JPWO2023190052A5 - - Google Patents

Download PDF

Info

Publication number
JPWO2023190052A5
JPWO2023190052A5 JP2024512280A JP2024512280A JPWO2023190052A5 JP WO2023190052 A5 JPWO2023190052 A5 JP WO2023190052A5 JP 2024512280 A JP2024512280 A JP 2024512280A JP 2024512280 A JP2024512280 A JP 2024512280A JP WO2023190052 A5 JPWO2023190052 A5 JP WO2023190052A5
Authority
JP
Japan
Prior art keywords
optical sheet
center
base material
concentric pattern
die
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2024512280A
Other languages
English (en)
Japanese (ja)
Other versions
JPWO2023190052A1 (cg-RX-API-DMAC7.html
Filing date
Publication date
Application filed filed Critical
Priority claimed from PCT/JP2023/011561 external-priority patent/WO2023190052A1/ja
Publication of JPWO2023190052A1 publication Critical patent/JPWO2023190052A1/ja
Publication of JPWO2023190052A5 publication Critical patent/JPWO2023190052A5/ja
Pending legal-status Critical Current

Links

JP2024512280A 2022-03-29 2023-03-23 Pending JPWO2023190052A1 (cg-RX-API-DMAC7.html)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2022052858 2022-03-29
PCT/JP2023/011561 WO2023190052A1 (ja) 2022-03-29 2023-03-23 光学シートの製造方法および光学シートの製造装置

Publications (2)

Publication Number Publication Date
JPWO2023190052A1 JPWO2023190052A1 (cg-RX-API-DMAC7.html) 2023-10-05
JPWO2023190052A5 true JPWO2023190052A5 (cg-RX-API-DMAC7.html) 2024-12-13

Family

ID=88202154

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2024512280A Pending JPWO2023190052A1 (cg-RX-API-DMAC7.html) 2022-03-29 2023-03-23

Country Status (3)

Country Link
US (1) US20250001635A1 (cg-RX-API-DMAC7.html)
JP (1) JPWO2023190052A1 (cg-RX-API-DMAC7.html)
WO (1) WO2023190052A1 (cg-RX-API-DMAC7.html)

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DD111044A1 (cg-RX-API-DMAC7.html) * 1974-01-02 1975-01-20
JPS63229624A (ja) * 1987-03-18 1988-09-26 Fuji Photo Film Co Ltd 円盤状磁気記録媒体の製法
JPH01192019A (ja) * 1988-01-28 1989-08-02 Toshiba Corp 磁気ディスクの複製装置
US6520056B1 (en) * 1999-08-26 2003-02-18 Rockwell Collins, Inc. Method and apparatus for cutting optical films having precision alignment of optical axes with optical film edges
US6991695B2 (en) * 2002-05-21 2006-01-31 3M Innovative Properties Company Method for subdividing multilayer optical film cleanly and rapidly
JP2006179122A (ja) * 2004-12-22 2006-07-06 Hitachi Maxell Ltd 薄型光ディスクの製造方法及び製造装置
US8052902B2 (en) * 2006-11-28 2011-11-08 Lg Display Co., Ltd. Method of fabricating polarizing plate
CN101315470A (zh) * 2007-05-30 2008-12-03 赖秀惠 用于检测设备的透镜拼接方法及其系统
JP2016179504A (ja) * 2015-03-23 2016-10-13 ブラザー工業株式会社 切断装置
CN107924013B (zh) * 2015-08-21 2019-08-16 3M创新有限公司 具有光轴的光学膜及用于处理光学膜的系统和方法
EP3515710B1 (en) * 2016-09-26 2026-02-11 Ashok Chaturvedi Apparatus for registered foil stamping and process
CN119319591A (zh) * 2016-12-01 2025-01-17 3M创新有限公司 转换工位、方法和系统
EP3342568B1 (en) * 2016-12-28 2019-08-21 Fundacion Centro de Tecnologias de Interaccion Visual y Communicaciones VICOMTECH Digitally assisted compensation of misalignments in die cutting of cardboard
US11247422B2 (en) * 2018-10-22 2022-02-15 Facebook Technologies, Llc Optical element fabrication with optical scanner feedback

Similar Documents

Publication Publication Date Title
TWI707757B (zh) 晶圓生成方法及加工進給方向檢測方法
CN105382420B (zh) 激光加工装置
CN105643094B (zh) 激光加工装置
US9517962B2 (en) Plate-shaped object processing method
JP6328521B2 (ja) レーザー光線のスポット形状検出方法
US10207362B2 (en) Laser processing apparatus
US9186750B2 (en) Laser processing apparatus
US8304691B2 (en) Determining a focal position of a laser
US9981343B2 (en) Laser processing apparatus
TW201836033A (zh) 半導體晶錠的檢查方法、檢查裝置及雷射加工裝置
TW201733760A (zh) 晶圓生成方法
TWI460427B (zh) 原木的年輪中心檢測裝置及方法
TWI743297B (zh) 雷射加工裝置
TWI712079B (zh) 晶圓之加工方法
JP7437958B2 (ja) ウエーハの中心検出方法及びウエーハの中心検出装置
CN108723599B (zh) 聚光点位置检测方法
TW201838751A (zh) 雷射加工裝置的高度位置檢測單元之評價用治具以及雷射加工裝置的高度位置檢測單元之評價方法
JP2021020242A (ja) レーザー加工装置およびレーザー加工方法
US8098923B2 (en) Sheet metal processing examination
TW201801836A (zh) 雷射加工裝置
KR20170107900A (ko) 피가공물의 내부 검출 장치 및 내부 검출 방법
JP2008110400A5 (ja) レーザ加工方法及びレーザ加工装置
TW202112475A (zh) 雷射加工方法以及雷射加工裝置
JP2017135132A (ja) レーザー加工装置
TWI555599B (zh) 在雷射劃刻裝置中執行光束特徵化之方法，及可執行此方法之雷射劃刻裝置