JPWO2021181441A1 - - Google Patents

Info

Publication number
JPWO2021181441A1
JPWO2021181441A1 JP2022506988A JP2022506988A JPWO2021181441A1 JP WO2021181441 A1 JPWO2021181441 A1 JP WO2021181441A1 JP 2022506988 A JP2022506988 A JP 2022506988A JP 2022506988 A JP2022506988 A JP 2022506988A JP WO2021181441 A1 JPWO2021181441 A1 JP WO2021181441A1
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2022506988A
Other languages
Japanese (ja)
Other versions
JPWO2021181441A5 (https=
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPWO2021181441A1 publication Critical patent/JPWO2021181441A1/ja
Publication of JPWO2021181441A5 publication Critical patent/JPWO2021181441A5/ja
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B17/00Systems with reflecting surfaces, with or without refracting elements
    • G02B17/02Catoptric systems, e.g. image erecting and reversing system
    • G02B17/06Catoptric systems, e.g. image erecting and reversing system using mirrors only, i.e. having only one curved mirror
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00Image analysis
    • G06T7/0002Inspection of images, e.g. flaw detection
    • G06T7/0004Industrial image inspection
    • G06T7/001Industrial image inspection using an image reference approach
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00Optical elements other than lenses
    • G02B5/04Prisms
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00Image analysis
    • G06T7/0002Inspection of images, e.g. flaw detection
    • G06T7/0004Industrial image inspection
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00Indexing scheme for image analysis or image enhancement
    • G06T2207/10Image acquisition modality
    • G06T2207/10016Video; Image sequence
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00Indexing scheme for image analysis or image enhancement
    • G06T2207/30Subject of image; Context of image processing
    • G06T2207/30181Earth observation
    • G06T2207/30184Infrastructure

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Optics & Photonics (AREA)
  • Quality & Reliability (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Theoretical Computer Science (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Length Measuring Devices By Optical Means (AREA)
JP2022506988A 2020-03-09 2020-03-09 Pending JPWO2021181441A1 (https=)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2020/009914 WO2021181441A1 (ja) 2020-03-09 2020-03-09 異常判定システム、撮影装置および異常判定方法

Publications (2)

Publication Number Publication Date
JPWO2021181441A1 true JPWO2021181441A1 (https=) 2021-09-16
JPWO2021181441A5 JPWO2021181441A5 (https=) 2022-09-13

Family

ID=77670482

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2022506988A Pending JPWO2021181441A1 (https=) 2020-03-09 2020-03-09

Country Status (3)

Country Link
US (1) US20230111602A1 (https=)
JP (1) JPWO2021181441A1 (https=)
WO (1) WO2021181441A1 (https=)

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002218295A (ja) * 2001-01-18 2002-08-02 Olympus Optical Co Ltd 撮像装置
JP2004205652A (ja) * 2002-12-24 2004-07-22 Nikon Corp ワイドコンバーターレンズ
WO2016152076A1 (ja) * 2015-03-20 2016-09-29 日本電気株式会社 構造物の状態判定装置と状態判定システムおよび状態判定方法

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006064975A (ja) * 2004-08-26 2006-03-09 Olympus Corp 顕微鏡および薄板エッジ検査装置
JP4847128B2 (ja) * 2005-12-21 2011-12-28 日本エレクトロセンサリデバイス株式会社 表面欠陥検査装置
DE102007037726B4 (de) * 2007-08-09 2010-07-08 Lavision Gmbh Verfahren zur berührungslosen Messung von Verformungen einer Oberfläche eines Messobjektes
US8692880B2 (en) * 2010-10-05 2014-04-08 Mitutoyo Corporation Image correlation displacement sensor
AU2016308995B2 (en) * 2015-08-19 2019-02-14 National Institute Of Advanced Industrial Science And Technology Method, device, and program for measuring displacement and vibration of object by single camera
JP6984747B2 (ja) * 2018-06-05 2021-12-22 日本電気株式会社 変位量測定装置、変位量測定方法、およびプログラム

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002218295A (ja) * 2001-01-18 2002-08-02 Olympus Optical Co Ltd 撮像装置
JP2004205652A (ja) * 2002-12-24 2004-07-22 Nikon Corp ワイドコンバーターレンズ
WO2016152076A1 (ja) * 2015-03-20 2016-09-29 日本電気株式会社 構造物の状態判定装置と状態判定システムおよび状態判定方法

Also Published As

Publication number Publication date
WO2021181441A1 (ja) 2021-09-16
US20230111602A1 (en) 2023-04-13

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