CN118511070A - 缺陷检测装置和缺陷检测方法 - Google Patents

缺陷检测装置和缺陷检测方法 Download PDF

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Publication number
CN118511070A
CN118511070A CN202280087903.0A CN202280087903A CN118511070A CN 118511070 A CN118511070 A CN 118511070A CN 202280087903 A CN202280087903 A CN 202280087903A CN 118511070 A CN118511070 A CN 118511070A
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CN
China
Prior art keywords
defect
axis
images
inspected
image
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN202280087903.0A
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English (en)
Chinese (zh)
Inventor
中田武男
太田祥之
中野竜辅
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Steel Corp
Original Assignee
Nippon Steel and Sumitomo Metal Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Steel and Sumitomo Metal Corp filed Critical Nippon Steel and Sumitomo Metal Corp
Publication of CN118511070A publication Critical patent/CN118511070A/zh
Pending legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/91—Investigating the presence of flaws or contamination using penetration of dyes, e.g. fluorescent ink

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
CN202280087903.0A 2022-01-11 2022-05-26 缺陷检测装置和缺陷检测方法 Pending CN118511070A (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2022002590 2022-01-11
JP2022-002590 2022-01-11
PCT/JP2022/021526 WO2023135833A1 (ja) 2022-01-11 2022-05-26 欠陥検出装置及び欠陥検出方法

Publications (1)

Publication Number Publication Date
CN118511070A true CN118511070A (zh) 2024-08-16

Family

ID=87278747

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202280087903.0A Pending CN118511070A (zh) 2022-01-11 2022-05-26 缺陷检测装置和缺陷检测方法

Country Status (3)

Country Link
JP (1) JPWO2023135833A1 (https=)
CN (1) CN118511070A (https=)
WO (1) WO2023135833A1 (https=)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN117665095B (zh) * 2024-02-01 2024-04-19 潍坊市计量测试所 一种基于机器视觉的无缝钢管检测方法及系统

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI420081B (zh) * 2010-07-27 2013-12-21 Pixart Imaging Inc 測距系統及測距方法
JP6508763B2 (ja) * 2014-10-17 2019-05-08 セイコーインスツル株式会社 表面検査装置
JP7132894B2 (ja) * 2019-08-05 2022-09-07 電子磁気工業株式会社 磁粉探傷装置、及び磁粉探傷方法
JP7360048B2 (ja) * 2020-03-02 2023-10-12 日本製鉄株式会社 表面検査装置及び表面検査方法

Also Published As

Publication number Publication date
WO2023135833A1 (ja) 2023-07-20
JPWO2023135833A1 (https=) 2023-07-20

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