JPWO2023286657A5 - - Google Patents

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Publication number
JPWO2023286657A5
JPWO2023286657A5 JP2023535257A JP2023535257A JPWO2023286657A5 JP WO2023286657 A5 JPWO2023286657 A5 JP WO2023286657A5 JP 2023535257 A JP2023535257 A JP 2023535257A JP 2023535257 A JP2023535257 A JP 2023535257A JP WO2023286657 A5 JPWO2023286657 A5 JP WO2023286657A5
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JP
Japan
Prior art keywords
wavelength
light
led chip
signals
readout means
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Pending
Application number
JP2023535257A
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English (en)
Japanese (ja)
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JPWO2023286657A1 (enrdf_load_stackoverflow
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Priority claimed from PCT/JP2022/026693 external-priority patent/WO2023286657A1/ja
Publication of JPWO2023286657A1 publication Critical patent/JPWO2023286657A1/ja
Publication of JPWO2023286657A5 publication Critical patent/JPWO2023286657A5/ja
Pending legal-status Critical Current

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JP2023535257A 2021-07-16 2022-07-05 Pending JPWO2023286657A1 (enrdf_load_stackoverflow)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2021118071 2021-07-16
PCT/JP2022/026693 WO2023286657A1 (ja) 2021-07-16 2022-07-05 波長測定装置及び波長測定方法

Publications (2)

Publication Number Publication Date
JPWO2023286657A1 JPWO2023286657A1 (enrdf_load_stackoverflow) 2023-01-19
JPWO2023286657A5 true JPWO2023286657A5 (enrdf_load_stackoverflow) 2024-06-04

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ID=84920087

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2023535257A Pending JPWO2023286657A1 (enrdf_load_stackoverflow) 2021-07-16 2022-07-05

Country Status (4)

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JP (1) JPWO2023286657A1 (enrdf_load_stackoverflow)
KR (1) KR20240027128A (enrdf_load_stackoverflow)
CN (1) CN117651850A (enrdf_load_stackoverflow)
WO (1) WO2023286657A1 (enrdf_load_stackoverflow)

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02150833A (ja) * 1988-12-02 1990-06-11 Fuji Photo Film Co Ltd 写真プリンタの測光装置
JP5210571B2 (ja) * 2007-08-28 2013-06-12 オリンパス株式会社 画像処理装置、画像処理プログラムおよび画像処理方法
JP2010078418A (ja) * 2008-09-25 2010-04-08 Seiko Epson Corp 分光測定装置、校正装置、分光測定方法、および校正方法
JP2010261861A (ja) * 2009-05-08 2010-11-18 Ricoh Co Ltd 分光特性取得装置、画像評価装置、及び画像形成装置
KR102117734B1 (ko) * 2012-10-23 2020-06-01 애플 인크. 분광기를 이용하여 특수 설계된 패턴 폐루프 보정에 의한 고 정확도의 영상 색도계
JP2018128326A (ja) 2017-02-07 2018-08-16 大塚電子株式会社 光学スペクトル測定装置および光学スペクトル測定方法
JP2019020311A (ja) * 2017-07-20 2019-02-07 株式会社パパラボ 色彩測定方法及び色彩測定装置
US11202062B2 (en) * 2017-11-21 2021-12-14 University Of New Hampshire Methods and systems of determining quantum efficiency of a camera
WO2020054381A1 (ja) * 2018-09-14 2020-03-19 コニカミノルタ株式会社 表面特性測定用データの出力装置及び表面特性測定装置
US12154298B2 (en) * 2019-07-29 2024-11-26 Casio Computer Co., Ltd. Color estimation device, color estimation method, and program

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