JPWO2024070737A5 - - Google Patents

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Publication number
JPWO2024070737A5
JPWO2024070737A5 JP2024550075A JP2024550075A JPWO2024070737A5 JP WO2024070737 A5 JPWO2024070737 A5 JP WO2024070737A5 JP 2024550075 A JP2024550075 A JP 2024550075A JP 2024550075 A JP2024550075 A JP 2024550075A JP WO2024070737 A5 JPWO2024070737 A5 JP WO2024070737A5
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JP
Japan
Prior art keywords
electrode
detection element
radiation
radiation detection
potential
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Pending
Application number
JP2024550075A
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English (en)
Japanese (ja)
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JPWO2024070737A1 (https=
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Application filed filed Critical
Priority claimed from PCT/JP2023/033568 external-priority patent/WO2024070737A1/ja
Publication of JPWO2024070737A1 publication Critical patent/JPWO2024070737A1/ja
Publication of JPWO2024070737A5 publication Critical patent/JPWO2024070737A5/ja
Pending legal-status Critical Current

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JP2024550075A 2022-09-29 2023-09-14 Pending JPWO2024070737A1 (https=)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2022156683 2022-09-29
PCT/JP2023/033568 WO2024070737A1 (ja) 2022-09-29 2023-09-14 放射線検出素子、放射線検出器及び放射線検出装置

Publications (2)

Publication Number Publication Date
JPWO2024070737A1 JPWO2024070737A1 (https=) 2024-04-04
JPWO2024070737A5 true JPWO2024070737A5 (https=) 2025-06-13

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ID=90477624

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2024550075A Pending JPWO2024070737A1 (https=) 2022-09-29 2023-09-14

Country Status (4)

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US (1) US20260086251A1 (https=)
EP (1) EP4597171A1 (https=)
JP (1) JPWO2024070737A1 (https=)
WO (1) WO2024070737A1 (https=)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2026048679A1 (ja) * 2024-08-29 2026-03-05 株式会社堀場製作所 放射線検出素子、放射線検出器及び放射線検出装置

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE10260229B3 (de) 2002-12-20 2005-08-18 MAX-PLANCK-Gesellschaft zur Förderung der Wissenschaften e.V. Halbleiter-Detektor mit optimiertem Strahlungseintrittsfenster
JP2011187501A (ja) * 2010-03-04 2011-09-22 Seiko Instruments Inc シリコン検出器およびシリコン検出器の製造方法
CN111354747A (zh) * 2020-03-23 2020-06-30 湘潭大学 基于分压电阻和漂浮电极的硅漂移探测器及其设计方法

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