JPWO2023105553A1 - - Google Patents
Info
- Publication number
- JPWO2023105553A1 JPWO2023105553A1 JP2023565664A JP2023565664A JPWO2023105553A1 JP WO2023105553 A1 JPWO2023105553 A1 JP WO2023105553A1 JP 2023565664 A JP2023565664 A JP 2023565664A JP 2023565664 A JP2023565664 A JP 2023565664A JP WO2023105553 A1 JPWO2023105553 A1 JP WO2023105553A1
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measuring Leads Or Probes (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/JP2021/044633 WO2023105553A1 (ja) | 2021-12-06 | 2021-12-06 | プローブカード |
Publications (2)
Publication Number | Publication Date |
---|---|
JPWO2023105553A1 true JPWO2023105553A1 (ja) | 2023-06-15 |
JPWO2023105553A5 JPWO2023105553A5 (ja) | 2024-05-23 |
Family
ID=86729755
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2023565664A Pending JPWO2023105553A1 (ja) | 2021-12-06 | 2021-12-06 |
Country Status (3)
Country | Link |
---|---|
JP (1) | JPWO2023105553A1 (ja) |
TW (1) | TW202323827A (ja) |
WO (1) | WO2023105553A1 (ja) |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2007033363A (ja) * | 2005-07-29 | 2007-02-08 | Hioki Ee Corp | プローブ、プローブユニットおよび回路基板検査装置 |
JP4421550B2 (ja) * | 2005-12-05 | 2010-02-24 | 日本電子材料株式会社 | プローブ及びプローブカード |
JP2012093127A (ja) * | 2010-10-25 | 2012-05-17 | Advanced Systems Japan Inc | バーチカルプローブヘッド |
TWI702402B (zh) * | 2015-05-07 | 2020-08-21 | 義大利商探針科技公司 | 特別用於減少間距應用的具有垂直探針的測試頭 |
JP6654061B2 (ja) * | 2016-02-23 | 2020-02-26 | 日本電子材料株式会社 | プローブガイド、プローブカード及びプローブガイドの製造方法 |
JP6781598B2 (ja) * | 2016-09-16 | 2020-11-04 | 日本電子材料株式会社 | プローブカード |
JP7094726B2 (ja) * | 2018-03-02 | 2022-07-04 | 東京特殊電線株式会社 | プローブ針 |
JP6636079B2 (ja) * | 2018-05-10 | 2020-01-29 | 株式会社Creative Design | プローブピンガイド構造及びプローブカード |
-
2021
- 2021-12-06 JP JP2023565664A patent/JPWO2023105553A1/ja active Pending
- 2021-12-06 WO PCT/JP2021/044633 patent/WO2023105553A1/ja active Application Filing
-
2022
- 2022-06-15 TW TW111122209A patent/TW202323827A/zh unknown
Also Published As
Publication number | Publication date |
---|---|
WO2023105553A1 (ja) | 2023-06-15 |
TW202323827A (zh) | 2023-06-16 |
Similar Documents
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20240215 |
|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20240514 |