JPWO2021106646A1 - - Google Patents
Info
- Publication number
- JPWO2021106646A1 JPWO2021106646A1 JP2021561312A JP2021561312A JPWO2021106646A1 JP WO2021106646 A1 JPWO2021106646 A1 JP WO2021106646A1 JP 2021561312 A JP2021561312 A JP 2021561312A JP 2021561312 A JP2021561312 A JP 2021561312A JP WO2021106646 A1 JPWO2021106646 A1 JP WO2021106646A1
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
- G06N5/00—Computing arrangements using knowledge-based models
- G06N5/04—Inference or reasoning models
- G06N5/045—Explanation of inference; Explainable artificial intelligence [XAI]; Interpretable artificial intelligence
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- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B23/00—Testing or monitoring of control systems or parts thereof
- G05B23/02—Electric testing or monitoring
- G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
- G05B23/0218—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults
- G05B23/0243—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults model based detection method, e.g. first-principles knowledge model
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
- G06N5/00—Computing arrangements using knowledge-based models
- G06N5/04—Inference or reasoning models
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B23/00—Testing or monitoring of control systems or parts thereof
- G05B23/02—Electric testing or monitoring
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B23/00—Testing or monitoring of control systems or parts thereof
- G05B23/02—Electric testing or monitoring
- G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
- G05B23/0218—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults
- G05B23/0221—Preprocessing measurements, e.g. data collection rate adjustment; Standardization of measurements; Time series or signal analysis, e.g. frequency analysis or wavelets; Trustworthiness of measurements; Indexes therefor; Measurements using easily measured parameters to estimate parameters difficult to measure; Virtual sensor creation; De-noising; Sensor fusion; Unconventional preprocessing inherently present in specific fault detection methods like PCA-based methods
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
- G06N20/00—Machine learning
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
- G06N3/00—Computing arrangements based on biological models
- G06N3/02—Neural networks
- G06N3/04—Architecture, e.g. interconnection topology
- G06N3/0464—Convolutional networks [CNN, ConvNet]
Landscapes
- Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Physics & Mathematics (AREA)
- Software Systems (AREA)
- Evolutionary Computation (AREA)
- Data Mining & Analysis (AREA)
- Computing Systems (AREA)
- General Engineering & Computer Science (AREA)
- Mathematical Physics (AREA)
- Artificial Intelligence (AREA)
- Automation & Control Theory (AREA)
- Medical Informatics (AREA)
- Computational Linguistics (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Testing And Monitoring For Control Systems (AREA)
- General Factory Administration (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2019217439 | 2019-11-29 | ||
| JP2019217439 | 2019-11-29 | ||
| PCT/JP2020/042564 WO2021106646A1 (ja) | 2019-11-29 | 2020-11-16 | 推論装置、推論方法及び推論プログラム |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JPWO2021106646A1 true JPWO2021106646A1 (https=) | 2021-06-03 |
| JPWO2021106646A5 JPWO2021106646A5 (https=) | 2022-07-14 |
| JP7224492B2 JP7224492B2 (ja) | 2023-02-17 |
Family
ID=76130232
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2021561312A Active JP7224492B2 (ja) | 2019-11-29 | 2020-11-16 | 推論装置、推論方法及び推論プログラム |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US20230004837A1 (https=) |
| JP (1) | JP7224492B2 (https=) |
| KR (1) | KR20220106999A (https=) |
| CN (1) | CN114746820B (https=) |
| TW (1) | TWI867094B (https=) |
| WO (1) | WO2021106646A1 (https=) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR102539835B1 (ko) * | 2023-01-10 | 2023-06-02 | (재) 한국건설품질연구원 | 3d 카메라를 이용한 디지털 트윈 생성 및 손상 분석 시스템 |
| WO2025249225A1 (ja) * | 2024-05-29 | 2025-12-04 | 東京エレクトロン株式会社 | コンピュータプログラム、学習モデルの生成方法、情報処理方法及び情報処理装置 |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0736505A (ja) * | 1993-07-21 | 1995-02-07 | Nkk Corp | 制御対象の同定・制御方法 |
| JPH10260718A (ja) * | 1997-03-19 | 1998-09-29 | Fuji Electric Co Ltd | ダムにおける水量予測方法 |
| WO2010119894A1 (ja) * | 2009-04-14 | 2010-10-21 | シャープ株式会社 | 出来映え予測装置、出来映え予測方法、出来映え予測プログラム、及び、プログラム記録媒体 |
| JP2015127914A (ja) * | 2013-12-27 | 2015-07-09 | 三菱重工業株式会社 | 予測システム、監視システム、運転支援システム、ガスタービン設備及び予測方法 |
| WO2019159483A1 (ja) * | 2018-02-14 | 2019-08-22 | オムロン株式会社 | デバイス選択装置、データセット選択装置、デバイス選択方法及びプログラム |
Family Cites Families (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4635194B2 (ja) | 2004-12-02 | 2011-02-16 | 財団法人石油産業活性化センター | 異常検知装置 |
| US7359759B2 (en) * | 2005-10-31 | 2008-04-15 | Taiwan Semiconductor Manufacturing Company | Method and system for virtual metrology in semiconductor manufacturing |
| KR101150791B1 (ko) * | 2007-09-11 | 2012-06-13 | 도쿄엘렉트론가부시키가이샤 | 정보 처리 장치, 정보 처리 방법 및, 프로그램이 기록된 컴퓨터 판독가능 기록매체 |
| KR102084930B1 (ko) * | 2015-06-03 | 2020-03-05 | 미쓰비시덴키 가부시키가이샤 | 추론 장치 및 추론 방법 |
| US10304154B2 (en) * | 2017-04-24 | 2019-05-28 | Intel Corporation | Coordination and increased utilization of graphics processors during inference |
| US11131989B2 (en) * | 2017-08-02 | 2021-09-28 | Strong Force Iot Portfolio 2016, Llc | Systems and methods for data collection including pattern recognition |
| US11187992B2 (en) * | 2017-10-23 | 2021-11-30 | Applied Materials, Inc. | Predictive modeling of metrology in semiconductor processes |
| KR102028093B1 (ko) * | 2017-10-25 | 2019-10-02 | 한국전자통신연구원 | 네트워크에 대한 이상행위 탐지 방법 및 이를 이용한 장치 |
-
2020
- 2020-11-16 US US17/756,373 patent/US20230004837A1/en active Pending
- 2020-11-16 CN CN202080082402.4A patent/CN114746820B/zh active Active
- 2020-11-16 WO PCT/JP2020/042564 patent/WO2021106646A1/ja not_active Ceased
- 2020-11-16 JP JP2021561312A patent/JP7224492B2/ja active Active
- 2020-11-16 KR KR1020227021133A patent/KR20220106999A/ko not_active Ceased
- 2020-11-17 TW TW109140051A patent/TWI867094B/zh active
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0736505A (ja) * | 1993-07-21 | 1995-02-07 | Nkk Corp | 制御対象の同定・制御方法 |
| JPH10260718A (ja) * | 1997-03-19 | 1998-09-29 | Fuji Electric Co Ltd | ダムにおける水量予測方法 |
| WO2010119894A1 (ja) * | 2009-04-14 | 2010-10-21 | シャープ株式会社 | 出来映え予測装置、出来映え予測方法、出来映え予測プログラム、及び、プログラム記録媒体 |
| JP2015127914A (ja) * | 2013-12-27 | 2015-07-09 | 三菱重工業株式会社 | 予測システム、監視システム、運転支援システム、ガスタービン設備及び予測方法 |
| WO2019159483A1 (ja) * | 2018-02-14 | 2019-08-22 | オムロン株式会社 | デバイス選択装置、データセット選択装置、デバイス選択方法及びプログラム |
Also Published As
| Publication number | Publication date |
|---|---|
| JP7224492B2 (ja) | 2023-02-17 |
| KR20220106999A (ko) | 2022-08-01 |
| CN114746820A (zh) | 2022-07-12 |
| US20230004837A1 (en) | 2023-01-05 |
| CN114746820B (zh) | 2025-06-03 |
| TW202123057A (zh) | 2021-06-16 |
| WO2021106646A1 (ja) | 2021-06-03 |
| TWI867094B (zh) | 2024-12-21 |
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