JPWO2023135833A1 - - Google Patents

Info

Publication number
JPWO2023135833A1
JPWO2023135833A1 JP2023573823A JP2023573823A JPWO2023135833A1 JP WO2023135833 A1 JPWO2023135833 A1 JP WO2023135833A1 JP 2023573823 A JP2023573823 A JP 2023573823A JP 2023573823 A JP2023573823 A JP 2023573823A JP WO2023135833 A1 JPWO2023135833 A1 JP WO2023135833A1
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2023573823A
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPWO2023135833A1 publication Critical patent/JPWO2023135833A1/ja
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/89Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/91Investigating the presence of flaws or contamination using penetration of dyes, e.g. fluorescent ink

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
JP2023573823A 2022-01-11 2022-05-26 Pending JPWO2023135833A1 (https=)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2022002590 2022-01-11
PCT/JP2022/021526 WO2023135833A1 (ja) 2022-01-11 2022-05-26 欠陥検出装置及び欠陥検出方法

Publications (1)

Publication Number Publication Date
JPWO2023135833A1 true JPWO2023135833A1 (https=) 2023-07-20

Family

ID=87278747

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2023573823A Pending JPWO2023135833A1 (https=) 2022-01-11 2022-05-26

Country Status (3)

Country Link
JP (1) JPWO2023135833A1 (https=)
CN (1) CN118511070A (https=)
WO (1) WO2023135833A1 (https=)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN117665095B (zh) * 2024-02-01 2024-04-19 潍坊市计量测试所 一种基于机器视觉的无缝钢管检测方法及系统

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20120026319A1 (en) * 2010-07-27 2012-02-02 Pixart Imaging Inc. Distance measuring system and distance measuring method
JP2016080517A (ja) * 2014-10-17 2016-05-16 セイコーインスツル株式会社 表面検査装置
JP2021025878A (ja) * 2019-08-05 2021-02-22 電子磁気工業株式会社 磁粉探傷装置、及び磁粉探傷方法
JP2021139630A (ja) * 2020-03-02 2021-09-16 日本製鉄株式会社 表面検査装置及び表面検査方法

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20120026319A1 (en) * 2010-07-27 2012-02-02 Pixart Imaging Inc. Distance measuring system and distance measuring method
JP2016080517A (ja) * 2014-10-17 2016-05-16 セイコーインスツル株式会社 表面検査装置
JP2021025878A (ja) * 2019-08-05 2021-02-22 電子磁気工業株式会社 磁粉探傷装置、及び磁粉探傷方法
JP2021139630A (ja) * 2020-03-02 2021-09-16 日本製鉄株式会社 表面検査装置及び表面検査方法

Also Published As

Publication number Publication date
WO2023135833A1 (ja) 2023-07-20
CN118511070A (zh) 2024-08-16

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