JPWO2023084888A1 - - Google Patents

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Publication number
JPWO2023084888A1
JPWO2023084888A1 JP2023559442A JP2023559442A JPWO2023084888A1 JP WO2023084888 A1 JPWO2023084888 A1 JP WO2023084888A1 JP 2023559442 A JP2023559442 A JP 2023559442A JP 2023559442 A JP2023559442 A JP 2023559442A JP WO2023084888 A1 JPWO2023084888 A1 JP WO2023084888A1
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2023559442A
Other languages
Japanese (ja)
Other versions
JPWO2023084888A5 (https=
JP7563627B2 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Publication date
Application filed filed Critical
Publication of JPWO2023084888A1 publication Critical patent/JPWO2023084888A1/ja
Publication of JPWO2023084888A5 publication Critical patent/JPWO2023084888A5/ja
Application granted granted Critical
Publication of JP7563627B2 publication Critical patent/JP7563627B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/02—Contact members
    • H01R13/22—Contacts for co-operating by abutting
    • H01R13/24—Contacts for co-operating by abutting resilient; resiliently-mounted

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)
JP2023559442A 2021-11-12 2022-09-03 測定用プローブ Active JP7563627B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2021184436 2021-11-12
JP2021184436 2021-11-12
PCT/JP2022/033201 WO2023084888A1 (ja) 2021-11-12 2022-09-03 測定用プローブ

Publications (3)

Publication Number Publication Date
JPWO2023084888A1 true JPWO2023084888A1 (https=) 2023-05-19
JPWO2023084888A5 JPWO2023084888A5 (https=) 2024-07-12
JP7563627B2 JP7563627B2 (ja) 2024-10-08

Family

ID=86335482

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2023559442A Active JP7563627B2 (ja) 2021-11-12 2022-09-03 測定用プローブ

Country Status (3)

Country Link
JP (1) JP7563627B2 (https=)
CN (1) CN118318169A (https=)
WO (1) WO2023084888A1 (https=)

Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06324079A (ja) * 1992-10-29 1994-11-25 Toudai Musen Kk コンタクトプローブ
JP2007525809A (ja) * 2004-02-27 2007-09-06 グリーン， ツイード オブ デラウェア， インコーポレイテッド 密閉電気コネクター
JP2009265049A (ja) * 2008-04-30 2009-11-12 Wakabayashi Seiko Kk コンタクトプローブおよびその製造方法
JP2010014449A (ja) * 2008-07-01 2010-01-21 Aisin Aw Co Ltd 電子機器の自動検査装置用プローブ及びその自動検査装置
KR20110126366A (ko) * 2010-05-17 2011-11-23 주식회사 타이스전자 반도체 검사용 프로브 핀
JP2015152547A (ja) * 2014-02-19 2015-08-24 オルガン針株式会社 電流プローブ
CN109254180A (zh) * 2017-07-13 2019-01-22 致茂电子(苏州)有限公司 电流探针以及适用于此电流探针的治具
WO2020122006A1 (ja) * 2018-12-13 2020-06-18 株式会社村田製作所 プローブ
JP2020537160A (ja) * 2017-11-07 2020-12-17 リーノ インダストリアル インコーポレイテッド 検査プローブ組立体及び検査ソケット
WO2021075455A1 (ja) * 2019-10-18 2021-04-22 株式会社村田製作所 検査用コネクタ及び検査用ユニット

Patent Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06324079A (ja) * 1992-10-29 1994-11-25 Toudai Musen Kk コンタクトプローブ
JP2007525809A (ja) * 2004-02-27 2007-09-06 グリーン， ツイード オブ デラウェア， インコーポレイテッド 密閉電気コネクター
JP2009265049A (ja) * 2008-04-30 2009-11-12 Wakabayashi Seiko Kk コンタクトプローブおよびその製造方法
JP2010014449A (ja) * 2008-07-01 2010-01-21 Aisin Aw Co Ltd 電子機器の自動検査装置用プローブ及びその自動検査装置
KR20110126366A (ko) * 2010-05-17 2011-11-23 주식회사 타이스전자 반도체 검사용 프로브 핀
JP2015152547A (ja) * 2014-02-19 2015-08-24 オルガン針株式会社 電流プローブ
CN109254180A (zh) * 2017-07-13 2019-01-22 致茂电子(苏州)有限公司 电流探针以及适用于此电流探针的治具
JP2020537160A (ja) * 2017-11-07 2020-12-17 リーノ インダストリアル インコーポレイテッド 検査プローブ組立体及び検査ソケット
WO2020122006A1 (ja) * 2018-12-13 2020-06-18 株式会社村田製作所 プローブ
WO2021075455A1 (ja) * 2019-10-18 2021-04-22 株式会社村田製作所 検査用コネクタ及び検査用ユニット

Also Published As

Publication number Publication date
WO2023084888A1 (ja) 2023-05-19
CN118318169A (zh) 2024-07-09
JP7563627B2 (ja) 2024-10-08

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