JPWO2021181441A1 - - Google Patents

Info

Publication number
JPWO2021181441A1
JPWO2021181441A1 JP2022506988A JP2022506988A JPWO2021181441A1 JP WO2021181441 A1 JPWO2021181441 A1 JP WO2021181441A1 JP 2022506988 A JP2022506988 A JP 2022506988A JP 2022506988 A JP2022506988 A JP 2022506988A JP WO2021181441 A1 JPWO2021181441 A1 JP WO2021181441A1
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2022506988A
Other versions
JPWO2021181441A5 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPWO2021181441A1 publication Critical patent/JPWO2021181441A1/ja
Publication of JPWO2021181441A5 publication Critical patent/JPWO2021181441A5/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B17/00—Systems with reflecting surfaces, with or without refracting elements
    • G02B17/02—Catoptric systems, e.g. image erecting and reversing system
    • G02B17/06—Catoptric systems, e.g. image erecting and reversing system using mirrors only, i.e. having only one curved mirror
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G06T7/001—Industrial image inspection using an image reference approach
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00—Optical elements other than lenses
    • G02B5/04—Prisms
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10016—Video; Image sequence
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30181—Earth observation
    • G06T2207/30184—Infrastructure

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Optics & Photonics (AREA)
  • Quality & Reliability (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Theoretical Computer Science (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Length Measuring Devices By Optical Means (AREA)
JP2022506988A 2020-03-09 2020-03-09 Pending JPWO2021181441A1 (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2020/009914 WO2021181441A1 (ja) 2020-03-09 2020-03-09 異常判定システム、撮影装置および異常判定方法

Publications (2)

Publication Number Publication Date
JPWO2021181441A1 true JPWO2021181441A1 (ja) 2021-09-16
JPWO2021181441A5 JPWO2021181441A5 (ja) 2022-09-13

Family

ID=77670482

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2022506988A Pending JPWO2021181441A1 (ja) 2020-03-09 2020-03-09

Country Status (3)

Country Link
US (1) US20230111602A1 (ja)
JP (1) JPWO2021181441A1 (ja)
WO (1) WO2021181441A1 (ja)

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002218295A (ja) * 2001-01-18 2002-08-02 Olympus Optical Co Ltd 撮像装置
JP2004205652A (ja) * 2002-12-24 2004-07-22 Nikon Corp ワイドコンバーターレンズ
JP2006064975A (ja) * 2004-08-26 2006-03-09 Olympus Corp 顕微鏡および薄板エッジ検査装置
JP4847128B2 (ja) * 2005-12-21 2011-12-28 日本エレクトロセンサリデバイス株式会社 表面欠陥検査装置
DE102007037726B4 (de) * 2007-08-09 2010-07-08 Lavision Gmbh Verfahren zur berührungslosen Messung von Verformungen einer Oberfläche eines Messobjektes
US8692880B2 (en) * 2010-10-05 2014-04-08 Mitutoyo Corporation Image correlation displacement sensor
JPWO2016152076A1 (ja) * 2015-03-20 2018-01-11 日本電気株式会社 構造物の状態判定装置と状態判定システムおよび状態判定方法
WO2017029905A1 (ja) * 2015-08-19 2017-02-23 国立研究開発法人産業技術総合研究所 単一カメラによる物体の変位と振動の測定方法、装置およびそのプログラム
US11846498B2 (en) * 2018-06-05 2023-12-19 Nec Corporation Displacement amount measuring device, displacement amount measuring method, and recording medium

Also Published As

Publication number Publication date
US20230111602A1 (en) 2023-04-13
WO2021181441A1 (ja) 2021-09-16

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