JPWO2023084888A5 - - Google Patents

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Publication number
JPWO2023084888A5
JPWO2023084888A5 JP2023559442A JP2023559442A JPWO2023084888A5 JP WO2023084888 A5 JPWO2023084888 A5 JP WO2023084888A5 JP 2023559442 A JP2023559442 A JP 2023559442A JP 2023559442 A JP2023559442 A JP 2023559442A JP WO2023084888 A5 JPWO2023084888 A5 JP WO2023084888A5
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JP
Japan
Prior art keywords
housing
plunger
fixing member
pin
measuring probe
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Granted
Application number
JP2023559442A
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English (en)
Japanese (ja)
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JPWO2023084888A1 (https=
JP7563627B2 (ja
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Priority claimed from PCT/JP2022/033201 external-priority patent/WO2023084888A1/ja
Publication of JPWO2023084888A1 publication Critical patent/JPWO2023084888A1/ja
Publication of JPWO2023084888A5 publication Critical patent/JPWO2023084888A5/ja
Application granted granted Critical
Publication of JP7563627B2 publication Critical patent/JP7563627B2/ja
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JP2023559442A 2021-11-12 2022-09-03 測定用プローブ Active JP7563627B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2021184436 2021-11-12
JP2021184436 2021-11-12
PCT/JP2022/033201 WO2023084888A1 (ja) 2021-11-12 2022-09-03 測定用プローブ

Publications (3)

Publication Number Publication Date
JPWO2023084888A1 JPWO2023084888A1 (https=) 2023-05-19
JPWO2023084888A5 true JPWO2023084888A5 (https=) 2024-07-12
JP7563627B2 JP7563627B2 (ja) 2024-10-08

Family

ID=86335482

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2023559442A Active JP7563627B2 (ja) 2021-11-12 2022-09-03 測定用プローブ

Country Status (3)

Country Link
JP (1) JP7563627B2 (https=)
CN (1) CN118318169A (https=)
WO (1) WO2023084888A1 (https=)

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06324079A (ja) * 1992-10-29 1994-11-25 Toudai Musen Kk コンタクトプローブ
JP4806395B2 (ja) * 2004-02-27 2011-11-02 グリーン， ツイード オブ デラウェア， インコーポレイテッド 密閉電気コネクター
JP2009265049A (ja) * 2008-04-30 2009-11-12 Wakabayashi Seiko Kk コンタクトプローブおよびその製造方法
JP2010014449A (ja) * 2008-07-01 2010-01-21 Aisin Aw Co Ltd 電子機器の自動検査装置用プローブ及びその自動検査装置
KR101106666B1 (ko) * 2010-05-17 2012-01-20 주식회사 타이스일렉 반도체 검사용 프로브 핀
JP2015152547A (ja) * 2014-02-19 2015-08-24 オルガン針株式会社 電流プローブ
CN109254180A (zh) * 2017-07-13 2019-01-22 致茂电子(苏州)有限公司 电流探针以及适用于此电流探针的治具
KR101954086B1 (ko) * 2017-11-07 2019-03-06 리노공업주식회사 검사 프로브 조립체 및 검사 소켓
WO2020122006A1 (ja) * 2018-12-13 2020-06-18 株式会社村田製作所 プローブ
JP7334791B2 (ja) * 2019-10-18 2023-08-29 株式会社村田製作所 検査用コネクタ及び検査用ユニット

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