 6 The empty tray 8a includes a second unloading part 8 vertically stacked to accommodate a large number of defective modules.

In the above configuration, the secondary test unit 6 is separately separated and coupled to the rear portion of the housing 1 in a detachable state, which is a test condition of high temperature and low temperature when the module is secondary tested. This is to satisfy all of them.

In this case, the module ram accommodated in the tray of the loading unit 2 is transferred to the primary test unit 3, and the module ram primarily tested by the primary test unit 3 is transferred to the buffer unit 4. The transfer of the module ram of the quantity of goods separated in the buffer unit 4 to the secondary test unit 6, the first test of the module ram tested by the secondary test unit 6 The transfer to the tray of the loading unit 7 or the transfer to the tray of the second unloading unit 8 is configured to be performed by the robot picker 9.

In the present invention, the tray of the loading unit 2, the tray of the first unloading unit 7 and the tray of the second unloading unit 8, the motherboard 5 of the secondary test unit 6 is a motor and The elevating means is constituted by elevating means composed of a chain or the like.

Hereinafter, the operation of the test handler according to the prior art will be described.

First, the test module is stored in a tray, and the tray in which the module is stored is vertically stacked on the loading unit 2.

Subsequently, when the test start mode is selected in a state in which the trays in which the modulator is accommodated in the loading unit 2 are vertically stacked, one tray of the stacked trays is lifted and positioned by lifting means, and at the same time, the two-axis robot Or a robot picker 9 including a two-axis linear motor, etc., picks up a plurality of modulators stored in the tray of the loading unit 2 and transfers them to the first test unit 3, for example. The primary test unit 3 performs a primary test for inspecting a short of the transferred module ram.

In this way, the first test module 3 in the primary test unit 3 is again transferred to the buffer unit 4 by the robot picker 9 and separated into good and bad parts temporarily stored in this process, the secondary test unit ( One motherboard 5 in any one row of 6) is horizontally pulled out and ready to be transported with a good quality modulator temporarily stored in the buffer unit 4.

On the other hand, the modules of the quantity separated and temporarily stored in the buffer unit 4 are transferred by the robot picker 9 to the withdrawn motherboard 5 of the secondary test unit 6 by four, and thus the upper portion of the motherboard. As it is inserted through the socket mounted on the surface, it is temporarily mounted on the motherboard 5, and one motherboard 5 in which the module is mounted is horizontally inserted into the secondary test unit 6. As it moves in and descends or rises at the same time, a new motherboard 5, in which the module is not mounted again, is pulled out, and the module is continuously mounted on the motherboard.

In this way, when the module ram is completed on all the motherboards 5 constituting the secondary test unit 6 in any one row, the mounted module ram may be modified by various testing means in the secondary test unit 6. In this case, the module is mounted on the motherboard 5 constituting the second test unit 6 in another row by the process described above.

After the module ram is inspected in the state of being mounted on the motherboard 5 in the secondary test unit 5, the module ram is divided into good and defective parts again according to the test result. Finally, the modular ram determined to be a good product is transferred to the empty tray of the first unloading unit 7 by the robot picker, and the modular ram determined to be a defective product is transferred to the empty tray of the second unloading unit 8. It is moved and stored, and once the module of the article is stored in all the trays of the first unloading unit 7, the process of taking out and shipping, as well as the defective parts of all trays of the second unloading unit 8 After the module is stored, it is taken out and destroyed.

The test handler according to the prior art has a number of inefficient elements in terms of movement and time of the robot picker in the handling process for the first and second tests.

For example, if a picking error of the robot picker occurs or the number of modules remaining in the tray of the loading unit is less than one preset number of modular ram movements (for example, four) of the robot picker, the picking unit picks it up again. Wait until the loading tray is ready or pick up the tray.

In addition, if only one of the test results is determined to be defective, the robot picker, which can move four at a time, must move to accommodate this one module ram in the second unloading section.

In addition, when all of the secondary test results are determined to be good, it should be stored in the tray of the first unloading unit. In this case, if the tray is full and needs to be replaced, the corresponding time should be waited.

Accordingly, an object of the present invention is to provide a test handler and a control method for improving the inefficiency of the moving and temporal aspects of the robot picker by using a buffer. have.

1 is a plan view showing the configuration of a typical test handler

2 is a plan view showing a buffer of a test handler according to the present invention;

3 is a flowchart illustrating a method of controlling a test handler according to the present invention.

Explanation of symbols for main parts of the drawings

2: loading unit 3: primary test unit

4: buffer section 5: motherboard

6: 2nd test part 7: 1st unloading part

8: 2nd unloading part 9: robot picker

The test handler according to the present invention includes a loading unit for storing an object for performing a test, an unloading unit for classifying and storing the tested object according to the test result, at least one test unit, and an object according to a predetermined handling program. In the test handler comprising a robot picker for storing the moving to the test unit or the unloading unit from the loading unit, and a buffer unit for temporarily storing the object during each test process, the buffer unit has a number of objects stored in the loading unit. If the number of movements of the robot picker is less than one movement, the loading buffer for temporarily storing it, and if the number of objects determined to be good or bad by the test results of each of the at least one test unit is less than the number of movements of the robot picker, the respective classification and temporary At least two test burrs for storage It is characterized by including a fur.

The test handler control method according to the present invention includes a buffer unit including a loading unit, an unloading unit, at least one test unit, a robot picker, a loading buffer, at least one test good buffer, and at least one test bad buffer, By using a robot picker, the object stored in the loading unit is moved to at least one test unit by a predetermined number of movement units of a predetermined robot picker in a predetermined order to perform a corresponding test, and the object is classified according to the execution result. In the test handler for moving to the loading unit, when the number of objects stored in the loading unit is less than the number of movements of the robot picker, it is stored in the loading buffer, and if the number of objects stored in the loading buffer is more than one movement of the robot picker, Moving to a test unit, and testing each test unit As a result, when a part of the object is judged to be defective, the object determined as bad is stored in the test bad buffer, the remaining good object is stored in the test good buffer, and the number of objects contained in each test bad buffer and the test good buffer It characterized in that it comprises a step of accommodating the object in the buffer in the case of more than one movement of the unloading unit.

Hereinafter, a preferred embodiment of a buffer control method of a test handler according to the present invention will be described in detail with reference to the accompanying drawings.

2 is a plan view illustrating a buffer of a test handler according to the present invention, and FIG. 3 is a flowchart illustrating a control method of the test handler according to the present invention.

First, the buffer unit 4 of the test handler according to the present invention will be described.

As shown in FIG. 2, the buffer unit 4 of the test handler according to the present invention is divided into predetermined regions.

The allocation by area may vary depending on the total storage space of the buffer unit 4. For example, when the buffer unit 4 has a total of 46 storage spaces, a module for preparing a first test Allocate 12 and 12 loading buffers for temporarily loading RAM, and 8 and 7 areas for accommodating module RAM that has been judged good and fail as a result of the first test. 1st test good buffer, 1st test bad buffer, and 2nd test good buffer which allocated 12 and 7, respectively, as an area for accommodating the good and failing modules. And the second test bad buffer. In addition, the buffer unit 4 is provided with a sensor for determining the presence or absence of the storage module.

The control method of the test handler having the buffer in which the area allocation is performed will be described in detail with reference to FIG. 3 as follows.

First, the test module is stored in a tray, and the tray in which the module is stored is vertically stacked on the loading unit 2.

Subsequently, when the test start mode is selected in a state in which the trays in which the modulator is accommodated in the loading unit 2 are vertically stacked, one tray of the stacked trays is lifted and positioned by lifting means, and at the same time, the two-axis robot The robot picker 9 including a two-axis linear motor or the like is picked up to pick up the module to be tested by the loading unit 2. At this time, if the number of modules that the robot picker 9 should normally pick up at once is four, for example, it is determined whether four have been picked up normally (S31). This may occur when the number of modules loaded on the tray of the loading unit 2 is an odd number or a number not divided by four, which may cause the robot picker to not pick four and picking errors of the robot picker may also occur. Because there is.

And if the determination result (S31), four do not pick up is placed in the loading buffer of the buffer unit (4) (S32).

Subsequently, it is determined whether the total number of modules laid in the loading buffer is four or more (S33), and if it is four or more, it is picked up and transferred to the first test unit 3 (S34).

At this time, the robot picker 9 failed to pick up four cases because there is a picking error or less than four modules remain in the tray of the loading unit 2, so to fill the four, wait while the tray is replaced or the loading unit ( It must be picked up again from the tray of 2), which may lower the handling efficiency. Therefore, the robot picker 9 puts the current module into the loading buffer, grasps the number of modules stored in the loading buffer, and picks four or more modules to carry out the first test.

On the other hand, if the number of modules stored in the loading buffer is less than four, the process returns to the initial step (S31).

The first test result determines whether all four modules are determined to be good (S35). If all four are determined to be good, the second test unit 6 is moved to perform the second test (S36).

On the other hand, if only a part of the four modules of the determination result (S35) is good, the module ram determined to be good is placed in the first test good buffer, and the module ram determined bad is placed in the first test bad buffer (S37).

Subsequently, it is determined whether the number of module rams in the primary test good buffer is 4 or more (S38). If the number is 4 or more, the second test unit 6 is transferred to the secondary test unit 6 (S36).

And if the determination result (S38), if the number of module ram in the first test good buffer is less than four, it is determined whether the number of module ram in the first test bad buffer is four or more (S39), and if it is four or more After placing the second unloading unit 8 (S40), the process returns to the initial stage S31.

At this time, it is inefficient in terms of movement and time of the robot picker to move some of the modules determined to be defective among the four modules according to the first test as the first unsuccessful buffer. If the number of modules in the first test bad buffer after placing the four or more, it is to be stored in the second unloading unit (8).

On the other hand, if the determination result (S39), the number of the module RAM in the first test bad buffer is less than four, the process returns to the initial step (S31).

Subsequently, as a result of performing the second test, it is determined whether all four modules are satisfactory (S41), and if all four are satisfactory, the first unloading unit 7 determines whether a tray for receiving the four determined modules is ready. (S42).

When the tray of the first unloading unit 7 is prepared, the determination result (S42) places the modulator determined to be the second test good on the tray of the first unloading unit 7 (S43). Return to S31.

On the other hand, if the tray of the first unloading unit 7 is not prepared, the module ram determined to be the second test good is placed in the second test good buffer (S45).

Subsequently, it is determined whether there are four or more modulators in the secondary test good buffer (S46), and if the number is four or more, the process returns to the step S42.

On the other hand, if the determination result (S46), the second test good buffer is less than four modules in the second test bad buffer is determined whether there are four or more module ram (S47), if four or more, pick it up 2 is placed in the unloading section 8 (S48), and the process returns to the initial step S11.

If the determination result (S47), less than four modules in the secondary test failure buffer is returned to the initial step (S11).

As described above, after all the trays of the first unloading unit 7 have been determined to be good, the modules are unloaded and shipped, as well as those of the second unloading unit 8. After the storage is completed, it is taken out and discarded.

The test handler and its control method according to the present invention minimize the movement and movement time of the robot picker during the handling process by using a buffer allocated with an area according to the loading and each test result. Since the test can be performed, the operation efficiency of the test handler can be improved.

Claims (4)

A loading unit for storing an object for performing a test, an unloading unit for classifying and storing the tested object according to the test result, at least one test unit, and the object from the loading unit according to a preset handling program. In the test handler having a robot picker for moving to the test unit or the unloading unit for storage, and a buffer unit for temporarily storing the object during the test process, The buffer unit includes a loading buffer for temporarily storing the number of objects stored in the loading unit when the number of objects in the loading unit is less than one movement of the preset robot picker, and the number of objects determined to be good or bad by the test results of each of the at least one test unit. And at least two test buffers for classifying and temporarily storing the robot pickers when they are less than one movement of the robot picker. A loading unit for storing an object for performing a test, an unloading unit for classifying and storing the tested object according to the test result, a primary test unit, a secondary test unit, and the object according to a predetermined handling program. In the test handler having a robot picker for moving and storing from the loading unit to the first test unit, the second test unit or the unloading unit, and a buffer unit for temporarily storing the object during each test process, The buffer unit includes a loading buffer for temporarily storing the number of objects stored in the loading unit when the number of objects stored in the loading unit is less than one movement of a preset robot picker, and an object determined to be good or bad by a test result of each of the first and second test units. And four test buffers for classifying and temporarily storing the number of times less than the number of movements of the robot picker. The method of claim 2, The buffer unit is a test handler, characterized in that provided with a sensor for detecting the object receiving state of each buffer. A loading unit, an unloading unit, at least one test unit, a robot picker, a loading buffer and a buffer unit including at least one test good buffer and at least one test bad buffer, and the loading unit using the robot picker. In the test handler to move the object stored in the predetermined number of movement units of the predetermined robot picker to the at least one or more test unit in a predetermined order to perform the test, and to classify the object to the unloading unit according to the result of the execution In If the number of objects stored in the loading unit is less than one movement of the robot picker, storing them in the loading buffer; and if the number of objects stored in the loading buffer is more than one movement of the robot picker, moving them to the corresponding test unit. , If a part of an object is determined to be defective in the test result of each test unit, the defective object is stored in the corresponding test bad buffer, the remaining good object is stored in the corresponding test good buffer, and stored in the respective test bad buffer and the test good buffer. And storing an object in a corresponding buffer in an unloading unit when the number of objects is more than one movement of the robot picker.