JPWO2024166415A1 - - Google Patents
Info
- Publication number
- JPWO2024166415A1 JPWO2024166415A1 JP2024576093A JP2024576093A JPWO2024166415A1 JP WO2024166415 A1 JPWO2024166415 A1 JP WO2024166415A1 JP 2024576093 A JP2024576093 A JP 2024576093A JP 2024576093 A JP2024576093 A JP 2024576093A JP WO2024166415 A1 JPWO2024166415 A1 JP WO2024166415A1
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/91—Investigating the presence of flaws or contamination using penetration of dyes, e.g. fluorescent ink
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2023016416 | 2023-02-06 | ||
| PCT/JP2023/024817 WO2024166415A1 (ja) | 2023-02-06 | 2023-07-04 | 表面検査装置及び表面検査方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPWO2024166415A1 true JPWO2024166415A1 (https=) | 2024-08-15 |
| JPWO2024166415A5 JPWO2024166415A5 (https=) | 2025-10-16 |
Family
ID=92262244
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2024576093A Pending JPWO2024166415A1 (https=) | 2023-02-06 | 2023-07-04 |
Country Status (3)
| Country | Link |
|---|---|
| JP (1) | JPWO2024166415A1 (https=) |
| CN (1) | CN120659988A (https=) |
| WO (1) | WO2024166415A1 (https=) |
Family Cites Families (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH07111419B2 (ja) * | 1985-08-30 | 1995-11-29 | 大同特殊鋼株式会社 | 螢光磁粉探傷における画像信号処理方法および装置 |
| JPH0810197B2 (ja) * | 1992-04-30 | 1996-01-31 | 株式会社神戸製鋼所 | 表面疵自動探傷方法 |
| JPH06174696A (ja) * | 1992-12-10 | 1994-06-24 | Nkk Corp | 磁粉探傷用磁化装置 |
| JP3440569B2 (ja) * | 1994-09-13 | 2003-08-25 | 住友金属工業株式会社 | 磁粉探傷方法及びその装置 |
| JP2001281226A (ja) * | 2000-03-29 | 2001-10-10 | Daido Steel Co Ltd | 蛍光磁粉探傷方法および蛍光磁粉探傷装置 |
| JP2002324233A (ja) * | 2001-04-25 | 2002-11-08 | Showa Corp | パイプの割れ検出方法及び装置 |
| JP4189307B2 (ja) * | 2003-12-05 | 2008-12-03 | 新日本製鐵株式会社 | 鋼片の表面疵検査方法 |
| JP6596188B2 (ja) * | 2015-04-02 | 2019-10-23 | マークテック株式会社 | 探傷装置、及び探傷装置による傷部検出方法 |
| JP7132894B2 (ja) * | 2019-08-05 | 2022-09-07 | 電子磁気工業株式会社 | 磁粉探傷装置、及び磁粉探傷方法 |
-
2023
- 2023-07-04 JP JP2024576093A patent/JPWO2024166415A1/ja active Pending
- 2023-07-04 CN CN202380093329.4A patent/CN120659988A/zh active Pending
- 2023-07-04 WO PCT/JP2023/024817 patent/WO2024166415A1/ja not_active Ceased
Also Published As
| Publication number | Publication date |
|---|---|
| CN120659988A (zh) | 2025-09-16 |
| WO2024166415A1 (ja) | 2024-08-15 |
Similar Documents
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20250805 |
|
| A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20250805 |