JPWO2022070437A1 - - Google Patents

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Publication number
JPWO2022070437A1
JPWO2022070437A1 JP2022519612A JP2022519612A JPWO2022070437A1 JP WO2022070437 A1 JPWO2022070437 A1 JP WO2022070437A1 JP 2022519612 A JP2022519612 A JP 2022519612A JP 2022519612 A JP2022519612 A JP 2022519612A JP WO2022070437 A1 JPWO2022070437 A1 JP WO2022070437A1
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Application number
JP2022519612A
Other versions
JP7194365B2 (ja
JPWO2022070437A5 (ja
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Publication of JPWO2022070437A1 publication Critical patent/JPWO2022070437A1/ja
Publication of JPWO2022070437A5 publication Critical patent/JPWO2022070437A5/ja
Priority to JP2022198239A priority Critical patent/JP7485001B2/ja
Application granted granted Critical
Publication of JP7194365B2 publication Critical patent/JP7194365B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/8422—Investigating thin films, e.g. matrix isolation method
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/8422—Investigating thin films, e.g. matrix isolation method
    • G01N2021/8427—Coatings
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N2021/9513—Liquid crystal panels

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Mathematical Physics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Optical Elements Other Than Lenses (AREA)
  • Polarising Elements (AREA)
  • Electroluminescent Light Sources (AREA)
JP2022519612A 2020-10-02 2020-11-24 ぎらつきコントラストの補正方法、比較方法および比較装置、電子ディスプレイの製造方法、及び防眩層の製造方法 Active JP7194365B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2022198239A JP7485001B2 (ja) 2020-10-02 2022-12-12 ぎらつきコントラストの補正方法、比較方法および比較装置、電子ディスプレイの製造方法、及び防眩層の製造方法

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
JP2020168022 2020-10-02
JP2020168022 2020-10-02
JP2020180850 2020-10-28
JP2020180850 2020-10-28
PCT/JP2020/043685 WO2022070437A1 (ja) 2020-10-02 2020-11-24 ぎらつきコントラストの補正方法、比較方法および比較装置、電子ディスプレイの製造方法、及び防眩層の製造方法

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2022198239A Division JP7485001B2 (ja) 2020-10-02 2022-12-12 ぎらつきコントラストの補正方法、比較方法および比較装置、電子ディスプレイの製造方法、及び防眩層の製造方法

Publications (3)

Publication Number Publication Date
JPWO2022070437A1 true JPWO2022070437A1 (ja) 2022-04-07
JPWO2022070437A5 JPWO2022070437A5 (ja) 2022-09-20
JP7194365B2 JP7194365B2 (ja) 2022-12-22

Family

ID=80950557

Family Applications (2)

Application Number Title Priority Date Filing Date
JP2022519612A Active JP7194365B2 (ja) 2020-10-02 2020-11-24 ぎらつきコントラストの補正方法、比較方法および比較装置、電子ディスプレイの製造方法、及び防眩層の製造方法
JP2022198239A Active JP7485001B2 (ja) 2020-10-02 2022-12-12 ぎらつきコントラストの補正方法、比較方法および比較装置、電子ディスプレイの製造方法、及び防眩層の製造方法

Family Applications After (1)

Application Number Title Priority Date Filing Date
JP2022198239A Active JP7485001B2 (ja) 2020-10-02 2022-12-12 ぎらつきコントラストの補正方法、比較方法および比較装置、電子ディスプレイの製造方法、及び防眩層の製造方法

Country Status (6)

Country Link
US (1) US20240027357A1 (ja)
EP (1) EP4224134A1 (ja)
JP (2) JP7194365B2 (ja)
CN (1) CN116324365A (ja)
TW (1) TWI826748B (ja)
WO (1) WO2022070437A1 (ja)

Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000304648A (ja) * 1999-02-19 2000-11-02 Dainippon Printing Co Ltd 面ぎらの定量的評価方法、評価装置、防眩性フィルム及びその製造方法
JP2004239663A (ja) * 2003-02-04 2004-08-26 Fuji Photo Film Co Ltd ディスプレイの輝度測定方法
JP2009074981A (ja) * 2007-09-21 2009-04-09 Fuji Xerox Co Ltd 画像評価装置
JP2009175041A (ja) * 2008-01-25 2009-08-06 Asahi Kasei Corp 表示画像のギラツキ評価方法
JP2010169788A (ja) * 2009-01-21 2010-08-05 Toray Ind Inc ディスプレイ用フィルター
CN103929130A (zh) * 2014-03-26 2014-07-16 合肥晶澳太阳能科技有限公司 一种防眩光光伏组件眩光等级测评方法
WO2018021388A1 (ja) * 2016-07-29 2018-02-01 大日本印刷株式会社 文字ぼけ評価方法、光学部材、および表示装置
CN108088658A (zh) * 2016-11-23 2018-05-29 深圳华萤光电技术有限公司 一种眩光测量方法及其测量系统
WO2020085308A1 (ja) * 2018-10-26 2020-04-30 東洋紡株式会社 液晶化合物配向層転写用配向フィルム

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004101868A (ja) 2002-09-10 2004-04-02 Hitachi Ltd フォトマスクの製造方法
TW200537127A (en) * 2004-01-29 2005-11-16 Nippon Paint Co Ltd Antidazzle coating composition, antidazzle film and process for producing the same
JP4869053B2 (ja) * 2006-01-11 2012-02-01 日東電工株式会社 積層フィルムの製造方法、積層フィルムの欠陥検出方法、積層フィルムの欠陥検出装置、積層フィルム、及び画像表示装置
JP2013019886A (ja) * 2011-06-13 2013-01-31 Ricoh Co Ltd 画像計測装置
JP7208737B2 (ja) 2018-08-08 2023-01-19 日本放送協会 カメラ評価値測定装置およびカメラ評価値測定方法
CN110399633B (zh) * 2019-06-06 2022-12-16 杭州电子科技大学上虞科学与工程研究院有限公司 一种能够校正炫光影响的显示器色彩管理实现方法

Patent Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000304648A (ja) * 1999-02-19 2000-11-02 Dainippon Printing Co Ltd 面ぎらの定量的評価方法、評価装置、防眩性フィルム及びその製造方法
JP2004239663A (ja) * 2003-02-04 2004-08-26 Fuji Photo Film Co Ltd ディスプレイの輝度測定方法
JP2009074981A (ja) * 2007-09-21 2009-04-09 Fuji Xerox Co Ltd 画像評価装置
JP2009175041A (ja) * 2008-01-25 2009-08-06 Asahi Kasei Corp 表示画像のギラツキ評価方法
JP2010169788A (ja) * 2009-01-21 2010-08-05 Toray Ind Inc ディスプレイ用フィルター
CN103929130A (zh) * 2014-03-26 2014-07-16 合肥晶澳太阳能科技有限公司 一种防眩光光伏组件眩光等级测评方法
WO2018021388A1 (ja) * 2016-07-29 2018-02-01 大日本印刷株式会社 文字ぼけ評価方法、光学部材、および表示装置
CN108088658A (zh) * 2016-11-23 2018-05-29 深圳华萤光电技术有限公司 一种眩光测量方法及其测量系统
WO2020085308A1 (ja) * 2018-10-26 2020-04-30 東洋紡株式会社 液晶化合物配向層転写用配向フィルム

Also Published As

Publication number Publication date
JP7485001B2 (ja) 2024-05-16
CN116324365A (zh) 2023-06-23
JP7194365B2 (ja) 2022-12-22
TWI826748B (zh) 2023-12-21
JP2023041667A (ja) 2023-03-24
WO2022070437A1 (ja) 2022-04-07
TW202215099A (zh) 2022-04-16
US20240027357A1 (en) 2024-01-25
EP4224134A1 (en) 2023-08-09

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