WO2017161536A1 - 一种用于标定测试探针线路损耗的转接头及测试仪 - Google Patents

一种用于标定测试探针线路损耗的转接头及测试仪 Download PDF

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Publication number
WO2017161536A1
WO2017161536A1 PCT/CN2016/077233 CN2016077233W WO2017161536A1 WO 2017161536 A1 WO2017161536 A1 WO 2017161536A1 CN 2016077233 W CN2016077233 W CN 2016077233W WO 2017161536 A1 WO2017161536 A1 WO 2017161536A1
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Prior art keywords
probe
adapter
test
sleeve
test probe
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PCT/CN2016/077233
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English (en)
French (fr)
Inventor
熊忠恺
胡义伟
时永福
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华为技术有限公司
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Priority to PCT/CN2016/077233 priority Critical patent/WO2017161536A1/zh
Priority to CN201680025216.0A priority patent/CN107534249A/zh
Publication of WO2017161536A1 publication Critical patent/WO2017161536A1/zh

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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/02—Contact members
    • H01R13/22—Contacts for co-operating by abutting
    • H01R13/24—Contacts for co-operating by abutting resilient; resiliently-mounted
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/40—Securing contact members in or to a base or case; Insulating of contact members
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/46—Bases; Cases
    • H01R13/502—Bases; Cases composed of different pieces
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/62—Means for facilitating engagement or disengagement of coupling parts or for holding them in engagement

Definitions

  • the invention relates to the technical field of line loss calibration, in particular to an adapter and a tester for calibrating the line loss of a test probe.
  • the RF matching circuit is provided with an RF switch to be compatible with the production line test and transmit the RF signal in the RF circuit.
  • the board must match the RF switch in the RF test of the factory. Therefore, the technician usually uses the RF test probe to match the RF switch on the test carrier.
  • the RF probe is used to open the RF switch to shunt. Signal to get the test results.
  • the line loss of the test probe must be calibrated before the test.
  • an adapter is needed to connect the RF probe to the common RF cable to realize the RF probe end. Test the RF signal transmission at the instrument end to accurately determine the line loss.
  • a matching adapter of a corresponding RF probe is generally used or a dummy board (imitation product board) is used to connect the RF probe to a common RF cable.
  • the matching adapter is the main way to connect the RF probe and the RF cable.
  • one end of the matching adapter 01 is provided with a radio frequency head that matches the standard of the RF probe interface, and the other end is designed as a standard coaxial. Connector female.
  • the technician performs alignment by the naked eye, and the probe hole 011 on the matching adapter 01 is sleeved on the core of the RF probe, and then the hand is positioned and ensured to be perpendicular to the reference surface until the end of the test, and the entire calibration process is required.
  • the technicians use the matching adapter 01 to mark the timing, which is prone to inaccurate alignment and sloshing during the hand-held process, causing the core to bend, causing errors and reducing the life of the probe and increasing the probe loss. cost.
  • the contact area of the matching adapter 01 and the probe is very small, and the holding force is required during the calibration process to ensure the alignment, but the holding force applied by the technician is extremely low. Stable, resulting in fluctuations in the calibration results, reducing the accuracy of the calibration.
  • the copying dummy board is to develop a circuit board corresponding to the circuit board to be tested, and correspondingly set the adapter at the position where the RF probe is set, and the common RF cable is connected to the tail of the adapter, and the measurement is performed after the alignment. It is a specialized component for a certain board.
  • the development cycle of the copy dummy board is long, and it must be waited for the test board design to be completed before development, which prolongs the test time and reduces the test efficiency.
  • the universal dummy board is provided with a adapter matched with the probe on a small-sized circuit board.
  • the tail of the adapter is connected to a common RF cable, and a positioning portion is arranged on the side of the board, and only needs to be turned when used.
  • the head of the connector is aligned with the RF probe insertion for measurement.
  • the universal dummy board still needs to be manually aligned when it is used, and its own holding power is insufficient, and it is necessary to use it manually. Also, there is a problem that the damage probe leads to low reliability of the test result.
  • Embodiments of the present invention provide a adapter for calibrating test line loss of a test probe.
  • the production cost of the adapter for calibrating the test probe line loss is not high, and the alignment is accurate and difficult to shake, so that the test result is relatively accurate.
  • an adapter for calibrating a test probe line loss is disclosed.
  • Test probes that require calibration of line losses include a syringe and a core that protrudes from the end of the barrel.
  • the first end of the adapter is provided with a probe hole, and the outer wall of the first end of the adapter is sleeved with a sleeve.
  • the probe aperture is for mating with a needle core that houses the probe, the sleeve being for mating with a syringe that houses the probe.
  • the adapter for calibrating the test probe line loss has a low production cost due to its simple structure, and the adapter can be applied to all probe calibration alignment schemes.
  • the versatility is strong, and it takes a lot of time to develop and design during testing, and the test efficiency is high.
  • the technicians held the adapter, and the sleeve on the adapter was sleeved on the outer wall of the syringe of the test probe and slid along the inner wall of the sleeve until the needle of the test probe was inserted into the adapter. Inside the pinhole.
  • the needle of the test probe is automatically aligned with the probe hole on the adapter, without Manual alignment eliminates the workload of technicians.
  • the technician applies a holding force to the adapter, the holding force is applied to the sleeve and transmitted to the syringe of the test probe, and the holding force does not directly act on the needle of the test probe, thereby reducing the test.
  • the needle core of the probe is at risk of damage, and the core of the test probe is protected to some extent.
  • the adapter does not have a large relative sway with the test probe, and the problem of damage to the test probe core, increased test cost, and test error is avoided, thereby ensuring the accuracy of the test.
  • the gap between the probe hole and the core of the test probe is larger than the gap between the sleeve and the syringe of the test probe, if the technician applies the holding force, if there is interference, The holding force cannot be perpendicular to the plane of the circuit board where the test probe is located, and slight relative sway occurs between the adapter and the test probe, and the first sloshing will occur first.
  • the relative sway is gradually increased, the core of the test probe and the inner wall of the probe hole are brought into contact and a relative force is generated.
  • the probability that the needle of the test probe is damaged greatly protects the core of the test probe, thereby ensuring the accuracy of the test result. If the gap between the probe hole and the core of the test probe is equal to the gap between the sleeve and the syringe of the test probe, the retention force applied by the technician is not related to the test When the plane of the circuit board where the needle is located is perpendicular, the holding force is shared by the sleeve and the syringe of the test probe, the probe hole and the core of the test probe, and is reduced. The force of the needle of the test probe at this time is reduced, thereby reducing the probability of damage of the needle of the test probe, and ensuring the accuracy of the test result.
  • the gap between the probe aperture and the needle core of the probe is zero, the sleeve and the The gap between the syringes of the probe is zero.
  • the gap between the sleeve and the syringe of the test probe is also set to Zero, to the greatest extent, ensures the stability of the needle of the test probe and the accuracy of the test.
  • the cylindrical wall of the sleeve is provided with a threaded hole penetrating the wall of the sleeve in a radial direction thereof, and the threaded hole is disposed There are set screws.
  • the inner wall of the sleeve is provided with internal threads for mating with external threads provided on the outer wall of the first end of the adapter.
  • the internal thread disposed on the inner wall of the sleeve and the outer wall disposed on the outer wall of the first end of the adapter is a self-locking thread pair.
  • a tester including a host, and the adapter for calibrating the test probe line loss described in the above technical solution is connected to the host.
  • the tester uses the tester to calibrate the line loss of the test probe, the turn The connector is sleeved on the test probe and then applied with a certain holding force for testing.
  • the test result is highly reliable and does not damage the core of the test probe.
  • the tester has good general performance and can Suitable for line loss calibration tests such as RF test probes, Bluetooth test probes, and baseband test probes.
  • FIG. 1 is a front view of a matching adapter in the prior art
  • FIG. 2 is a front view of a adapter for calibrating a line loss of a test probe according to an embodiment of the present invention
  • FIG. 3 is a cross-sectional view showing a needle core inserted into a probe hole of a probe for calibrating a test probe line loss according to an embodiment of the present invention
  • FIG. 4 is a cross-sectional view of a adapter for calibrating a test probe line loss according to an embodiment of the present invention.
  • first and second are used for descriptive purposes only and are not to be construed as indicating or implying a relative importance or implicitly indicating the number of technical features indicated. Thus, features defining “first” and “second” may include one or more of the features either explicitly or implicitly.
  • connection In the description of the present invention, it should be noted that the terms “installation”, “connected”, and “connected” are to be understood broadly, and may be fixed or detachable, for example, unless otherwise explicitly defined and defined. Connected, or integrally connected; may be a mechanical connection; may be directly connected, or may be indirectly connected through an intermediate medium, and may be internal communication between the two elements.
  • Connected, or integrally connected may be a mechanical connection; may be directly connected, or may be indirectly connected through an intermediate medium, and may be internal communication between the two elements.
  • the specific meaning of the above terms in the present invention can be understood in a specific case by those skilled in the art.
  • calibration is an important step that cannot be ignored.
  • the main function of calibration is to eliminate systematic errors and improve the accuracy of the instrument or system, so that the test results of the system are more accurate.
  • the test probe 1 In the test of the circuit, according to the requirements of the predetermined function of the circuit, the test probe 1 is provided with a corresponding test probe 1 to test the performance of the circuit.
  • the tester tests the circuit performance by connecting the test probe 1 and the tester's main unit through the adapter 2.
  • the line loss of the test probe 1 needs to be calibrated to ensure the accuracy of the test results of the circuit performance.
  • the test probe 1 includes a syringe 11 and a core 12 projecting from the end 111 of the barrel 11, the adapter 2
  • the first end 21 is provided with a probe hole 22, and the outer wall 211 of the first end 21 of the adapter 2 is sleeved with a sleeve 23 for fitting the core 12 of the test probe 1 for the sleeve 23
  • the syringe 11 housing the test probe 1 is fitted.
  • the adapter provided by the invention for calibrating the test probe line loss has a low production cost due to its simple structure.
  • the technicians hold the adapter 2, and the sleeve 23 on the adapter 2 is sleeved on the outer wall 211 of the syringe 11 of the test probe 1 and slides along the inner wall of the sleeve 23 until the test probe 1 of the core 12 is inserted into the adapter 2 Inside the probe hole 22. Since the sleeve 23 and the syringe 22 of the test probe 1 are cooperatively arranged, after the sleeve 23 is sleeved on the syringe 11 of the test probe 1, the core 12 of the test probe 1 is automatically aligned.
  • the probe hole 22 on the joint 2 eliminates the need for manual alignment, reducing the workload of the technician.
  • the technician applies a holding force to the adapter 2
  • the holding force is applied to the sleeve 23 and transmitted to the syringe 11 of the test probe 1, and the holding force does not directly act on the core of the test probe 1.
  • the risk of damage to the core 12 of the test probe 1 is reduced, and the core 12 of the test probe 1 is protected to some extent.
  • the adapter 2 does not have a large relative sway with the test probe 1, and the sloshing is prevented to damage the core 12 of the test probe 1, the test cost is increased, and test errors are caused, and the test is guaranteed.
  • the degree of precision is achieved.
  • the small sway between the core 12 of the test probe 1 and the probe hole 22 also causes a certain error in the test. Therefore, in order to ensure the accuracy of the test result, as shown in FIG. 3, there is a clearance fit between the probe hole 22 and the core 12 of the test probe 1, and between the sleeve 23 and the syringe 11 of the test probe 1.
  • the gap fits, and the gap between the probe hole 22 and the core 12 of the test probe 1 is greater than or equal to the gap between the sleeve 23 and the barrel 11 of the test probe 1.
  • the gap between the probe hole 22 and the core 12 of the test probe 1 is larger than the gap between the sleeve 23 and the syringe 11 of the test probe 1, after the technician applies the holding force, if there is interference, the holding force is maintained. It cannot be perpendicular to the plane where the test board 1 is located, and there will be slight relative sway between the adapter 2 and the test probe 1. In this case, the first sloshing will be the sleeve 23 and the test probe. Between the syringes 11 of the needle 1, when the relative sway is gradually increased, the inner core 12 of the test probe 1 and the inner wall of the probe hole 22 are brought into contact and a relative force is generated, which is somewhat reduced.
  • the probability of damage to the core 12 greatly protects the core 12 of the test probe 1, thereby ensuring the accuracy of the test results. If the gap between the probe hole 22 and the core 12 of the test probe 1 is equal to the gap between the sleeve 23 and the barrel 11 of the test probe 1, the retention force applied by the technician is not perpendicular to the plane in which the board is located. At this time, the holding force is shared by the sleeve 23 and the syringe 11, the probe hole 22 of the test probe 1, and the core 12 of the test probe 1, reducing the force that the core 12 receives at this time. , thereby reducing the probability of damage to the core 12, and ensuring the accuracy of the test results.
  • the test probe 1 transmits the signal through the core 12 during the test. Therefore, the smaller the gap between the probe hole 22 and the core 12 of the test probe 1, the stronger the signal received by the test instrument is.
  • the test results are more accurate. As shown in FIG. 3, the gap between the probe hole 22 and the core 12 of the test probe 1 is zero, and the gap between the sleeve 23 and the syringe 11 of the test probe 1 is zero. When the gap between the probe hole 22 and the core 12 of the test probe 1 is zero, the contact area between the probe hole 22 and the core 12 of the test probe 1 is the largest, which makes the signal transmission effect the most.
  • the gap between the sleeve 23 and the barrel 11 of the test probe 1 is also set to zero, thereby ensuring the needle to the utmost extent.
  • the stability of the core 12 and the accuracy of the test is also set to zero, thereby ensuring the needle to the utmost extent.
  • the sleeve 23 is disposed on the outer wall 211 of the first end 21 of the adapter 2 for engaging the syringe 11 containing the test probe 1. If the length of the sleeve 23 is too long, the syringe of the test probe 1 is caused. After the sleeve 11 is completely wrapped by the sleeve 23, the core 12 of the test probe 1 is still unable to be inserted into the probe hole 12, so that the sleeve 23 is movably connected to the outer wall 211 of the first end 21 of the adapter 2, so that the sleeve The barrel 23 is axially movable on the outer wall 211 of the first end 21 of the adapter 2. As shown in FIG.
  • the cylinder wall of the sleeve 23 is provided with a threaded hole 231 penetrating the wall of the sleeve in a radial direction thereof, and a set screw 232 is disposed in the threaded hole 231.
  • the technician adjusts the length of the sleeve 23 extending from the first end 21 of the adapter 2 according to the length of the syringe 11 of the test probe 1 during testing, and then screws the set screw 232 so that the set screw 232 abuts the adapter
  • the outer wall 211 of the first end 21 of the second portion 21 is adjusted and positioned to extend the length of the first end 21 of the sleeve 2 beyond the adapter 2 to ensure smooth testing.
  • the adjustment sleeve 23 When the adjustment sleeve 23 extends beyond the length of the first end 21 of the adapter 2, it can also be screwed. As shown in FIG. 4, the inner wall of the sleeve 23 is provided with an internal thread to cooperate with an external thread provided on the outer wall 211 of the first end 21 of the adapter 2. According to the requirements of the actual test, the direction of the screw sleeve 23 is selected to increase or decrease the length of the sleeve 23 extending out of the first end 21 of the adapter 2, thereby ensuring smooth running of the test.
  • the sleeve 23 may be produced between the outer wall 211 of the first end 21 of the adapter 2 due to an external force such as self-weight or sway.
  • an external force such as self-weight or sway.
  • the relative motion of the student affects the test process. Therefore, as shown in FIG. 4, the thread pair formed by the internal thread provided on the inner wall of the sleeve 23 and the external thread provided on the outer wall 211 of the first end 21 of the adapter 2 is Self-locking thread pair.
  • the self-locking thread pair enables the sleeve 23 to be kept in this position without being disturbed by external force factors such as weight and sway after being screwed to a proper position, thereby ensuring smooth running of the test.
  • a tester (not shown) includes a host, and the adapter 2 for calibrating the test probe line loss described in the above scheme is connected to the host.
  • the tester calibrates the line loss of the probe, the cost is not high, and the needle 12 of the test probe 1 is not damaged, thereby avoiding the cost increase and the error increase caused by the damage of the probe. Larger problems, high accuracy and credibility of test results.
  • the tester has good general performance and can be applied to the line loss calibration test of RF test probe, Bluetooth test probe and baseband test probe.
  • the adapter 2 used in the tester of the present embodiment is the same as the adapter 2 provided in the respective embodiments of the above-described adapter, both can solve the same technical problem and achieve the same expected effect.

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Abstract

一种用于标定测试探针（1）线路损耗的转接头（2），测试探针（1）包括针筒（11）和突出于针筒（11）的针芯（12），转接头（2）的第一端（21）设有探针孔（22），转接头（2）的第一端（21）的外壁（211）套设有套筒（23），探针孔（22）用于配合容纳测试探针（1）的针芯（12），套筒（23）用于配合容纳测试探针（1）的针筒（11）。该转接头解决了现有技术中生产成本高，对位不精确、易晃动、测试结果可信度低的问题。还提供一种测试仪。

Description

一种用于标定测试探针线路损耗的转接头及测试仪 技术领域
本发明涉及线路损耗标定的技术领域，尤其涉及一种用于标定测试探针线路损耗的转接头及测试仪。
背景技术
为更好地实现预定功能，射频匹配电路上设置了射频开关以兼容产线测试并传输射频电路中的射频信号。该电路板在工厂的射频测试中就必须匹配该射频开关，因此技术人员通常会在测试载具上使用到射频测试探针来匹配该射频开关，由射频探针将射频开关顶开，以分流信号，从而得到测试结果。为使射频测试的结果更为可靠准确，测试之前就必须标定测试探针的线路损耗，标定过程中需要使用转接器将射频探针和普通射频线缆连接起来，从而实现射频探针端与测试仪器端的射频信号传输，进而准确得出线路损耗。现有技术中通常使用对应射频探针的配套转接头或是使用dummy板(仿产品电路板)来实现射频探针和普通射频线缆的连接。
配套转接头是目前实现连接射频探针和射频线缆的主要方式，如图1所示，配套转接头01的一端设置有与射频探针接口标准匹配的射频头，另一端设计为标准同轴连接器母头。使用时技术人员通过肉眼进行对位，将配套转接头01上的探针孔011套设在射频探针的针芯上，然后手持定位并保证其与基准面垂直直至测试结束，整个标定过程需要一分钟左右，技术人员在使用配套转接头01标定时，容易出现对位不准确和手持过程中晃动的问题，导致针芯折弯，从而引起误差并降低探针的使用寿命，增加探针损耗费用。同时，配套转接头01和探针的接触面积非常小，而标定过程中需要持续的保持力来确保对位，但技术人员手持的方式所施加的保持力极其不 稳定，从而导致标定结果出现波动，降低标定的精确性。
使用dummy板连接射频探针和普通射频线缆的方式目前有两种，一种是仿形dummy板，一种是通用dummy板。仿形dummy板是开发一块与待测电路板相应的电路板，并在设置射频探针的位置处对应设置转接器，转接器的尾部连接有普通射频电缆，在对位后进行测量，是一种针对某一电路板的专用元件。但是仿形dummy板的开发周期长，且必须等待测电路板设计完成后才能进行开发，延长了测试时间，降低了测试效率，若电路发生改动时必须重新设计仿形dummy板，导致测试成本过高。同时，由于电路板在测试过程中需要通过夹具夹持以确保其位置被固定，因此仿形dummy板在开发设计时必须对夹具进行避让，以避免出现无法配合进行测量的问题，这就大大增加了仿形dummy板的设计工作量。通用dummy板是在一块面积较小的电路板上设置一个与探针配套的转接头，转接头的尾部连接普通射频电缆，并在该电路板的侧部设置定位部分，使用时只需将转接器的头部对准射频探针插入即可进行测量。但是通用dummy板在使用时仍需手工对位，且自身保持力不足，需要手动配合使用，同样会出现损伤探针导致测试结果可信度低的问题出现。
发明内容
本发明的实施例提供一种用于标定测试探针线路损耗的转接头，该用于标定测试探针线路损耗的转接头的生产成本不高，且对位精确、不易晃动，使得测试结果较为精确。
为达到上述目的，本发明的实施例采用如下技术方案：
第一方面，公开了一种用于标定测试探针线路损耗的转接头，
需要标定线路损耗的测试探针包括针筒和突出于针筒的端部的针芯。
首先，所述转接头的第一端设有探针孔，所述转接头的第一端的外壁套设有套筒。
具体实现中，所述探针孔用于配合容纳所述探针的针芯，所述套筒用于配合容纳所述探针的针筒。
相较于现有技术，本发明提供的用于标定测试探针线路损耗的转接头，由于其结构简单，因此生产成本不高，且该转接头能够应用在所有的探针校准对位的方案中，通用性强，测试时无需花费大量时间进行开发设计，测试效率高。在测试时，技术人员们手持转接头，将转接头上的套筒套设在测试探针的针筒外壁上，并沿套筒内壁滑动，直至测试探针的针芯插入转接头上的探针孔内。由于套筒和测试探针的针筒配合设置，因此，将套筒套设在测试探针的针筒上后，测试探针的针芯就会自动对准转接头上的探针孔，无需进行人工对位，减小了技术人员的工作量。同时，技术人员在对转接头施加保持力时，该保持力施加在套筒上并传递到测试探针的针筒上，保持力并未直接作用于测试探针的针芯上，降低了测试探针的针芯受力出现损伤的风险，在一定程度上保护了测试探针的针芯。且施加保持力后转接头也不会和测试探针发生较大的相对晃动，避免了晃动导致损伤测试探针的针芯、增加测试成本以及引起测试误差等问题，保证了测试的精确程度。
在第一种可能实现的方式中，结合第一方面，为保证测试结果的精确度，避免所述测试探针的针芯和所述探针孔之间出现相对晃动。所述探针孔和所述探针的针芯之间呈间隙配合，所述套筒和所述探针的针筒之间呈间隙配合，且所述探针孔和所述探针的针芯之间的间隙大于等于所述套筒和所述探针的针筒之间的间隙。
当所述探针孔和所述测试探针的针芯之间的间隙大于所述套筒和所述测试探针的针筒之间的间隙时，技术人员施加保持力后，若有干扰使得保持力不能够与所述测试探针所在的电路板所在的平面保持垂直，所述转接头和所述测试探针之间就会出现细微的相对晃动，此时首先出现相对晃动的会是所述套筒和所述测试探针的针筒之间，当该相对晃动逐渐增大时，才会使所述测试探针的针芯和所述探针孔的内壁发生接触并产生相对作用力，这在一定程度上降低 了所述测试探针的针芯受到损伤的概率，极大程度上保护了所述测试探针的针芯，进而保障了测试结果的准确性。若所述探针孔和所述测试探针的针芯之间的间隙等于所述套筒和所述测试探针的针筒之间的间隙，技术人员施加的保持力不与所述测试探针所在的电路板所在的平面垂直时，该保持力被所述套筒和所述测试探针的针筒、所述探针孔和所述测试探针的针芯之间共同分担，减小了所述测试探针的针芯在此时受到的作用力，从而降低了所述测试探针的针芯出现损伤的概率，保障了测试结果的准确性。
在第二种可能实现的方式中，结合第一方面的第一种可能实现的方式，所述探针孔和所述探针的针芯之间的间隙为零，所述套筒和所述探针的针筒之间的间隙为零。
所述探针孔和所述测试探针的针芯之间的间隙为零时，所述探针孔和所述测试探针的针芯之间的接触面积最大，这就使得信号的传输效果达到最佳，同时，为了避免保持力被干扰导致方向出现偏差时对所述测试探针的针芯造成损伤，将所述套筒和所述测试探针的针筒之间的间隙也设置为零，最大程度上确保了所述测试探针的针芯的稳定性及测试的精确度。
在第三种可能实现的方式中，结合第一方面，所述套筒的筒壁上沿其径向方向上开设有穿透所述套筒的筒壁的螺纹孔，所述螺纹孔内设置有定位螺钉。
在第四种可能实现的方式中，结合第一方面，所述套筒的内壁上设置有内螺纹，以与设置在所述转接头的第一端的外壁上的外螺纹相配合。
在第五种可能实现的方式中，结合第一方面的第四种可能实现的方式，设置在所述套筒内壁上的内螺纹和设置在所述转接头的第一端的外壁上的外螺纹构成的螺纹副为自锁螺纹副。
第二方面，公开了一种用于测试仪，包括主机，上述技术方案所述的用于标定测试探针线路损耗的转接头与所述主机连接。
使用所述测试仪对测试探针的线路损耗进行标定时，将所述转 接头套设在测试探针上，然后施加一定的保持力即可进行测试，测试结果可信度高，且不会损伤测试探针的针芯，同时该测试仪具有较好的通用性能，能够适用于射频测试探针、蓝牙测试探针以及基带测试探针等的线路损耗标定测试中。
附图说明
为了更清楚地说明本发明实施例或现有技术中的技术方案，下面将对实施例或现有技术描述中所需要使用的附图作简单地介绍，显而易见地，下面描述中的附图仅仅是本发明的一些实施例，对于本领域普通技术人员来讲，在不付出创造性劳动的前提下，还可以根据这些附图获得其他的附图。
图1为现有技术中配套转接头的主视示意图；
图2为本发明实施例提供的一种用于标定测试探针线路损耗的转接头的主视示意图；
图3为本发明实施例提供的一种用于标定测试探针线路损耗的转接头的探针孔内插入测试探针的针芯的剖视示意图；
图4为本发明实施例提供的一种用于标定测试探针线路损耗的转接头的剖视示意图。
具体实施方式
下面将结合本发明实施例中的附图，对本发明实施例中的技术方案进行清楚、完整地描述，显然，所描述的实施例仅仅是本发明一部分实施例，而不是全部的实施例。基于本发明中的实施例，本领域普通技术人员在没有作出创造性劳动前提下所获得的所有其他实施例，都属于本发明保护的范围。
在本发明的描述中，需要理解的是，术语“中心”、“上”、“下”、“前”、“后”、“左”、“右”、“竖直”、“水平”、“顶”、“底”、“内”、“外”等指示的方位或位置关系为基于附图所示的方位或位置关系，仅是为了便于描述本发明和简化描述，而不是指示或暗示所指的装 置或元件必须具有特定的方位、以特定的方位构造和操作，因此不能理解为对本发明的限制。
术语“第一”、“第二”仅用于描述目的，而不能理解为指示或暗示相对重要性或者隐含指明所指示的技术特征的数量。由此，限定有“第一”、“第二”的特征可以明示或者隐含地包括一个或者更多个该特征。
在本发明的描述中，需要说明的是，除非另有明确的规定和限定，术语“安装”、“相连”、“连接”应做广义理解，例如，可以是固定连接，也可以是可拆卸连接，或一体地连接；可以是机械连接；可以是直接相连，也可以通过中间媒介间接相连，可以是两个元件内部的连通。对于本领域的普通技术人员而言，可以具体情况理解上述术语在本发明中的具体含义。
在科学测量中，标定是一个不容忽视的重要步骤。标定的主要作用是消除系统误差，改善仪器或系统的正确度，从而使系统的测试结果更为精确。
在电路的测试中，根据电路预定功能的要求，测试载具上设置有相应的测试探针1，以测试该电路的性能。测试仪通过转接头2连通测试探针1和测试仪的主机，从而对电路性能进行测试。但在测试之前，需要标定该测试探针1的线路损耗，以确保电路性能的测试结果的精确性。
如图2和图3所示，一种用于标定测试探针线路损耗的转接头，测试探针1包括针筒11和突出于针筒11的端部111的针芯12，转接头2的第一端21设有探针孔22，转接头2的第一端21的外壁211套设有套筒23，探针孔22用于配合容纳测试探针1的针芯12，套筒23用于配合容纳测试探针1的针筒11。
本发明提供的用于标定测试探针线路损耗的转接头，由于其结构简单，因此生产成本不高。在测试时，技术人员们手持转接头2，将转接头2上的套筒23套设在测试探针1的针筒11的外壁211上，并沿套筒23的内壁滑动，直至测试探针1的针芯12插入转接头2 上的探针孔22内。由于套筒23和测试探针1的针筒22配合设置，因此，将套筒23套设在测试探针1的针筒11上后，测试探针1的针芯12就会自动对准转接头2上的探针孔22，无需进行人工对位，减小了技术人员的工作量。同时，技术人员在对转接头2施加保持力时，该保持力施加在套筒23上并传递到测试探针1的针筒11上，保持力并未直接作用于测试探针1的针芯12上，降低了测试探针1的针芯12受力出现损伤的风险，在一定程度上保护了测试探针1的针芯12。且施加保持力后转接头2也不会和测试探针1发生较大的相对晃动，避免了晃动导致损伤测试探针1的针芯12、增加测试成本以及引起测试误差等问题，保证了测试的精确程度。
测试过程中，测试探针1的针芯12和探针孔22之间的细小晃动也会对测试造成一定的误差。因此，为保证测试结果的精确度，如图3所示，探针孔22和测试探针1的针芯12之间呈间隙配合，套筒23和测试探针1的针筒11之间呈间隙配合，且探针孔22和测试探针1的针芯12之间的间隙大于或等于套筒23和测试探针1的针筒11之间的间隙。当探针孔22和测试探针1的针芯12之间的间隙大于套筒23和测试探针1的针筒11之间的间隙时，技术人员施加保持力后，若有干扰使得保持力不能够与测试探针1所在的电路板所在的平面保持垂直，转接头2和测试探针1之间就会出现细微的相对晃动，此时首先出现相对晃动的会是套筒23和测试探针1的针筒11之间，当该相对晃动逐渐增大时，才会使测试探针1的针芯12和探针孔22的内壁发生接触并产生相对作用力，这在一定程度上降低了针芯12受到损伤的概率，极大程度上保护了测试探针1的针芯12，进而保障了测试结果的准确性。若探针孔22和测试探针1的针芯12之间的间隙等于套筒23和测试探针1的针筒11之间的间隙，技术人员施加的保持力不与电路板所在的平面垂直时，该保持力被套筒23和测试探针1的针筒11、探针孔22和测试探针1的针芯12之间共同分担，减小了针芯12在此时受到的作用力，从而降低了针芯12出现损伤的概率，保障了测试结果的准确性。
测试时测试探针1通过针芯12将信号传递出来，因此，探针孔22和测试探针1的针芯12之间的间隙越小，测试用的仪器所接收到的信号也就越强，测试结果也就更为准确。如图3所示，探针孔22和测试探针1的针芯12之间的间隙为零，套筒23和测试探针1的针筒11之间的间隙为零。探针孔22和测试探针1的针芯12之间的间隙为零时，探针孔22和测试探针1的针芯12之间的接触面积最大，这就使得信号的传输效果达到最佳，同时，为了避免保持力被干扰导致方向出现偏差时对针芯12造成损伤，将套筒23和测试探针1的针筒11之间的间隙也设置为零，最大程度上确保了针芯12的稳定性及测试的精确度。
套筒23设置在转接头2的第一端21的外壁211上，用以配合容纳测试探针1的针筒11，若套筒23的长度过长，则会导致测试探针1的针筒11被套筒23完全包裹后，测试探针1的针芯12仍然无法插入探针孔12内，因此，将套筒23与转接头2的第一端21的外壁211可活动连接，使得套筒23可在转接头2的第一端21的外壁211上沿轴向运动。如图3所示，套筒23的筒壁上沿其径向方向上开设有穿透所述套筒的筒壁的螺纹孔231，螺纹孔231内设置有定位螺钉232。技术人员在测试时根据测试探针1的针筒11的长度来调节套筒23伸出转接头2的第一端21的长度，然后旋拧定位螺钉232，使定位螺钉232抵靠在转接头2的第一端21的外壁211上，从而实现对套筒23伸出转接头2的第一端21的长度的调节及定位，保证测试的顺利进行。
调节套筒23伸出转接头2的第一端21的长度时也可以通过螺纹旋拧的方式。如图4所示，套筒23的内壁上设置有内螺纹，以与设置在转接头2的第一端21的外壁211上的外螺纹相配合。根据实际测试时的需求，选择旋拧套筒23的方向，使套筒23伸出转接头2的第一端21的长度增大或减小，进而保证测试的顺利进行。
进一步地，将套筒23旋拧到合适位置后，套筒23可能会因为自重或晃动等外力因素，与转接头2的第一端21的外壁211之间产 生相对运动，进而影响测试过程，因此，如图4所示，设置在套筒23内壁上的内螺纹和设置在转接头2的第一端21的外壁211上的外螺纹构成的螺纹副为自锁螺纹副。自锁螺纹副使得套筒23在被旋拧到合适位置后，能够不受自重和晃动等外力因素的干扰，保持在该位置，保障了测试的顺利进行。
一种测试仪(图中未示出)，包括主机，上述方案中所述的用于标定测试探针线路损耗的转接头2与主机连接。使得该测试仪在标定探针的线路损耗时，所消耗的成本不高，且不会对测试探针1的针芯12造成损伤，从而避免了探针出现损伤带来的成本增加及误差增大等问题，测试结果精确度和可信度高。同时该测试仪具有较好的通用性能，能够适用于射频测试探针、蓝牙测试探针以及基带测试探针等的线路损耗标定测试中。
由于在本实施例的测试仪中使用的转接头2与上述转接头的各实施例中提供的转接头2相同，因此二者能够解决相同的技术问题，并达到相同的预期效果。
关于本发明实施例的测试仪的其他构成等已为本领域的技术人员所熟知，在此不再详细说明。
以上所述，仅为本发明的具体实施方式，但本发明的保护范围并不局限于此，任何熟悉本技术领域的技术人员在本发明揭露的技术范围内，可轻易想到变化或替换，都应涵盖在本发明的保护范围之内。因此，本发明的保护范围应所述以权利要求的保护范围为准。

Claims (7)

  1. 一种用于标定测试探针线路损耗的转接头，测试探针包括针筒和突出于针筒的端部的针芯，其特征在于，所述转接头的第一端设有探针孔，所述转接头的第一端的外壁套设有套筒，所述探针孔用于配合容纳所述探针的针芯，所述套筒用于配合容纳所述探针的针筒。
  2. 根据权利要求1所述的用于标定测试探针线路损耗的转接头，其特征在于，所述探针孔和所述探针的针芯之间呈间隙配合，所述套筒和所述探针的针筒之间呈间隙配合，且所述探针孔和所述探针的针芯之间的间隙大于或等于所述套筒和所述探针的针筒之间的间隙。
  3. 根据权利要求2所述的用于标定测试探针线路损耗的转接头，其特征在于，所述探针孔和所述探针的针芯之间的间隙为零，所述套筒和所述探针的针筒之间的间隙为零。
  4. 根据权利要求1所述的用于标定测试探针线路损耗的转接头，其特征在于，所述套筒的筒壁上沿其径向方向上开设有穿透所述套筒的筒壁的螺纹孔，所述螺纹孔内设置有定位螺钉。
  5. 根据权利要求1所述的用于标定测试探针线路损耗的转接头，其特征在于，所述套筒的内壁上设置有内螺纹，以与设置在所述转接头的第一端的外壁上的外螺纹相配合。
  6. 根据权利要求5所述的用于标定测试探针线路损耗的转接头，其特征在于，设置在所述套筒内壁上的内螺纹和设置在所述转接头的第一端的外壁上的外螺纹构成的螺纹副为自锁螺纹副。
  7. 一种测试仪，其特征在于，包括主机，权利要求1～6中任一项所述的用于标定测试探针线路损耗的转接头与所述主机连接。
PCT/CN2016/077233 2016-03-24 2016-03-24 一种用于标定测试探针线路损耗的转接头及测试仪 WO2017161536A1 (zh)

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