JPWO2023157291A5 - - Google Patents

Download PDF

Info

Publication number
JPWO2023157291A5
JPWO2023157291A5 JP2022542725A JP2022542725A JPWO2023157291A5 JP WO2023157291 A5 JPWO2023157291 A5 JP WO2023157291A5 JP 2022542725 A JP2022542725 A JP 2022542725A JP 2022542725 A JP2022542725 A JP 2022542725A JP WO2023157291 A5 JPWO2023157291 A5 JP WO2023157291A5
Authority
JP
Japan
Prior art keywords
test
result data
test result
unit
analysis
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2022542725A
Other languages
English (en)
Japanese (ja)
Other versions
JP7241978B1 (ja
JPWO2023157291A1 (enExample
Filing date
Publication date
Application filed filed Critical
Priority claimed from PCT/JP2022/006941 external-priority patent/WO2023157291A1/ja
Application granted granted Critical
Publication of JP7241978B1 publication Critical patent/JP7241978B1/ja
Publication of JPWO2023157291A1 publication Critical patent/JPWO2023157291A1/ja
Publication of JPWO2023157291A5 publication Critical patent/JPWO2023157291A5/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

JP2022542725A 2022-02-21 2022-02-21 デバイス検査装置及びデバイス検査方法 Active JP7241978B1 (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2022/006941 WO2023157291A1 (ja) 2022-02-21 2022-02-21 デバイス検査装置及びデバイス検査方法

Publications (3)

Publication Number Publication Date
JP7241978B1 JP7241978B1 (ja) 2023-03-17
JPWO2023157291A1 JPWO2023157291A1 (enExample) 2023-08-24
JPWO2023157291A5 true JPWO2023157291A5 (enExample) 2024-01-23

Family

ID=85600328

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2022542725A Active JP7241978B1 (ja) 2022-02-21 2022-02-21 デバイス検査装置及びデバイス検査方法

Country Status (4)

Country Link
US (1) US20250102566A1 (enExample)
JP (1) JP7241978B1 (enExample)
CN (1) CN118648094A (enExample)
WO (1) WO2023157291A1 (enExample)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102801402B1 (ko) * 2024-01-09 2025-04-29 경남대학교 산학협력단 패널접착 및 기판검사용 프레싱 장치

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04249335A (ja) * 1991-02-05 1992-09-04 Matsushita Electron Corp プローブ検査システム
JP7219046B2 (ja) * 2018-10-12 2023-02-07 株式会社アドバンテスト 解析装置、解析方法および解析プログラム
JP2021025971A (ja) * 2019-08-08 2021-02-22 株式会社日本ロック 通電検査装置及び通電検査方法

Similar Documents

Publication Publication Date Title
US20070164763A1 (en) Method for detecting abnormality of probe card
CN118428609B (zh) 一种航空航天紧固件产品检测管理系统
CN118311363B (zh) 变电站设备缺陷检测方法及系统
JPWO2023157291A5 (enExample)
KR100259322B1 (ko) 반도체소자 검사장비의 안정도 분석방법
CN105004367A (zh) 单片集成电路贮存寿命特征检测方法
KR20230119646A (ko) 반도체 디바이스에서 결함 기반 테스트 커버리지 갭을 자동으로 식별하기 위한 시스템 및 방법
KR101290928B1 (ko) 음질인자를 이용한 고장 진단 장치 및 방법
KR102826562B1 (ko) 결함 유형별 대역 구분과 머신러닝을 이용한 유도 전동기의 결함 진단 장치
US20230081224A1 (en) Method and system for evaluating test data, wafer test system, and storage medium
CN118244190B (zh) 一种电能表自动检定装置在线质量评估方法及系统
CN105789076B (zh) 点测机故障判别方法
CN119199456A (zh) 半导体测试方法、系统、终端及介质
JP7241978B1 (ja) デバイス検査装置及びデバイス検査方法
CN115020285B (zh) Wat测试装置的检测方法及系统
JP2017110916A (ja) 劣化診断装置及び劣化診断方法
CN117213546A (zh) 一种传感器数据检测方法
JP2011215007A (ja) 試験装置及び試験方法
JP2013140117A (ja) 半導体装置の製造方法及び半導体試験装置
CN117288987A (zh) 用于芯片测试的插座组件以及芯片测试系统
JPH09203764A (ja) 四端子測定法による接続不良リードの有無判別方法
CN112379186A (zh) 电容测试装置
KR101893952B1 (ko) 고장 감지 장치
US9952184B2 (en) Ultrasonic monitoring of electrical connections
CN118759301B (zh) 一种新能源汽车大电流端子的状态监测方法、设备及系统