JPWO2021166543A5 - - Google Patents

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JPWO2021166543A5
JPWO2021166543A5 JP2022501718A JP2022501718A JPWO2021166543A5 JP WO2021166543 A5 JPWO2021166543 A5 JP WO2021166543A5 JP 2022501718 A JP2022501718 A JP 2022501718A JP 2022501718 A JP2022501718 A JP 2022501718A JP WO2021166543 A5 JPWO2021166543 A5 JP WO2021166543A5
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JP
Japan
Prior art keywords
light
imaging
infrared
infrared light
imaging device
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JP2022501718A
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English (en)
Japanese (ja)
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JP7334325B2 (ja
JPWO2021166543A1 (https=
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Priority claimed from PCT/JP2021/002087 external-priority patent/WO2021166543A1/ja
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Publication of JPWO2021166543A5 publication Critical patent/JPWO2021166543A5/ja
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JP2022501718A 2020-02-21 2021-01-21 撮像装置 Active JP7334325B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2020028626 2020-02-21
JP2020028626 2020-02-21
PCT/JP2021/002087 WO2021166543A1 (ja) 2020-02-21 2021-01-21 撮像装置

Publications (3)

Publication Number Publication Date
JPWO2021166543A1 JPWO2021166543A1 (https=) 2021-08-26
JPWO2021166543A5 true JPWO2021166543A5 (https=) 2022-10-14
JP7334325B2 JP7334325B2 (ja) 2023-08-28

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JP2022501718A Active JP7334325B2 (ja) 2020-02-21 2021-01-21 撮像装置

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US (2) US12231750B2 (https=)
JP (1) JP7334325B2 (https=)
WO (1) WO2021166543A1 (https=)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7496879B2 (ja) * 2020-08-20 2024-06-07 富士フイルム株式会社 撮像装置、撮像方法、及びプログラム
US20240430584A1 (en) * 2023-06-26 2024-12-26 Canon Kabushiki Kaisha Image processing apparatus, image processing method, and storage medium

Family Cites Families (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2305799A (en) * 1995-10-02 1997-04-16 Secr Defence Thermal imaging system with controlled mean scene reference temperature source
US7030378B2 (en) * 2003-08-05 2006-04-18 Bae Systems Information And Electronic Systems Integration, Inc. Real-time radiation sensor calibration
JP2008070828A (ja) * 2006-09-15 2008-03-27 Agc Techno Glass Co Ltd 赤外線遮蔽フィルタ
JP2008145270A (ja) 2006-12-11 2008-06-26 Hioki Ee Corp サーモグラフィ装置
US10091439B2 (en) * 2009-06-03 2018-10-02 Flir Systems, Inc. Imager with array of multiple infrared imaging modules
CN102377937B (zh) * 2010-08-04 2015-07-15 株式会社日立国际电气 摄像装置
EP3184038B1 (en) * 2012-12-31 2019-02-20 Omni MedSci, Inc. Mouth guard with short-wave infrared super-continuum lasers for early detection of dental caries
JP6570059B2 (ja) * 2015-07-17 2019-09-04 国立研究開発法人産業技術総合研究所 非接触温度測定方法および測定システム
GB2542115B (en) * 2015-09-03 2017-11-15 Rail Vision Europe Ltd Rail track asset survey system
CA3022092A1 (en) * 2016-05-03 2017-11-09 Adolphe Merkle Institute, University Of Fribourg Sample holder and lock-in thermography system
JP2020509364A (ja) * 2017-02-20 2020-03-26 ヨラン イメージング リミテッドＹｏｒａｎ Ｉｍａｇｉｎｇ Ｌｔｄ． パッケージ完全性を決定するための方法およびシステム
JP6765327B2 (ja) * 2017-03-15 2020-10-07 Ｊｆｅスチール株式会社 放射温度測定装置及び放射温度測定方法
JP2018179932A (ja) * 2017-04-21 2018-11-15 日本アビオニクス株式会社 赤外線撮影装置、赤外線撮影システム及び赤外線撮影方法
CN110582721B (zh) * 2017-05-01 2022-09-20 金泰克斯公司 具有可切换的白天和夜晚模式的成像装置
CN111565621B (zh) * 2018-01-10 2024-07-19 开米美景公司 用于内窥镜的时间相关的源调制
US20210239955A1 (en) * 2018-06-08 2021-08-05 The Board Of Trustees Of The Leland Stanford Junior University Near infra-red light sheet microscopy through scattering tissues
NL2021205B1 (en) * 2018-06-28 2020-01-07 Univ Eindhoven Tech Method and system for performing terahertz near-field measurements
US11011882B2 (en) * 2018-09-05 2021-05-18 Government Of The United States Of America, As Represented By The Secretary Of Commerce Ultrafast electro-optic laser

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