JPWO2021144981A1 - - Google Patents

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Publication number
JPWO2021144981A1
JPWO2021144981A1 JP2021570617A JP2021570617A JPWO2021144981A1 JP WO2021144981 A1 JPWO2021144981 A1 JP WO2021144981A1 JP 2021570617 A JP2021570617 A JP 2021570617A JP 2021570617 A JP2021570617 A JP 2021570617A JP WO2021144981 A1 JPWO2021144981 A1 JP WO2021144981A1
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JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Application number
JP2021570617A
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Japanese (ja)
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JP7406571B2 (ja
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Publication of JPWO2021144981A1 publication Critical patent/JPWO2021144981A1/ja
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Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K13/00—Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
    • H05K13/08—Monitoring manufacture of assemblages
    • H05K13/081—Integration of optical monitoring devices in assembly lines; Processes using optical monitoring devices specially adapted for controlling devices or machines in assembly lines
    • H05K13/0817—Monitoring of soldering processes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M1/00—Testing static or dynamic balance of machines or structures
    • G01M1/12—Static balancing; Determining position of centre of gravity
    • G01M1/122—Determining position of centre of gravity
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/956—Inspecting patterns on the surface of objects
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G06T7/001—Industrial image inspection using an image reference approach
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/60—Analysis of geometric attributes
    • G06T7/66—Analysis of geometric attributes of image moments or centre of gravity
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8887—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/956—Inspecting patterns on the surface of objects
    • G01N2021/95638—Inspecting patterns on the surface of objects for PCB's
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/956—Inspecting patterns on the surface of objects
    • G01N2021/95638—Inspecting patterns on the surface of objects for PCB's
    • G01N2021/95646—Soldering
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30141—Printed circuit board [PCB]
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30152—Solder
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00—Printed circuits
    • H05K1/02—Details
    • H05K1/0266—Marks, test patterns or identification means
    • H05K1/0269—Marks, test patterns or identification means for visual or optical inspection
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2203/00—Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
    • H05K2203/16—Inspection; Monitoring; Aligning
    • H05K2203/162—Testing a finished product, e.g. heat cycle testing of solder joints
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00—Apparatus or processes for manufacturing printed circuits
    • H05K3/10—Apparatus or processes for manufacturing printed circuits in which conductive material is applied to the insulating support in such a manner as to form the desired conductive pattern
    • H05K3/12—Apparatus or processes for manufacturing printed circuits in which conductive material is applied to the insulating support in such a manner as to form the desired conductive pattern using thick film techniques, e.g. printing techniques to apply the conductive material or similar techniques for applying conductive paste or ink patterns
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00—Apparatus or processes for manufacturing printed circuits
    • H05K3/30—Assembling printed circuits with electric components, e.g. with resistors
    • H05K3/32—Assembling printed circuits with electric components, e.g. with resistors electrically connecting electric components or wires to printed circuits
    • H05K3/34—Assembling printed circuits with electric components, e.g. with resistors electrically connecting electric components or wires to printed circuits by soldering
    • H05K3/341—Surface mounted components

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Theoretical Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Aviation & Aerospace Engineering (AREA)
  • Geometry (AREA)
  • Operations Research (AREA)
  • Manufacturing & Machinery (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Signal Processing (AREA)
  • Supply And Installment Of Electrical Components (AREA)
  • Electric Connection Of Electric Components To Printed Circuits (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
JP2021570617A 2020-01-17 2020-01-17 検査装置及び検査方法 Active JP7406571B2 (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2020/001559 WO2021144981A1 (ja) 2020-01-17 2020-01-17 検査装置及び検査方法

Publications (2)

Publication Number Publication Date
JPWO2021144981A1 true JPWO2021144981A1 (https=) 2021-07-22
JP7406571B2 JP7406571B2 (ja) 2023-12-27

Family

ID=76864072

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2021570617A Active JP7406571B2 (ja) 2020-01-17 2020-01-17 検査装置及び検査方法

Country Status (5)

Country Link
US (1) US12342468B2 (https=)
EP (1) EP4092408B1 (https=)
JP (1) JP7406571B2 (https=)
CN (1) CN114930160B (https=)
WO (1) WO2021144981A1 (https=)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7191173B1 (ja) * 2021-09-17 2022-12-16 Ckd株式会社 基板検査装置及び基板検査方法
CN118176841A (zh) * 2021-11-19 2024-06-11 株式会社富士 元件检查方法以及元件检查装置
CN117764899A (zh) * 2022-09-16 2024-03-26 富联精密电子(天津)有限公司 瑕疵检测方法、终端设备和存储介质

Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06331327A (ja) * 1993-05-21 1994-12-02 Matsushita Electric Ind Co Ltd クリーム半田印刷状態の検査方法
JPH07221151A (ja) * 1994-01-19 1995-08-18 Internatl Business Mach Corp <Ibm> 部品間の接合部を検査する方法および装置
US5621811A (en) * 1987-10-30 1997-04-15 Hewlett-Packard Co. Learning method and apparatus for detecting and controlling solder defects
JPH1075051A (ja) * 1996-07-05 1998-03-17 Toyota Motor Corp 外観検査装置
JP2002543421A (ja) * 1999-05-04 2002-12-17 スピードライン・テクノロジーズ・インコーポレーテッド 基板上の半田ペースト堆積を検査する方法および装置
JP2003315014A (ja) * 2002-04-19 2003-11-06 Fujitsu Ltd 検査方法及び検査装置
JP2009192282A (ja) * 2008-02-13 2009-08-27 Ckd Corp 半田印刷検査装置及び部品実装システム
JP2016217872A (ja) * 2015-05-20 2016-12-22 大日本印刷株式会社 検査装置、検査方法、プログラム、記録媒体
WO2019146004A1 (ja) * 2018-01-23 2019-08-01 株式会社Ｆｕｊｉ 対応関係生成装置

Family Cites Families (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2964007A (en) * 1956-02-16 1960-12-13 Gen Mills Inc Dip soldering machine
US4362987A (en) * 1980-09-12 1982-12-07 Huntron Instruments, Inc. Apparatus for detecting electrical shorts in electronic circuits
US5086397A (en) * 1989-07-18 1992-02-04 Schuster Pamela K Method and apparatus for data collection of testing and inspection of products made on a production assembly line
JP3105353B2 (ja) * 1992-06-30 2000-10-30 松下電器産業株式会社 クリーム半田印刷検査装置
US6891967B2 (en) 1999-05-04 2005-05-10 Speedline Technologies, Inc. Systems and methods for detecting defects in printed solder paste
US7072503B2 (en) 1999-05-04 2006-07-04 Speedline Technologies, Inc. Systems and methods for detecting defects in printed solder paste
JP2004050413A (ja) 2002-07-16 2004-02-19 Hitachi High-Tech Instruments Co Ltd スクリーン印刷機
GB2403003B (en) * 2003-06-19 2006-06-07 Dek Int Gmbh Inspection system for and method of inspecting deposits printed on workpieces
JP4549662B2 (ja) 2003-12-04 2010-09-22 パナソニック株式会社 半田検査装置および半田検査方法
US20050209822A1 (en) * 2004-03-01 2005-09-22 Masato Ishiba Inspection method and system and production method of mounted substrate
JP4935109B2 (ja) * 2005-03-17 2012-05-23 オムロン株式会社 基板検査装置並びにその検査ロジック設定方法および検査ロジック設定装置
JP4770517B2 (ja) * 2006-03-01 2011-09-14 株式会社日立プラントテクノロジー 半田ペースト印刷検査方法
JP5421763B2 (ja) * 2009-12-24 2014-02-19 ヤマハ発動機株式会社 検査装置および検査方法
JP5559551B2 (ja) * 2010-01-19 2014-07-23 株式会社サキコーポレーション 検査装置
JP5884015B2 (ja) * 2012-11-19 2016-03-15 パナソニックＩｐマネジメント株式会社 電子部品装着システム
US9900982B2 (en) * 2013-11-12 2018-02-20 Finisar Corporation Buttoned soldering pad for use with fine-pitch hot bar soldering
EP3410834B1 (en) * 2016-01-29 2020-12-23 Fuji Corporation Electronic component mounting apparatus and production line
JP6262378B1 (ja) * 2017-02-09 2018-01-17 Ckd株式会社 基板検査装置、基板検査方法、及び、基板の製造方法
JP6306230B1 (ja) * 2017-02-09 2018-04-04 Ckd株式会社 半田印刷検査装置、半田印刷検査方法、及び、基板の製造方法
KR20190084167A (ko) * 2017-12-21 2019-07-16 주식회사 고영테크놀러지 인쇄 회로 기판 검사 장치, 스크린 프린터의 결함 유형 결정 방법 및 컴퓨터 판독 가능한 기록 매체

Patent Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5621811A (en) * 1987-10-30 1997-04-15 Hewlett-Packard Co. Learning method and apparatus for detecting and controlling solder defects
JPH06331327A (ja) * 1993-05-21 1994-12-02 Matsushita Electric Ind Co Ltd クリーム半田印刷状態の検査方法
JPH07221151A (ja) * 1994-01-19 1995-08-18 Internatl Business Mach Corp <Ibm> 部品間の接合部を検査する方法および装置
JPH1075051A (ja) * 1996-07-05 1998-03-17 Toyota Motor Corp 外観検査装置
JP2002543421A (ja) * 1999-05-04 2002-12-17 スピードライン・テクノロジーズ・インコーポレーテッド 基板上の半田ペースト堆積を検査する方法および装置
JP2003315014A (ja) * 2002-04-19 2003-11-06 Fujitsu Ltd 検査方法及び検査装置
JP2009192282A (ja) * 2008-02-13 2009-08-27 Ckd Corp 半田印刷検査装置及び部品実装システム
JP2016217872A (ja) * 2015-05-20 2016-12-22 大日本印刷株式会社 検査装置、検査方法、プログラム、記録媒体
WO2019146004A1 (ja) * 2018-01-23 2019-08-01 株式会社Ｆｕｊｉ 対応関係生成装置

Also Published As

Publication number Publication date
CN114930160A (zh) 2022-08-19
US20230029470A1 (en) 2023-02-02
WO2021144981A1 (ja) 2021-07-22
EP4092408B1 (en) 2025-09-24
US12342468B2 (en) 2025-06-24
CN114930160B (zh) 2025-10-03
JP7406571B2 (ja) 2023-12-27
EP4092408A4 (en) 2023-02-08
EP4092408A1 (en) 2022-11-23

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