JPWO2022153821A1 - - Google Patents

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Publication number
JPWO2022153821A1
JPWO2022153821A1 JP2022575499A JP2022575499A JPWO2022153821A1 JP WO2022153821 A1 JPWO2022153821 A1 JP WO2022153821A1 JP 2022575499 A JP2022575499 A JP 2022575499A JP 2022575499 A JP2022575499 A JP 2022575499A JP WO2022153821 A1 JPWO2022153821 A1 JP WO2022153821A1
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JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Application number
JP2022575499A
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Japanese (ja)
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JP7378649B2 (ja
JPWO2022153821A5 (enrdf_load_stackoverflow
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Publication of JPWO2022153821A1 publication Critical patent/JPWO2022153821A1/ja
Publication of JPWO2022153821A5 publication Critical patent/JPWO2022153821A5/ja
Application granted granted Critical
Publication of JP7378649B2 publication Critical patent/JP7378649B2/ja
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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/02—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance
    • G01N27/22—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating capacitance
    • G01N27/24—Investigating the presence of flaws
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/92—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating breakdown voltage
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/12—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing

Landscapes

  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Electrochemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Testing Relating To Insulation (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
JP2022575499A 2021-01-14 2021-12-23 欠陥検出装置、欠陥検出方法、欠陥検出システムおよび回転電機の製造方法 Active JP7378649B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2021003909 2021-01-14
JP2021003909 2021-01-14
PCT/JP2021/047803 WO2022153821A1 (ja) 2021-01-14 2021-12-23 欠陥検出装置、欠陥検出方法、欠陥検出システムおよび回転電機の製造方法

Publications (3)

Publication Number Publication Date
JPWO2022153821A1 true JPWO2022153821A1 (enrdf_load_stackoverflow) 2022-07-21
JPWO2022153821A5 JPWO2022153821A5 (enrdf_load_stackoverflow) 2023-03-02
JP7378649B2 JP7378649B2 (ja) 2023-11-13

Family

ID=82447273

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2022575499A Active JP7378649B2 (ja) 2021-01-14 2021-12-23 欠陥検出装置、欠陥検出方法、欠陥検出システムおよび回転電機の製造方法

Country Status (3)

Country Link
JP (1) JP7378649B2 (enrdf_load_stackoverflow)
CN (1) CN116670503A (enrdf_load_stackoverflow)
WO (1) WO2022153821A1 (enrdf_load_stackoverflow)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2023139910A1 (ja) * 2022-01-24 2023-07-27 三菱電機株式会社 巻線負荷再現装置、マグネットワイヤ絶縁被膜の検査装置、マグネットワイヤ絶縁被膜の検査方法、および回転電機の製造方法
CN116660789B (zh) * 2023-06-25 2024-02-20 新疆天成鲁源电气工程有限公司 一种用于电缆的智能带电检测装置
CN119001376B (zh) * 2024-10-23 2025-03-11 中国电建集团山东电力建设第一工程有限公司 测量装置

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5324626B1 (enrdf_load_stackoverflow) * 1967-07-10 1978-07-21
JPH08211115A (ja) * 1995-02-06 1996-08-20 Toshiba Corp 被覆電線用絶縁被膜劣化診断装置
JP2004347523A (ja) * 2003-05-23 2004-12-09 Hitachi Ltd コイルの絶縁特性試験方法
JP2006300532A (ja) * 2005-04-15 2006-11-02 Toyota Motor Corp コイルの品質検査方法、及び、コイルの品質検査装置
JP2009236887A (ja) * 2008-03-28 2009-10-15 Furukawa Electric Co Ltd:The 絶縁不良検出用電極構造および絶縁不良検出方法
JP2014182053A (ja) * 2013-03-21 2014-09-29 Hitachi Metals Ltd 絶縁特性の検査装置、絶縁特性の検査方法及び絶縁電線の製造方法
JP2016180629A (ja) * 2015-03-23 2016-10-13 日立金属株式会社 部分放電測定方法および部分放電測定装置、並びに絶縁電線の製造方法

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05332981A (ja) * 1992-06-02 1993-12-17 Fujikura Ltd 絶縁被覆層のピンホール等の検査方法及び検査装置
CN1214509C (zh) * 2001-09-06 2005-08-10 建准电机工业股份有限公司 直流马达及其线圈绕线方法
JP3614141B2 (ja) * 2002-02-25 2005-01-26 日産自動車株式会社 コイル傷検査装置、およびその方法
JP2006098362A (ja) * 2004-09-30 2006-04-13 Kobe Steel Ltd 絶縁性薄膜の欠陥検出方法
KR200418696Y1 (ko) * 2006-03-27 2006-06-14 여상현 선재의 재권취장치
CN101329305A (zh) * 2008-07-25 2008-12-24 常熟泓淋电线电缆有限公司 导线检测装置
JP5839986B2 (ja) * 2011-12-26 2016-01-06 日産自動車株式会社 検査方法および検査システム
WO2016143218A1 (ja) * 2015-03-12 2016-09-15 三菱電機株式会社 電動機の絶縁検査装置および電動機の絶縁検査方法
CN106442716B (zh) * 2016-11-04 2019-08-13 西安交通大学 一种复合绝缘子内部缺陷检测方法

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5324626B1 (enrdf_load_stackoverflow) * 1967-07-10 1978-07-21
JPH08211115A (ja) * 1995-02-06 1996-08-20 Toshiba Corp 被覆電線用絶縁被膜劣化診断装置
JP2004347523A (ja) * 2003-05-23 2004-12-09 Hitachi Ltd コイルの絶縁特性試験方法
JP2006300532A (ja) * 2005-04-15 2006-11-02 Toyota Motor Corp コイルの品質検査方法、及び、コイルの品質検査装置
JP2009236887A (ja) * 2008-03-28 2009-10-15 Furukawa Electric Co Ltd:The 絶縁不良検出用電極構造および絶縁不良検出方法
JP2014182053A (ja) * 2013-03-21 2014-09-29 Hitachi Metals Ltd 絶縁特性の検査装置、絶縁特性の検査方法及び絶縁電線の製造方法
JP2016180629A (ja) * 2015-03-23 2016-10-13 日立金属株式会社 部分放電測定方法および部分放電測定装置、並びに絶縁電線の製造方法

Also Published As

Publication number Publication date
CN116670503A (zh) 2023-08-29
JP7378649B2 (ja) 2023-11-13
WO2022153821A1 (ja) 2022-07-21

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