KR0160159B1 - 마이크로파를 이용한 농도계 - Google Patents

마이크로파를 이용한 농도계 Download PDF

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Publication number
KR0160159B1
KR0160159B1 KR1019940006570A KR19940006570A KR0160159B1 KR 0160159 B1 KR0160159 B1 KR 0160159B1 KR 1019940006570 A KR1019940006570 A KR 1019940006570A KR 19940006570 A KR19940006570 A KR 19940006570A KR 0160159 B1 KR0160159 B1 KR 0160159B1
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KR
South Korea
Prior art keywords
microwave
ghz
reception signal
phase
phase delay
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
KR1019940006570A
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English (en)
Korean (ko)
Other versions
KR940022081A (ko
Inventor
세이지 야마구찌
다께시 야마우라
다까쯔구 오가따
츠또무 스즈끼
이꾸오 아라이
Original Assignee
사또우 후미오
가부시키가이샤 도시바
지사 스즈키 쥰이치
도쿄도
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Publication date
Application filed by 사또우 후미오, 가부시키가이샤 도시바, 지사 스즈키 쥰이치, 도쿄도 filed Critical 사또우 후미오
Publication of KR940022081A publication Critical patent/KR940022081A/ko
Application granted granted Critical
Publication of KR0160159B1 publication Critical patent/KR0160159B1/ko
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N22/00—Investigating or analysing materials by the use of microwaves or radio waves, i.e. electromagnetic waves with a wavelength of one millimetre or more

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Pathology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • General Health & Medical Sciences (AREA)
  • Electromagnetism (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Geophysics And Detection Of Objects (AREA)
KR1019940006570A 1993-03-30 1994-03-30 마이크로파를 이용한 농도계 Expired - Lifetime KR0160159B1 (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP93-071664 1993-03-30
JP05071664A JP3139874B2 (ja) 1993-03-30 1993-03-30 濃度計
JP93-71664 1993-03-30

Publications (2)

Publication Number Publication Date
KR940022081A KR940022081A (ko) 1994-10-20
KR0160159B1 true KR0160159B1 (ko) 1999-05-01

Family

ID=13467101

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019940006570A Expired - Lifetime KR0160159B1 (ko) 1993-03-30 1994-03-30 마이크로파를 이용한 농도계

Country Status (7)

Country Link
US (1) US5502393A (enExample)
EP (1) EP0619485B1 (enExample)
JP (1) JP3139874B2 (enExample)
KR (1) KR0160159B1 (enExample)
CN (1) CN1049494C (enExample)
DE (1) DE69422213T2 (enExample)
TW (1) TW283203B (enExample)

Families Citing this family (31)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3160428B2 (ja) * 1993-07-12 2001-04-25 株式会社東芝 濃度計
US5576627A (en) * 1994-09-06 1996-11-19 The Regents Of The University Of California Narrow field electromagnetic sensor system and method
JP3160474B2 (ja) * 1994-09-12 2001-04-25 株式会社東芝 マイクロ波濃度計
KR0137576B1 (ko) * 1994-12-07 1998-06-15 양승택 가변 임피던스 전자파 발생장치
DE19504544A1 (de) * 1995-02-11 1996-08-14 Reich Ernst Verfahren zum Ermitteln der Beladung eines Gasstroms mit Feststoffanteilen
US5741979A (en) * 1995-11-09 1998-04-21 The United States Of America As Represented By The Administrator Of National Aeronautics And Space Adminstrator Particle velocity measuring system
DE19705260B4 (de) * 1996-02-20 2008-12-24 Hauni Maschinenbau Ag Anordnung zum Erfassen mindestens einer dielektrischen Eigenschaft eines Stoffes
FI103920B (fi) * 1997-05-21 1999-10-15 Neles Field Controls Oy Menetelmä kaasupitoisuuden mittaamiseksi ja kaasupitoisuusmittari
SE509970C2 (sv) * 1997-06-18 1999-03-29 Anders Karlstroem Förfarande för mätning av koncentrationen av cellulosamaterial i en vattensuspension vid malning av träflis samt anordning för utövande av förfarandet
FI105363B (fi) * 1997-07-04 2000-07-31 Neles Field Controls Oy Menetelmä virtauksen mittaamiseksi ja virtausmittari
JPH1183758A (ja) * 1997-09-09 1999-03-26 Toshiba Joho Seigyo Syst Kk 濃度計
JP3413073B2 (ja) * 1997-09-11 2003-06-03 東芝Ｉｔコントロールシステム株式会社 マイクロ波式濃度測定装置
JP3876064B2 (ja) * 1997-12-25 2007-01-31 三菱重工業株式会社 分散状態測定装置
US6064903A (en) * 1997-12-29 2000-05-16 Spectra Research, Inc. Electromagnetic detection of an embedded dielectric region within an ambient dielectric region
DE19823695A1 (de) 1998-05-27 1999-12-02 Voith Sulzer Papiertech Patent Verfahren und Meßgerät zur quantitativen Erfassung von Inhaltsstoffen
JP2002519686A (ja) * 1998-07-03 2002-07-02 ネレス・フィールド・コントロールズ・オイ 液体物質測定方法および装置
FI104447B (fi) * 1998-07-10 2000-01-31 Valmet Automation Inc Menetelmä ja mittalaite nestemäisen aineen kaasupitoisuuden mittaamiseksi
JP2000111499A (ja) * 1998-10-02 2000-04-21 Toshiba Fa Syst Eng Corp マイクロ波濃度測定装置
AU770854B2 (en) * 1999-09-17 2004-03-04 Food Radar System In Sweden Ab Apparatus and method for detection of foreign bodies in products
AUPR611101A0 (en) * 2001-07-04 2001-07-26 Commonwealth Scientific And Industrial Research Organisation Apparatus and analysis method for determination of moisture in materials
AU2008201375B2 (en) * 2001-07-04 2009-09-03 Thermo Gamma-Metrics Pty Ltd Apparatus and analysis method for determination of moisture in materials
US20040194541A1 (en) * 2002-06-10 2004-10-07 The Procter & Gamble Company High-Q LC circuit moisture sensor
US6854322B2 (en) * 2002-06-10 2005-02-15 The Procter & Gamble Company Directional coupler sensor
CA2562001C (en) 2004-04-26 2013-04-16 The Procter & Gamble Company Methods of assessing characteristics of fibrous substrates and treating fibrous substrates
US7520667B2 (en) * 2006-05-11 2009-04-21 John Bean Technologies Ab Method and system for determining process parameters
AU2007269726B2 (en) 2006-06-30 2011-10-20 The Procter & Gamble Company Device for measuring moisture in overlays (like hair) of a microstrip directional coupler
JP5481154B2 (ja) * 2009-10-19 2014-04-23 株式会社東芝 電磁気応用濃度計
FI126030B (en) * 2014-11-10 2016-05-31 Senfit Oy An apparatus and method for measuring the fluid and an arrangement and method for controlling the solids content of the fluid
KR20160101221A (ko) * 2015-02-13 2016-08-25 삼성디스플레이 주식회사 유체 갈라짐 감지 장치
JP6889346B1 (ja) * 2019-08-20 2021-06-18 日本たばこ産業株式会社 円筒状加熱型喫煙物品の製造方法及び製造装置
KR102790867B1 (ko) * 2023-02-24 2025-04-04 주식회사 동도뉴텍 콘크리트 회수수 농도 측정 장치

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5919846A (ja) * 1982-07-27 1984-02-01 Nippon Steel Corp マイクロ波濃度計
US4486714A (en) * 1982-09-08 1984-12-04 Texaco Inc. Method and apparatus for measuring relative permeability and water saturation of a core of earthen material
US4764718A (en) * 1986-04-23 1988-08-16 Chevron Research Company Microwave oil saturation scanner
US4862060A (en) * 1986-11-18 1989-08-29 Atlantic Richfield Company Microwave apparatus for measuring fluid mixtures
US4888547A (en) * 1989-01-23 1989-12-19 Rockwell International Corporation Meter using a microwave bridge detector for measuring fluid mixtures
US4977377A (en) * 1989-04-13 1990-12-11 Texaco Inc. Microwave water cut monitor with temperature controlled test cell
ES2146579T3 (es) * 1990-03-23 2000-08-16 Commw Scient Ind Res Org Medicion del contenido de carbono en cenizas volantes.
US5455516A (en) * 1992-04-21 1995-10-03 Thermedics Inc. Meter and method for in situ measurement of the electromagnetic properties of various process materials using cutoff frequency characterization and analysis

Also Published As

Publication number Publication date
CN1105123A (zh) 1995-07-12
DE69422213D1 (de) 2000-01-27
DE69422213T2 (de) 2000-08-24
JP3139874B2 (ja) 2001-03-05
US5502393A (en) 1996-03-26
TW283203B (enExample) 1996-08-11
JPH06288937A (ja) 1994-10-18
KR940022081A (ko) 1994-10-20
EP0619485B1 (en) 1999-12-22
CN1049494C (zh) 2000-02-16
EP0619485A1 (en) 1994-10-12

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