JPWO2023095864A5 - - Google Patents

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Publication number
JPWO2023095864A5
JPWO2023095864A5 JP2023563745A JP2023563745A JPWO2023095864A5 JP WO2023095864 A5 JPWO2023095864 A5 JP WO2023095864A5 JP 2023563745 A JP2023563745 A JP 2023563745A JP 2023563745 A JP2023563745 A JP 2023563745A JP WO2023095864 A5 JPWO2023095864 A5 JP WO2023095864A5
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JP
Japan
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concentration
absorption
calculated based
measuring
acetylene
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Pending
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JP2023563745A
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English (en)
Japanese (ja)
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JPWO2023095864A1 (https=
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Priority claimed from PCT/JP2022/043508 external-priority patent/WO2023095864A1/ja
Publication of JPWO2023095864A1 publication Critical patent/JPWO2023095864A1/ja
Publication of JPWO2023095864A5 publication Critical patent/JPWO2023095864A5/ja
Pending legal-status Critical Current

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JP2023563745A 2021-11-25 2022-11-25 Pending JPWO2023095864A1 (https=)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2021191219 2021-11-25
PCT/JP2022/043508 WO2023095864A1 (ja) 2021-11-25 2022-11-25 分析装置、分析装置用プログラム及び分析方法

Publications (2)

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JPWO2023095864A1 JPWO2023095864A1 (https=) 2023-06-01
JPWO2023095864A5 true JPWO2023095864A5 (https=) 2024-08-08

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ID=86539597

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JP2023563745A Pending JPWO2023095864A1 (https=) 2021-11-25 2022-11-25

Country Status (5)

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US (1) US20250389654A1 (https=)
EP (1) EP4439048A4 (https=)
JP (1) JPWO2023095864A1 (https=)
CN (1) CN118202228A (https=)
WO (1) WO2023095864A1 (https=)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
AT527329A1 (de) * 2023-06-29 2025-01-15 Avl List Gmbh Verfahren zur Messwertkorrektur sowie Vorrichtung zur Konzentrationsmessung eines Messgases

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1995026497A1 (en) * 1994-03-25 1995-10-05 Nippon Sanso Corporation Infrared spectrochemical gas analysis and apparatus used for the same
FR2776771B1 (fr) * 1998-03-24 2000-05-26 Schlumberger Ind Sa Procede d'etalonnage en longueur d'onde d'un dispositif de filtrage d'un rayonnement electromagnetique
JP4449058B2 (ja) * 2004-08-09 2010-04-14 独立行政法人科学技術振興機構 気体中微量物質の濃度測定方法
WO2006085646A1 (ja) * 2005-02-14 2006-08-17 Japan Science And Technology Agency ガス相関法によるガス濃度測定装置
JP2016090521A (ja) 2014-11-11 2016-05-23 株式会社島津製作所 ガス吸光度測定装置
JP6513762B2 (ja) * 2016-12-15 2019-05-15 株式会社堀場製作所 分析装置、分析装置用プログラム及び分析方法
GB201700905D0 (en) * 2017-01-19 2017-03-08 Cascade Tech Holdings Ltd Close-Coupled Analyser
CN110998290B (zh) * 2017-07-21 2022-10-28 西门子股份公司 确定乙烯中的杂质气体的方法和测量系统

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