KR100381079B1 - 아날로그기능을가진집적회로,집적회로캐리어,및복수의인쇄회로기판들을구비하는시스템 - Google Patents

아날로그기능을가진집적회로,집적회로캐리어,및복수의인쇄회로기판들을구비하는시스템 Download PDF

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Publication number
KR100381079B1
KR100381079B1 KR1019940010457A KR19940010457A KR100381079B1 KR 100381079 B1 KR100381079 B1 KR 100381079B1 KR 1019940010457 A KR1019940010457 A KR 1019940010457A KR 19940010457 A KR19940010457 A KR 19940010457A KR 100381079 B1 KR100381079 B1 KR 100381079B1
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KR
South Korea
Prior art keywords
circuit
integrated circuit
stage switch
test bus
analog
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Expired - Fee Related
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KR1019940010457A
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English (en)
Korean (ko)
Inventor
리나아찌
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코닌클리케 필립스 일렉트로닉스 엔.브이.
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Application filed by 코닌클리케 필립스 일렉트로닉스 엔.브이. filed Critical 코닌클리케 필립스 일렉트로닉스 엔.브이.
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Publication of KR100381079B1 publication Critical patent/KR100381079B1/ko
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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318558—Addressing or selecting of subparts of the device under test
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2884—Testing of integrated circuits [IC] using dedicated test connectors, test elements or test circuits on the IC under test
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/3167—Testing of combined analog and digital circuits

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  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
KR1019940010457A 1993-05-24 1994-05-13 아날로그기능을가진집적회로,집적회로캐리어,및복수의인쇄회로기판들을구비하는시스템 Expired - Fee Related KR100381079B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US066,957 1993-05-24
US08/066,957 US5581176A (en) 1993-05-24 1993-05-24 Analog autonomous test bus framework for testing integrated circuits on a printed circuit board

Publications (1)

Publication Number Publication Date
KR100381079B1 true KR100381079B1 (ko) 2003-06-19

Family

ID=22072819

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019940010457A Expired - Fee Related KR100381079B1 (ko) 1993-05-24 1994-05-13 아날로그기능을가진집적회로,집적회로캐리어,및복수의인쇄회로기판들을구비하는시스템

Country Status (6)

Country Link
US (4) US5581176A (enExample)
EP (1) EP0627631B1 (enExample)
JP (1) JPH06331697A (enExample)
KR (1) KR100381079B1 (enExample)
DE (1) DE69429741T2 (enExample)
TW (1) TW256887B (enExample)

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US5581176A (en) * 1993-05-24 1996-12-03 North American Philips Corporation Analog autonomous test bus framework for testing integrated circuits on a printed circuit board
US5572160A (en) * 1994-12-01 1996-11-05 Teradyne, Inc. Architecture for RF signal automatic test equipment
US5619461A (en) 1995-07-28 1997-04-08 Micron Quantum Devices, Inc. Memory system having internal state monitoring circuit
KR100440366B1 (ko) * 1995-10-20 2004-11-16 코닌클리케 필립스 일렉트로닉스 엔.브이. 테스트가능회로및테스트방법
US6592619B2 (en) 1996-01-02 2003-07-15 University Of Cincinnati Heart wall actuation device for the natural heart
US6229296B1 (en) 1996-02-27 2001-05-08 Micron Technology, Inc. Circuit and method for measuring and forcing an internal voltage of an integrated circuit
US5977763A (en) * 1996-02-27 1999-11-02 Micron Technology, Inc. Circuit and method for measuring and forcing an internal voltage of an integrated circuit
US6946863B1 (en) 1998-02-27 2005-09-20 Micron Technology, Inc. Circuit and method for measuring and forcing an internal voltage of an integrated circuit
US6472747B2 (en) * 2001-03-02 2002-10-29 Qualcomm Incorporated Mixed analog and digital integrated circuits
US6949251B2 (en) * 2001-03-02 2005-09-27 Stryker Corporation Porous β-tricalcium phosphate granules for regeneration of bone tissue
US6986992B2 (en) * 2001-03-30 2006-01-17 Amersham Biosciences Ab P450 single nucleotide polymorphism biochip analysis
US6900106B2 (en) 2002-03-06 2005-05-31 Micron Technology, Inc. Methods of forming capacitor constructions
US7340659B2 (en) * 2002-05-15 2008-03-04 Infineon Technologies, A.G. Method of testing multiple modules on an integrated circuit
US7850729B2 (en) 2002-07-18 2010-12-14 The University Of Cincinnati Deforming jacket for a heart actuation device
US20040059180A1 (en) * 2002-09-23 2004-03-25 The University Of Cincinnati Basal mounting cushion frame component to facilitate extrinsic heart wall actuation
JP2004085366A (ja) * 2002-08-27 2004-03-18 Matsushita Electric Ind Co Ltd マルチチップモジュールおよびそのテスト方法
US20060178551A1 (en) * 2003-06-09 2006-08-10 Melvin David B Securement system for a heart actuation device
WO2004110553A1 (en) * 2003-06-09 2004-12-23 The University Of Cincinnati Actuation mechanisms for a heart actuation device
US6870384B1 (en) * 2004-07-02 2005-03-22 Credence Systems Corporation Test instrument with multiple analog modules
JP4299760B2 (ja) * 2004-10-21 2009-07-22 エルピーダメモリ株式会社 半導体装置のテスト方法
US7646203B2 (en) * 2007-07-16 2010-01-12 United Microelectronics Corp. Defect detection system with multilevel output capability and method thereof
JP2009025054A (ja) * 2007-07-18 2009-02-05 Panasonic Corp 半導体検査回路、および半導体検査方法
JP2011149775A (ja) * 2010-01-20 2011-08-04 Renesas Electronics Corp 半導体集積回路及びコアテスト回路
KR101709071B1 (ko) * 2010-05-19 2017-02-22 삼성전자주식회사 컴프레션 모드 스캔 테스트를 위한 집적 회로
US11431379B1 (en) * 2021-03-31 2022-08-30 Teradyne, Inc. Front-end module
US12474399B2 (en) * 2023-04-19 2025-11-18 Nxp B.V. Analog test devices for integrated circuits with multiple power domains

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US4395767A (en) * 1981-04-20 1983-07-26 Control Data Corporation Interconnect fault detector for LSI logic chips
US4441075A (en) * 1981-07-02 1984-04-03 International Business Machines Corporation Circuit arrangement which permits the testing of each individual chip and interchip connection in a high density packaging structure having a plurality of interconnected chips, without any physical disconnection
US4509008A (en) * 1982-04-20 1985-04-02 International Business Machines Corporation Method of concurrently testing each of a plurality of interconnected integrated circuit chips
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JPH04212524A (ja) * 1990-12-06 1992-08-04 Matsushita Electric Ind Co Ltd 半導体集積回路
US5391984A (en) * 1991-11-01 1995-02-21 Sgs-Thomson Microelectronics, Inc. Method and apparatus for testing integrated circuit devices
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US5379308A (en) * 1992-04-20 1995-01-03 Intel Corporation Apparatus for a bus-based integrated circuit test architecture
US5294882A (en) * 1992-07-28 1994-03-15 Sharp Kabushiki Kaisha Integrated circuit capable of testing reliability
US5581176A (en) * 1993-05-24 1996-12-03 North American Philips Corporation Analog autonomous test bus framework for testing integrated circuits on a printed circuit board

Also Published As

Publication number Publication date
DE69429741T2 (de) 2002-09-05
US5581176A (en) 1996-12-03
DE69429741D1 (de) 2002-03-14
EP0627631B1 (en) 2002-01-30
US5705925A (en) 1998-01-06
US5731701A (en) 1998-03-24
EP0627631A3 (en) 1995-05-17
JPH06331697A (ja) 1994-12-02
US5717329A (en) 1998-02-10
EP0627631A2 (en) 1994-12-07
TW256887B (enExample) 1995-09-11

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