JPWO2022244055A5 - - Google Patents

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JPWO2022244055A5
JPWO2022244055A5 JP2023522004A JP2023522004A JPWO2022244055A5 JP WO2022244055 A5 JPWO2022244055 A5 JP WO2022244055A5 JP 2023522004 A JP2023522004 A JP 2023522004A JP 2023522004 A JP2023522004 A JP 2023522004A JP WO2022244055 A5 JPWO2022244055 A5 JP WO2022244055A5
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JP2023522004A
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JPWO2022244055A1 (https=
JP7547630B2 (ja
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Priority claimed from PCT/JP2021/018607 external-priority patent/WO2022244055A1/ja
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JP2023522004A 2021-05-17 2021-05-17 試料ホルダおよび解析システム Active JP7547630B2 (ja)

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Application Number Priority Date Filing Date Title
PCT/JP2021/018607 WO2022244055A1 (ja) 2021-05-17 2021-05-17 試料ホルダおよび解析システム

Publications (3)

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JPWO2022244055A1 JPWO2022244055A1 (https=) 2022-11-24
JPWO2022244055A5 true JPWO2022244055A5 (https=) 2024-02-14
JP7547630B2 JP7547630B2 (ja) 2024-09-09

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JP2023522004A Active JP7547630B2 (ja) 2021-05-17 2021-05-17 試料ホルダおよび解析システム

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US (1) US20240266141A1 (https=)
JP (1) JP7547630B2 (https=)
DE (1) DE112021007286T5 (https=)
WO (1) WO2022244055A1 (https=)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN119008367B (zh) * 2024-08-14 2025-09-19 北京大学 一种用于保护敏感样品的样品杆

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4654216B2 (ja) 2007-04-23 2011-03-16 株式会社日立ハイテクノロジーズ 荷電粒子線装置用試料ホールダ
JP5517559B2 (ja) 2009-10-26 2014-06-11 株式会社日立ハイテクノロジーズ 荷電粒子線装置及び荷電粒子線装置における三次元情報の表示方法
JP5875500B2 (ja) * 2012-10-31 2016-03-02 株式会社日立ハイテクノロジーズ 電子ビーム顕微装置
JP2015018645A (ja) * 2013-07-10 2015-01-29 株式会社日立ハイテクノロジーズ 試料ホールダおよび荷電粒子装置
JP6515320B2 (ja) * 2014-11-19 2019-05-22 日本製鉄株式会社 試料ホルダー及び透過型電子顕微鏡による観察方法

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