JPWO2023095881A5 - - Google Patents

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Publication number
JPWO2023095881A5
JPWO2023095881A5 JP2023563757A JP2023563757A JPWO2023095881A5 JP WO2023095881 A5 JPWO2023095881 A5 JP WO2023095881A5 JP 2023563757 A JP2023563757 A JP 2023563757A JP 2023563757 A JP2023563757 A JP 2023563757A JP WO2023095881 A5 JPWO2023095881 A5 JP WO2023095881A5
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JP
Japan
Prior art keywords
concentration
absorption
measuring
calculated based
ethane
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Pending
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JP2023563757A
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English (en)
Japanese (ja)
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JPWO2023095881A1 (https=
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Priority claimed from PCT/JP2022/043575 external-priority patent/WO2023095881A1/ja
Publication of JPWO2023095881A1 publication Critical patent/JPWO2023095881A1/ja
Publication of JPWO2023095881A5 publication Critical patent/JPWO2023095881A5/ja
Pending legal-status Critical Current

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JP2023563757A 2021-11-25 2022-11-25 Pending JPWO2023095881A1 (https=)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2021191220 2021-11-25
PCT/JP2022/043575 WO2023095881A1 (ja) 2021-11-25 2022-11-25 分析装置、分析装置用プログラム及び分析方法

Publications (2)

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JPWO2023095881A1 JPWO2023095881A1 (https=) 2023-06-01
JPWO2023095881A5 true JPWO2023095881A5 (https=) 2024-08-09

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ID=86539630

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JP2023563757A Pending JPWO2023095881A1 (https=) 2021-11-25 2022-11-25

Country Status (4)

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EP (1) EP4439050A4 (https=)
JP (1) JPWO2023095881A1 (https=)
CN (1) CN118176413A (https=)
WO (1) WO2023095881A1 (https=)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN120578240B (zh) * 2025-05-27 2026-02-10 湖南光智通信技术有限公司 一种dfb激光器的光斑一致性控制方法及系统

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2866230B2 (ja) * 1991-09-20 1999-03-08 東京瓦斯株式会社 ガス濃度測定装置
JP2008232920A (ja) * 2007-03-22 2008-10-02 Anritsu Corp ガス検知装置及び該装置を用いた校正方法並びに波長確認方法
JP2016090521A (ja) 2014-11-11 2016-05-23 株式会社島津製作所 ガス吸光度測定装置
JP2017101950A (ja) * 2015-11-30 2017-06-08 富士電機株式会社 レーザ式ガス分析計
JP7049820B2 (ja) * 2017-12-15 2022-04-07 株式会社堀場製作所 半導体レーザ装置及びその製造方法並びにガス分析装置
CN109406438A (zh) * 2018-11-06 2019-03-01 宁波海尔欣光电科技有限公司 光源封装体和用于检测气体的浓度的系统
JP2021043117A (ja) * 2019-09-12 2021-03-18 富士電機株式会社 レーザ式ガス分析計
CN111521581B (zh) * 2020-04-24 2023-02-03 北京航天控制仪器研究所 一氧化碳和甲烷组分判断及浓度检测方法、装置及应用

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