JPWO2024241920A5 - - Google Patents

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Publication number
JPWO2024241920A5
JPWO2024241920A5 JP2025522310A JP2025522310A JPWO2024241920A5 JP WO2024241920 A5 JPWO2024241920 A5 JP WO2024241920A5 JP 2025522310 A JP2025522310 A JP 2025522310A JP 2025522310 A JP2025522310 A JP 2025522310A JP WO2024241920 A5 JPWO2024241920 A5 JP WO2024241920A5
Authority
JP
Japan
Prior art keywords
acetylene
laser light
concentration
sample
sample gas
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2025522310A
Other languages
English (en)
Japanese (ja)
Other versions
JPWO2024241920A1 (https=
Publication date
Application filed filed Critical
Priority claimed from PCT/JP2024/017471 external-priority patent/WO2024241920A1/ja
Publication of JPWO2024241920A1 publication Critical patent/JPWO2024241920A1/ja
Publication of JPWO2024241920A5 publication Critical patent/JPWO2024241920A5/ja
Pending legal-status Critical Current

Links

JP2025522310A 2023-05-19 2024-05-10 Pending JPWO2024241920A1 (https=)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2023082813 2023-05-19
PCT/JP2024/017471 WO2024241920A1 (ja) 2023-05-19 2024-05-10 分析装置、分析装置用プログラム及び分析方法

Publications (2)

Publication Number Publication Date
JPWO2024241920A1 JPWO2024241920A1 (https=) 2024-11-28
JPWO2024241920A5 true JPWO2024241920A5 (https=) 2026-02-18

Family

ID=93589796

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2025522310A Pending JPWO2024241920A1 (https=) 2023-05-19 2024-05-10

Country Status (2)

Country Link
JP (1) JPWO2024241920A1 (https=)
WO (1) WO2024241920A1 (https=)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN120330655B (zh) * 2025-06-20 2025-08-22 法垄热工技术(上海)有限公司 引入气体调节干涉图像系统的工件渗碳工艺

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110998290B (zh) * 2017-07-21 2022-10-28 西门子股份公司 确定乙烯中的杂质气体的方法和测量系统
JP7473546B2 (ja) * 2019-06-27 2024-04-23 株式会社堀場製作所 分析装置
EP4160189B1 (en) * 2020-05-29 2026-03-25 HORIBA, Ltd. Analysis device, program for analysis device, and analysis method

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